CH615748A5 - - Google Patents

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Publication number
CH615748A5
CH615748A5 CH447177A CH447177A CH615748A5 CH 615748 A5 CH615748 A5 CH 615748A5 CH 447177 A CH447177 A CH 447177A CH 447177 A CH447177 A CH 447177A CH 615748 A5 CH615748 A5 CH 615748A5
Authority
CH
Switzerland
Prior art keywords
reference plane
microscope
light
boundary line
line
Prior art date
Application number
CH447177A
Other languages
German (de)
English (en)
Inventor
Morton Kaye
Original Assignee
Morton Kaye
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Morton Kaye filed Critical Morton Kaye
Publication of CH615748A5 publication Critical patent/CH615748A5/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
CH447177A 1976-04-19 1977-04-07 CH615748A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/678,059 US4113389A (en) 1976-04-19 1976-04-19 Optical measurement system

Publications (1)

Publication Number Publication Date
CH615748A5 true CH615748A5 (fr) 1980-02-15

Family

ID=24721209

Family Applications (1)

Application Number Title Priority Date Filing Date
CH447177A CH615748A5 (fr) 1976-04-19 1977-04-07

Country Status (10)

Country Link
US (1) US4113389A (fr)
JP (1) JPS52128170A (fr)
AU (1) AU2425477A (fr)
CA (1) CA1088302A (fr)
CH (1) CH615748A5 (fr)
DE (1) DE2716869A1 (fr)
DK (1) DK171677A (fr)
FR (1) FR2349126A1 (fr)
GB (1) GB1581948A (fr)
NL (1) NL7704206A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111164375A (zh) * 2017-10-06 2020-05-15 亚伦·伯恩斯坦 生成一个或多个亮度边缘以形成物体的三维模型

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4165178A (en) * 1978-06-29 1979-08-21 International Business Machines Corporation Gap measurement tool
EP0048346A1 (fr) * 1980-09-23 1982-03-31 The University Of Birmingham Mesure automatique des surfaces
GB2089044B (en) * 1980-11-19 1985-05-01 Cosciani Roberto Carlo Improvements in or relating to measuring apparatus
US4502785A (en) * 1981-08-31 1985-03-05 At&T Technologies, Inc. Surface profiling technique
JPS6063030A (ja) * 1983-09-19 1985-04-11 株式会社肌粧品科学開放研究所 皮溝又はしわの深さの測定方法及び装置
SE456976B (sv) * 1985-06-14 1988-11-21 Asea Ab Foerfarande och anordning vid en robotutrustning foer bestaemning av laeget av ett foeremaal
GB2179155B (en) * 1985-08-13 1989-08-16 English Electric Valve Co Ltd Spatial characteristic determination
EP0342251A1 (fr) * 1988-05-17 1989-11-23 Contour Dynamics Appareil et méthode pour la saisie d'images 3D
US4983043A (en) * 1987-04-17 1991-01-08 Industrial Technology Institute High accuracy structured light profiler
GB8725705D0 (en) * 1987-11-03 1987-12-09 Cosciani R C Optical probe
US4979815A (en) * 1989-02-17 1990-12-25 Tsikos Constantine J Laser range imaging system based on projective geometry
US4965665A (en) * 1989-10-25 1990-10-23 At&T Bell Laboratories 3D imaging of a substrate using perpendicular scanning directions
US5101442A (en) * 1989-11-24 1992-03-31 At&T Bell Laboratories Three-dimensional imaging technique using sharp gradient of illumination
US5097516A (en) * 1991-02-28 1992-03-17 At&T Bell Laboratories Technique for illuminating a surface with a gradient intensity line of light to achieve enhanced two-dimensional imaging
DE19642293C2 (de) * 1996-10-14 1998-07-16 Zeiss Carl Jena Gmbh Koordinatenmeßgerät
GB9701177D0 (en) * 1997-01-21 1997-03-12 Hamilton Neil C Thickness measuring apparatus
JP3272998B2 (ja) * 1997-09-30 2002-04-08 イビデン株式会社 バンプ高さ良否判定装置
IES20010218A2 (en) * 2000-03-09 2001-09-19 Athlone Extrusions Dev Ltd A method of testing co-extruded panels
US6830334B2 (en) * 2001-07-30 2004-12-14 Bausch & Lomb Incorporated Anterior chamber diameter measurement system from limbal ring measurement
DE10328537B4 (de) * 2003-06-24 2015-03-26 Pixargus Gmbh Vorrichtung und Verfahren zum Vermessen der Dimension eines Körpers
JP6079664B2 (ja) * 2014-02-25 2017-02-15 トヨタ自動車株式会社 被測定物の表面測定装置およびその表面測定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2976762A (en) * 1957-06-11 1961-03-28 Arnold L Imshaug Depth measuring apparatus for printing plates and like articles
US3022578A (en) * 1958-02-26 1962-02-27 Boeing Co Discontinuity depth gauge
US3187185A (en) * 1960-12-22 1965-06-01 United States Steel Corp Apparatus for determining surface contour
JPS5418145B1 (fr) * 1971-06-08 1979-07-05
GB1449044A (en) * 1972-11-14 1976-09-08 Kongsberg Vapenfab As Procedures and apparatuses for determining the shapes of surfaces

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111164375A (zh) * 2017-10-06 2020-05-15 亚伦·伯恩斯坦 生成一个或多个亮度边缘以形成物体的三维模型
CN111164375B (zh) * 2017-10-06 2022-04-19 先进扫描仪公司 用于生成锐化阴影的装置

Also Published As

Publication number Publication date
AU2425477A (en) 1978-10-19
DK171677A (da) 1977-10-20
FR2349126A1 (fr) 1977-11-18
JPS52128170A (en) 1977-10-27
NL7704206A (nl) 1977-10-21
CA1088302A (fr) 1980-10-28
DE2716869A1 (de) 1977-10-27
US4113389A (en) 1978-09-12
GB1581948A (en) 1980-12-31

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Legal Events

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PL Patent ceased