CH480735A - Feldeffekttransistor mit isolierten Torelektroden - Google Patents

Feldeffekttransistor mit isolierten Torelektroden

Info

Publication number
CH480735A
CH480735A CH428667A CH428667A CH480735A CH 480735 A CH480735 A CH 480735A CH 428667 A CH428667 A CH 428667A CH 428667 A CH428667 A CH 428667A CH 480735 A CH480735 A CH 480735A
Authority
CH
Switzerland
Prior art keywords
field effect
effect transistor
gate electrodes
isolated gate
isolated
Prior art date
Application number
CH428667A
Other languages
English (en)
Inventor
Okumura Tomisaburo
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Publication of CH480735A publication Critical patent/CH480735A/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7831—Field effect transistors with field effect produced by an insulated gate with multiple gate structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
    • H01L29/0642—Isolation within the component, i.e. internal isolation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
    • H01L29/0692—Surface layout
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Thin Film Transistor (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
CH428667A 1966-03-28 1967-03-28 Feldeffekttransistor mit isolierten Torelektroden CH480735A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1982866 1966-03-28

Publications (1)

Publication Number Publication Date
CH480735A true CH480735A (de) 1969-10-31

Family

ID=12010142

Family Applications (1)

Application Number Title Priority Date Filing Date
CH428667A CH480735A (de) 1966-03-28 1967-03-28 Feldeffekttransistor mit isolierten Torelektroden

Country Status (8)

Country Link
US (1) US3786319A (de)
BE (1) BE696169A (de)
CH (1) CH480735A (de)
DE (1) DE1614144B2 (de)
GB (1) GB1175601A (de)
NL (1) NL154625B (de)
SE (1) SE337262B (de)
SU (1) SU398068A3 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3893162A (en) * 1972-03-02 1975-07-01 Siemens Ag Resilient tubular member for holding a semiconductor device together under pressure
JPS5613029B2 (de) * 1973-09-21 1981-03-25
US4240093A (en) * 1976-12-10 1980-12-16 Rca Corporation Integrated circuit device including both N-channel and P-channel insulated gate field effect transistors
US4173022A (en) * 1978-05-09 1979-10-30 Rca Corp. Integrated gate field effect transistors having closed gate structure with controlled avalanche characteristics
JPS5553462A (en) * 1978-10-13 1980-04-18 Int Rectifier Corp Mosfet element
US5191396B1 (en) * 1978-10-13 1995-12-26 Int Rectifier Corp High power mosfet with low on-resistance and high breakdown voltage
US5130767C1 (en) * 1979-05-14 2001-08-14 Int Rectifier Corp Plural polygon source pattern for mosfet
US4370669A (en) * 1980-07-16 1983-01-25 General Motors Corporation Reduced source capacitance ring-shaped IGFET load transistor in mesa-type integrated circuit
JPS5727070A (en) * 1980-07-25 1982-02-13 Toshiba Corp Mos type semiconductor device
US4499482A (en) * 1981-12-22 1985-02-12 Levine Michael A Weak-source for cryogenic semiconductor device
DE3639433A1 (de) * 1986-11-18 1988-05-26 Licentia Gmbh Halbleiteranordnung
GB9201004D0 (en) * 1992-01-17 1992-03-11 Philips Electronic Associated A semiconductor device comprising an insulated gate field effect device
US5440154A (en) * 1993-07-01 1995-08-08 Lsi Logic Corporation Non-rectangular MOS device configurations for gate array type integrated circuits
US5874754A (en) * 1993-07-01 1999-02-23 Lsi Logic Corporation Microelectronic cells with bent gates and compressed minimum spacings, and method of patterning interconnections for the gates
US6097073A (en) * 1994-11-02 2000-08-01 Lsi Logic Corporation Triangular semiconductor or gate
US5742086A (en) * 1994-11-02 1998-04-21 Lsi Logic Corporation Hexagonal DRAM array
US5864165A (en) * 1994-11-02 1999-01-26 Lsi Logic Corporation Triangular semiconductor NAND gate
US5973376A (en) * 1994-11-02 1999-10-26 Lsi Logic Corporation Architecture having diamond shaped or parallelogram shaped cells
US5777360A (en) * 1994-11-02 1998-07-07 Lsi Logic Corporation Hexagonal field programmable gate array architecture
US5869371A (en) * 1995-06-07 1999-02-09 Stmicroelectronics, Inc. Structure and process for reducing the on-resistance of mos-gated power devices
AU1714700A (en) * 1998-11-09 2000-05-29 Smith Technology Development, Llc Two-dimensional amplifier
JP4794141B2 (ja) * 2004-06-03 2011-10-19 Ｏｋｉセミコンダクタ株式会社 半導体素子及びその製造方法
US10276679B2 (en) * 2017-05-30 2019-04-30 Vanguard International Semiconductor Corporation Semiconductor device and method for manufacturing the same

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3268827A (en) * 1963-04-01 1966-08-23 Rca Corp Insulated-gate field-effect transistor amplifier having means to reduce high frequency instability
US3339128A (en) * 1964-07-31 1967-08-29 Rca Corp Insulated offset gate field effect transistor
US3406298A (en) * 1965-02-03 1968-10-15 Ibm Integrated igfet logic circuit with linear resistive load
US3436622A (en) * 1966-12-20 1969-04-01 Texas Instruments Inc Compound channel insulated gate triode

Also Published As

Publication number Publication date
GB1175601A (en) 1969-12-23
NL154625B (nl) 1977-09-15
DE1614144B2 (de) 1970-11-05
DE1614144A1 (de) 1970-06-25
US3786319A (en) 1974-01-15
SE337262B (de) 1971-08-02
SU398068A3 (de) 1973-09-17
NL6704263A (de) 1967-09-29
BE696169A (de) 1967-09-01

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Legal Events

Date Code Title Description
PL Patent ceased