CN102004157B - 分析装置以及分析方法 - Google Patents

分析装置以及分析方法 Download PDF

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Publication number
CN102004157B
CN102004157B CN201010254418.7A CN201010254418A CN102004157B CN 102004157 B CN102004157 B CN 102004157B CN 201010254418 A CN201010254418 A CN 201010254418A CN 102004157 B CN102004157 B CN 102004157B
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unit
sample
measurement
abnormality
flow path
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Chinese (zh)
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CN102004157A (zh
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水本徹
立谷洋大
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Sysmex Corp
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Sysmex Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00603—Reinspection of samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1004—Cleaning sample transfer devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G01N15/1459—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G01N2035/00653—Quality control of instruments statistical methods comparing labs or apparatuses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0412—Block or rack elements with a single row of samples
    • G01N2035/0415—Block or rack elements with a single row of samples moving in two dimensions in a horizontal plane

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  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201010254418.7A 2009-08-28 2010-08-12 分析装置以及分析方法 Active CN102004157B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009-199054 2009-08-28
JP2009199054A JP5513040B2 (ja) 2009-08-28 2009-08-28 自動分析装置

Publications (2)

Publication Number Publication Date
CN102004157A CN102004157A (zh) 2011-04-06
CN102004157B true CN102004157B (zh) 2014-03-05

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Family Applications (1)

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CN201010254418.7A Active CN102004157B (zh) 2009-08-28 2010-08-12 分析装置以及分析方法

Country Status (4)

Country Link
US (1) US9529007B2 (enExample)
EP (1) EP2293081B1 (enExample)
JP (1) JP5513040B2 (enExample)
CN (1) CN102004157B (enExample)

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JP3371424B2 (ja) 1990-10-26 2003-01-27 ヤマハ株式会社 共鳴音付加装置
JP5513259B2 (ja) * 2010-05-27 2014-06-04 シスメックス株式会社 検体処理装置およびラック搬送方法
JP5792508B2 (ja) * 2011-05-02 2015-10-14 シスメックス株式会社 検体処理装置
CN103018470B (zh) * 2011-09-27 2015-02-04 希森美康株式会社 样本分析装置
JP5830330B2 (ja) * 2011-09-27 2015-12-09 シスメックス株式会社 検体分析装置
JP2013083452A (ja) * 2011-10-06 2013-05-09 Hitachi High-Technologies Corp 自動分析装置
EP2818872B1 (en) * 2012-02-22 2020-04-22 Hitachi High-Technologies Corporation Automatic analysis device
JP6025397B2 (ja) * 2012-05-22 2016-11-16 株式会社日立ハイテクノロジーズ 自動分析装置
JP5948173B2 (ja) * 2012-07-20 2016-07-06 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法
JP6054758B2 (ja) * 2013-01-31 2016-12-27 シスメックス株式会社 免疫測定方法および免疫測定装置
CN106170687B (zh) * 2014-04-17 2019-10-15 深圳迈瑞生物医疗电子股份有限公司 粒子分析仪及其分析操作结果回退方法和装置
JP2015227805A (ja) * 2014-05-30 2015-12-17 アズビル株式会社 液中粒子検出装置及び液中粒子の検出方法
JP6694868B2 (ja) * 2015-03-02 2020-05-20 株式会社日立ハイテク 自動分析装置
JP6139603B2 (ja) 2015-06-30 2017-05-31 シスメックス株式会社 塗抹標本作製装置、血液検体処理システム、および、塗抹標本作製装置における血液処理部の洗浄方法
JP6710512B2 (ja) * 2015-09-14 2020-06-17 シスメックス株式会社 血液分析装置、血液分析方法及びコンピュータプログラム
CN108957018A (zh) * 2018-05-19 2018-12-07 贾晓轻 一种自动生化分析仪
CN108802414B (zh) * 2018-06-29 2022-05-20 迈克医疗电子有限公司 掉杯阀的判定方法和装置、反应杯添加的控制方法和装置
JP2020051800A (ja) * 2018-09-25 2020-04-02 株式会社日立ハイテクノロジーズ 自動分析装置
CN109807148B (zh) * 2018-12-13 2020-09-22 迈克医疗电子有限公司 样本分析仪清洗方法、装置、设备及计算机存储介质
US20230375581A1 (en) * 2020-09-30 2023-11-23 Hitachi High-Tech Corporation Data processing device and automatic analyzer
WO2023153073A1 (ja) * 2022-02-14 2023-08-17 株式会社日立ハイテク 部品異常検知システム、自動分析装置、及び部品異常検知方法

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CN101135692A (zh) * 2006-08-31 2008-03-05 株式会社日立高新技术 自动分析装置
EP2293082A2 (en) * 2009-08-31 2011-03-09 Sysmex Corporation Sample processing system, method for saving electricity consumed by sample processing system, and non-transitory storage medium

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CN1613014A (zh) * 2002-06-12 2005-05-04 株式会社东芝 自动分析器、测量装置、及控制测量的方法
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Also Published As

Publication number Publication date
US20110054807A1 (en) 2011-03-03
US9529007B2 (en) 2016-12-27
EP2293081A3 (en) 2018-01-17
EP2293081B1 (en) 2020-10-28
JP2011047911A (ja) 2011-03-10
JP5513040B2 (ja) 2014-06-04
EP2293081A2 (en) 2011-03-09
CN102004157A (zh) 2011-04-06

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