CN101266281B - 自动处理机 - Google Patents
自动处理机 Download PDFInfo
- Publication number
- CN101266281B CN101266281B CN200810083171XA CN200810083171A CN101266281B CN 101266281 B CN101266281 B CN 101266281B CN 200810083171X A CN200810083171X A CN 200810083171XA CN 200810083171 A CN200810083171 A CN 200810083171A CN 101266281 B CN101266281 B CN 101266281B
- Authority
- CN
- China
- Prior art keywords
- adhesive tape
- push plate
- component package
- automatic processor
- package adhesive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (3)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP062747/07 | 2007-03-13 | ||
JP2007062747A JP2008224399A (ja) | 2007-03-13 | 2007-03-13 | オートハンドラ |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101266281A CN101266281A (zh) | 2008-09-17 |
CN101266281B true CN101266281B (zh) | 2010-12-15 |
Family
ID=39843209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200810083171XA Ceased CN101266281B (zh) | 2007-03-13 | 2008-03-07 | 自动处理机 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2008224399A (zh) |
KR (1) | KR100942479B1 (zh) |
CN (1) | CN101266281B (zh) |
TW (1) | TW200837371A (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200124795A (ko) | 2019-04-24 | 2020-11-04 | 삼성디스플레이 주식회사 | 표시 장치 조립 장치 및 이를 이용한 표시 장치 제조 방법 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03173146A (ja) * | 1989-12-01 | 1991-07-26 | Hitachi Ltd | 検査装置 |
JP2001124825A (ja) | 1999-10-28 | 2001-05-11 | Ando Electric Co Ltd | オートハンドラ用ハンド |
JP2002107410A (ja) * | 2000-09-29 | 2002-04-10 | Ando Electric Co Ltd | Tab用オートハンドラ |
CN100570385C (zh) * | 2004-05-12 | 2009-12-16 | 株式会社爱德万测试 | Tcp处理装置 |
-
2007
- 2007-03-13 JP JP2007062747A patent/JP2008224399A/ja active Pending
-
2008
- 2008-03-07 CN CN200810083171XA patent/CN101266281B/zh not_active Ceased
- 2008-03-07 TW TW097108030A patent/TW200837371A/zh unknown
- 2008-03-11 KR KR1020080022343A patent/KR100942479B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR100942479B1 (ko) | 2010-02-12 |
CN101266281A (zh) | 2008-09-17 |
TW200837371A (en) | 2008-09-16 |
JP2008224399A (ja) | 2008-09-25 |
KR20080084636A (ko) | 2008-09-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: TAISAIKE CO., LTD. Free format text: FORMER OWNER: YOKOGAWA ELECTRIC CORP. Effective date: 20100317 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20100317 Address after: Tokyo, Japan Applicant after: Tesec Corp. Address before: Tokyo, Japan Applicant before: Yokogawa Electric Corp. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
IW01 | Full invalidation of patent right |
Decision date of declaring invalidation: 20220130 Decision number of declaring invalidation: 53153 Granted publication date: 20101215 |
|
IW01 | Full invalidation of patent right |