CN101896828B - 薄膜磁通量闸门传感器 - Google Patents
薄膜磁通量闸门传感器 Download PDFInfo
- Publication number
- CN101896828B CN101896828B CN200880120351.9A CN200880120351A CN101896828B CN 101896828 B CN101896828 B CN 101896828B CN 200880120351 A CN200880120351 A CN 200880120351A CN 101896828 B CN101896828 B CN 101896828B
- Authority
- CN
- China
- Prior art keywords
- layer
- section
- magnetic material
- current conductor
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/04—Measuring direction or magnitude of magnetic fields or magnetic flux using the flux-gate principle
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/183—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core
- G01R15/185—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core with compensation or feedback windings or interacting coils, e.g. 0-flux sensors
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP07024346A EP2071346A1 (en) | 2007-12-14 | 2007-12-14 | Thin film fluxgate sensor |
| EP07024346.4 | 2007-12-14 | ||
| PCT/IB2008/055270 WO2009077959A1 (en) | 2007-12-14 | 2008-12-12 | Thin film fluxgate sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101896828A CN101896828A (zh) | 2010-11-24 |
| CN101896828B true CN101896828B (zh) | 2014-12-31 |
Family
ID=39402663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200880120351.9A Active CN101896828B (zh) | 2007-12-14 | 2008-12-12 | 薄膜磁通量闸门传感器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8339133B2 (enExample) |
| EP (2) | EP2071346A1 (enExample) |
| JP (1) | JP5444245B2 (enExample) |
| CN (1) | CN101896828B (enExample) |
| WO (1) | WO2009077959A1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10165276B2 (en) | 2010-09-30 | 2018-12-25 | Texas Instruments Incorporated | Method and apparatus for frame coding in vertical raster scan order for HEVC |
| US9176203B2 (en) | 2013-02-05 | 2015-11-03 | Texas Instruments Incorporated | Apparatus and method for in situ current measurement in a conductor |
| US9704637B2 (en) | 2013-07-15 | 2017-07-11 | Texas Instruments Incorporated | Method and apparatus for demagnetizing transformer cores in closed loop magnetic current sensors |
| US9291648B2 (en) | 2013-08-07 | 2016-03-22 | Texas Instruments Incorporated | Hybrid closed-loop/open-loop magnetic current sensor |
| US9229066B2 (en) | 2013-08-15 | 2016-01-05 | Texas Instruments Incorporated | Integrated fluxgate magnetic sensor and excitation circuitry |
| US9261571B2 (en) | 2013-08-15 | 2016-02-16 | Texas Instruments Incorporated | Fluxgate magnetic sensor readout apparatus |
| US11448711B2 (en) | 2015-03-25 | 2022-09-20 | Texas Instruments Incorporated | Simulation models for integrated fluxgate magnetic sensors and other magnetic circuit components |
| US11092656B2 (en) | 2015-05-12 | 2021-08-17 | Texas Instruments Incorporated | Fluxgate magnetic field detection method and circuit |
| CN109358301A (zh) * | 2018-09-29 | 2019-02-19 | 河南理工大学 | 一种基于缝纫式线芯结构的微型磁通门传感器 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1444237A (zh) * | 2002-03-13 | 2003-09-24 | 三星电机株式会社 | 集成在印刷电路板中的磁通闸门传感器及其制造方法 |
| CN1493887A (zh) * | 2002-09-18 | 2004-05-05 | 三星电子株式会社 | 具有磁通量闸门的测定装置及其控制方法 |
| EP1785738A2 (en) * | 2005-11-09 | 2007-05-16 | M.D. MICRO DETECTORS S.p.A. | Magnetic sensor, particularly for measuring the position and movement of an object, and related manufacturing method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3545074B2 (ja) * | 1994-12-27 | 2004-07-21 | 独立行政法人 科学技術振興機構 | 半導体基板に集積される磁気検出素子及び磁気検出モジュール |
| US6885074B2 (en) * | 2002-11-27 | 2005-04-26 | Freescale Semiconductor, Inc. | Cladded conductor for use in a magnetoelectronics device and method for fabricating the same |
| JP2004184232A (ja) * | 2002-12-03 | 2004-07-02 | Matsushita Electric Ind Co Ltd | 磁気検出素子及びその製造方法、並びにその磁気検出素子を用いた磁気検出装置及び方位センサ |
| EP1746430A1 (en) | 2005-07-22 | 2007-01-24 | Liaisons Electroniques-Mecaniques Lem S.A. | Orthogonal fluxgate magnetic field sensor |
-
2007
- 2007-12-14 EP EP07024346A patent/EP2071346A1/en not_active Withdrawn
-
2008
- 2008-12-12 US US12/747,784 patent/US8339133B2/en not_active Expired - Fee Related
- 2008-12-12 EP EP08862912A patent/EP2232286B1/en active Active
- 2008-12-12 WO PCT/IB2008/055270 patent/WO2009077959A1/en not_active Ceased
- 2008-12-12 CN CN200880120351.9A patent/CN101896828B/zh active Active
- 2008-12-12 JP JP2010537592A patent/JP5444245B2/ja active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1444237A (zh) * | 2002-03-13 | 2003-09-24 | 三星电机株式会社 | 集成在印刷电路板中的磁通闸门传感器及其制造方法 |
| CN1493887A (zh) * | 2002-09-18 | 2004-05-05 | 三星电子株式会社 | 具有磁通量闸门的测定装置及其控制方法 |
| EP1785738A2 (en) * | 2005-11-09 | 2007-05-16 | M.D. MICRO DETECTORS S.p.A. | Magnetic sensor, particularly for measuring the position and movement of an object, and related manufacturing method |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009077959A1 (en) | 2009-06-25 |
| US8339133B2 (en) | 2012-12-25 |
| EP2232286A1 (en) | 2010-09-29 |
| EP2071346A1 (en) | 2009-06-17 |
| EP2232286B1 (en) | 2013-02-13 |
| CN101896828A (zh) | 2010-11-24 |
| US20100271017A1 (en) | 2010-10-28 |
| JP2011506958A (ja) | 2011-03-03 |
| JP5444245B2 (ja) | 2014-03-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C53 | Correction of patent of invention or patent application | ||
| CB02 | Change of applicant information |
Address after: Fribourg Applicant after: Lem Liaisons Electron Mec Address before: The Swiss - Les outesi Applicant before: Liaisons Electromechanic S. A. |
|
| COR | Change of bibliographic data |
Free format text: CORRECT: APPLICANT; FROM: LIAISONS ELECTROMECHANIC S. A. TO: RAM INTELLECTUAL PROPERTY CO., LTD. |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20191231 Address after: 28 Linhe street, Linhe Industrial District, Shunyi District, Beijing Patentee after: Lyme Electronics (China) Co., Ltd. Address before: Fribourg Patentee before: Lem Liaisons Electron Mec |