CN101822530B - 光学相干层析摄影方法和光学相干层析摄影装置 - Google Patents

光学相干层析摄影方法和光学相干层析摄影装置 Download PDF

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CN101822530B
CN101822530B CN 201010123799 CN201010123799A CN101822530B CN 101822530 B CN101822530 B CN 101822530B CN 201010123799 CN201010123799 CN 201010123799 CN 201010123799 A CN201010123799 A CN 201010123799A CN 101822530 B CN101822530 B CN 101822530B
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measured zone
image
light
measurement
measured
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CN101822530A (zh
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末平信人
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0062—Arrangements for scanning
    • A61B5/0066—Optical coherence imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A61B5/0073—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by tomography, i.e. reconstruction of 3D images from 2D projections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02063—Active error reduction, i.e. varying with time by particular alignment of focus position, e.g. dynamic focussing in optical coherence tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G01B9/02085—Combining two or more images of different regions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Surgery (AREA)
  • Molecular Biology (AREA)
  • Pathology (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
CN 201010123799 2009-03-06 2010-03-02 光学相干层析摄影方法和光学相干层析摄影装置 Expired - Fee Related CN101822530B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009053793A JP5605998B2 (ja) 2009-03-06 2009-03-06 光干渉断層撮像方法および装置
JP2009-053793 2009-03-06

Publications (2)

Publication Number Publication Date
CN101822530A CN101822530A (zh) 2010-09-08
CN101822530B true CN101822530B (zh) 2013-11-06

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US (1) US8818063B2 (enExample)
EP (1) EP2251637B1 (enExample)
JP (1) JP5605998B2 (enExample)
CN (1) CN101822530B (enExample)

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JP5306075B2 (ja) * 2008-07-07 2013-10-02 キヤノン株式会社 光干渉断層法を用いる撮像装置及び撮像方法
JP5605998B2 (ja) 2009-03-06 2014-10-15 キヤノン株式会社 光干渉断層撮像方法および装置
JP5054072B2 (ja) * 2009-07-28 2012-10-24 キヤノン株式会社 光断層画像撮像装置
JP5036785B2 (ja) * 2009-10-23 2012-09-26 キヤノン株式会社 光断層画像生成方法及び光断層画像生成装置
JP4902721B2 (ja) * 2009-10-23 2012-03-21 キヤノン株式会社 光断層画像生成装置及び光断層画像生成方法
JP2011257160A (ja) 2010-06-04 2011-12-22 Canon Inc 光干渉断層撮像装置、光干渉断層撮像方法、およびプログラム
JP2012042348A (ja) 2010-08-19 2012-03-01 Canon Inc 断層画像表示装置およびその制御方法
JP5733960B2 (ja) 2010-11-26 2015-06-10 キヤノン株式会社 撮像方法および撮像装置
US8517537B2 (en) 2011-01-20 2013-08-27 Canon Kabushiki Kaisha Optical coherence tomographic imaging method and optical coherence tomographic imaging apparatus
EP2498048A1 (de) * 2011-03-10 2012-09-12 Agfa HealthCare N.V. System und Verfahren zur optischen Kohärenztomographie
US9161690B2 (en) 2011-03-10 2015-10-20 Canon Kabushiki Kaisha Ophthalmologic apparatus and control method of the same
JP5901124B2 (ja) 2011-03-10 2016-04-06 キヤノン株式会社 撮像装置およびその制御方法
TWI473037B (zh) * 2011-10-11 2015-02-11 Univ Nat Taiwan 鏡像消除方法
JP5210442B1 (ja) 2012-01-26 2013-06-12 キヤノン株式会社 光断層撮像装置および制御方法
JP6053138B2 (ja) * 2013-01-24 2016-12-27 株式会社日立エルジーデータストレージ 光断層観察装置及び光断層観察方法
EP2965039A4 (en) * 2013-03-07 2016-11-02 Univ Nanyang Tech OPTICAL IMAGING APPARATUS AND METHOD FOR SHAPING A SAMPLE
US8939582B1 (en) * 2013-07-12 2015-01-27 Kabushiki Kaisha Topcon Optical coherence tomography with dynamic focus sweeping and windowed averaging
CN107328740B (zh) * 2017-06-06 2019-10-18 中国科学院上海光学精密机械研究所 偏振频域光学相干层析成像光谱校准方法
JP7081288B2 (ja) 2018-05-07 2022-06-07 株式会社ニデック 眼科撮影装置及び眼科撮影プログラム
CN109691977B (zh) * 2018-12-29 2023-11-28 佛山科学技术学院 非共聚焦自适应光学成像系统
TWI749531B (zh) * 2020-04-22 2021-12-11 晉弘科技股份有限公司 掃描裝置以及光學同調斷層掃描系統
CN115219504B (zh) * 2022-07-15 2025-08-26 北京航空航天大学 微纳器件三维缺陷快速检测装置和方法

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Publication number Publication date
US20100226553A1 (en) 2010-09-09
JP2010210267A (ja) 2010-09-24
CN101822530A (zh) 2010-09-08
US8818063B2 (en) 2014-08-26
JP5605998B2 (ja) 2014-10-15
EP2251637B1 (en) 2015-09-23
EP2251637A1 (en) 2010-11-17

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