CN101390193B - 奈米结构微型化的方法 - Google Patents
奈米结构微型化的方法 Download PDFInfo
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- CN101390193B CN101390193B CN2006800500646A CN200680050064A CN101390193B CN 101390193 B CN101390193 B CN 101390193B CN 2006800500646 A CN2006800500646 A CN 2006800500646A CN 200680050064 A CN200680050064 A CN 200680050064A CN 101390193 B CN101390193 B CN 101390193B
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- 239000011148 porous material Substances 0.000 claims abstract description 85
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C99/00—Subject matter not provided for in other groups of this subclass
- B81C99/0075—Manufacture of substrate-free structures
- B81C99/0085—Manufacture of substrate-free structures using moulds and master templates, e.g. for hot-embossing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B1/00—Nanostructures formed by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/0405, H01L21/0445, H01L21/06, H01L21/16 and H01L21/18 with or without impurities, e.g. doping materials
- H01L21/44—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/38 - H01L21/428
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/122—Single quantum well structures
- H01L29/127—Quantum box structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66439—Unipolar field-effect transistors with a one- or zero-dimensional channel, e.g. quantum wire FET, in-plane gate transistor [IPG], single electron transistor [SET], striped channel transistor, Coulomb blockade transistor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Composite Materials (AREA)
- Materials Engineering (AREA)
- Cereal-Derived Products (AREA)
- Magnetic Record Carriers (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US75461405P | 2005-12-30 | 2005-12-30 | |
US60/754,614 | 2005-12-30 | ||
US11/645,526 US8318520B2 (en) | 2005-12-30 | 2006-12-27 | Method of microminiaturizing a nano-structure |
US11/645,526 | 2006-12-27 | ||
PCT/US2006/049394 WO2008002326A2 (en) | 2005-12-30 | 2006-12-28 | A method of microminiaturizing a nano-structure |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101390193A CN101390193A (zh) | 2009-03-18 |
CN101390193B true CN101390193B (zh) | 2011-03-16 |
Family
ID=38233271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800500646A Expired - Fee Related CN101390193B (zh) | 2005-12-30 | 2006-12-28 | 奈米结构微型化的方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8318520B2 (ko) |
EP (1) | EP1974369A4 (ko) |
JP (1) | JP5372520B2 (ko) |
KR (1) | KR20080083692A (ko) |
CN (1) | CN101390193B (ko) |
WO (1) | WO2008002326A2 (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100483613C (zh) * | 2005-02-24 | 2009-04-29 | 鸿富锦精密工业(深圳)有限公司 | 量子点制作方法 |
TWI307677B (en) * | 2006-07-18 | 2009-03-21 | Applied Res Lab | Method and device for fabricating nano-structure with patterned particle beam |
US8349546B2 (en) * | 2007-06-28 | 2013-01-08 | Ming-Nung Lin | Fabricating method of nano-ring structure by nano-lithography |
JP5345078B2 (ja) * | 2010-01-22 | 2013-11-20 | 公益財団法人神奈川科学技術アカデミー | 脂質二重膜、それを形成するために用いられる自己支持性フィルム及びそれを具備するマイクロ流路デバイス |
RU2495511C2 (ru) * | 2011-09-02 | 2013-10-10 | Федеральное государственное бюджетное учреждение " Петербургский институт ядерной физики им. Б.П. Константинова" | Способ получения массивов наноколец |
US9303310B2 (en) * | 2013-10-15 | 2016-04-05 | International Business Machines Corporation | Nanofluidic sensor comprising spatially separated functional sensing components |
US11174545B2 (en) | 2019-11-06 | 2021-11-16 | International Business Machines Corporation | Oblique deposition for quantum device fabrication |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6515339B2 (en) * | 2000-07-18 | 2003-02-04 | Lg Electronics Inc. | Method of horizontally growing carbon nanotubes and field effect transistor using the carbon nanotubes grown by the method |
CN1437715A (zh) * | 2000-04-18 | 2003-08-20 | 奥布杜卡特公司 | 衬底及与该结构的制造相关的工艺 |
CN1449510A (zh) * | 2000-08-31 | 2003-10-15 | 尤尼瑟驰有限公司 | 纳米电子电路的制造 |
US6656568B1 (en) * | 1999-05-28 | 2003-12-02 | The Regents Of The University Of Colorado | Ordered arrays of nanoclusters |
US6952055B2 (en) * | 1999-10-29 | 2005-10-04 | California Institute Of Technology | Intermediate structures in porous substrates in which electrical and optical microdevices are fabricated and intermediate structures formed by the same |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
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US3755704A (en) * | 1970-02-06 | 1973-08-28 | Stanford Research Inst | Field emission cathode structures and devices utilizing such structures |
US4599790A (en) * | 1985-01-30 | 1986-07-15 | Texas Instruments Incorporated | Process for forming a T-shaped gate structure |
US5225131A (en) * | 1989-12-07 | 1993-07-06 | Daikin Industries, Ltd. | Process for producing multilayer polytetrafluoroethylene porous membrane and semisintered polytetrafluoroethylene multilayer structure |
US5420067A (en) * | 1990-09-28 | 1995-05-30 | The United States Of America As Represented By The Secretary Of The Navy | Method of fabricatring sub-half-micron trenches and holes |
US5480843A (en) * | 1994-02-10 | 1996-01-02 | Samsung Display Devices Co., Ltd. | Method for making a field emission device |
US5529952A (en) * | 1994-09-20 | 1996-06-25 | Texas Instruments Incorporated | Method of fabricating lateral resonant tunneling structure |
US5621272A (en) * | 1995-05-30 | 1997-04-15 | Texas Instruments Incorporated | Field emission device with over-etched gate dielectric |
KR100339186B1 (ko) * | 1998-09-28 | 2002-05-31 | 포만 제프리 엘 | 기판상에서 패턴을 규정하는 장치 및 방법 |
JP2000173444A (ja) * | 1998-12-04 | 2000-06-23 | Agency Of Ind Science & Technol | 電界放出型冷陰極及びその製造方法 |
US6827979B2 (en) * | 1999-01-07 | 2004-12-07 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
US8206568B2 (en) * | 1999-06-22 | 2012-06-26 | President And Fellows Of Harvard College | Material deposition techniques for control of solid state aperture surface properties |
JP2001126609A (ja) * | 1999-10-26 | 2001-05-11 | Futaba Corp | 電子放出素子及び蛍光発光型表示器 |
CA2404296A1 (en) * | 2000-03-22 | 2001-09-27 | University Of Massachusetts | Nanocylinder arrays |
US6872645B2 (en) * | 2002-04-02 | 2005-03-29 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US7233101B2 (en) * | 2002-12-31 | 2007-06-19 | Samsung Electronics Co., Ltd. | Substrate-supported array having steerable nanowires elements use in electron emitting devices |
US6858521B2 (en) * | 2002-12-31 | 2005-02-22 | Samsung Electronics Co., Ltd. | Method for fabricating spaced-apart nanostructures |
US6770353B1 (en) * | 2003-01-13 | 2004-08-03 | Hewlett-Packard Development Company, L.P. | Co-deposited films with nano-columnar structures and formation process |
US20050066897A1 (en) * | 2003-09-29 | 2005-03-31 | Seagate Technology Llc | System, method and aperture for oblique deposition |
US7351607B2 (en) * | 2003-12-11 | 2008-04-01 | Georgia Tech Research Corporation | Large scale patterned growth of aligned one-dimensional nanostructures |
US7749784B2 (en) * | 2005-12-30 | 2010-07-06 | Ming-Nung Lin | Fabricating method of single electron transistor (SET) by employing nano-lithographical technology in the semiconductor process |
US7859036B2 (en) * | 2007-04-05 | 2010-12-28 | Micron Technology, Inc. | Memory devices having electrodes comprising nanowires, systems including same and methods of forming same |
US7659129B2 (en) * | 2007-06-29 | 2010-02-09 | Ming-Nung Lin | Fabricating method for quantum dot of active layer of LED by nano-lithography |
-
2006
- 2006-12-27 US US11/645,526 patent/US8318520B2/en not_active Expired - Fee Related
- 2006-12-28 KR KR1020087018766A patent/KR20080083692A/ko not_active Application Discontinuation
- 2006-12-28 EP EP06851505A patent/EP1974369A4/en not_active Withdrawn
- 2006-12-28 WO PCT/US2006/049394 patent/WO2008002326A2/en active Application Filing
- 2006-12-28 CN CN2006800500646A patent/CN101390193B/zh not_active Expired - Fee Related
- 2006-12-28 JP JP2008548713A patent/JP5372520B2/ja not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6656568B1 (en) * | 1999-05-28 | 2003-12-02 | The Regents Of The University Of Colorado | Ordered arrays of nanoclusters |
US6952055B2 (en) * | 1999-10-29 | 2005-10-04 | California Institute Of Technology | Intermediate structures in porous substrates in which electrical and optical microdevices are fabricated and intermediate structures formed by the same |
CN1437715A (zh) * | 2000-04-18 | 2003-08-20 | 奥布杜卡特公司 | 衬底及与该结构的制造相关的工艺 |
US6515339B2 (en) * | 2000-07-18 | 2003-02-04 | Lg Electronics Inc. | Method of horizontally growing carbon nanotubes and field effect transistor using the carbon nanotubes grown by the method |
CN1449510A (zh) * | 2000-08-31 | 2003-10-15 | 尤尼瑟驰有限公司 | 纳米电子电路的制造 |
Also Published As
Publication number | Publication date |
---|---|
EP1974369A2 (en) | 2008-10-01 |
US8318520B2 (en) | 2012-11-27 |
WO2008002326A3 (en) | 2008-05-15 |
CN101390193A (zh) | 2009-03-18 |
JP2009522785A (ja) | 2009-06-11 |
EP1974369A4 (en) | 2010-11-24 |
WO2008002326A2 (en) | 2008-01-03 |
KR20080083692A (ko) | 2008-09-18 |
US20070161238A1 (en) | 2007-07-12 |
JP5372520B2 (ja) | 2013-12-18 |
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