CN100335891C - 图像处理与检验系统 - Google Patents
图像处理与检验系统 Download PDFInfo
- Publication number
- CN100335891C CN100335891C CNB028026896A CN02802689A CN100335891C CN 100335891 C CN100335891 C CN 100335891C CN B028026896 A CNB028026896 A CN B028026896A CN 02802689 A CN02802689 A CN 02802689A CN 100335891 C CN100335891 C CN 100335891C
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- CN
- China
- Prior art keywords
- controller
- monitor
- computing machine
- menu
- dynamic image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 14
- 238000012360 testing method Methods 0.000 claims description 53
- 239000004575 stone Substances 0.000 claims description 49
- 238000000034 method Methods 0.000 claims description 21
- 230000008569 process Effects 0.000 claims description 18
- 238000003556 assay Methods 0.000 claims description 14
- 230000005540 biological transmission Effects 0.000 claims description 14
- 230000004044 response Effects 0.000 claims description 8
- 238000013144 data compression Methods 0.000 claims description 7
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- 238000012790 confirmation Methods 0.000 abstract 1
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- 238000005516 engineering process Methods 0.000 description 3
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- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
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- 238000001303 quality assessment method Methods 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2200/00—Indexing scheme for image data processing or generation, in general
- G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001264782A JP4096533B2 (ja) | 2001-08-31 | 2001-08-31 | 画像処理検査システム |
JP264782/01 | 2001-08-31 | ||
JP264782/2001 | 2001-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1466678A CN1466678A (zh) | 2004-01-07 |
CN100335891C true CN100335891C (zh) | 2007-09-05 |
Family
ID=19091333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028026896A Expired - Fee Related CN100335891C (zh) | 2001-08-31 | 2002-08-28 | 图像处理与检验系统 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7145595B2 (zh) |
EP (1) | EP1421368B1 (zh) |
JP (1) | JP4096533B2 (zh) |
CN (1) | CN100335891C (zh) |
DE (1) | DE60237830D1 (zh) |
WO (1) | WO2003019162A1 (zh) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7269111B2 (en) * | 2004-06-14 | 2007-09-11 | Hewlett-Packard Development Company, L.P. | Detecting radius of optically writable label side of optical disc at which markings have not been written |
WO2007017909A1 (en) | 2005-08-05 | 2007-02-15 | Datasensor S.P.A. | System for automatic configuration of a control keyboard of an optoelectronic sensor |
JP4500752B2 (ja) * | 2005-09-07 | 2010-07-14 | 株式会社日立ハイテクノロジーズ | 観察/検査作業支援システム及び観察/検査条件設定方法 |
JP4982493B2 (ja) * | 2005-09-13 | 2012-07-25 | スレッテモエン,グドムン | 光機械位置測定器 |
JP2007228337A (ja) * | 2006-02-24 | 2007-09-06 | Olympus Corp | 画像撮影装置 |
DE102006015963A1 (de) * | 2006-04-05 | 2007-10-31 | Quiss Gmbh | Verfahren zum optischen Überprüfen von Prüfobjekten mit variabler Parametrisierung sowie Vorrichtung hierfür |
CN100389595C (zh) * | 2006-04-30 | 2008-05-21 | 北京中星微电子有限公司 | 电视图像算法验证系统及方法 |
JP4843399B2 (ja) | 2006-07-31 | 2011-12-21 | 株式会社日立ハイテクノロジーズ | 検査装置及び検査方法 |
JP2008293373A (ja) * | 2007-05-25 | 2008-12-04 | Micro Vision:Kk | 多機能画像センサーシステム |
JP4963284B2 (ja) * | 2007-10-04 | 2012-06-27 | 株式会社メガトレード | 基準データ作成方法 |
JP5060677B2 (ja) * | 2007-12-13 | 2012-10-31 | 株式会社キーエンス | 画像処理コントローラ及び検査支援システム |
JP5211951B2 (ja) * | 2008-09-05 | 2013-06-12 | 富士ゼロックス株式会社 | 検査システム、検査装置、表示装置及びプログラム |
US20100119142A1 (en) * | 2008-11-11 | 2010-05-13 | Sean Miceli | Monitoring Multiple Similar Objects Using Image Templates |
US8706264B1 (en) * | 2008-12-17 | 2014-04-22 | Cognex Corporation | Time synchronized registration feedback |
JP4749507B1 (ja) * | 2010-03-05 | 2011-08-17 | キヤノンItソリューションズ株式会社 | 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体 |
JP4801791B1 (ja) * | 2010-11-17 | 2011-10-26 | キヤノンItソリューションズ株式会社 | 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体 |
CN102841103A (zh) * | 2011-06-23 | 2012-12-26 | 神讯电脑(昆山)有限公司 | 键盘外观检测装置及方法 |
TWI442047B (zh) * | 2012-09-18 | 2014-06-21 | Quanta Comp Inc | 動態取像系統 |
EP2913148B8 (en) * | 2014-02-28 | 2020-03-25 | Hexagon Metrology (Israel) Ltd. | Method and system for analyzing process monitoring data |
CN108459023A (zh) * | 2018-03-27 | 2018-08-28 | 松下电子部品(江门)有限公司 | 双基准电容外观图像检测方法 |
JP7025266B2 (ja) * | 2018-03-29 | 2022-02-24 | パナソニック デバイスSunx株式会社 | 画像検査システム |
JP7310338B2 (ja) * | 2019-06-10 | 2023-07-19 | コベルコ建機株式会社 | 遠隔操作システムおよび遠隔操作サーバ |
JP7247769B2 (ja) * | 2019-06-10 | 2023-03-29 | コベルコ建機株式会社 | 遠隔操作システム |
JP6898684B1 (ja) * | 2020-11-17 | 2021-07-07 | 株式会社シンカ・アウトフィットNq | 解析装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4570180A (en) * | 1982-05-28 | 1986-02-11 | International Business Machines Corporation | Method for automatic optical inspection |
US5408104A (en) * | 1992-06-10 | 1995-04-18 | Valinox | Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products |
JPH07210657A (ja) * | 1994-01-26 | 1995-08-11 | Matsushita Electric Works Ltd | 画像処理検査装置 |
CN1127037A (zh) * | 1993-05-28 | 1996-07-17 | 公理图像处理系统有限公司 | 自动检查设备 |
JPH1166281A (ja) * | 1997-08-26 | 1999-03-09 | Matsushita Electric Works Ltd | 画像処理検査装置 |
CN1300991A (zh) * | 1999-12-22 | 2001-06-27 | 南京明维自动化有限公司 | 实时监控信息管理一体化系统 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5917726A (en) * | 1993-11-18 | 1999-06-29 | Sensor Adaptive Machines, Inc. | Intelligent machining and manufacturing |
GB9416406D0 (en) * | 1994-08-13 | 1994-10-05 | Univ Of Huddersfield | Colour inspection system |
US6026176A (en) * | 1995-07-25 | 2000-02-15 | Cognex Corporation | Machine vision methods and articles of manufacture for ball grid array inspection |
AU3956899A (en) | 1998-05-29 | 1999-12-20 | Matsushita Electric Works Ltd. | Image processing inspection apparatus |
JP2001268509A (ja) * | 2000-03-17 | 2001-09-28 | Omron Corp | 画像記録装置及び画像記録システム |
US6741275B2 (en) * | 2001-01-04 | 2004-05-25 | Frigon Electrique Inc. | Lumber grading system |
-
2001
- 2001-08-31 JP JP2001264782A patent/JP4096533B2/ja not_active Expired - Fee Related
-
2002
- 2002-08-28 DE DE60237830T patent/DE60237830D1/de not_active Expired - Lifetime
- 2002-08-28 WO PCT/JP2002/008691 patent/WO2003019162A1/en active Application Filing
- 2002-08-28 US US10/399,869 patent/US7145595B2/en not_active Expired - Fee Related
- 2002-08-28 CN CNB028026896A patent/CN100335891C/zh not_active Expired - Fee Related
- 2002-08-28 EP EP02760777A patent/EP1421368B1/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4570180A (en) * | 1982-05-28 | 1986-02-11 | International Business Machines Corporation | Method for automatic optical inspection |
US5408104A (en) * | 1992-06-10 | 1995-04-18 | Valinox | Apparatus and process with an annular fluorescent tube for detection in a moving mode of surface defects on long metallic products |
CN1127037A (zh) * | 1993-05-28 | 1996-07-17 | 公理图像处理系统有限公司 | 自动检查设备 |
JPH07210657A (ja) * | 1994-01-26 | 1995-08-11 | Matsushita Electric Works Ltd | 画像処理検査装置 |
JPH1166281A (ja) * | 1997-08-26 | 1999-03-09 | Matsushita Electric Works Ltd | 画像処理検査装置 |
CN1300991A (zh) * | 1999-12-22 | 2001-06-27 | 南京明维自动化有限公司 | 实时监控信息管理一体化系统 |
Also Published As
Publication number | Publication date |
---|---|
US7145595B2 (en) | 2006-12-05 |
US20040061778A1 (en) | 2004-04-01 |
EP1421368A1 (en) | 2004-05-26 |
WO2003019162A1 (en) | 2003-03-06 |
JP2003076978A (ja) | 2003-03-14 |
JP4096533B2 (ja) | 2008-06-04 |
DE60237830D1 (zh) | 2010-11-11 |
CN1466678A (zh) | 2004-01-07 |
EP1421368B1 (en) | 2010-09-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: PANASONIC ELECTRIC WORKS SUNX CO., LTD. Free format text: FORMER OWNER: MATSUSHITA ELECTRIC WORKS LTD. Effective date: 20111128 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111128 Address after: Japan's Aichi Patentee after: Panasonic Electric Works Sunx Co., Ltd. Address before: Japan's Osaka kamato City Patentee before: Matsushita Electric Works, Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: PANASONIC SUNX CO., LTD. Free format text: FORMER NAME: PANASONIC ELECTRIC WORKS SUNX CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Japan's Aichi Patentee after: Panasonic Electric Works Sunx Co., Ltd. Address before: Japan's Aichi Patentee before: Panasonic Electric Works Sunx Co., Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070905 Termination date: 20200828 |
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CF01 | Termination of patent right due to non-payment of annual fee |