CH441813A - Auftreffplatte für Röntgenstrahlenbeugung - Google Patents
Auftreffplatte für RöntgenstrahlenbeugungInfo
- Publication number
- CH441813A CH441813A CH1243065A CH1243065A CH441813A CH 441813 A CH441813 A CH 441813A CH 1243065 A CH1243065 A CH 1243065A CH 1243065 A CH1243065 A CH 1243065A CH 441813 A CH441813 A CH 441813A
- Authority
- CH
- Switzerland
- Prior art keywords
- target
- greatest width
- line
- sides
- intersection
- Prior art date
Links
- 238000002441 X-ray diffraction Methods 0.000 title claims description 5
- 239000000463 material Substances 0.000 claims description 6
- 239000010445 mica Substances 0.000 claims description 3
- 229910052618 mica group Inorganic materials 0.000 claims description 3
- 230000001419 dependent effect Effects 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 1
- 239000013078 crystal Substances 0.000 description 11
- 238000005452 bending Methods 0.000 description 7
- 230000005855 radiation Effects 0.000 description 7
- 230000004075 alteration Effects 0.000 description 5
- 230000002349 favourable effect Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/315—Accessories, mechanical or electrical features monochromators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL6410514A NL6410514A (enExample) | 1964-09-10 | 1964-09-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH441813A true CH441813A (de) | 1967-08-15 |
Family
ID=19790980
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH1243065A CH441813A (de) | 1964-09-10 | 1965-09-07 | Auftreffplatte für Röntgenstrahlenbeugung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3439163A (enExample) |
| AT (1) | AT257212B (enExample) |
| BE (1) | BE669377A (enExample) |
| CH (1) | CH441813A (enExample) |
| DE (1) | DE1598850C3 (enExample) |
| GB (1) | GB1089714A (enExample) |
| NL (1) | NL6410514A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0024859A1 (en) * | 1979-08-28 | 1981-03-11 | Gec Avionics Limited | X-ray diffraction apparatus |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4132653A (en) * | 1977-06-29 | 1979-01-02 | Samson James A R | Polarization analyzer for vacuum ultraviolet and x-ray radiation |
| NL8300421A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen onderzoek apparaat met dubbel focusserend kristal. |
| NL8302263A (nl) * | 1983-06-27 | 1985-01-16 | Philips Nv | Roentgen analyse apparaat met dubbel gebogen monochromator kristal. |
| US4599741A (en) * | 1983-11-04 | 1986-07-08 | USC--Dept. of Materials Science | System for local X-ray excitation by monochromatic X-rays |
| US4752945A (en) * | 1985-11-04 | 1988-06-21 | North American Philips Corp. | Double crystal X-ray spectrometer |
| NL8801019A (nl) * | 1988-04-20 | 1989-11-16 | Philips Nv | Roentgen spectrometer met dubbel gebogen kristal. |
| WO1996034274A2 (en) * | 1995-04-26 | 1996-10-31 | Philips Electronics N.V. | Method of manufacturing an x-ray optical element for an x-ray analysis apparatus |
| WO1998028609A1 (en) * | 1996-12-20 | 1998-07-02 | Koninklijke Philips Electronics N.V. | X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature |
| US6038285A (en) * | 1998-02-02 | 2000-03-14 | Zhong; Zhong | Method and apparatus for producing monochromatic radiography with a bent laue crystal |
| US6259763B1 (en) * | 1999-05-21 | 2001-07-10 | The United States Of America As Represented By The United States Department Of Energy | X-ray imaging crystal spectrometer for extended X-ray sources |
| JP3729203B2 (ja) * | 2003-03-27 | 2005-12-21 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| US7076025B2 (en) | 2004-05-19 | 2006-07-11 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
| US7330530B2 (en) * | 2004-10-04 | 2008-02-12 | Illinois Institute Of Technology | Diffraction enhanced imaging method using a line x-ray source |
| JP2007093581A (ja) * | 2005-09-01 | 2007-04-12 | Jeol Ltd | 波長分散型ｘ線分光器 |
| US7469037B2 (en) * | 2007-04-03 | 2008-12-23 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
| US20100310041A1 (en) * | 2009-06-03 | 2010-12-09 | Adams William L | X-Ray System and Methods with Detector Interior to Focusing Element |
| JP2013096750A (ja) * | 2011-10-28 | 2013-05-20 | Hamamatsu Photonics Kk | Ｘ線分光検出装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2853617A (en) * | 1955-01-27 | 1958-09-23 | California Inst Res Found | Focusing crystal for x-rays and method of manufacture |
-
1964
- 1964-09-10 NL NL6410514A patent/NL6410514A/xx unknown
-
1965
- 1965-09-03 US US484907A patent/US3439163A/en not_active Expired - Lifetime
- 1965-09-07 CH CH1243065A patent/CH441813A/de unknown
- 1965-09-07 DE DE1598850A patent/DE1598850C3/de not_active Expired
- 1965-09-07 AT AT816665A patent/AT257212B/de active
- 1965-09-07 GB GB38161/65A patent/GB1089714A/en not_active Expired
- 1965-09-08 BE BE669377A patent/BE669377A/xx unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0024859A1 (en) * | 1979-08-28 | 1981-03-11 | Gec Avionics Limited | X-ray diffraction apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| BE669377A (enExample) | 1966-03-08 |
| DE1598850B2 (de) | 1974-01-24 |
| DE1598850A1 (de) | 1970-07-30 |
| DE1598850C3 (de) | 1974-08-08 |
| AT257212B (de) | 1967-09-25 |
| GB1089714A (en) | 1967-11-08 |
| US3439163A (en) | 1969-04-15 |
| NL6410514A (enExample) | 1966-03-11 |
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