JP5608919B2 - 光学測定装置 - Google Patents

光学測定装置 Download PDF

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Publication number
JP5608919B2
JP5608919B2 JP2010038377A JP2010038377A JP5608919B2 JP 5608919 B2 JP5608919 B2 JP 5608919B2 JP 2010038377 A JP2010038377 A JP 2010038377A JP 2010038377 A JP2010038377 A JP 2010038377A JP 5608919 B2 JP5608919 B2 JP 5608919B2
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JP
Japan
Prior art keywords
light
hemispherical
window
light source
peripheral portion
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Application number
JP2010038377A
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English (en)
Japanese (ja)
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JP2011174785A5 (enExample
JP2011174785A (ja
Inventor
祥宏 大澤
祥宏 大澤
大久保　和明
和明 大久保
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Otsuka Electronics Co Ltd
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Otsuka Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Otsuka Electronics Co Ltd filed Critical Otsuka Electronics Co Ltd
Priority to JP2010038377A priority Critical patent/JP5608919B2/ja
Priority to US13/029,067 priority patent/US8422018B2/en
Priority to TW100105597A priority patent/TWI497039B/zh
Priority to KR1020110015876A priority patent/KR101825223B1/ko
Priority to CN201110043621.4A priority patent/CN102192832B/zh
Publication of JP2011174785A publication Critical patent/JP2011174785A/ja
Publication of JP2011174785A5 publication Critical patent/JP2011174785A5/ja
Application granted granted Critical
Publication of JP5608919B2 publication Critical patent/JP5608919B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/58—Photometry, e.g. photographic exposure meter using luminescence generated by light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481—Preset integrating sphere or cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2010038377A 2010-02-24 2010-02-24 光学測定装置 Active JP5608919B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010038377A JP5608919B2 (ja) 2010-02-24 2010-02-24 光学測定装置
US13/029,067 US8422018B2 (en) 2010-02-24 2011-02-16 Optical measurement apparatus including hemispherical optical integrator
TW100105597A TWI497039B (zh) 2010-02-24 2011-02-21 含有半球型積分球的光學測量裝置
KR1020110015876A KR101825223B1 (ko) 2010-02-24 2011-02-23 반구형의 적분구를 포함하는 광학 측정 장치
CN201110043621.4A CN102192832B (zh) 2010-02-24 2011-02-23 包括半球型的积分球的光学测量装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010038377A JP5608919B2 (ja) 2010-02-24 2010-02-24 光学測定装置

Publications (3)

Publication Number Publication Date
JP2011174785A JP2011174785A (ja) 2011-09-08
JP2011174785A5 JP2011174785A5 (enExample) 2013-03-14
JP5608919B2 true JP5608919B2 (ja) 2014-10-22

Family

ID=44476250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010038377A Active JP5608919B2 (ja) 2010-02-24 2010-02-24 光学測定装置

Country Status (5)

Country Link
US (1) US8422018B2 (enExample)
JP (1) JP5608919B2 (enExample)
KR (1) KR101825223B1 (enExample)
CN (1) CN102192832B (enExample)
TW (1) TWI497039B (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507144A (zh) * 2011-09-30 2012-06-20 上海理工大学 紫外传感增强膜变频效率的测试方法
WO2013054379A1 (en) * 2011-10-13 2013-04-18 Otsuka Electronics Co., Ltd. Optical measurement system, optical measurement method, and mirror plate for optical measurement system
JP5944719B2 (ja) * 2012-04-04 2016-07-05 大塚電子株式会社 配光特性測定装置および配光特性測定方法
KR101411428B1 (ko) * 2012-07-12 2014-06-24 한국과학기술원 집광식 휴대용 형광 검출 시스템
JP5479543B2 (ja) * 2012-07-19 2014-04-23 大塚電子株式会社 光学特性測定装置
TWI502173B (zh) * 2012-08-28 2015-10-01 Mpi Corp 光電零組件檢測設備
JP6357153B2 (ja) * 2012-09-10 2018-07-11 ブルーライト アナリティックス インコーポレイテッド 光を測定するデバイス及び方法
CN104006877A (zh) * 2013-02-27 2014-08-27 中国计量学院 一种利用半积分球测量长尺寸日光灯光通量的方法及装置
TW201333499A (zh) * 2013-04-16 2013-08-16 Hauman Technologies Corp 待測發光元件之光檢測裝置及其方法
CN103411885A (zh) * 2013-07-18 2013-11-27 江苏大学 一种多光谱成像系统的漫反射照明装置
KR102242460B1 (ko) * 2013-09-19 2021-04-21 로레알 표면의 색상 및 스펙트럼의 측정 및 범주화를 위한 시스템 및 방법
JP6613063B2 (ja) * 2015-07-07 2019-11-27 大塚電子株式会社 光学特性測定システム
CN106090700B (zh) * 2016-06-06 2017-09-19 北京理工大学 超大张角多光谱朗伯面照明光源
JP7196924B2 (ja) * 2018-09-21 2022-12-27 コニカミノルタ株式会社 反射特性測定装置及び該方法
JP6492220B1 (ja) * 2018-09-26 2019-03-27 大塚電子株式会社 測定システムおよび測定方法
CN110595613B (zh) * 2019-10-13 2024-05-03 云南师范大学 一种积分球进光口置换装置及其积分球
US20220105227A1 (en) * 2020-10-02 2022-04-07 Dynamis Energy, Llc Dual chamber ultra-violet led device for use with face masks to disinfect end-user's inhaled and exhaled air
CN114354565A (zh) * 2022-01-26 2022-04-15 厦门行者科创科技有限公司 一种半积分球测样系统
CN115077875A (zh) * 2022-07-21 2022-09-20 厦门行者科创科技有限公司 一种积分半球装置及其应用
DE102022127793B3 (de) 2022-10-20 2023-09-21 Hochschule Reutlingen, Körperschaft des öffentlichen Rechts Verfahren und Vorrichtung zur Spektroskopie einer Probe

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JP3117565B2 (ja) 1992-11-27 2000-12-18 松下電器産業株式会社 光束計
US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
JP3246320B2 (ja) * 1996-03-27 2002-01-15 松下電器産業株式会社 配光特性測定装置と配光特性測定方法
US5803592A (en) * 1996-11-22 1998-09-08 Austin Air Systems Limited Light source
JP3266046B2 (ja) 1997-04-21 2002-03-18 松下電器産業株式会社 蛍光体の量子効率測定装置
JP3682528B2 (ja) * 2002-01-24 2005-08-10 独立行政法人産業技術総合研究所 固体試料の絶対蛍光量子効率測定方法及び装置
CN2658729Y (zh) * 2003-03-26 2004-11-24 中国科学院长春光学精密机械与物理研究所 一种吸收率测量装置
US7145125B2 (en) * 2003-06-23 2006-12-05 Advanced Optical Technologies, Llc Integrating chamber cone light using LED sources
US8102531B2 (en) * 2006-12-15 2012-01-24 Inlight Solutions, Inc. Illumination source and non-invasive tissue sampling system
JP4452737B2 (ja) * 2007-10-25 2010-04-21 大塚電子株式会社 光束計および測定方法
US7980728B2 (en) * 2008-05-27 2011-07-19 Abl Ip Holding Llc Solid state lighting using light transmissive solid in or forming optical integrating volume
JP2008292497A (ja) * 2008-07-04 2008-12-04 Panasonic Corp 光学測定装置
CN101932926B (zh) * 2009-01-20 2013-07-24 大塚电子株式会社 量子效率测量装置以及量子效率测量方法

Also Published As

Publication number Publication date
CN102192832B (zh) 2014-12-17
US8422018B2 (en) 2013-04-16
KR20110097677A (ko) 2011-08-31
JP2011174785A (ja) 2011-09-08
CN102192832A (zh) 2011-09-21
TW201135194A (en) 2011-10-16
US20110205541A1 (en) 2011-08-25
TWI497039B (zh) 2015-08-21
KR101825223B1 (ko) 2018-02-02

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