TWI497039B - 含有半球型積分球的光學測量裝置 - Google Patents

含有半球型積分球的光學測量裝置 Download PDF

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Publication number
TWI497039B
TWI497039B TW100105597A TW100105597A TWI497039B TW I497039 B TWI497039 B TW I497039B TW 100105597 A TW100105597 A TW 100105597A TW 100105597 A TW100105597 A TW 100105597A TW I497039 B TWI497039 B TW I497039B
Authority
TW
Taiwan
Prior art keywords
light
hemispherical
light source
window
peripheral portion
Prior art date
Application number
TW100105597A
Other languages
English (en)
Chinese (zh)
Other versions
TW201135194A (en
Inventor
Yoshihiro Osawa
Kazuaki Ohkubo
Original Assignee
Otsuka Denshi Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otsuka Denshi Kk filed Critical Otsuka Denshi Kk
Publication of TW201135194A publication Critical patent/TW201135194A/zh
Application granted granted Critical
Publication of TWI497039B publication Critical patent/TWI497039B/zh

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254Spectrometers, other than colorimeters, making use of an integrating sphere
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/58Photometry, e.g. photographic exposure meter using luminescence generated by light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481Preset integrating sphere or cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW100105597A 2010-02-24 2011-02-21 含有半球型積分球的光學測量裝置 TWI497039B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010038377A JP5608919B2 (ja) 2010-02-24 2010-02-24 光学測定装置

Publications (2)

Publication Number Publication Date
TW201135194A TW201135194A (en) 2011-10-16
TWI497039B true TWI497039B (zh) 2015-08-21

Family

ID=44476250

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100105597A TWI497039B (zh) 2010-02-24 2011-02-21 含有半球型積分球的光學測量裝置

Country Status (5)

Country Link
US (1) US8422018B2 (enExample)
JP (1) JP5608919B2 (enExample)
KR (1) KR101825223B1 (enExample)
CN (1) CN102192832B (enExample)
TW (1) TWI497039B (enExample)

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CN102507144A (zh) * 2011-09-30 2012-06-20 上海理工大学 紫外传感增强膜变频效率的测试方法
WO2013054379A1 (en) * 2011-10-13 2013-04-18 Otsuka Electronics Co., Ltd. Optical measurement system, optical measurement method, and mirror plate for optical measurement system
JP5944719B2 (ja) * 2012-04-04 2016-07-05 大塚電子株式会社 配光特性測定装置および配光特性測定方法
KR101411428B1 (ko) * 2012-07-12 2014-06-24 한국과학기술원 집광식 휴대용 형광 검출 시스템
JP5479543B2 (ja) * 2012-07-19 2014-04-23 大塚電子株式会社 光学特性測定装置
TWI502173B (zh) * 2012-08-28 2015-10-01 Mpi Corp 光電零組件檢測設備
JP6357153B2 (ja) * 2012-09-10 2018-07-11 ブルーライト アナリティックス インコーポレイテッド 光を測定するデバイス及び方法
CN104006877A (zh) * 2013-02-27 2014-08-27 中国计量学院 一种利用半积分球测量长尺寸日光灯光通量的方法及装置
TW201333499A (zh) * 2013-04-16 2013-08-16 Hauman Technologies Corp 待測發光元件之光檢測裝置及其方法
CN103411885A (zh) * 2013-07-18 2013-11-27 江苏大学 一种多光谱成像系统的漫反射照明装置
KR102242460B1 (ko) * 2013-09-19 2021-04-21 로레알 표면의 색상 및 스펙트럼의 측정 및 범주화를 위한 시스템 및 방법
JP6613063B2 (ja) * 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
CN106090700B (zh) * 2016-06-06 2017-09-19 北京理工大学 超大张角多光谱朗伯面照明光源
JP7196924B2 (ja) * 2018-09-21 2022-12-27 コニカミノルタ株式会社 反射特性測定装置及び該方法
JP6492220B1 (ja) * 2018-09-26 2019-03-27 大塚電子株式会社 測定システムおよび測定方法
CN110595613B (zh) * 2019-10-13 2024-05-03 云南师范大学 一种积分球进光口置换装置及其积分球
US20220105227A1 (en) * 2020-10-02 2022-04-07 Dynamis Energy, Llc Dual chamber ultra-violet led device for use with face masks to disinfect end-user's inhaled and exhaled air
CN114354565A (zh) * 2022-01-26 2022-04-15 厦门行者科创科技有限公司 一种半积分球测样系统
CN115077875A (zh) * 2022-07-21 2022-09-20 厦门行者科创科技有限公司 一种积分半球装置及其应用
DE102022127793B3 (de) 2022-10-20 2023-09-21 Hochschule Reutlingen, Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zur Spektroskopie einer Probe

Citations (7)

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US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
US5803592A (en) * 1996-11-22 1998-09-08 Austin Air Systems Limited Light source
JP2003215041A (ja) * 2002-01-24 2003-07-30 National Institute Of Advanced Industrial & Technology 固体試料の絶対蛍光量子効率測定方法及び装置
US20050156103A1 (en) * 2003-06-23 2005-07-21 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
JP2008292497A (ja) * 2008-07-04 2008-12-04 Panasonic Corp 光学測定装置
EP2053370A1 (en) * 2007-10-25 2009-04-29 Otsuka Electronics Co., Ltd. Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the same
TW201028672A (en) * 2009-01-20 2010-08-01 Otsuka Denshi Kk Quantum efficiency measurement apparatus and quantum efficiency measurement method

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JP3246320B2 (ja) * 1996-03-27 2002-01-15 松下電器産業株式会社 配光特性測定装置と配光特性測定方法
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CN2658729Y (zh) * 2003-03-26 2004-11-24 中国科学院长春光学精密机械与物理研究所 一种吸收率测量装置
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Patent Citations (8)

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US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
US5803592A (en) * 1996-11-22 1998-09-08 Austin Air Systems Limited Light source
JP2003215041A (ja) * 2002-01-24 2003-07-30 National Institute Of Advanced Industrial & Technology 固体試料の絶対蛍光量子効率測定方法及び装置
US20050156103A1 (en) * 2003-06-23 2005-07-21 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
US7145125B2 (en) * 2003-06-23 2006-12-05 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
EP2053370A1 (en) * 2007-10-25 2009-04-29 Otsuka Electronics Co., Ltd. Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the same
JP2008292497A (ja) * 2008-07-04 2008-12-04 Panasonic Corp 光学測定装置
TW201028672A (en) * 2009-01-20 2010-08-01 Otsuka Denshi Kk Quantum efficiency measurement apparatus and quantum efficiency measurement method

Also Published As

Publication number Publication date
CN102192832B (zh) 2014-12-17
US8422018B2 (en) 2013-04-16
KR20110097677A (ko) 2011-08-31
JP2011174785A (ja) 2011-09-08
CN102192832A (zh) 2011-09-21
TW201135194A (en) 2011-10-16
US20110205541A1 (en) 2011-08-25
JP5608919B2 (ja) 2014-10-22
KR101825223B1 (ko) 2018-02-02

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