CN101626008A - 一种铜线键合ic芯片封装件的生产方法 - Google Patents
一种铜线键合ic芯片封装件的生产方法 Download PDFInfo
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Abstract
一种铜线键合IC芯片封装件的生产方法,在IC芯片的焊盘上设一金球,在金球上堆叠铜键合球,拱丝拉弧在引线框架内引脚上打一个铜焊点,使IC芯片的焊盘与引线框架引脚相连。塑封体覆盖IC芯片、焊盘上的金球、堆叠金球上的铜球、拱丝拉弧在引线框架内引脚上的铜焊点及引线框架部分引脚,构成电路的整体。本发明的生产方法包括晶圆减薄、划片、上芯、压焊、塑封、后固化、打印、冲切分离、检验、包装、入库。本发明结构简单合理,能避免产生弹坑、简单易行,而且焊点强度加强,铜焊线的拉力和焊点的剪切力要比直接打线的铜(金)键合生产方法高,而且内焊点不会脱焊,封装良率和测试良率均会提高,提高了可靠性。
Description
技术领域
本发明涉及电子信息自动化元器件制造技术领域,尤其涉及到一种IC芯片集成电路封装,具体说是一种铜线键合IC芯片封装件,本发明还包括该封装件的生产方法。
背景技术
虽然在20世纪80年代晚期和90年代早期,几乎所有半导体制造商都在开展铜线键合研制工作,但由于成品率的问题和铜线本身的一些局限性,他们都没能进入大批量IC制造业中。目前经过铜线键合工艺的优化和在铜线及支持设备上的重要改进,已在低档和简单线路设计的IC芯片封装中得以批量生产。但对于多引脚产品,由于IC芯片焊盘(PAD)下有较复杂的线路设计,铜线键合时产生的弹坑,会给产品带来致命损伤。为了防止铜线键合焊点产生弹坑,封装工艺不得不对IC芯片提出了较高的要求,IC芯片焊盘(PAD)下的钝化层既要厚,又要坚硬,IC芯片焊盘上的铝层厚度不得小于3μm。这样的要求给芯片制造增加了成本,在芯片制造成本与性价比激烈竞争的状况下,要让芯片制造商改进的可能性很小。正常铜线键合方法是先在IC芯片焊盘(PAD)上打一个铜键合球,然后拱丝拉弧,在引线框架内引脚上打一个月牙形焊点。由于铜线相对于金线较硬,铜键合焊点直接打在IC芯片焊盘(PAD)上容易产生弹坑,影响产品的质量和可靠性。
发明内容
本发明就是为了解决铜线键合在IC芯片焊盘上产生弹坑问题,存在质量和可靠性隐患,并制约了铜线键合封装向多引脚和高端产品推广的进程的技术问题,从而提供一种能避免产生弹坑、简单易行的一种铜线键合IC芯片封装件。
本发明采用下述技术手段解决其技术问题:
一种铜线键合IC芯片封装件,包括引线框架载体、引线框架内引脚、引线框架外引脚、塑封体、粘片胶、IC芯片。所述IC芯片的焊盘上设一金球,在金球上堆叠铜键合球,拱丝拉弧在引线框架内引脚上打一个铜焊点,使IC芯片的焊盘与引线框架引脚相连。所述塑封体覆盖IC芯片、焊盘上的金球、堆叠金球上的铜球、拱丝拉弧在引线框架内引脚上的铜焊点及引线框架部分引脚,构成电路的整体。
所述铜线键合IC芯片封装件的生产方法,包括晶圆减薄、划片、上芯、压焊、塑封、后固化、打印、冲切分离、检验、包装、入库工艺,其中的压焊操作按下述工艺步骤进行:
a、先在每个需要焊线的IC芯片的焊盘上预植一个金球;
b、在每个IC芯片焊盘上已预植的金球上,堆叠一个铜键合球;
c、在金球上堆叠铜键合球后,向上拱丝拉弧到引线框架内引脚上打一个月牙形焊点。
本发明的产品结构简单合理,由于铜键合球不是直接打在芯片焊盘上,而是打在金球上,不仅不会产生弹坑,而且焊点强度加强,铜焊线的的拉力和焊点的剪切力要比直接打线的铜(金)键合生产方法高,而且内焊点不会脱焊,封装良率和测试良率均会提高,提高了可靠性。本发明的方法简单易行,现行设备完全可以满足工艺要求,不需要增加新的设备投资。既解决了铜线键合直接在IC芯片上焊盘上打线出现弹坑的难题,又可在多引脚封装中应用,还可以推广到其它高端封装,实现铜线代替金线键合,节约金线焊线成本更加明显,将产生良好的经济效益和社会效益。
附图说明
图1为现有铜线键合产品结构剖面示意图;
图2为本发明结构示意图;
图3为本发明金球上堆叠铜键合球示意图。
具体实施方式
下面结合附图对本发明做进一步详细叙述:
本发明包括引线框架载体1、引线框架内引脚6、塑封体10、粘片胶2、IC芯片3。所述引线框架载体上通过片胶2粘接IC芯片3,IC芯片3的焊盘4上先预植一个金球5,然后再在金球5上堆叠铜键合球7,拱丝拉弧8在引线框架内引脚6上打一个铜焊点9,使IC芯片3的焊盘4与引线框架内引脚6相连,构成电路的信号和电流通道。塑封料10覆盖了IC芯片3、焊盘4上的金球5、堆叠在金球5上的铜键合球7及拱丝拉弧8在引线框架内引脚6上打的铜焊点9及引线框架部分引脚,构成电路的整体,并对电路起到了保护和支撑作用。
本发明的生产方法的全线工艺流程如下:
晶圆减薄→划片→上芯→压焊→塑封→后固化→打印→冲切分离→检验→包装→入库。
其中的减薄、划片、上芯、塑封、后固化、切筋、电镀、打印、成形分离、包装与常规金线和铜线键合封装生产相同。
其中的压焊操作工艺流程如下:
植金球-叠球-拱丝打点。
1.植金球
在压焊台上将金线轴固定,穿好线后,将已粘IC芯片的框架自动传送到轨道上,预热后传送到压焊夹具上,在每个需要焊线的IC芯片3的焊盘4上植一个金球,打完金球的框架传送到收料夹;
2.叠球
在压焊台上将铜线轴固定,穿好线后,将已植金球的框架自动传送到轨道上,预热后传送到压焊夹具上,在每个IC芯片焊盘上已打金球上堆叠一个铜键合球;
3.拱丝打点
在每个IC芯片焊盘4上已打金球5上堆叠一个铜键合球7后,向上拱丝拉弧8到引线框架内引脚6上打一个月牙形焊点9。
实施例1
生产方法的全线工艺流程中的减薄、划片、上芯、塑封、后固化、切筋、电镀、打印、成形分离、包装与常规金线和铜线键合封装生产相同,其压焊操作工艺过程为
1.植金球
在压焊台上将金线轴固定,穿好线后,将已粘IC芯片的框架自动传送到轨道上,预热后传送到压焊夹具上,在每个需要焊线的IC芯片3的焊盘4上植一个金球,打完金球的框架传送到收料夹;
2.叠球
在压焊台上将铜线轴固定,穿好线后,将已植金球的框架自动传送到轨道上,预热后传送到压焊夹具上,在每个IC芯片焊盘上已打金球上堆叠一个铜键合球;
3.拱丝打点
在每个IC芯片焊盘4上已打金球5上堆叠一个铜键合球7后,向上拱丝拉弧8到引线框架内引脚6上打一个月牙形焊点9。
Claims (2)
1、一种铜线键合IC芯片封装件,包括引线框架载体、引线框架内引脚、引线框架外引脚、塑封体、粘片胶、IC芯片,其特征在于所述IC芯片(3)的焊盘(4)上设一金球(5),在金球(5)上堆叠铜键合球(7),拱丝拉弧(8)在引线框架内引脚(6)上打一个铜焊点(9),使IC芯片(3)的焊盘(4)与框架引脚(6)相连;所述塑封体(10)覆盖IC芯片(3)、焊盘(4)上的金球(5)、堆叠在金球(5)上的铜球(7)、拱丝拉弧(8)在引线框架内引脚(6)上的铜焊点(9)及引线框架部分引脚,构成电路的整体。
2、一种生产如权利要求1所述铜线键合IC芯片封装件的生产方法,包括晶圆减薄、划片、上芯、压焊、塑封、后固化、打印、冲切分离、检验、包装、入库工艺,其特征在于其中的压焊操作按下述工艺步骤进行:
a、植金球:先在每个需要焊线的IC芯片(3)的焊盘(4)上预植一个金球(5);
b、叠球:在每个IC芯片焊盘上已预植金球(5)上,堆叠一个铜键合球(7);
c、拱丝打点:在金球上堆叠铜键合球(7)后,向上拱丝拉弧(8)到引线框架内引脚(6)上打一个月牙形焊点(9)。
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