JP2011174785A5 - - Google Patents
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- JP2011174785A5 JP2011174785A5 JP2010038377A JP2010038377A JP2011174785A5 JP 2011174785 A5 JP2011174785 A5 JP 2011174785A5 JP 2010038377 A JP2010038377 A JP 2010038377A JP 2010038377 A JP2010038377 A JP 2010038377A JP 2011174785 A5 JP2011174785 A5 JP 2011174785A5
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Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010038377A JP5608919B2 (ja) | 2010-02-24 | 2010-02-24 | 光学測定装置 |
| US13/029,067 US8422018B2 (en) | 2010-02-24 | 2011-02-16 | Optical measurement apparatus including hemispherical optical integrator |
| TW100105597A TWI497039B (zh) | 2010-02-24 | 2011-02-21 | 含有半球型積分球的光學測量裝置 |
| KR1020110015876A KR101825223B1 (ko) | 2010-02-24 | 2011-02-23 | 반구형의 적분구를 포함하는 광학 측정 장치 |
| CN201110043621.4A CN102192832B (zh) | 2010-02-24 | 2011-02-23 | 包括半球型的积分球的光学测量装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010038377A JP5608919B2 (ja) | 2010-02-24 | 2010-02-24 | 光学測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011174785A JP2011174785A (ja) | 2011-09-08 |
| JP2011174785A5 true JP2011174785A5 (enExample) | 2013-03-14 |
| JP5608919B2 JP5608919B2 (ja) | 2014-10-22 |
Family
ID=44476250
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010038377A Active JP5608919B2 (ja) | 2010-02-24 | 2010-02-24 | 光学測定装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8422018B2 (enExample) |
| JP (1) | JP5608919B2 (enExample) |
| KR (1) | KR101825223B1 (enExample) |
| CN (1) | CN102192832B (enExample) |
| TW (1) | TWI497039B (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102507144A (zh) * | 2011-09-30 | 2012-06-20 | 上海理工大学 | 紫外传感增强膜变频效率的测试方法 |
| WO2013054379A1 (en) * | 2011-10-13 | 2013-04-18 | Otsuka Electronics Co., Ltd. | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
| JP5944719B2 (ja) * | 2012-04-04 | 2016-07-05 | 大塚電子株式会社 | 配光特性測定装置および配光特性測定方法 |
| KR101411428B1 (ko) * | 2012-07-12 | 2014-06-24 | 한국과학기술원 | 집광식 휴대용 형광 검출 시스템 |
| JP5479543B2 (ja) * | 2012-07-19 | 2014-04-23 | 大塚電子株式会社 | 光学特性測定装置 |
| TWI502173B (zh) * | 2012-08-28 | 2015-10-01 | Mpi Corp | 光電零組件檢測設備 |
| JP6357153B2 (ja) * | 2012-09-10 | 2018-07-11 | ブルーライト アナリティックス インコーポレイテッド | 光を測定するデバイス及び方法 |
| CN104006877A (zh) * | 2013-02-27 | 2014-08-27 | 中国计量学院 | 一种利用半积分球测量长尺寸日光灯光通量的方法及装置 |
| TW201333499A (zh) * | 2013-04-16 | 2013-08-16 | Hauman Technologies Corp | 待測發光元件之光檢測裝置及其方法 |
| CN103411885A (zh) * | 2013-07-18 | 2013-11-27 | 江苏大学 | 一种多光谱成像系统的漫反射照明装置 |
| KR102242460B1 (ko) * | 2013-09-19 | 2021-04-21 | 로레알 | 표면의 색상 및 스펙트럼의 측정 및 범주화를 위한 시스템 및 방법 |
| JP6613063B2 (ja) * | 2015-07-07 | 2019-11-27 | 大塚電子株式会社 | 光学特性測定システム |
| CN106090700B (zh) * | 2016-06-06 | 2017-09-19 | 北京理工大学 | 超大张角多光谱朗伯面照明光源 |
| JP7196924B2 (ja) * | 2018-09-21 | 2022-12-27 | コニカミノルタ株式会社 | 反射特性測定装置及び該方法 |
| JP6492220B1 (ja) * | 2018-09-26 | 2019-03-27 | 大塚電子株式会社 | 測定システムおよび測定方法 |
| CN110595613B (zh) * | 2019-10-13 | 2024-05-03 | 云南师范大学 | 一种积分球进光口置换装置及其积分球 |
| US20220105227A1 (en) * | 2020-10-02 | 2022-04-07 | Dynamis Energy, Llc | Dual chamber ultra-violet led device for use with face masks to disinfect end-user's inhaled and exhaled air |
| CN114354565A (zh) * | 2022-01-26 | 2022-04-15 | 厦门行者科创科技有限公司 | 一种半积分球测样系统 |
| CN115077875A (zh) * | 2022-07-21 | 2022-09-20 | 厦门行者科创科技有限公司 | 一种积分半球装置及其应用 |
| DE102022127793B3 (de) | 2022-10-20 | 2023-09-21 | Hochschule Reutlingen, Körperschaft des öffentlichen Rechts | Verfahren und Vorrichtung zur Spektroskopie einer Probe |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3117565B2 (ja) | 1992-11-27 | 2000-12-18 | 松下電器産業株式会社 | 光束計 |
| US5659397A (en) * | 1995-06-08 | 1997-08-19 | Az Technology | Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object |
| JP3246320B2 (ja) * | 1996-03-27 | 2002-01-15 | 松下電器産業株式会社 | 配光特性測定装置と配光特性測定方法 |
| US5803592A (en) * | 1996-11-22 | 1998-09-08 | Austin Air Systems Limited | Light source |
| JP3266046B2 (ja) | 1997-04-21 | 2002-03-18 | 松下電器産業株式会社 | 蛍光体の量子効率測定装置 |
| JP3682528B2 (ja) * | 2002-01-24 | 2005-08-10 | 独立行政法人産業技術総合研究所 | 固体試料の絶対蛍光量子効率測定方法及び装置 |
| CN2658729Y (zh) * | 2003-03-26 | 2004-11-24 | 中国科学院长春光学精密机械与物理研究所 | 一种吸收率测量装置 |
| US7145125B2 (en) * | 2003-06-23 | 2006-12-05 | Advanced Optical Technologies, Llc | Integrating chamber cone light using LED sources |
| US8102531B2 (en) * | 2006-12-15 | 2012-01-24 | Inlight Solutions, Inc. | Illumination source and non-invasive tissue sampling system |
| JP4452737B2 (ja) * | 2007-10-25 | 2010-04-21 | 大塚電子株式会社 | 光束計および測定方法 |
| US7980728B2 (en) * | 2008-05-27 | 2011-07-19 | Abl Ip Holding Llc | Solid state lighting using light transmissive solid in or forming optical integrating volume |
| JP2008292497A (ja) * | 2008-07-04 | 2008-12-04 | Panasonic Corp | 光学測定装置 |
| CN101932926B (zh) * | 2009-01-20 | 2013-07-24 | 大塚电子株式会社 | 量子效率测量装置以及量子效率测量方法 |
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2010
- 2010-02-24 JP JP2010038377A patent/JP5608919B2/ja active Active
-
2011
- 2011-02-16 US US13/029,067 patent/US8422018B2/en active Active
- 2011-02-21 TW TW100105597A patent/TWI497039B/zh active
- 2011-02-23 KR KR1020110015876A patent/KR101825223B1/ko active Active
- 2011-02-23 CN CN201110043621.4A patent/CN102192832B/zh active Active