CH615515A5 - - Google Patents

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Publication number
CH615515A5
CH615515A5 CH698877A CH698877A CH615515A5 CH 615515 A5 CH615515 A5 CH 615515A5 CH 698877 A CH698877 A CH 698877A CH 698877 A CH698877 A CH 698877A CH 615515 A5 CH615515 A5 CH 615515A5
Authority
CH
Switzerland
Prior art keywords
eyepiece
angle
axis
inclination
scale
Prior art date
Application number
CH698877A
Other languages
German (de)
English (en)
Inventor
Albrecht Vogel
Original Assignee
Zeiss Carl Fa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Carl Fa filed Critical Zeiss Carl Fa
Publication of CH615515A5 publication Critical patent/CH615515A5/de

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B25/00—Eyepieces; Magnifying glasses
    • G02B25/001—Eyepieces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C1/00—Measuring angles
    • G01C1/02—Theodolites
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system
    • G02B27/36—Fiducial marks and measuring scales within the optical system adjustable

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Eye Examination Apparatus (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Eyeglasses (AREA)
  • Telescopes (AREA)
CH698877A 1976-09-08 1977-06-08 CH615515A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19762640284 DE2640284A1 (de) 1976-09-08 1976-09-08 Okular zur laengen- und winkelmessung durch ein mikroskop

Publications (1)

Publication Number Publication Date
CH615515A5 true CH615515A5 (fr) 1980-01-31

Family

ID=5987368

Family Applications (1)

Application Number Title Priority Date Filing Date
CH698877A CH615515A5 (fr) 1976-09-08 1977-06-08

Country Status (6)

Country Link
US (1) US4172662A (fr)
JP (1) JPS5333167A (fr)
CH (1) CH615515A5 (fr)
DE (1) DE2640284A1 (fr)
FR (1) FR2364474A1 (fr)
GB (1) GB1580636A (fr)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4291978A (en) * 1979-12-05 1981-09-29 Scintrex Limited Apparatus for automatically determining the position at which a beam of light impinges on a target
US4382678A (en) * 1981-06-29 1983-05-10 The United States Of America As Represented By The Secretary Of The Army Measuring of feature for photo interpretation
FR2623294A1 (fr) * 1987-11-17 1989-05-19 Dousset Robert Dispositif passif pour l'acquisition et la transmission d'images par fibres optique
US5060389A (en) * 1989-01-18 1991-10-29 Frederick Thomas J Semiconductor device inspection template
DE69524288T2 (de) * 1994-05-31 2002-05-23 Japan Em Co. Ltd., Hamamatsu Apparat und Skala zum Messen einer Dimension eines Objektes
BE1009108A4 (fr) * 1995-02-15 1996-11-05 Philippe Tassier Lunettes a horizon artificiel.
DE69620873T2 (de) * 1995-02-15 2002-12-12 Philippe Tassier Brille mit künstlichem horizont
JP3137573B2 (ja) * 1995-11-15 2001-02-26 ジャパン・イー・エム株式会社 計測装置
US5835289A (en) * 1997-01-07 1998-11-10 Berry; James M. Auxiliary lens attachment for an optical device
US5920995A (en) 1997-12-08 1999-07-13 Sammut; Dennis J. Gunsight and reticle therefor
US7856750B2 (en) 1997-12-08 2010-12-28 Horus Vision Llc Apparatus and method for calculating aiming point information
US6381016B1 (en) * 2000-07-14 2002-04-30 Advanced Micro Devices, Inc. Lead width inspection system and methods
DE60143712D1 (de) * 2001-02-05 2011-02-03 Yoshimine Takashi Adaptersystem und abbildungssystem
DE10140504A1 (de) * 2001-08-17 2003-03-06 Hensoldt Systemtechnik Gmbh Fernrohr
DE10244814A1 (de) * 2002-09-27 2004-04-15 Hensoldt Ag Okular
US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
US20050241653A1 (en) 2004-04-20 2005-11-03 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
US7239379B2 (en) * 2004-09-13 2007-07-03 Technology Innovations, Llc Method and apparatus for determining a vertical intensity profile through a plane of focus in a confocal microscope
US7474393B2 (en) * 2004-09-13 2009-01-06 Joel C. Wojciechowski Method and apparatus for determining a vertical intensity profile along an illuminating beam
US7391566B2 (en) * 2006-05-02 2008-06-24 Leica Microsystems Cms Gmbh Microscope having eyepiece reticle slider
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US8550624B2 (en) 2008-11-06 2013-10-08 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
WO2010132831A1 (fr) 2009-05-15 2010-11-18 Dennis Sammut Appareil et procédé pour calculer des informations de point de visée
US8876290B2 (en) * 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
ES2653970T3 (es) 2009-07-14 2018-02-09 Wavetec Vision Systems, Inc. Determinación de la posición efectiva de la lente de una lente intraocular utilizando potencia refractiva afáquica
KR101730675B1 (ko) 2009-07-14 2017-05-11 웨이브텍 비젼 시스템스, 인크. 안과 수술 측정 시스템
US20120320462A1 (en) * 2011-06-15 2012-12-20 Asia Optical Co., Inc. Aimer
WO2013106280A1 (fr) * 2012-01-10 2013-07-18 Horus Vision Llc Appareil et procédé permettant de calculer des informations de point de visée
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
US9500444B2 (en) 2013-01-11 2016-11-22 Hvrt. Corp. Apparatus and method for calculating aiming point information
JP2016099261A (ja) * 2014-11-25 2016-05-30 日立造船株式会社 管検査用撮影装置
US10413642B2 (en) 2015-04-28 2019-09-17 James Michael Berry System for dynamic control of medical vacuum
CN107238341A (zh) * 2017-06-30 2017-10-10 安徽江淮汽车集团股份有限公司 一种缸孔网纹角度测量装置
AU2019388605A1 (en) 2018-09-04 2021-02-18 Hvrt Corp. Reticles, methods of use and manufacture
CN113218302B (zh) * 2021-03-16 2024-02-20 河南省计量测试科学研究院 带有角度测量功能的便携式测量显微镜

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US559090A (en) * 1896-04-28 Level
GB191213320A (en) * 1912-06-06 1913-06-05 Robert Percy Melsome A New or Improved Artificial Horizon for Sextants and like Instruments.
US2067474A (en) * 1933-07-08 1937-01-12 Bendix Aviat Corp Inclinometer

Also Published As

Publication number Publication date
US4172662A (en) 1979-10-30
JPS5333167A (en) 1978-03-28
DE2640284A1 (de) 1978-03-09
FR2364474A1 (fr) 1978-04-07
GB1580636A (en) 1980-12-03
FR2364474B3 (fr) 1980-06-06

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PL Patent ceased