CN102192832B - 包括半球型的积分球的光学测量装置 - Google Patents

包括半球型的积分球的光学测量装置 Download PDF

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Publication number
CN102192832B
CN102192832B CN201110043621.4A CN201110043621A CN102192832B CN 102192832 B CN102192832 B CN 102192832B CN 201110043621 A CN201110043621 A CN 201110043621A CN 102192832 B CN102192832 B CN 102192832B
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China
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mentioned
light
window
planar portions
half bulb
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CN201110043621.4A
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English (en)
Chinese (zh)
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CN102192832A (zh
Inventor
大泽祥宏
大久保和明
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Otsuka Electronics Co Ltd
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Otsuka Electronics Co Ltd
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Publication of CN102192832A publication Critical patent/CN102192832A/zh
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254Spectrometers, other than colorimeters, making use of an integrating sphere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/58Photometry, e.g. photographic exposure meter using luminescence generated by light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481Preset integrating sphere or cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201110043621.4A 2010-02-24 2011-02-23 包括半球型的积分球的光学测量装置 Active CN102192832B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010038377A JP5608919B2 (ja) 2010-02-24 2010-02-24 光学測定装置
JP2010-038377 2010-02-24

Publications (2)

Publication Number Publication Date
CN102192832A CN102192832A (zh) 2011-09-21
CN102192832B true CN102192832B (zh) 2014-12-17

Family

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CN201110043621.4A Active CN102192832B (zh) 2010-02-24 2011-02-23 包括半球型的积分球的光学测量装置

Country Status (5)

Country Link
US (1) US8422018B2 (enExample)
JP (1) JP5608919B2 (enExample)
KR (1) KR101825223B1 (enExample)
CN (1) CN102192832B (enExample)
TW (1) TWI497039B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106338469A (zh) * 2015-07-07 2017-01-18 大塚电子株式会社 光学特性测定系统以及光学特性测定系统的校正方法

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CN102507144A (zh) * 2011-09-30 2012-06-20 上海理工大学 紫外传感增强膜变频效率的测试方法
WO2013054379A1 (en) * 2011-10-13 2013-04-18 Otsuka Electronics Co., Ltd. Optical measurement system, optical measurement method, and mirror plate for optical measurement system
JP5944719B2 (ja) * 2012-04-04 2016-07-05 大塚電子株式会社 配光特性測定装置および配光特性測定方法
KR101411428B1 (ko) * 2012-07-12 2014-06-24 한국과학기술원 집광식 휴대용 형광 검출 시스템
JP5479543B2 (ja) * 2012-07-19 2014-04-23 大塚電子株式会社 光学特性測定装置
TWI502173B (zh) * 2012-08-28 2015-10-01 Mpi Corp 光電零組件檢測設備
JP6357153B2 (ja) * 2012-09-10 2018-07-11 ブルーライト アナリティックス インコーポレイテッド 光を測定するデバイス及び方法
CN104006877A (zh) * 2013-02-27 2014-08-27 中国计量学院 一种利用半积分球测量长尺寸日光灯光通量的方法及装置
TW201333499A (zh) * 2013-04-16 2013-08-16 Hauman Technologies Corp 待測發光元件之光檢測裝置及其方法
CN103411885A (zh) * 2013-07-18 2013-11-27 江苏大学 一种多光谱成像系统的漫反射照明装置
KR102242460B1 (ko) * 2013-09-19 2021-04-21 로레알 표면의 색상 및 스펙트럼의 측정 및 범주화를 위한 시스템 및 방법
CN106090700B (zh) * 2016-06-06 2017-09-19 北京理工大学 超大张角多光谱朗伯面照明光源
JP7196924B2 (ja) * 2018-09-21 2022-12-27 コニカミノルタ株式会社 反射特性測定装置及び該方法
JP6492220B1 (ja) * 2018-09-26 2019-03-27 大塚電子株式会社 測定システムおよび測定方法
CN110595613B (zh) * 2019-10-13 2024-05-03 云南师范大学 一种积分球进光口置换装置及其积分球
US20220105227A1 (en) * 2020-10-02 2022-04-07 Dynamis Energy, Llc Dual chamber ultra-violet led device for use with face masks to disinfect end-user's inhaled and exhaled air
CN114354565A (zh) * 2022-01-26 2022-04-15 厦门行者科创科技有限公司 一种半积分球测样系统
CN115077875A (zh) * 2022-07-21 2022-09-20 厦门行者科创科技有限公司 一种积分半球装置及其应用
DE102022127793B3 (de) 2022-10-20 2023-09-21 Hochschule Reutlingen, Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zur Spektroskopie einer Probe

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0599024A1 (en) * 1992-11-27 1994-06-01 Matsushita Electric Industrial Co., Ltd. A luminous flux measuring apparatus
US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
US5803592A (en) * 1996-11-22 1998-09-08 Austin Air Systems Limited Light source
CN2658729Y (zh) * 2003-03-26 2004-11-24 中国科学院长春光学精密机械与物理研究所 一种吸收率测量装置
CN101419091A (zh) * 2007-10-25 2009-04-29 大电子株式会社 光通量计及总光通量的测量方法

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JP3246320B2 (ja) * 1996-03-27 2002-01-15 松下電器産業株式会社 配光特性測定装置と配光特性測定方法
JP3266046B2 (ja) 1997-04-21 2002-03-18 松下電器産業株式会社 蛍光体の量子効率測定装置
JP3682528B2 (ja) * 2002-01-24 2005-08-10 独立行政法人産業技術総合研究所 固体試料の絶対蛍光量子効率測定方法及び装置
US7145125B2 (en) * 2003-06-23 2006-12-05 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
US8102531B2 (en) * 2006-12-15 2012-01-24 Inlight Solutions, Inc. Illumination source and non-invasive tissue sampling system
US7980728B2 (en) * 2008-05-27 2011-07-19 Abl Ip Holding Llc Solid state lighting using light transmissive solid in or forming optical integrating volume
JP2008292497A (ja) * 2008-07-04 2008-12-04 Panasonic Corp 光学測定装置
CN101932926B (zh) * 2009-01-20 2013-07-24 大塚电子株式会社 量子效率测量装置以及量子效率测量方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0599024A1 (en) * 1992-11-27 1994-06-01 Matsushita Electric Industrial Co., Ltd. A luminous flux measuring apparatus
US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
US5803592A (en) * 1996-11-22 1998-09-08 Austin Air Systems Limited Light source
CN2658729Y (zh) * 2003-03-26 2004-11-24 中国科学院长春光学精密机械与物理研究所 一种吸收率测量装置
CN101419091A (zh) * 2007-10-25 2009-04-29 大电子株式会社 光通量计及总光通量的测量方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106338469A (zh) * 2015-07-07 2017-01-18 大塚电子株式会社 光学特性测定系统以及光学特性测定系统的校正方法

Also Published As

Publication number Publication date
US8422018B2 (en) 2013-04-16
KR20110097677A (ko) 2011-08-31
JP2011174785A (ja) 2011-09-08
CN102192832A (zh) 2011-09-21
TW201135194A (en) 2011-10-16
US20110205541A1 (en) 2011-08-25
TWI497039B (zh) 2015-08-21
JP5608919B2 (ja) 2014-10-22
KR101825223B1 (ko) 2018-02-02

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