CN101772690B - 表面传感器偏移 - Google Patents

表面传感器偏移 Download PDF

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Publication number
CN101772690B
CN101772690B CN200880024540.6A CN200880024540A CN101772690B CN 101772690 B CN101772690 B CN 101772690B CN 200880024540 A CN200880024540 A CN 200880024540A CN 101772690 B CN101772690 B CN 101772690B
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China
Prior art keywords
probe
surface probe
skew
around
axis
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CN200880024540.6A
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Chinese (zh)
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CN101772690A (zh
Inventor
戴维·斯文·瓦利亚塞
琼·路易斯·格热西亚克
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Renishaw PLC
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Renishaw PLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
CN200880024540.6A 2007-07-13 2008-07-11 表面传感器偏移 Active CN101772690B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0713639.3 2007-07-13
GBGB0713639.3A GB0713639D0 (en) 2007-07-13 2007-07-13 Error correction
PCT/GB2008/002375 WO2009010721A1 (en) 2007-07-13 2008-07-11 Surface sensor offset

Publications (2)

Publication Number Publication Date
CN101772690A CN101772690A (zh) 2010-07-07
CN101772690B true CN101772690B (zh) 2014-08-20

Family

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Application Number Title Priority Date Filing Date
CN200880024540.6A Active CN101772690B (zh) 2007-07-13 2008-07-11 表面传感器偏移

Country Status (6)

Country Link
US (1) US8756973B2 (enExample)
EP (2) EP2167911B1 (enExample)
JP (2) JP5706158B2 (enExample)
CN (1) CN101772690B (enExample)
GB (1) GB0713639D0 (enExample)
WO (1) WO2009010721A1 (enExample)

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CN112518790A (zh) 2014-09-26 2021-03-19 泰瑞达公司 手爪和自动测试设备
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JP6585476B2 (ja) * 2015-11-17 2019-10-02 ローランドディー．ジー．株式会社 補正方法および補正装置
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CN114018497B (zh) * 2016-06-30 2024-03-26 株式会社开滋 阀用耐压检查装置和其检查方法、以及氢气检测单元
JP2018031754A (ja) * 2016-08-26 2018-03-01 株式会社ミツトヨ 三次元測定装置及び座標補正方法
JP6341962B2 (ja) * 2016-08-26 2018-06-13 株式会社ミツトヨ 三次元測定装置及び座標補正方法
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JP2019007762A (ja) * 2017-06-21 2019-01-17 中村留精密工業株式会社 タッチプローブを用いた計測方法
JP6344630B2 (ja) * 2017-07-12 2018-06-20 株式会社東京精密 三次元測定機を用いた円測定方法
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US11709045B1 (en) * 2022-02-19 2023-07-25 National Institute Of Metrology, China Surface texture probe and measurement apparatus with a vibrational membrane
CN116147564B (zh) * 2023-02-23 2023-09-12 泰微科技(珠海)有限公司 三维表面形貌测量方法及装置

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CN1882821A (zh) * 2003-11-13 2006-12-20 瑞尼斯豪公司 对具有铰接探头的坐标测量仪进行误差补偿的方法

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Also Published As

Publication number Publication date
JP5706158B2 (ja) 2015-04-22
EP2167911B1 (en) 2013-05-22
US20100132432A1 (en) 2010-06-03
EP2543958A1 (en) 2013-01-09
CN101772690A (zh) 2010-07-07
US8756973B2 (en) 2014-06-24
GB0713639D0 (en) 2007-08-22
WO2009010721A1 (en) 2009-01-22
JP2010533303A (ja) 2010-10-21
EP2167911A1 (en) 2010-03-31
JP2015127714A (ja) 2015-07-09
JP6013533B2 (ja) 2016-10-25

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