CN100335891C - 图像处理与检验系统 - Google Patents

图像处理与检验系统 Download PDF

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Publication number
CN100335891C
CN100335891C CNB028026896A CN02802689A CN100335891C CN 100335891 C CN100335891 C CN 100335891C CN B028026896 A CNB028026896 A CN B028026896A CN 02802689 A CN02802689 A CN 02802689A CN 100335891 C CN100335891 C CN 100335891C
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CN
China
Prior art keywords
controller
monitor
menu
image
computer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CNB028026896A
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English (en)
Chinese (zh)
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CN1466678A (zh
Inventor
山根俊树
服部真之
西岛润
饭岛治
小泉豪章
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Panasonic Industrial Devices SUNX Co Ltd
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Matsushita Electric Works Ltd
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Publication date
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Publication of CN1466678A publication Critical patent/CN1466678A/zh
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Publication of CN100335891C publication Critical patent/CN100335891C/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Debugging And Monitoring (AREA)
CNB028026896A 2001-08-31 2002-08-28 图像处理与检验系统 Expired - Fee Related CN100335891C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP264782/2001 2001-08-31
JP2001264782A JP4096533B2 (ja) 2001-08-31 2001-08-31 画像処理検査システム
JP264782/01 2001-08-31

Publications (2)

Publication Number Publication Date
CN1466678A CN1466678A (zh) 2004-01-07
CN100335891C true CN100335891C (zh) 2007-09-05

Family

ID=19091333

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB028026896A Expired - Fee Related CN100335891C (zh) 2001-08-31 2002-08-28 图像处理与检验系统

Country Status (6)

Country Link
US (1) US7145595B2 (enExample)
EP (1) EP1421368B1 (enExample)
JP (1) JP4096533B2 (enExample)
CN (1) CN100335891C (enExample)
DE (1) DE60237830D1 (enExample)
WO (1) WO2003019162A1 (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7269111B2 (en) * 2004-06-14 2007-09-11 Hewlett-Packard Development Company, L.P. Detecting radius of optically writable label side of optical disc at which markings have not been written
WO2007017909A1 (en) 2005-08-05 2007-02-15 Datasensor S.P.A. System for automatic configuration of a control keyboard of an optoelectronic sensor
JP4500752B2 (ja) * 2005-09-07 2010-07-14 株式会社日立ハイテクノロジーズ 観察／検査作業支援システム及び観察／検査条件設定方法
ATE550140T1 (de) * 2005-09-13 2012-04-15 Gudmunn Slettemoen Opto-mechanischer positionsfinder
JP2007228337A (ja) * 2006-02-24 2007-09-06 Olympus Corp 画像撮影装置
DE102006015963A1 (de) * 2006-04-05 2007-10-31 Quiss Gmbh Verfahren zum optischen Überprüfen von Prüfobjekten mit variabler Parametrisierung sowie Vorrichtung hierfür
CN100389595C (zh) * 2006-04-30 2008-05-21 北京中星微电子有限公司 电视图像算法验证系统及方法
JP4843399B2 (ja) 2006-07-31 2011-12-21 株式会社日立ハイテクノロジーズ 検査装置及び検査方法
JP2008293373A (ja) * 2007-05-25 2008-12-04 Micro Vision:Kk 多機能画像センサーシステム
JP4963284B2 (ja) * 2007-10-04 2012-06-27 株式会社メガトレード 基準データ作成方法
JP5060677B2 (ja) * 2007-12-13 2012-10-31 株式会社キーエンス 画像処理コントローラ及び検査支援システム
JP5211951B2 (ja) * 2008-09-05 2013-06-12 富士ゼロックス株式会社 検査システム、検査装置、表示装置及びプログラム
US20100119142A1 (en) * 2008-11-11 2010-05-13 Sean Miceli Monitoring Multiple Similar Objects Using Image Templates
US8706264B1 (en) * 2008-12-17 2014-04-22 Cognex Corporation Time synchronized registration feedback
JP4749507B1 (ja) * 2010-03-05 2011-08-17 キヤノンＩｔソリューションズ株式会社 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体
JP4801791B1 (ja) * 2010-11-17 2011-10-26 キヤノンＩｔソリューションズ株式会社 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体
CN102841103A (zh) * 2011-06-23 2012-12-26 神讯电脑(昆山)有限公司 键盘外观检测装置及方法
TWI442047B (zh) * 2012-09-18 2014-06-21 Quanta Comp Inc 動態取像系統
EP2913148B8 (en) * 2014-02-28 2020-03-25 Hexagon Metrology (Israel) Ltd. Method and system for analyzing process monitoring data
CN108459023A (zh) * 2018-03-27 2018-08-28 松下电子部品（江门）有限公司 双基准电容外观图像检测方法
JP7025266B2 (ja) * 2018-03-29 2022-02-24 パナソニック デバイスＳｕｎｘ株式会社 画像検査システム
JP7247769B2 (ja) * 2019-06-10 2023-03-29 コベルコ建機株式会社 遠隔操作システム
JP7310338B2 (ja) * 2019-06-10 2023-07-19 コベルコ建機株式会社 遠隔操作システムおよび遠隔操作サーバ
JP6898684B1 (ja) * 2020-11-17 2021-07-07 株式会社シンカ・アウトフィットＮｑ 解析装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4570180A (en) * 1982-05-28 1986-02-11 International Business Machines Corporation Method for automatic optical inspection
US5408104A (en) * 1992-06-10 1995-04-18 Valinox Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products
JPH07210657A (ja) * 1994-01-26 1995-08-11 Matsushita Electric Works Ltd 画像処理検査装置
CN1127037A (zh) * 1993-05-28 1996-07-17 公理图像处理系统有限公司 自动检查设备
JPH1166281A (ja) * 1997-08-26 1999-03-09 Matsushita Electric Works Ltd 画像処理検査装置
CN1300991A (zh) * 1999-12-22 2001-06-27 南京明维自动化有限公司 实时监控信息管理一体化系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5917726A (en) * 1993-11-18 1999-06-29 Sensor Adaptive Machines, Inc. Intelligent machining and manufacturing
GB9416406D0 (en) * 1994-08-13 1994-10-05 Univ Of Huddersfield Colour inspection system
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
ES2175977T3 (es) * 1998-05-29 2002-11-16 Matsushita Electric Works Ltd Aparato de inspeccion de procesamiento de imagenes.
JP2001268509A (ja) * 2000-03-17 2001-09-28 Omron Corp 画像記録装置及び画像記録システム
US6741275B2 (en) * 2001-01-04 2004-05-25 Frigon Electrique Inc. Lumber grading system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4570180A (en) * 1982-05-28 1986-02-11 International Business Machines Corporation Method for automatic optical inspection
US5408104A (en) * 1992-06-10 1995-04-18 Valinox Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products
CN1127037A (zh) * 1993-05-28 1996-07-17 公理图像处理系统有限公司 自动检查设备
JPH07210657A (ja) * 1994-01-26 1995-08-11 Matsushita Electric Works Ltd 画像処理検査装置
JPH1166281A (ja) * 1997-08-26 1999-03-09 Matsushita Electric Works Ltd 画像処理検査装置
CN1300991A (zh) * 1999-12-22 2001-06-27 南京明维自动化有限公司 实时监控信息管理一体化系统

Also Published As

Publication number Publication date
JP4096533B2 (ja) 2008-06-04
JP2003076978A (ja) 2003-03-14
WO2003019162A1 (en) 2003-03-06
US7145595B2 (en) 2006-12-05
US20040061778A1 (en) 2004-04-01
DE60237830D1 (enExample) 2010-11-11
EP1421368A1 (en) 2004-05-26
EP1421368B1 (en) 2010-09-29
CN1466678A (zh) 2004-01-07

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Owner name: PANASONIC ELECTRIC WORKS SUNX CO., LTD.

Free format text: FORMER OWNER: MATSUSHITA ELECTRIC WORKS LTD.

Effective date: 20111128

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Address after: Japan's Aichi

Patentee after: Panasonic Electric Works Sunx Co., Ltd.

Address before: Japan's Osaka kamato City

Patentee before: Matsushita Electric Works, Ltd.

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Owner name: PANASONIC SUNX CO., LTD.

Free format text: FORMER NAME: PANASONIC ELECTRIC WORKS SUNX CO., LTD.

CP01 Change in the name or title of a patent holder

Address after: Japan's Aichi

Patentee after: Panasonic Electric Works Sunx Co., Ltd.

Address before: Japan's Aichi

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070905

Termination date: 20200828

CF01 Termination of patent right due to non-payment of annual fee