CN1466678A - 图像处理与检验系统 - Google Patents
图像处理与检验系统 Download PDFInfo
- Publication number
- CN1466678A CN1466678A CNA028026896A CN02802689A CN1466678A CN 1466678 A CN1466678 A CN 1466678A CN A028026896 A CNA028026896 A CN A028026896A CN 02802689 A CN02802689 A CN 02802689A CN 1466678 A CN1466678 A CN 1466678A
- Authority
- CN
- China
- Prior art keywords
- controller
- monitor
- computing machine
- menu
- dynamic image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2200/00—Indexing scheme for image data processing or generation, in general
- G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Textile Engineering (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Closed-Circuit Television Systems (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Debugging And Monitoring (AREA)
Abstract
Description
Claims (12)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP264782/01 | 2001-08-31 | ||
JP2001264782A JP4096533B2 (ja) | 2001-08-31 | 2001-08-31 | 画像処理検査システム |
JP264782/2001 | 2001-08-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1466678A true CN1466678A (zh) | 2004-01-07 |
CN100335891C CN100335891C (zh) | 2007-09-05 |
Family
ID=19091333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028026896A Expired - Fee Related CN100335891C (zh) | 2001-08-31 | 2002-08-28 | 图像处理与检验系统 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7145595B2 (zh) |
EP (1) | EP1421368B1 (zh) |
JP (1) | JP4096533B2 (zh) |
CN (1) | CN100335891C (zh) |
DE (1) | DE60237830D1 (zh) |
WO (1) | WO2003019162A1 (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100389595C (zh) * | 2006-04-30 | 2008-05-21 | 北京中星微电子有限公司 | 电视图像算法验证系统及方法 |
CN104881863A (zh) * | 2014-02-28 | 2015-09-02 | 海克斯康计量(以色列)有限公司 | 用于分析处理监视数据的方法和系统 |
CN108459023A (zh) * | 2018-03-27 | 2018-08-28 | 松下电子部品(江门)有限公司 | 双基准电容外观图像检测方法 |
CN110320210A (zh) * | 2018-03-29 | 2019-10-11 | 松下神视株式会社 | 图像检查装置以及图像检查系统 |
CN114570495A (zh) * | 2020-11-17 | 2022-06-03 | 株式会社希力卡·装备Nq | 解析装置 |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7269111B2 (en) * | 2004-06-14 | 2007-09-11 | Hewlett-Packard Development Company, L.P. | Detecting radius of optically writable label side of optical disc at which markings have not been written |
EP1925152A1 (en) | 2005-08-05 | 2008-05-28 | Datasensor S.p.A. | System for automatic configuration of a control keyboard of an optoelectric sensor |
JP4500752B2 (ja) * | 2005-09-07 | 2010-07-14 | 株式会社日立ハイテクノロジーズ | 観察/検査作業支援システム及び観察/検査条件設定方法 |
US9027218B2 (en) * | 2005-09-13 | 2015-05-12 | Gudmunn Slettemoen | Opto-mechanical postion finder |
JP2007228337A (ja) * | 2006-02-24 | 2007-09-06 | Olympus Corp | 画像撮影装置 |
DE102006015963A1 (de) * | 2006-04-05 | 2007-10-31 | Quiss Gmbh | Verfahren zum optischen Überprüfen von Prüfobjekten mit variabler Parametrisierung sowie Vorrichtung hierfür |
JP4843399B2 (ja) * | 2006-07-31 | 2011-12-21 | 株式会社日立ハイテクノロジーズ | 検査装置及び検査方法 |
JP2008293373A (ja) * | 2007-05-25 | 2008-12-04 | Micro Vision:Kk | 多機能画像センサーシステム |
JP4963284B2 (ja) * | 2007-10-04 | 2012-06-27 | 株式会社メガトレード | 基準データ作成方法 |
JP5060677B2 (ja) * | 2007-12-13 | 2012-10-31 | 株式会社キーエンス | 画像処理コントローラ及び検査支援システム |
JP5211951B2 (ja) * | 2008-09-05 | 2013-06-12 | 富士ゼロックス株式会社 | 検査システム、検査装置、表示装置及びプログラム |
US20100119142A1 (en) * | 2008-11-11 | 2010-05-13 | Sean Miceli | Monitoring Multiple Similar Objects Using Image Templates |
US8706264B1 (en) * | 2008-12-17 | 2014-04-22 | Cognex Corporation | Time synchronized registration feedback |
JP4749507B1 (ja) * | 2010-03-05 | 2011-08-17 | キヤノンItソリューションズ株式会社 | 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体 |
JP4801791B1 (ja) * | 2010-11-17 | 2011-10-26 | キヤノンItソリューションズ株式会社 | 情報処理装置、情報処理装置の制御方法、プログラム、及びプログラムを記録した記録媒体 |
CN102841103A (zh) * | 2011-06-23 | 2012-12-26 | 神讯电脑(昆山)有限公司 | 键盘外观检测装置及方法 |
TWI442047B (zh) * | 2012-09-18 | 2014-06-21 | Quanta Comp Inc | 動態取像系統 |
JP7247769B2 (ja) * | 2019-06-10 | 2023-03-29 | コベルコ建機株式会社 | 遠隔操作システム |
JP7310338B2 (ja) * | 2019-06-10 | 2023-07-19 | コベルコ建機株式会社 | 遠隔操作システムおよび遠隔操作サーバ |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0095517B1 (de) * | 1982-05-28 | 1985-11-21 | Ibm Deutschland Gmbh | Verfahren und Einrichtung zur automatischen optischen Inspektion |
FR2692355B1 (fr) * | 1992-06-10 | 1997-06-20 | Valinox | Dispositif et procede de detection au defile de defauts de surface sur des produits longs metalliques. |
CN1095079C (zh) * | 1993-05-28 | 2002-11-27 | 千年风险集团公司 | 自动检查设备 |
US5917726A (en) * | 1993-11-18 | 1999-06-29 | Sensor Adaptive Machines, Inc. | Intelligent machining and manufacturing |
JP3456002B2 (ja) * | 1994-01-26 | 2003-10-14 | 松下電工株式会社 | 画像処理検査装置 |
GB9416406D0 (en) * | 1994-08-13 | 1994-10-05 | Univ Of Huddersfield | Colour inspection system |
US6026176A (en) * | 1995-07-25 | 2000-02-15 | Cognex Corporation | Machine vision methods and articles of manufacture for ball grid array inspection |
JPH1166281A (ja) * | 1997-08-26 | 1999-03-09 | Matsushita Electric Works Ltd | 画像処理検査装置 |
DE69901030T2 (de) | 1998-05-29 | 2002-07-18 | Matsushita Electric Works Ltd | Bildverarbeitungs-inspektionsgerät |
CN1105366C (zh) * | 1999-12-22 | 2003-04-09 | 南京明维自动化有限公司 | 实时监控信息管理一体化系统 |
JP2001268509A (ja) * | 2000-03-17 | 2001-09-28 | Omron Corp | 画像記録装置及び画像記録システム |
US6741275B2 (en) * | 2001-01-04 | 2004-05-25 | Frigon Electrique Inc. | Lumber grading system |
-
2001
- 2001-08-31 JP JP2001264782A patent/JP4096533B2/ja not_active Expired - Fee Related
-
2002
- 2002-08-28 WO PCT/JP2002/008691 patent/WO2003019162A1/en active Application Filing
- 2002-08-28 DE DE60237830T patent/DE60237830D1/de not_active Expired - Lifetime
- 2002-08-28 US US10/399,869 patent/US7145595B2/en not_active Expired - Fee Related
- 2002-08-28 CN CNB028026896A patent/CN100335891C/zh not_active Expired - Fee Related
- 2002-08-28 EP EP02760777A patent/EP1421368B1/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100389595C (zh) * | 2006-04-30 | 2008-05-21 | 北京中星微电子有限公司 | 电视图像算法验证系统及方法 |
CN104881863A (zh) * | 2014-02-28 | 2015-09-02 | 海克斯康计量(以色列)有限公司 | 用于分析处理监视数据的方法和系统 |
CN104881863B (zh) * | 2014-02-28 | 2019-04-30 | 海克斯康计量(以色列)有限公司 | 用于分析处理监视数据的方法、系统和机器可读媒体介质 |
CN108459023A (zh) * | 2018-03-27 | 2018-08-28 | 松下电子部品(江门)有限公司 | 双基准电容外观图像检测方法 |
CN110320210A (zh) * | 2018-03-29 | 2019-10-11 | 松下神视株式会社 | 图像检查装置以及图像检查系统 |
CN114570495A (zh) * | 2020-11-17 | 2022-06-03 | 株式会社希力卡·装备Nq | 解析装置 |
CN114570495B (zh) * | 2020-11-17 | 2023-08-29 | 株式会社新科集团 | 解析装置 |
Also Published As
Publication number | Publication date |
---|---|
CN100335891C (zh) | 2007-09-05 |
DE60237830D1 (zh) | 2010-11-11 |
US20040061778A1 (en) | 2004-04-01 |
WO2003019162A1 (en) | 2003-03-06 |
JP2003076978A (ja) | 2003-03-14 |
US7145595B2 (en) | 2006-12-05 |
JP4096533B2 (ja) | 2008-06-04 |
EP1421368B1 (en) | 2010-09-29 |
EP1421368A1 (en) | 2004-05-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: PANASONIC ELECTRIC WORKS SUNX CO., LTD. Free format text: FORMER OWNER: MATSUSHITA ELECTRIC WORKS LTD. Effective date: 20111128 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20111128 Address after: Japan's Aichi Patentee after: Panasonic Electric Works Sunx Co., Ltd. Address before: Japan's Osaka kamato City Patentee before: Matsushita Electric Works, Ltd. |
|
C56 | Change in the name or address of the patentee |
Owner name: PANASONIC SUNX CO., LTD. Free format text: FORMER NAME: PANASONIC ELECTRIC WORKS SUNX CO., LTD. |
|
CP01 | Change in the name or title of a patent holder |
Address after: Japan's Aichi Patentee after: Panasonic Electric Works Sunx Co., Ltd. Address before: Japan's Aichi Patentee before: Panasonic Electric Works Sunx Co., Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20070905 Termination date: 20200828 |
|
CF01 | Termination of patent right due to non-payment of annual fee |