KR100942479B1 - 오토 핸들러 - Google Patents
오토 핸들러 Download PDFInfo
- Publication number
- KR100942479B1 KR100942479B1 KR1020080022343A KR20080022343A KR100942479B1 KR 100942479 B1 KR100942479 B1 KR 100942479B1 KR 1020080022343 A KR1020080022343 A KR 1020080022343A KR 20080022343 A KR20080022343 A KR 20080022343A KR 100942479 B1 KR100942479 B1 KR 100942479B1
- Authority
- KR
- South Korea
- Prior art keywords
- tape
- suction
- pusher plate
- tapes
- auto handler
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (3)
- 디바이스 테이프에 실장된 IC 디바이스를 측정부에 반송하고, 상기 측정부에서 푸셔 플레이트와 테이프 클램퍼에 의해 상기 IC 디바이스를 끼워넣은 상태로 컨택트 푸셔에 의해 프로브에 가압하여 측정을 행하고, 측정한 상기 IC 디바이스를 반출하는 오토 핸들러에 있어서,상기 측정부에서, 상기 디바이스 테이프를 상기 푸셔 플레이트에 흡인하는 흡인 수단을 설치하고,상기 흡인 수단은 상기 푸셔 플레이트의 저부(底部)에 설치된 복수개의 흡인 구멍으로 구성되는,오토 핸들러.
- 제1항에 있어서,상기 흡인 수단은, 상기 복수개의 흡인 구멍에 연통하는 배관과, 상기 배관에 접속된 흡인 펌프로 더 구성되어 있는, 오토 핸들러.
- 제1항 또는 제2항에 있어서,상기 흡인 구멍은, 상기 IC 디바이스가 측정을 위해 미리 정해진 위치에 정지한 때, 상기 IC 디바이스가 형성된 부분의 주변 위치에 설치된, 오토 핸들러.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2007-00062747 | 2007-03-13 | ||
JP2007062747A JP2008224399A (ja) | 2007-03-13 | 2007-03-13 | オートハンドラ |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20080084636A KR20080084636A (ko) | 2008-09-19 |
KR100942479B1 true KR100942479B1 (ko) | 2010-02-12 |
Family
ID=39843209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080022343A KR100942479B1 (ko) | 2007-03-13 | 2008-03-11 | 오토 핸들러 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2008224399A (ko) |
KR (1) | KR100942479B1 (ko) |
CN (1) | CN101266281B (ko) |
TW (1) | TW200837371A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11411063B2 (en) | 2019-04-24 | 2022-08-09 | Samsung Display Co., Ltd. | Display device fabricating method |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001124825A (ja) | 1999-10-28 | 2001-05-11 | Ando Electric Co Ltd | オートハンドラ用ハンド |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03173146A (ja) * | 1989-12-01 | 1991-07-26 | Hitachi Ltd | 検査装置 |
JP2002107410A (ja) * | 2000-09-29 | 2002-04-10 | Ando Electric Co Ltd | Tab用オートハンドラ |
JPWO2005109016A1 (ja) * | 2004-05-12 | 2008-03-21 | 株式会社アドバンテスト | Tcpハンドリング装置 |
-
2007
- 2007-03-13 JP JP2007062747A patent/JP2008224399A/ja active Pending
-
2008
- 2008-03-07 CN CN200810083171XA patent/CN101266281B/zh not_active Ceased
- 2008-03-07 TW TW097108030A patent/TW200837371A/zh unknown
- 2008-03-11 KR KR1020080022343A patent/KR100942479B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001124825A (ja) | 1999-10-28 | 2001-05-11 | Ando Electric Co Ltd | オートハンドラ用ハンド |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11411063B2 (en) | 2019-04-24 | 2022-08-09 | Samsung Display Co., Ltd. | Display device fabricating method |
Also Published As
Publication number | Publication date |
---|---|
KR20080084636A (ko) | 2008-09-19 |
CN101266281B (zh) | 2010-12-15 |
TW200837371A (en) | 2008-09-16 |
JP2008224399A (ja) | 2008-09-25 |
CN101266281A (zh) | 2008-09-17 |
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