CN103076530B - CMOS chip automatic open-short circuit system and method for testing - Google Patents

CMOS chip automatic open-short circuit system and method for testing Download PDF

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Publication number
CN103076530B
CN103076530B CN201210585947.4A CN201210585947A CN103076530B CN 103076530 B CN103076530 B CN 103076530B CN 201210585947 A CN201210585947 A CN 201210585947A CN 103076530 B CN103076530 B CN 103076530B
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China
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module
pin
main control
signal
cmos chip
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CN201210585947.4A
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Chinese (zh)
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CN103076530A (en
Inventor
钟岳良
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昆山丘钛微电子科技有限公司
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Abstract

nullThe invention discloses a kind of CMOS chip automatic open-short circuit system and method for testing,This test system includes main control chip、Multiplexing module、LCD MODULE and memory module,Described main control chip respectively with described multiplexing module、Described LCD MODULE is connected with described memory module,Described multiplexing module is connected with CMOS chip to be measured,Described main control chip can carry out signals collecting by described multiplexing module and carry out signal processing by software the pin of CMOS chip to be measured,By described memory module, signal processing results can be stored,By LCD MODULE, signal processing results can also be shown,The present invention disclosure satisfy that the automatic open-short circuit of various CMOS chip on market,The precision of test is improve while optimal inspection efficiency,Testing standard can be formulated according to different CMOS chip.

Description

CMOS chip automatic open-short circuit system and method for testing

Technical field

The present invention relates to a kind of open-short circuit tester and method of testing, be specifically related to a kind of CMOS chip Automatically open-short circuit system and method for testing, it is adaptable to DVP interface, MIPI single channel interface, Various types of CMOS cores such as MIPI dual pathways interface, MIPI four-way interface and self defined interface The open-short circuit of sheet.

Background technology

Open-short circuit (is tested also known as OPEN/SHORT, O/S tests), is mainly used for test electricity The connection of sub-device, as the term suggests, open-short circuit tests open circuit and short circuit exactly, opens Short-circuit test application the most extensively, such as: test pcb board, is tested IC bonding line, is tested I The encapsulation of C, tests wire rod, tests FPC, and testing film switchs, test connector etc., no Same application has again the special demand of comparison, and at present, the open-short circuit tester of CMOS chip can only Product for parallel port is tested, it is impossible to meet increasing MIPI interface CMOS on market The open-short circuit of chip.

Summary of the invention

In order to solve above-mentioned technical problem, the present invention proposes a kind of CMOS chip automatic open-short circuit system System and method of testing, it is possible to meet various CMOS chip on market Automatic open-short circuit, improve the precision of test while optimal inspection efficiency, can foundation Different CMOS chip formulates testing standard.

The technical scheme is that and be achieved in that:

A kind of CMOS chip automatic open-short circuit system, including main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, Described LCD MODULE is connected with described memory module, and described multiplexing module is with to be measured CMOS chip is connected, and described main control chip can be by described multiplexing module to CM to be measured The pin of OS chip carries out signals collecting and carries out signal processing by software, it is possible to by described Signal processing results is stored by memory module, additionally it is possible to by LCD MODULE by signal Result shows.

As a further improvement on the present invention, being additionally provided with shifting device, described shifting device is with described many Road Multiplexing module is connected, described multiplexing module can by described shifting device select with The interface modes that CMOS chip to be measured matches.

As a further improvement on the present invention, described interface modes is DVP interface, MIPI single channel interface , MIPI dual pathways interface, one in MIPI four-way interface and self defined interface.

As a further improvement on the present invention, it is additionally provided with communication module, described communication module and described master Control chip is connected, and described main control chip can be described main control chip by described communication module Power supply and transmission data.

As a further improvement on the present invention, described communication module is USB communication interface.

The method of testing of a kind of CMOS chip automatic open-short circuit system, including such as Lower step:

A, open test, first, main control chip gives the G of CMOS chip to be measured by multiplexing module The test signal of ND pin input 1.5V, then, main control chip is by multiplexing module successively Gather the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured, if current The protection diode of pin does not collect conduction voltage drop signal, then judge current pin open circuit , otherwise, then judge that current pin is normal, stores open test information by memory module.

B, short-circuit test, first, main control chip gives CMOS chip to be measured successively by multiplexing module The test signal of pin input 1.5v, then, main control chip passes through multiplexing module Gather and contrast in addition to input signal pin the output signal of other pin whether with input signal Identical, if signal is identical, judge that the pin of current collected contrast is short with signal input tube foot Road, if signal differs, judges that current pin is normal, is surveyed by memory module storage short circuit Examination information;

C, open circuit information is shown by LCD MODULE with short circuit information.

The invention has the beneficial effects as follows: the present invention provides a kind of CMOS chip automatic open-short circuit system , main control chip gives the GND pin input test signal of CMOS chip to be measured by multiplexing module , then, it is judged that whether the protection diode of each pin of CMOS chip to be measured has conduction voltage drop signal , it is possible to realizing the open test of CMOS chip, main control chip is given successively by multiplexing module The test signal of one pin input 1.5v of CMOS chip to be measured, then, it is judged that input signal Pin is the most identical with the output signal of other pin, it is possible to realize the short-circuit test of CMOS chip , particularly, multiplexing module is matched by shifting device selection and CMOS chip to be measured Interface modes, interface modes is that DVP interface, MIPI single channel connect One in mouth, MIPI dual pathways interface, MIPI four-way interface and self defined interface, it is possible to Effectively meet the automatic open-short circuit of various CMOS chip on market, optimal inspection efficiency same Time improve the precision of test.

Accompanying drawing explanation

Fig. 1 is principle of the invention schematic block diagram;

Fig. 2 is testing process schematic diagram of the present invention.

Detailed description of the invention

As depicted in figs. 1 and 2, a kind of CMOS chip automatic open-short circuit system, including main control chip , multiplexing module, LCD MODULE and memory module, described main control chip respectively with institute State multiplexing module, described LCD MODULE is connected with described memory module, described many Road Multiplexing module is connected with CMOS chip to be measured, and described main control chip can be by described multichannel Multiplexing module is carried out signals collecting and is carried out at signal by software the pin of CMOS chip to be measured Reason, it is possible to by described memory module, signal processing results is stored, additionally it is possible to pass through liquid Signal processing results is shown by brilliant display module.

Preferably, being additionally provided with shifting device, described shifting device is connected with described multiplexing module , described multiplexing module can be selected and CMOS chip to be measured phase by described shifting device The interface modes joined.

Preferably, described interface modes is DVP interface, MIPI single channel interface, MIPI dual pathways interface , one in MIPI four-way interface and self defined interface.

Preferably, it is additionally provided with communication module, described communication module and described main control chip Be connected, described main control chip can by described communication module be described main control chip power and Transmission data.

Preferably, described communication module is USB communication interface.

The method of testing of a kind of CMOS chip automatic open-short circuit system, comprises the steps:

A, open test, first, main control chip gives the G of CMOS chip to be measured by multiplexing module The test signal of ND pin input 1.5V, then, main control chip is by multiplexing module successively Gather the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured, if current The protection diode of pin does not collect conduction voltage drop signal, then judge current pin open circuit , otherwise, then judge that current pin is normal, stores open test information by memory module.

B, short-circuit test, first, main control chip gives CMOS chip to be measured successively by multiplexing module The test signal of pin input 1.5v, then, main control chip passes through multiplexing module Gather and contrast in addition to input signal pin the output signal of other pin whether with input signal Identical, if signal is identical, judge that the pin of current collected contrast is short with signal input tube foot Road, if signal differs, judges that current pin is normal, is surveyed by memory module storage short circuit Examination information;

C, open circuit information is shown by LCD MODULE with short circuit information.

The test philosophy of CMOS chip of the present invention automatic open-short circuit system and method for testing is as follows: open Road test philosophy, owing to the forward conduction voltage of normal CMOS chip protection diode is at 0.4V-0 .5V between, during pin open circuit, this protection diode is not turned on, therefore can be by test CMOS core The conducting voltage signal of the protection diode of each pin of sheet may determine that whether pin opens a way;Short circuit Test philosophy, to one The pin input test signal of CMOS chip, goes to gather the signal on other pin, if adopting simultaneously The test signal that collection arrives is consistent with the test signal of input, then it represents that this pin and the input of test Pin short circuit.

Above example is referring to the drawings, to a preferred embodiment of the present invention will be described in detail, ability The technical staff in territory by not carrying out the amendment on various forms or change to above-described embodiment, but not In the case of deviating from the essence of the present invention, all fall within the scope and spirit of the invention.

Claims (4)

1. a CMOS chip automatic open-short circuit system, it is characterised in that: bag Include main control chip, multiplexing module, LCD MODULE and memory module, described Main control chip respectively with described multiplexing module, described LCD MODULE and described Memory module is connected, and described multiplexing module is connected with CMOS chip to be measured, Described main control chip can be by described multiplexing module to CMOS chip to be measured Pin carries out signals collecting and carries out signal processing by software, it is possible to deposited by described Signal processing results is stored by storage module, additionally it is possible to will by LCD MODULE Signal processing results shows;It is additionally provided with shifting device, described shifting device and institute Stating multiplexing module to be connected, described multiplexing module can pass through described dial-up Device selects the interface modes matched with CMOS chip to be measured;Described interface modes For DVP interface, MIPI single channel interface, MIPI dual pathways interface, MIPI four-way One in pipeline joint and self defined interface.
CMOS chip the most according to claim 1 automatic open-short circuit system, It is characterized in that: be additionally provided with communication module, described communication module and described main control chip Being connected, described main control chip can be described main control chip by described communication module Power supply and transmission data.
CMOS chip the most according to claim 2 automatic open-short circuit system, It is characterized in that: described communication module is USB communication interface.
4. the CMOS chip as described in any one of claim 1-3 is opened short automatically The method of testing of path test system, it is characterised in that: comprise the steps:
A, open test, first, main control chip is given to be measured by multiplexing module The test signal of the GND pin input 1.5V of CMOS chip, then, main control chip Protection two pole of each pin of CMOS chip to be measured is gathered successively by multiplexing module The conduction voltage drop signal of pipe, if the protection diode of current pin does not collect Conduction voltage drop signal, then judge current pin open circuit, otherwise, then judge current pipe Foot is normal, stores open test information by memory module;
B, short-circuit test, first, main control chip is given successively by multiplexing module The test signal of one pin input 1.5v of CMOS chip to be measured, then, master control Chip gathers and contrasts in addition to input signal pin other by multiplexing module The output signal of pin is the most identical with input signal, if signal is identical, judges to work as The pin of front collected contrast and the short circuit of signal input tube foot, if signal differs, Judge that current pin is normal, store short-circuit test information by memory module;
C, open test information is shown by LCD MODULE with short-circuit test information Illustrate.
CN201210585947.4A 2012-12-28 2012-12-28 CMOS chip automatic open-short circuit system and method for testing CN103076530B (en)

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CN104297614A (en) * 2014-09-16 2015-01-21 冀雅(廊坊)电子有限公司 Short-circuit testing device and method for segment code type liquid crystal display module
CN104569661B (en) * 2014-12-23 2018-02-06 深圳市九洲电器有限公司 A kind of HDMI test circuit and device
CN105548790B (en) * 2015-12-09 2019-08-16 上海斐讯数据通信技术有限公司 A kind of USB3.1 Type-C cable automatic test approach and system
CN105823956A (en) * 2016-03-16 2016-08-03 昆山软龙格自动化技术有限公司 IC open/short test system integrated in USB3.0 test card
CN105891657A (en) * 2016-04-25 2016-08-24 万高(杭州)科技有限公司 Method and apparatus for detecting chip bonding conditions of printed circuit board
CN106771823A (en) * 2017-02-06 2017-05-31 湖北三赢兴电子科技有限公司 Camera module open-short circuit device, system
CN106899844A (en) * 2017-02-13 2017-06-27 张家港市欧微自动化研发有限公司 A kind of cmos sensor test system
CN108957290A (en) * 2018-06-27 2018-12-07 四川斐讯信息技术有限公司 A kind of SCM Based chip method for detecting short circuit and system

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