GB1089714A - Improvements in or relating to x-ray analyzers - Google Patents

Improvements in or relating to x-ray analyzers

Info

Publication number
GB1089714A
GB1089714A GB38161/65A GB3816165A GB1089714A GB 1089714 A GB1089714 A GB 1089714A GB 38161/65 A GB38161/65 A GB 38161/65A GB 3816165 A GB3816165 A GB 3816165A GB 1089714 A GB1089714 A GB 1089714A
Authority
GB
United Kingdom
Prior art keywords
strip
line
plate
greatest width
sides
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB38161/65A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd filed Critical Philips Electronic and Associated Industries Ltd
Publication of GB1089714A publication Critical patent/GB1089714A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/315—Accessories, mechanical or electrical features monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,089,714. X-Ray diffraction apparatuscrystal plate for monochromator. PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd. Sept. 7, 1965 [Sept. 10, 1964], No. 38161/65. Heading H5R. A plate of incidence, e.g. a crystal plate or strip having parallel major surfaces, for X-ray diffraction having the shape of an elongated strip and which on being deflected by a bending force takes the shape of part of a logarithmic spiral is shaped to maximize its tendency to adapt this curvature under bending moments about the line of its greatest width by forces applied at both ends by shaping it such that the strip has four sides the four intersections of which lie on the line of greatest width of the strip and two on the central line of symmetry lying along the length of the strip and such that the two sides which meet in one of the latter two points are convex with respect to the said central line, and the two sides which meet at the other of these two points are concave with respect to the said central line. The sides are preferably curved on one side of the greatest width according to the equation and on the other side of said line according to the equation wherein A is the greatest width, B and #B are the lengths of strip on one side and on the other side respectively of the line of greatest width, r 0 is the average focus distance of the logarithmic spiral over the length of the strip, # is the Bragg angle and x is measured from the largest width in both directions. The strip is preferably constructed of mica and the deflection of the strip is such that it adopts the curvature of the logarithmic spiral, which has a reflection angle # having a cosine of 0À9. As an alternative to mica, the plate may consist of a carrier of metal coated with a substance which has properties suitable to provide the necessary deflection of X-rays. The crystal plate described above is used in monochromators, and in order to prevent weakness of the plate of incidence, the actual points of intersection on the central symmetry line may be replaced by an extended area of the strip.
GB38161/65A 1964-09-10 1965-09-07 Improvements in or relating to x-ray analyzers Expired GB1089714A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (en) 1964-09-10 1964-09-10

Publications (1)

Publication Number Publication Date
GB1089714A true GB1089714A (en) 1967-11-08

Family

ID=19790980

Family Applications (1)

Application Number Title Priority Date Filing Date
GB38161/65A Expired GB1089714A (en) 1964-09-10 1965-09-07 Improvements in or relating to x-ray analyzers

Country Status (7)

Country Link
US (1) US3439163A (en)
AT (1) AT257212B (en)
BE (1) BE669377A (en)
CH (1) CH441813A (en)
DE (1) DE1598850C3 (en)
GB (1) GB1089714A (en)
NL (1) NL6410514A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0115892A1 (en) * 1983-02-04 1984-08-15 Koninklijke Philips Electronics N.V. X-ray examination apparatus having a double focusing crystal
EP0339713A1 (en) * 1988-04-20 1989-11-02 Koninklijke Philips Electronics N.V. X-ray spectrometer having a doubly curved crystal

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
DE3071231D1 (en) * 1979-08-28 1985-12-19 Gec Avionics X-ray diffraction apparatus
NL8302263A (en) * 1983-06-27 1985-01-16 Philips Nv ROENTGEN ANALYSIS DEVICE WITH DOUBLE CURVED MONOCHROMATOR CRYSTAL.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
WO1996034274A2 (en) * 1995-04-26 1996-10-31 Philips Electronics N.V. Method of manufacturing an x-ray optical element for an x-ray analysis apparatus
EP0894264B1 (en) * 1996-12-20 2004-03-24 PANalytical B.V. X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
WO2004086018A1 (en) * 2003-03-27 2004-10-07 Rigaku Industrial Corporation X-ray fluorescence analyzer
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive x-ray spectrometer
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
EP2438431A4 (en) * 2009-06-03 2013-10-23 Thermo Scient Portable Analytical Instr Inc X-ray system and methods with detector interior to focusing element
JP2013096750A (en) * 2011-10-28 2013-05-20 Hamamatsu Photonics Kk X-ray spectral detection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0115892A1 (en) * 1983-02-04 1984-08-15 Koninklijke Philips Electronics N.V. X-ray examination apparatus having a double focusing crystal
EP0339713A1 (en) * 1988-04-20 1989-11-02 Koninklijke Philips Electronics N.V. X-ray spectrometer having a doubly curved crystal

Also Published As

Publication number Publication date
US3439163A (en) 1969-04-15
NL6410514A (en) 1966-03-11
AT257212B (en) 1967-09-25
DE1598850A1 (en) 1970-07-30
DE1598850B2 (en) 1974-01-24
CH441813A (en) 1967-08-15
DE1598850C3 (en) 1974-08-08
BE669377A (en) 1966-03-08

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