CN101026920B - 等离子体发生装置和工件处理装置 - Google Patents
等离子体发生装置和工件处理装置 Download PDFInfo
- Publication number
- CN101026920B CN101026920B CN2007100028736A CN200710002873A CN101026920B CN 101026920 B CN101026920 B CN 101026920B CN 2007100028736 A CN2007100028736 A CN 2007100028736A CN 200710002873 A CN200710002873 A CN 200710002873A CN 101026920 B CN101026920 B CN 101026920B
- Authority
- CN
- China
- Prior art keywords
- microwave
- microwaves
- main body
- waveguide
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
- H01J37/32211—Means for coupling power to the plasma
- H01J37/32229—Waveguides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
- H01J37/32311—Circuits specially adapted for controlling the microwave discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006042197 | 2006-02-20 | ||
| JP2006-042197 | 2006-02-20 | ||
| JP2006042197A JP4699235B2 (ja) | 2006-02-20 | 2006-02-20 | プラズマ発生装置およびそれを用いるワーク処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101026920A CN101026920A (zh) | 2007-08-29 |
| CN101026920B true CN101026920B (zh) | 2010-10-06 |
Family
ID=38426875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007100028736A Expired - Fee Related CN101026920B (zh) | 2006-02-20 | 2007-02-08 | 等离子体发生装置和工件处理装置 |
Country Status (5)
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7562638B2 (en) * | 2005-12-23 | 2009-07-21 | Lam Research Corporation | Methods and arrangement for implementing highly efficient plasma traps |
| JP2009099721A (ja) * | 2007-10-16 | 2009-05-07 | Dainippon Screen Mfg Co Ltd | 基板冷却方法および基板冷却装置 |
| TW200930158A (en) * | 2007-12-25 | 2009-07-01 | Ind Tech Res Inst | Jet plasma gun and plasma device using the same |
| KR20100025249A (ko) * | 2008-08-27 | 2010-03-09 | (주)쎄미시스코 | 공정챔버의 리크 검출 방법 |
| US8808456B2 (en) * | 2008-08-29 | 2014-08-19 | Tokyo Electron Limited | Film deposition apparatus and substrate process apparatus |
| US9297072B2 (en) * | 2008-12-01 | 2016-03-29 | Tokyo Electron Limited | Film deposition apparatus |
| US8841629B2 (en) | 2012-06-27 | 2014-09-23 | Applied Materials, Inc. | Microwave excursion detection for semiconductor processing |
| US9284210B2 (en) * | 2014-03-31 | 2016-03-15 | Corning Incorporated | Methods and apparatus for material processing using dual source cyclonic plasma reactor |
| US10079135B1 (en) * | 2018-04-18 | 2018-09-18 | Consolidated Nuclear Security, LLC | Gas-sealed stub tuner for microwave systems |
| WO2020039562A1 (ja) * | 2018-08-23 | 2020-02-27 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法、及びプログラム |
| CN114222626A (zh) * | 2019-04-05 | 2022-03-22 | 派罗波有限公司 | 用于微波热解系统的内部冷却的阻抗调谐器 |
| CN114747299B (zh) * | 2019-12-24 | 2025-01-07 | 株式会社富士 | 等离子体装置 |
| CN112844949A (zh) * | 2020-12-31 | 2021-05-28 | 上海爱声生物医疗科技有限公司 | 一种医用导管涂层涂覆设备 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2064507U (zh) * | 1990-03-17 | 1990-10-24 | 地方国营宿迁无线电厂 | 微波泄漏检测器 |
| US5328515A (en) * | 1992-05-07 | 1994-07-12 | France Telecom Etablissement Autonome De Droit Public | Chemical treatment plasma apparatus for forming a ribbon-like plasma |
| US20050001527A1 (en) * | 2003-02-24 | 2005-01-06 | Akira Sugiyama | Plasma processing apparatus |
| CN2704179Y (zh) * | 2004-05-14 | 2005-06-08 | 徐仁本 | 微波炉安全防护罩 |
| CN1633216A (zh) * | 2004-11-11 | 2005-06-29 | 南开大学 | 具有在线实时显示微波泄漏的微波协助化学反应谐振腔 |
| US20060021581A1 (en) * | 2004-07-30 | 2006-02-02 | Lee Sang H | Plasma nozzle array for providing uniform scalable microwave plasma generation |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5378170A (en) * | 1976-12-22 | 1978-07-11 | Toshiba Corp | Continuous processor for gas plasma etching |
| US5645796A (en) * | 1990-08-31 | 1997-07-08 | Abtox, Inc. | Process for plasma sterilizing with pulsed antimicrobial agent treatment |
| JPH06244140A (ja) * | 1992-10-28 | 1994-09-02 | Nec Kyushu Ltd | ドライエッチング装置 |
| JPH07135196A (ja) * | 1993-06-29 | 1995-05-23 | Nec Kyushu Ltd | 半導体基板アッシング装置 |
| JP3137810B2 (ja) * | 1993-07-29 | 2001-02-26 | キヤノン株式会社 | マイクロ波プラズマ放電停止検知方法、マイクロ波プラズマ処理方法及びマイクロ波プラズマ処理装置 |
| JP4044397B2 (ja) | 2001-10-15 | 2008-02-06 | 積水化学工業株式会社 | プラズマ表面処理装置 |
| JP3977114B2 (ja) * | 2002-03-25 | 2007-09-19 | 株式会社ルネサステクノロジ | プラズマ処理装置 |
| AU2003230265A1 (en) * | 2002-05-08 | 2003-11-11 | Dana Corporation | Methods and apparatus for forming and using plasma jets |
| US20060057016A1 (en) * | 2002-05-08 | 2006-03-16 | Devendra Kumar | Plasma-assisted sintering |
| US6769288B2 (en) * | 2002-11-01 | 2004-08-03 | Peak Sensor Systems Llc | Method and assembly for detecting a leak in a plasma system |
| US7164095B2 (en) * | 2004-07-07 | 2007-01-16 | Noritsu Koki Co., Ltd. | Microwave plasma nozzle with enhanced plume stability and heating efficiency |
| US20060021980A1 (en) | 2004-07-30 | 2006-02-02 | Lee Sang H | System and method for controlling a power distribution within a microwave cavity |
| JP4022590B2 (ja) * | 2005-03-25 | 2007-12-19 | 株式会社エーイーティー | マイクロ波プラズマ発生装置 |
-
2006
- 2006-02-20 JP JP2006042197A patent/JP4699235B2/ja not_active Expired - Fee Related
-
2007
- 2007-01-23 TW TW096102449A patent/TW200742505A/zh not_active IP Right Cessation
- 2007-01-29 KR KR1020070008811A patent/KR100884663B1/ko not_active Expired - Fee Related
- 2007-02-06 US US11/703,038 patent/US7682482B2/en not_active Expired - Fee Related
- 2007-02-08 CN CN2007100028736A patent/CN101026920B/zh not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2064507U (zh) * | 1990-03-17 | 1990-10-24 | 地方国营宿迁无线电厂 | 微波泄漏检测器 |
| US5328515A (en) * | 1992-05-07 | 1994-07-12 | France Telecom Etablissement Autonome De Droit Public | Chemical treatment plasma apparatus for forming a ribbon-like plasma |
| US20050001527A1 (en) * | 2003-02-24 | 2005-01-06 | Akira Sugiyama | Plasma processing apparatus |
| CN2704179Y (zh) * | 2004-05-14 | 2005-06-08 | 徐仁本 | 微波炉安全防护罩 |
| US20060021581A1 (en) * | 2004-07-30 | 2006-02-02 | Lee Sang H | Plasma nozzle array for providing uniform scalable microwave plasma generation |
| CN1633216A (zh) * | 2004-11-11 | 2005-06-29 | 南开大学 | 具有在线实时显示微波泄漏的微波协助化学反应谐振腔 |
Non-Patent Citations (2)
| Title |
|---|
| JP-特开平6-244140A 1994.09.02 |
| US 20050001527 A1,全文. |
Also Published As
| Publication number | Publication date |
|---|---|
| US20070193516A1 (en) | 2007-08-23 |
| KR100884663B1 (ko) | 2009-02-18 |
| TWI343764B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 2011-06-11 |
| CN101026920A (zh) | 2007-08-29 |
| TW200742505A (en) | 2007-11-01 |
| KR20070083176A (ko) | 2007-08-23 |
| US7682482B2 (en) | 2010-03-23 |
| JP4699235B2 (ja) | 2011-06-08 |
| JP2007220586A (ja) | 2007-08-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: SAIAN CO., LTD. Free format text: FORMER OWNER: NORITSU KOKI CO. LTD. Effective date: 20100903 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20100903 Address after: Wakayama County Applicant after: Saian Corp. Address before: Wakayama County Applicant before: Noritsu Koki Co., Ltd. |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101006 Termination date: 20120208 |