CN101369103A - 照明光学系、曝光装置、及器件制造方法 - Google Patents

照明光学系、曝光装置、及器件制造方法 Download PDF

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Publication number
CN101369103A
CN101369103A CNA2008101463842A CN200810146384A CN101369103A CN 101369103 A CN101369103 A CN 101369103A CN A2008101463842 A CNA2008101463842 A CN A2008101463842A CN 200810146384 A CN200810146384 A CN 200810146384A CN 101369103 A CN101369103 A CN 101369103A
Authority
CN
China
Prior art keywords
light
mentioned
optical system
polarized light
polarization element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2008101463842A
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English (en)
Chinese (zh)
Inventor
森坚一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN101369103A publication Critical patent/CN101369103A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
    • G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
    • G03F7/70966—Birefringence
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70191—Optical correction elements, filters or phase plates for controlling intensity, wavelength, polarisation, phase or the like
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70566—Polarisation control
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D9/00—Counting coins; Handling of coins not provided for in the other groups of this subclass

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Microscoopes, Condenser (AREA)
  • Polarising Elements (AREA)
CNA2008101463842A 2004-04-23 2005-04-12 照明光学系、曝光装置、及器件制造方法 Pending CN101369103A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004128602 2004-04-23
JP2004128602A JP4776891B2 (ja) 2004-04-23 2004-04-23 照明光学系、露光装置、及びデバイス製造方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2005100650138A Division CN1690861B (zh) 2004-04-23 2005-04-12 照明光学系、曝光装置、及器件制造方法

Publications (1)

Publication Number Publication Date
CN101369103A true CN101369103A (zh) 2009-02-18

Family

ID=34940974

Family Applications (2)

Application Number Title Priority Date Filing Date
CNA2008101463842A Pending CN101369103A (zh) 2004-04-23 2005-04-12 照明光学系、曝光装置、及器件制造方法
CN2005100650138A Expired - Fee Related CN1690861B (zh) 2004-04-23 2005-04-12 照明光学系、曝光装置、及器件制造方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN2005100650138A Expired - Fee Related CN1690861B (zh) 2004-04-23 2005-04-12 照明光学系、曝光装置、及器件制造方法

Country Status (5)

Country Link
US (1) US7206060B2 (enExample)
EP (2) EP1589379A3 (enExample)
JP (1) JP4776891B2 (enExample)
KR (1) KR100699955B1 (enExample)
CN (2) CN101369103A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110603695A (zh) * 2017-06-13 2019-12-20 极光先进雷射株式会社 激光装置和光学元件的制造方法

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KR101532824B1 (ko) 2003-04-09 2015-07-01 가부시키가이샤 니콘 노광 방법 및 장치, 그리고 디바이스 제조 방법
TWI609409B (zh) 2003-10-28 2017-12-21 尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造方法
TWI519819B (zh) 2003-11-20 2016-02-01 尼康股份有限公司 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法
US20070019179A1 (en) 2004-01-16 2007-01-25 Damian Fiolka Polarization-modulating optical element
US8279524B2 (en) 2004-01-16 2012-10-02 Carl Zeiss Smt Gmbh Polarization-modulating optical element
TWI395068B (zh) 2004-01-27 2013-05-01 尼康股份有限公司 光學系統、曝光裝置以及曝光方法
TWI609410B (zh) 2004-02-06 2017-12-21 尼康股份有限公司 光學照明裝置、曝光裝置、曝光方法以及元件製造方法
JP4776891B2 (ja) 2004-04-23 2011-09-21 キヤノン株式会社 照明光学系、露光装置、及びデバイス製造方法
JP2007220767A (ja) * 2006-02-15 2007-08-30 Canon Inc 露光装置及びデバイス製造方法
JP2007258575A (ja) * 2006-03-24 2007-10-04 Canon Inc 照明装置、当該照明装置を有する露光装置及びデバイス製造方法
JP4752695B2 (ja) * 2006-09-15 2011-08-17 ソニー株式会社 マスクパターン補正方法，マスクパターン補正装置およびそのプログラム
US7817250B2 (en) 2007-07-18 2010-10-19 Carl Zeiss Smt Ag Microlithographic projection exposure apparatus
DE102007043958B4 (de) 2007-09-14 2011-08-25 Carl Zeiss SMT GmbH, 73447 Beleuchtungseinrichtung einer mikrolithographischen Projektionsbelichtungsanlage
TW200938957A (en) * 2008-03-05 2009-09-16 Nanya Technology Corp Feedback system and feedback method for controlling power ratio of light source
JP5167032B2 (ja) 2008-08-27 2013-03-21 キヤノン株式会社 計算機ホログラム、露光装置及びデバイスの製造方法
JP2009065175A (ja) * 2008-10-02 2009-03-26 Canon Inc 照明光学系
JP5688672B2 (ja) * 2009-02-17 2015-03-25 株式会社ニコン 光伝送装置、照明光学系、露光装置、およびデバイス製造方法
JP5511882B2 (ja) * 2012-04-19 2014-06-04 ギガフォトン株式会社 極端紫外光源装置

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JP2884947B2 (ja) * 1992-10-01 1999-04-19 株式会社ニコン 投影露光装置、露光方法および半導体集積回路の製造方法
JP3322274B2 (ja) * 1992-10-29 2002-09-09 株式会社ニコン 投影露光方法及び投影露光装置
JP3189993B2 (ja) 1993-10-14 2001-07-16 日本電信電話株式会社 多地点間音声通信端末
EP1069600A4 (en) * 1998-03-24 2002-11-20 Nikon Corp ILLUMINATOR, EXPOSURE METHOD AND APPARATUS, METHOD FOR MANUFACTURING SAID DEVICE
JP3985346B2 (ja) * 1998-06-12 2007-10-03 株式会社ニコン 投影露光装置、投影露光装置の調整方法、及び投影露光方法
JP4065923B2 (ja) * 1998-09-29 2008-03-26 株式会社ニコン 照明装置及び該照明装置を備えた投影露光装置、該照明装置による投影露光方法、及び該投影露光装置の調整方法
KR20010088279A (ko) * 1999-01-06 2001-09-26 시마무라 테루오 투영광학계, 그 제조방법, 및 이를 사용한 투영노광장치
WO2000067303A1 (en) * 1999-04-28 2000-11-09 Nikon Corporation Exposure method and apparatus
US6410192B1 (en) * 1999-11-15 2002-06-25 Corning Incorporated Photolithography method, photolithography mask blanks, and method of making
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JP2003090978A (ja) * 2001-09-17 2003-03-28 Canon Inc 照明装置、露光装置及びデバイス製造方法
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JP4095376B2 (ja) * 2002-08-28 2008-06-04 キヤノン株式会社 露光装置及び方法、並びに、デバイス製造方法
JP4189724B2 (ja) 2002-09-09 2008-12-03 株式会社ニコン 露光装置および露光方法
JP2004128602A (ja) 2002-09-30 2004-04-22 Canon Inc 画像編集方法、画像編集装置、プログラム及び記録媒体
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JP4776891B2 (ja) 2004-04-23 2011-09-21 キヤノン株式会社 照明光学系、露光装置、及びデバイス製造方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110603695A (zh) * 2017-06-13 2019-12-20 极光先进雷射株式会社 激光装置和光学元件的制造方法
CN110603695B (zh) * 2017-06-13 2022-03-15 极光先进雷射株式会社 激光装置和光学元件的制造方法

Also Published As

Publication number Publication date
US20050237527A1 (en) 2005-10-27
KR20060047407A (ko) 2006-05-18
EP1589379A2 (en) 2005-10-26
KR100699955B1 (ko) 2007-03-27
EP2012183A8 (en) 2010-06-23
CN1690861A (zh) 2005-11-02
JP2005311187A (ja) 2005-11-04
CN1690861B (zh) 2011-11-23
EP2012183A2 (en) 2009-01-07
JP4776891B2 (ja) 2011-09-21
US7206060B2 (en) 2007-04-17
EP1589379A3 (en) 2008-04-09
EP2012183A3 (en) 2011-11-02

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Application publication date: 20090218