CN102696042B - 用于测量电磁波的装置和方法 - Google Patents

用于测量电磁波的装置和方法 Download PDF

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Publication number
CN102696042B
CN102696042B CN201080060768.8A CN201080060768A CN102696042B CN 102696042 B CN102696042 B CN 102696042B CN 201080060768 A CN201080060768 A CN 201080060768A CN 102696042 B CN102696042 B CN 102696042B
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CN
China
Prior art keywords
wavelet
waveform
time waveform
terahertz electromagnetic
electromagnetic wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CN201080060768.8A
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English (en)
Chinese (zh)
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CN102696042A (zh
Inventor
盐田道德
尾内敏彦
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102696042A publication Critical patent/CN102696042A/zh
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing
    • G06F2218/02—Preprocessing
    • G06F2218/04—Denoising
    • G06F2218/06—Denoising by applying a scale-space analysis, e.g. using wavelet analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201080060768.8A 2010-01-08 2010-12-28 用于测量电磁波的装置和方法 Expired - Fee Related CN102696042B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010002481A JP5552321B2 (ja) 2010-01-08 2010-01-08 電磁波の測定装置及び方法
JP2010-002481 2010-01-08
PCT/JP2010/007591 WO2011083558A2 (en) 2010-01-08 2010-12-28 Apparatus and method for measuring electromagnetic wave

Publications (2)

Publication Number Publication Date
CN102696042A CN102696042A (zh) 2012-09-26
CN102696042B true CN102696042B (zh) 2015-11-25

Family

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CN201080060768.8A Expired - Fee Related CN102696042B (zh) 2010-01-08 2010-12-28 用于测量电磁波的装置和方法

Country Status (5)

Country Link
US (1) US9104912B2 (enExample)
EP (1) EP2521986A2 (enExample)
JP (1) JP5552321B2 (enExample)
CN (1) CN102696042B (enExample)
WO (1) WO2011083558A2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6133112B2 (ja) * 2013-04-11 2017-05-24 Ntn株式会社 転がり軸受の診断装置および転がり軸受の診断方法
WO2019038823A1 (ja) * 2017-08-22 2019-02-28 株式会社日立ハイテクノロジーズ 遠赤外分光装置、および遠赤外分光方法
WO2024111794A1 (ko) * 2022-11-22 2024-05-30 삼성전자 주식회사 시간 평균 sar 모드를 수행하는 전자 장치 및 전자 장치의 동작 방법

Citations (4)

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Publication number Priority date Publication date Assignee Title
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
JP2004101510A (ja) * 2002-07-15 2004-04-02 Tochigi Nikon Corp パルス光を用いた分光計測方法および装置
CN101377406A (zh) * 2007-08-31 2009-03-04 佳能株式会社 用于获得与太赫兹波有关的信息的设备和方法
WO2009084712A1 (en) * 2007-12-28 2009-07-09 Canon Kabushiki Kaisha Waveform information acquisition apparatus and method

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JP3040651B2 (ja) * 1994-02-23 2000-05-15 三菱重工業株式会社 信号処理装置
JP2735064B2 (ja) * 1996-01-31 1998-04-02 日本電気株式会社 波形解析装置
US7738111B2 (en) * 2006-06-27 2010-06-15 Lawrence Livermore National Security, Llc Ultrafast chirped optical waveform recording using referenced heterodyning and a time microscope
US8067739B2 (en) * 2007-06-22 2011-11-29 Canon Kabushiki Kaisha Photoconductive element for generation and detection of terahertz wave
US7746400B2 (en) * 2007-07-31 2010-06-29 Aptina Imaging Corporation Method, apparatus, and system providing multi-column shared readout for imagers
JP4975001B2 (ja) * 2007-12-28 2012-07-11 キヤノン株式会社 波形情報取得装置及び波形情報取得方法
JP2009300109A (ja) * 2008-06-10 2009-12-24 Sony Corp テラヘルツ波測定方法及びテラヘルツ分光装置
JP5238370B2 (ja) 2008-06-18 2013-07-17 藤森工業株式会社 ディスプレイ用前面板および前面板用の積層フィルムの製造方法
WO2010032245A2 (en) * 2008-09-17 2010-03-25 Opticul Diagnostics Ltd. Means and methods for detecting bacteria in an aerosol sample
JP5623061B2 (ja) 2008-12-12 2014-11-12 キヤノン株式会社 検査装置及び検査方法
US20110068268A1 (en) * 2009-09-18 2011-03-24 T-Ray Science Inc. Terahertz imaging methods and apparatus using compressed sensing
JP5596982B2 (ja) * 2010-01-08 2014-10-01 キヤノン株式会社 電磁波の測定装置及び方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5939721A (en) * 1996-11-06 1999-08-17 Lucent Technologies Inc. Systems and methods for processing and analyzing terahertz waveforms
JP2004101510A (ja) * 2002-07-15 2004-04-02 Tochigi Nikon Corp パルス光を用いた分光計測方法および装置
CN101377406A (zh) * 2007-08-31 2009-03-04 佳能株式会社 用于获得与太赫兹波有关的信息的设备和方法
WO2009084712A1 (en) * 2007-12-28 2009-07-09 Canon Kabushiki Kaisha Waveform information acquisition apparatus and method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Optical discrimination and classification of THz Spectra in the wavelet domain;Roberto等;《OPTICS EXPRESS》;20030616;第11卷(第12期);1462-1473 *
the what,how, and why of wavelet shrinkage denoising;Carl Taswell;《Computing in Science and Engineering》;20060630;12-19 *

Also Published As

Publication number Publication date
WO2011083558A2 (en) 2011-07-14
EP2521986A2 (en) 2012-11-14
CN102696042A (zh) 2012-09-26
JP5552321B2 (ja) 2014-07-16
WO2011083558A3 (en) 2011-08-18
JP2011141214A (ja) 2011-07-21
US9104912B2 (en) 2015-08-11
US20120280128A1 (en) 2012-11-08

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