DE60237830D1 - - Google Patents

Info

Publication number
DE60237830D1
DE60237830D1 DE60237830T DE60237830T DE60237830D1 DE 60237830 D1 DE60237830 D1 DE 60237830D1 DE 60237830 T DE60237830 T DE 60237830T DE 60237830 T DE60237830 T DE 60237830T DE 60237830 D1 DE60237830 D1 DE 60237830D1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60237830T
Other languages
German (de)
Inventor
Toshiki Yamane
Masayuki Hattori
Jun Nishijima
Osamu Iijima
Yoshinori Koizumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Application granted granted Critical
Publication of DE60237830D1 publication Critical patent/DE60237830D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Debugging And Monitoring (AREA)
DE60237830T 2001-08-31 2002-08-28 Expired - Lifetime DE60237830D1 (enExample)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001264782A JP4096533B2 (ja) 2001-08-31 2001-08-31 画像処理検査システム
PCT/JP2002/008691 WO2003019162A1 (en) 2001-08-31 2002-08-28 Image processing and inspection system

Publications (1)

Publication Number Publication Date
DE60237830D1 true DE60237830D1 (enExample) 2010-11-11

Family

ID=19091333

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60237830T Expired - Lifetime DE60237830D1 (enExample) 2001-08-31 2002-08-28

Country Status (6)

Country Link
US (1) US7145595B2 (enExample)
EP (1) EP1421368B1 (enExample)
JP (1) JP4096533B2 (enExample)
CN (1) CN100335891C (enExample)
DE (1) DE60237830D1 (enExample)
WO (1) WO2003019162A1 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7269111B2 (en) * 2004-06-14 2007-09-11 Hewlett-Packard Development Company, L.P. Detecting radius of optically writable label side of optical disc at which markings have not been written
WO2007017909A1 (en) 2005-08-05 2007-02-15 Datasensor S.P.A. System for automatic configuration of a control keyboard of an optoelectronic sensor
JP4500752B2 (ja) * 2005-09-07 2010-07-14 株式会社日立ハイテクノロジーズ 観察／検査作業支援システム及び観察／検査条件設定方法
WO2007032681A1 (en) * 2005-09-13 2007-03-22 Gudmunn Slettemoen Opto-mechanical position finder
JP2007228337A (ja) * 2006-02-24 2007-09-06 Olympus Corp 画像撮影装置
DE102006015963A1 (de) * 2006-04-05 2007-10-31 Quiss Gmbh Verfahren zum optischen Überprüfen von Prüfobjekten mit variabler Parametrisierung sowie Vorrichtung hierfür
CN100389595C (zh) * 2006-04-30 2008-05-21 北京中星微电子有限公司 电视图像算法验证系统及方法
JP4843399B2 (ja) 2006-07-31 2011-12-21 株式会社日立ハイテクノロジーズ 検査装置及び検査方法
JP2008293373A (ja) * 2007-05-25 2008-12-04 Micro Vision:Kk 多機能画像センサーシステム
JP4963284B2 (ja) * 2007-10-04 2012-06-27 株式会社メガトレード 基準データ作成方法
JP5060677B2 (ja) * 2007-12-13 2012-10-31 株式会社キーエンス 画像処理コントローラ及び検査支援システム
JP5211951B2 (ja) * 2008-09-05 2013-06-12 富士ゼロックス株式会社 検査システム、検査装置、表示装置及びプログラム
US20100119142A1 (en) * 2008-11-11 2010-05-13 Sean Miceli Monitoring Multiple Similar Objects Using Image Templates
US8706264B1 (en) * 2008-12-17 2014-04-22 Cognex Corporation Time synchronized registration feedback
JP4749507B1 (ja) * 2010-03-05 2011-08-17 キヤノンＩｔソリューションズ株式会社 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体
JP4801791B1 (ja) * 2010-11-17 2011-10-26 キヤノンＩｔソリューションズ株式会社 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体
CN102841103A (zh) * 2011-06-23 2012-12-26 神讯电脑(昆山)有限公司 键盘外观检测装置及方法
TWI442047B (zh) * 2012-09-18 2014-06-21 Quanta Comp Inc 動態取像系統
EP2913148B8 (en) * 2014-02-28 2020-03-25 Hexagon Metrology (Israel) Ltd. Method and system for analyzing process monitoring data
CN108459023A (zh) * 2018-03-27 2018-08-28 松下电子部品（江门）有限公司 双基准电容外观图像检测方法
JP7025266B2 (ja) * 2018-03-29 2022-02-24 パナソニック デバイスＳｕｎｘ株式会社 画像検査システム
JP7310338B2 (ja) * 2019-06-10 2023-07-19 コベルコ建機株式会社 遠隔操作システムおよび遠隔操作サーバ
JP7247769B2 (ja) * 2019-06-10 2023-03-29 コベルコ建機株式会社 遠隔操作システム
KR102912492B1 (ko) * 2019-10-16 2026-01-15 현대자동차주식회사 차량 및 차량의 제어방법
JP6898684B1 (ja) * 2020-11-17 2021-07-07 株式会社シンカ・アウトフィットＮｑ 解析装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0095517B1 (de) * 1982-05-28 1985-11-21 Ibm Deutschland Gmbh Verfahren und Einrichtung zur automatischen optischen Inspektion
FR2692355B1 (fr) * 1992-06-10 1997-06-20 Valinox Dispositif et procede de detection au defile de defauts de surface sur des produits longs metalliques.
BR9406727A (pt) * 1993-05-28 1996-01-30 Axiom Bildverarbeit Syst Aparelho de inspeção automática para classificar artigo de acordo com caracteristica superficial de artigo aparelho de seleção automática aparelho de inspeção automática para categorizar peça de trabalho com base em seu padrão superficial e/ou de core/ou de textura processo para inspecionar artigo automaticamente para classificar o artigo de acordo com uma caracteristica superficical do mesmo
US5917726A (en) * 1993-11-18 1999-06-29 Sensor Adaptive Machines, Inc. Intelligent machining and manufacturing
JP3456002B2 (ja) 1994-01-26 2003-10-14 松下電工株式会社 画像処理検査装置
GB9416406D0 (en) * 1994-08-13 1994-10-05 Univ Of Huddersfield Colour inspection system
US6026176A (en) * 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
JPH1166281A (ja) 1997-08-26 1999-03-09 Matsushita Electric Works Ltd 画像処理検査装置
AU3956899A (en) 1998-05-29 1999-12-20 Matsushita Electric Works Ltd. Image processing inspection apparatus
CN1105366C (zh) * 1999-12-22 2003-04-09 南京明维自动化有限公司 实时监控信息管理一体化系统
JP2001268509A (ja) * 2000-03-17 2001-09-28 Omron Corp 画像記録装置及び画像記録システム
US6741275B2 (en) * 2001-01-04 2004-05-25 Frigon Electrique Inc. Lumber grading system

Also Published As

Publication number Publication date
US20040061778A1 (en) 2004-04-01
JP4096533B2 (ja) 2008-06-04
EP1421368B1 (en) 2010-09-29
CN100335891C (zh) 2007-09-05
US7145595B2 (en) 2006-12-05
CN1466678A (zh) 2004-01-07
EP1421368A1 (en) 2004-05-26
JP2003076978A (ja) 2003-03-14
WO2003019162A1 (en) 2003-03-06

Similar Documents

Publication Publication Date Title
BE2022C531I2 (enExample)
BE2022C547I2 (enExample)
BE2022C502I2 (enExample)
BE2017C059I2 (enExample)
BE2017C055I2 (enExample)
BE2017C051I2 (enExample)
BE2017C032I2 (enExample)
BE2016C051I2 (enExample)
BE2014C052I2 (enExample)
BE2014C036I2 (enExample)
BE2014C026I2 (enExample)
BE2007C047I2 (enExample)
AU2002307149A8 (enExample)
BE2011C034I2 (enExample)
BE2014C006I2 (enExample)
BRPI0209186B1 (enExample)
BRPI0204884A2 (enExample)
CH1379220H1 (enExample)
BE2016C043I2 (enExample)
BE2014C008I2 (enExample)
BE2016C021I2 (enExample)
BRPI0101486B8 (enExample)
BE2012C051I2 (enExample)
AU2000280389A8 (enExample)
BRMU8103221U (enExample)