CN102621574A - 闪烁体面板、其制造方法和放射线检测设备 - Google Patents

闪烁体面板、其制造方法和放射线检测设备 Download PDF

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Publication number
CN102621574A
CN102621574A CN2012100154867A CN201210015486A CN102621574A CN 102621574 A CN102621574 A CN 102621574A CN 2012100154867 A CN2012100154867 A CN 2012100154867A CN 201210015486 A CN201210015486 A CN 201210015486A CN 102621574 A CN102621574 A CN 102621574A
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CN
China
Prior art keywords
scintillator
columnar
columnar crystals
layer
scintillator layer
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Pending
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CN2012100154867A
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English (en)
Chinese (zh)
Inventor
佐佐木庆人
冈田聪
长野和美
野村庆一
石田阳平
市村知昭
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102621574A publication Critical patent/CN102621574A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members

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  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
CN2012100154867A 2011-01-26 2012-01-18 闪烁体面板、其制造方法和放射线检测设备 Pending CN102621574A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011-014382 2011-01-26
JP2011014382A JP2012154811A (ja) 2011-01-26 2011-01-26 シンチレータパネルおよびその製造方法ならびに放射線検出装置

Publications (1)

Publication Number Publication Date
CN102621574A true CN102621574A (zh) 2012-08-01

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CN2012100154867A Pending CN102621574A (zh) 2011-01-26 2012-01-18 闪烁体面板、其制造方法和放射线检测设备

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Country Link
US (1) US20120187298A1 (enExample)
JP (1) JP2012154811A (enExample)
CN (1) CN102621574A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675885A (zh) * 2012-08-28 2014-03-26 柯尼卡美能达株式会社 闪烁体板和放射线检测面板
KR20150103042A (ko) * 2013-01-09 2015-09-09 하마마츠 포토닉스 가부시키가이샤 신틸레이터 패널의 제조 방법, 신틸레이터 패널 및 방사선 검출기
CN114072702A (zh) * 2019-05-13 2022-02-18 特里希尔公司 生产入射辐射固态数字检测器的方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013029384A (ja) * 2011-07-27 2013-02-07 Canon Inc 放射線検出装置、その製造方法および放射線検出システム
JP2015049127A (ja) * 2013-08-30 2015-03-16 株式会社東芝 検出器モジュール製造方法、検出器モジュール及び医用画像診断装置
JP6524811B2 (ja) * 2015-06-16 2019-06-05 コニカミノルタ株式会社 放射線画像検出器
EP3226038B1 (en) 2016-03-28 2020-05-06 Canon Kabushiki Kaisha Radiation detection apparatus and radiation imaging system
JP2018004590A (ja) * 2016-07-08 2018-01-11 東芝電子管デバイス株式会社 シンチレータ、シンチレータパネル、放射線検出器、およびシンチレータの製造方法
JP6862324B2 (ja) * 2017-09-27 2021-04-21 浜松ホトニクス株式会社 シンチレータパネル及び放射線検出器
JP2024027374A (ja) * 2022-08-17 2024-03-01 キヤノン株式会社 放射線撮像装置の製造方法

Citations (4)

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Publication number Priority date Publication date Assignee Title
US4956556A (en) * 1988-11-14 1990-09-11 Siemens Analytical X-Ray Instruments, Inc. Radiation scintillation detector
CN1530667A (zh) * 2003-03-12 2004-09-22 ������������ʽ���� 放射线检测装置及其制造方法
JP2005337724A (ja) * 2004-05-24 2005-12-08 Konica Minolta Medical & Graphic Inc 放射線画像変換パネル及びその製造方法
CN101657737A (zh) * 2007-04-18 2010-02-24 佳能株式会社 放射线检测装置和放射线检测系统

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241180A (en) * 1992-08-05 1993-08-31 General Electric Company Radiation detection devices with tapered scintillator crystals

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4956556A (en) * 1988-11-14 1990-09-11 Siemens Analytical X-Ray Instruments, Inc. Radiation scintillation detector
CN1530667A (zh) * 2003-03-12 2004-09-22 ������������ʽ���� 放射线检测装置及其制造方法
JP2005337724A (ja) * 2004-05-24 2005-12-08 Konica Minolta Medical & Graphic Inc 放射線画像変換パネル及びその製造方法
CN101657737A (zh) * 2007-04-18 2010-02-24 佳能株式会社 放射线检测装置和放射线检测系统

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675885A (zh) * 2012-08-28 2014-03-26 柯尼卡美能达株式会社 闪烁体板和放射线检测面板
CN103675885B (zh) * 2012-08-28 2016-04-20 柯尼卡美能达株式会社 闪烁体板和放射线检测面板
KR20150103042A (ko) * 2013-01-09 2015-09-09 하마마츠 포토닉스 가부시키가이샤 신틸레이터 패널의 제조 방법, 신틸레이터 패널 및 방사선 검출기
CN104903971A (zh) * 2013-01-09 2015-09-09 浜松光子学株式会社 闪烁器面板的制造方法、闪烁器面板以及放射线检测器
US9405020B2 (en) 2013-01-09 2016-08-02 Hamamatsu Photonics K.K. Scintillator panel manufacturing method, scintillator panel, and radiation detector
CN104903971B (zh) * 2013-01-09 2017-08-18 浜松光子学株式会社 闪烁器面板的制造方法、闪烁器面板以及放射线检测器
KR102059230B1 (ko) 2013-01-09 2019-12-24 하마마츠 포토닉스 가부시키가이샤 신틸레이터 패널의 제조 방법, 신틸레이터 패널 및 방사선 검출기
CN114072702A (zh) * 2019-05-13 2022-02-18 特里希尔公司 生产入射辐射固态数字检测器的方法

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US20120187298A1 (en) 2012-07-26
JP2012154811A (ja) 2012-08-16

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Application publication date: 20120801