CN203054149U

CN203054149U - An automatic open circuit and short circuit testing system of a CMOS chip

Info

Publication number: CN203054149U
Application number: CN 201220741698
Authority: CN
Inventors: 钟岳良
Original assignee: Kunshan Q Technology Co Ltd
Current assignee: Kunshan Q Technology Co Ltd
Priority date: 2012-12-28
Filing date: 2012-12-28
Publication date: 2013-07-10
Anticipated expiration: 2022-12-28

Abstract

The utility model discloses an automatic open circuit and short circuit testing system of a CMOS chip. The testing system comprises a master control chip, a multiplexing module, a liquid crystal display module, and a storage module. The master control chip is connected with the multiplexing module, the liquid crystal display module, and the storage module. The multiplexing module is connected a CMOS chip to be tested. The master control chip is capable of acquiring signals on the pins of the CMOS chip to be tested by using the multiplexing module, processing the signals by using software, storing signal processed results by using the storage module, and displaying the signal processed results by using the liquid crystal display module. The automatic open circuit and short circuit testing system satisfies automatic open circuit and short circuit tests of various CMOS chips and increases testing precision while optimizing testing efficiency. Testing standards can be established according to different CMOS chips.

Description

The automatic open-short circuit of CMOS chip system

Technical field

The utility model relates to a kind of open-short circuit tester, specifically relate to the automatic open-short circuit of a kind of CMOS chip system, be applicable to the open-short circuit of various types of CMOS chips such as DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and self defined interface.

Background technology

Open-short circuit (claims OPEN/SHORT test again, the O/S test), it mainly is the connection situation for test electronic device, as its name suggests, open-short circuit is tested open circuit and short circuit exactly, open-short circuit use very extensively, for example: the test pcb board, test I C nation alignment, the encapsulation of test I C, test wire rod, test FPC, the testing film switch, test connector etc., different application has more special demand again, at present, the open-short circuit tester of CMOS chip can only be tested at the product of parallel port, can't satisfy the open-short circuit of increasing MIPI interface CMOS chip on the market.

Summary of the invention

In order to solve the problems of the technologies described above, the utility model proposes the automatic open-short circuit of a kind of CMOS chip system, can satisfy the automatic open-short circuit of various CMOS chips on the market, improve the precision of test when optimizing testing efficiency, can formulate testing standard according to different CMOS chips.

The technical solution of the utility model is achieved in that

The automatic open-short circuit of a kind of CMOS chip system, comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.

As further improvement of the utility model, other is provided with the dial-up device, and described dial-up device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described dial-up device is selected and CMOS chip to be measured is complementary.

As further improvement of the utility model, described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.

As further improvement of the utility model, other is provided with communication module, and described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and transmission data by described communication module.

As further improvement of the utility model, described communication module is the usb communication interface.

The beneficial effects of the utility model are: the utility model provides the automatic open-short circuit of a kind of CMOS chip system; main control chip is given the GND pin input test signal of CMOS chip to be measured by multiplexing module; then; whether the protection diode of judging each pin of CMOS chip to be measured has the conduction voltage drop signal; can realize the open test of CMOS chip; main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module; then; judge whether the input signal pin is identical with the output signal of other pin; can realize the short-circuit test of CMOS chip; especially; the interface modes that multiplexing module is complementary by the selection of dial-up device and CMOS chip to be measured; interface modes is the DVP interface; MIPI single channel interface; MIPI binary channels interface; a kind of in MIPI four-way interface and the self defined interface; can effectively satisfy the automatic open-short circuit of various CMOS chips on the market, improve the precision of test when optimizing testing efficiency.

Description of drawings

Fig. 1 is the utility model schematic block diagram;

Fig. 2 is the utility model testing process synoptic diagram.

Embodiment

As depicted in figs. 1 and 2, the automatic open-short circuit of a kind of CMOS chip system, comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.

Preferably, other is provided with the dial-up device, and described dial-up device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described dial-up device is selected and CMOS chip to be measured is complementary.

Preferably, described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.

Preferably, other is provided with communication module, and described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and transmission data by described communication module.

Preferably, described communication module is the usb communication interface.

The method of testing of the automatic open-short circuit of the utility model CMOS chip system comprises the steps:

A, open test; at first; main control chip is given the test signal of the GND pin input 1.5V of CMOS chip to be measured by multiplexing module; then, main control chip is gathered the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured successively by multiplexing module, if the protection diode of current pin does not collect the conduction voltage drop signal; then judge current pin open circuit; otherwise, judge that then current pin is normal, by memory module storage open test information.

B, short-circuit test, at first, main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module, then, whether main control chip is identical with input signal by multiplexing module collection and contrast output signal of other pin except the input signal pin, judge current pin and the short circuit of signal input tube pin of being gathered contrast if signal is identical, judge that current pin is normal if signal is inequality, by memory module storage short-circuit test information;

C, the information of will opening a way and short circuit information show by LCD MODULE.

The test philosophy of the utility model CMOS chip automatic open-short circuit system and method for testing is as follows: the open test principle, because the forward conduction voltage of normal CMOS chip protection diode is between 0.4V-0.5V, in pin when open circuit, should the not conducting of protection diode, and the forward voltage signal of protection diode that therefore can be by each pin of test CMOS chip can judge whether pin opens a way; The short-circuit test principle, the pin input test signal to a CMOS chip removes to gather the signal on other pin simultaneously, if the test signal of the test signal that collects and input is consistent, then represents the input pin short circuit of this pin and test.

Above embodiment is with reference to accompanying drawing; preferred embodiment of the present utility model is elaborated; those skilled in the art is by carrying out modification or the change on the various forms to above-described embodiment; but do not deviate under the situation of essence of the present utility model, all drop within the protection domain of the present utility model.

Claims

1. the automatic open-short circuit of CMOS chip system, it is characterized in that: comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.

2. the automatic open-short circuit of CMOS chip according to claim 1 system, it is characterized in that: other is provided with the dial-up device, described dial-up device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described dial-up device is selected and CMOS chip to be measured is complementary.

3. the automatic open-short circuit of CMOS chip according to claim 2 system is characterized in that: described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.

4. the automatic open-short circuit of CMOS chip according to claim 1 system, it is characterized in that: other is provided with communication module, described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and transmission data by described communication module.

5. the automatic open-short circuit of CMOS chip according to claim 4 system, it is characterized in that: described communication module is the usb communication interface.