GB1089714A - Improvements in or relating to x-ray analyzers - Google Patents

Improvements in or relating to x-ray analyzers

Info

Publication number
GB1089714A
GB1089714A GB3816165A GB3816165A GB1089714A GB 1089714 A GB1089714 A GB 1089714A GB 3816165 A GB3816165 A GB 3816165A GB 3816165 A GB3816165 A GB 3816165A GB 1089714 A GB1089714 A GB 1089714A
Authority
GB
United Kingdom
Prior art keywords
strip
line
plate
greatest width
sides
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3816165A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronics UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to NL6410514A priority Critical patent/NL6410514A/xx
Application filed by Philips Electronics UK Ltd filed Critical Philips Electronics UK Ltd
Publication of GB1089714A publication Critical patent/GB1089714A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/315Accessories, mechanical or electrical features monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067Construction details

Abstract

1,089,714. X-Ray diffraction apparatuscrystal plate for monochromator. PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd. Sept. 7, 1965 [Sept. 10, 1964], No. 38161/65. Heading H5R. A plate of incidence, e.g. a crystal plate or strip having parallel major surfaces, for X-ray diffraction having the shape of an elongated strip and which on being deflected by a bending force takes the shape of part of a logarithmic spiral is shaped to maximize its tendency to adapt this curvature under bending moments about the line of its greatest width by forces applied at both ends by shaping it such that the strip has four sides the four intersections of which lie on the line of greatest width of the strip and two on the central line of symmetry lying along the length of the strip and such that the two sides which meet in one of the latter two points are convex with respect to the said central line, and the two sides which meet at the other of these two points are concave with respect to the said central line. The sides are preferably curved on one side of the greatest width according to the equation and on the other side of said line according to the equation wherein A is the greatest width, B and #B are the lengths of strip on one side and on the other side respectively of the line of greatest width, r 0 is the average focus distance of the logarithmic spiral over the length of the strip, # is the Bragg angle and x is measured from the largest width in both directions. The strip is preferably constructed of mica and the deflection of the strip is such that it adopts the curvature of the logarithmic spiral, which has a reflection angle # having a cosine of 0À9. As an alternative to mica, the plate may consist of a carrier of metal coated with a substance which has properties suitable to provide the necessary deflection of X-rays. The crystal plate described above is used in monochromators, and in order to prevent weakness of the plate of incidence, the actual points of intersection on the central symmetry line may be replaced by an extended area of the strip.
GB3816165A 1964-09-10 1965-09-07 Improvements in or relating to x-ray analyzers Expired GB1089714A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (en) 1964-09-10 1964-09-10

Publications (1)

Publication Number Publication Date
GB1089714A true GB1089714A (en) 1967-11-08

Family

ID=19790980

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3816165A Expired GB1089714A (en) 1964-09-10 1965-09-07 Improvements in or relating to x-ray analyzers

Country Status (7)

Country Link
US (1) US3439163A (en)
AT (1) AT257212B (en)
BE (1) BE669377A (en)
CH (1) CH441813A (en)
DE (1) DE1598850C3 (en)
GB (1) GB1089714A (en)
NL (1) NL6410514A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0115892A1 (en) * 1983-02-04 1984-08-15 Philips Electronics N.V. X-ray examination apparatus having a double focusing crystal
EP0339713A1 (en) * 1988-04-20 1989-11-02 Philips Electronics N.V. X-ray spectrometer having a doubly curved crystal

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
DE3071231D1 (en) * 1979-08-28 1985-12-19 Gec Avionics X-ray diffraction apparatus
NL8302263A (en) * 1983-06-27 1985-01-16 Philips Nv Roentgen analysis device with double curved monochromator crystal.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
EP0765472A2 (en) * 1995-04-26 1997-04-02 Philips Electronics N.V. Method of manufacturing an x-ray optical element for an x-ray analysis apparatus
DE69728258T2 (en) * 1996-12-20 2004-12-30 Panalytical B.V. X-RAY SPECTROMETER WITH CRYSTAL ANALYZER WITH PARTLY CONSTANT AND ILLUSTRATELY VARIABLE CURVING RADIUS
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
WO2004086018A1 (en) * 2003-03-27 2004-10-07 Rigaku Industrial Corporation X-ray fluorescence analyzer
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive x-ray spectrometer
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
JP2013096750A (en) * 2011-10-28 2013-05-20 Hamamatsu Photonics Kk X-ray spectral detection device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0115892A1 (en) * 1983-02-04 1984-08-15 Philips Electronics N.V. X-ray examination apparatus having a double focusing crystal
EP0339713A1 (en) * 1988-04-20 1989-11-02 Philips Electronics N.V. X-ray spectrometer having a doubly curved crystal

Also Published As

Publication number Publication date
US3439163A (en) 1969-04-15
BE669377A (en) 1966-03-08
AT257212B (en) 1967-09-25
NL6410514A (en) 1966-03-11
DE1598850A1 (en) 1970-07-30
DE1598850C3 (en) 1974-08-08
DE1598850B2 (en) 1974-01-24
CH441813A (en) 1967-08-15

Similar Documents

Publication Publication Date Title
Wu Approximate weight functions for center and edge cracks in finite bodies
AU476468B2 (en) Aluminium base-silicon-copper-magnesium alloys
CA1018893A (en) Mild thickened shampoo compositions with conditioning properties
DE2526913A1 (en) Device for the surface temperature increase of a body, for example the skin, with the help of electromagnetic radiation of high frequency
Chan et al. Angular shift of a Gaussian beam reflected near the Brewster angle
DE69013335T2 (en) IRON ALUMINID ALLOYS WITH IMPROVED PROPERTIES FOR HIGH TEMPERATURE USE.
BR7400942D0 (en) Apparatus for simultaneously converting a narrow and collimated beam of electromagnetic radiation into a fine electromagnetic radiation reference plane
IT961870B (en) Nickel chromium cobalt molybdenum alloy
GB1420458A (en) Dielectric waveguides
Meek et al. Approximating quadratic NURBS curves by arc splines
GB1062863A (en)
SE7612385L (en) RELAY DETERMINATION CLAMP
DE1491903B1 (en) Radar antenna with a vertically and vertically adjustable antenna mirror
GB1404717A (en) Joint assembly for metallic tubes for use particularly in the petroleum industry
ES353712A1 (en) Fuel cell tab
SU651668A3 (en) Device for crimping ends of metal pipes
GB1292623A (en) Measuring tape with attachment device for securing the end of the tape
IT1248097B (en) Procedure for resolving an ambiguity in determining the angle of view of the antenna and the doppler frequency in a synthetic aperture radar
GB1530019A (en) Autoclave
CA1015580A (en) Reagent tube and stopper assembly with spherical member dispensing means
US1708551A (en) Instrument for drafting
Klein et al. A survey of the distribution of 2.8 cm-wavelength radio continuum in nearby galaxies. V-A small sample of edge-on galaxies
AT291151B (en) Zip fastener with helical or meander-shaped fastener link chains
Norris et al. Far-field analysis of the Malyuzhinets solution for plane and surface waves diffraction by an impedance wedge
EP0025807B1 (en) Device for measuring masses and forces