GB1089714A - Improvements in or relating to x-ray analyzers - Google Patents
Improvements in or relating to x-ray analyzersInfo
- Publication number
- GB1089714A GB1089714A GB38161/65A GB3816165A GB1089714A GB 1089714 A GB1089714 A GB 1089714A GB 38161/65 A GB38161/65 A GB 38161/65A GB 3816165 A GB3816165 A GB 3816165A GB 1089714 A GB1089714 A GB 1089714A
- Authority
- GB
- United Kingdom
- Prior art keywords
- strip
- line
- plate
- greatest width
- sides
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/315—Accessories, mechanical or electrical features monochromators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1,089,714. X-Ray diffraction apparatuscrystal plate for monochromator. PHILIPS ELECTRONIC & ASSOCIATED INDUSTRIES Ltd. Sept. 7, 1965 [Sept. 10, 1964], No. 38161/65. Heading H5R. A plate of incidence, e.g. a crystal plate or strip having parallel major surfaces, for X-ray diffraction having the shape of an elongated strip and which on being deflected by a bending force takes the shape of part of a logarithmic spiral is shaped to maximize its tendency to adapt this curvature under bending moments about the line of its greatest width by forces applied at both ends by shaping it such that the strip has four sides the four intersections of which lie on the line of greatest width of the strip and two on the central line of symmetry lying along the length of the strip and such that the two sides which meet in one of the latter two points are convex with respect to the said central line, and the two sides which meet at the other of these two points are concave with respect to the said central line. The sides are preferably curved on one side of the greatest width according to the equation and on the other side of said line according to the equation wherein A is the greatest width, B and #B are the lengths of strip on one side and on the other side respectively of the line of greatest width, r 0 is the average focus distance of the logarithmic spiral over the length of the strip, # is the Bragg angle and x is measured from the largest width in both directions. The strip is preferably constructed of mica and the deflection of the strip is such that it adopts the curvature of the logarithmic spiral, which has a reflection angle # having a cosine of 0À9. As an alternative to mica, the plate may consist of a carrier of metal coated with a substance which has properties suitable to provide the necessary deflection of X-rays. The crystal plate described above is used in monochromators, and in order to prevent weakness of the plate of incidence, the actual points of intersection on the central symmetry line may be replaced by an extended area of the strip.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL6410514A NL6410514A (en) | 1964-09-10 | 1964-09-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1089714A true GB1089714A (en) | 1967-11-08 |
Family
ID=19790980
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB38161/65A Expired GB1089714A (en) | 1964-09-10 | 1965-09-07 | Improvements in or relating to x-ray analyzers |
Country Status (7)
Country | Link |
---|---|
US (1) | US3439163A (en) |
AT (1) | AT257212B (en) |
BE (1) | BE669377A (en) |
CH (1) | CH441813A (en) |
DE (1) | DE1598850C3 (en) |
GB (1) | GB1089714A (en) |
NL (1) | NL6410514A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0115892A1 (en) * | 1983-02-04 | 1984-08-15 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus having a double focusing crystal |
EP0339713A1 (en) * | 1988-04-20 | 1989-11-02 | Koninklijke Philips Electronics N.V. | X-ray spectrometer having a doubly curved crystal |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4132653A (en) * | 1977-06-29 | 1979-01-02 | Samson James A R | Polarization analyzer for vacuum ultraviolet and x-ray radiation |
DE3071231D1 (en) * | 1979-08-28 | 1985-12-19 | Gec Avionics | X-ray diffraction apparatus |
NL8302263A (en) * | 1983-06-27 | 1985-01-16 | Philips Nv | ROENTGEN ANALYSIS DEVICE WITH DOUBLE CURVED MONOCHROMATOR CRYSTAL. |
US4599741A (en) * | 1983-11-04 | 1986-07-08 | USC--Dept. of Materials Science | System for local X-ray excitation by monochromatic X-rays |
US4752945A (en) * | 1985-11-04 | 1988-06-21 | North American Philips Corp. | Double crystal X-ray spectrometer |
WO1996034274A2 (en) * | 1995-04-26 | 1996-10-31 | Philips Electronics N.V. | Method of manufacturing an x-ray optical element for an x-ray analysis apparatus |
EP0894264B1 (en) * | 1996-12-20 | 2004-03-24 | PANalytical B.V. | X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature |
US6038285A (en) * | 1998-02-02 | 2000-03-14 | Zhong; Zhong | Method and apparatus for producing monochromatic radiography with a bent laue crystal |
US6259763B1 (en) * | 1999-05-21 | 2001-07-10 | The United States Of America As Represented By The United States Department Of Energy | X-ray imaging crystal spectrometer for extended X-ray sources |
WO2004086018A1 (en) * | 2003-03-27 | 2004-10-07 | Rigaku Industrial Corporation | X-ray fluorescence analyzer |
US7076025B2 (en) | 2004-05-19 | 2006-07-11 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
US7330530B2 (en) * | 2004-10-04 | 2008-02-12 | Illinois Institute Of Technology | Diffraction enhanced imaging method using a line x-ray source |
JP2007093581A (en) * | 2005-09-01 | 2007-04-12 | Jeol Ltd | Wavelength dispersive x-ray spectrometer |
US7469037B2 (en) * | 2007-04-03 | 2008-12-23 | Illinois Institute Of Technology | Method for detecting a mass density image of an object |
EP2438431A4 (en) * | 2009-06-03 | 2013-10-23 | Thermo Scient Portable Analytical Instr Inc | X-ray system and methods with detector interior to focusing element |
JP2013096750A (en) * | 2011-10-28 | 2013-05-20 | Hamamatsu Photonics Kk | X-ray spectral detection device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2853617A (en) * | 1955-01-27 | 1958-09-23 | California Inst Res Found | Focusing crystal for x-rays and method of manufacture |
-
1964
- 1964-09-10 NL NL6410514A patent/NL6410514A/xx unknown
-
1965
- 1965-09-03 US US484907A patent/US3439163A/en not_active Expired - Lifetime
- 1965-09-07 AT AT816665A patent/AT257212B/en active
- 1965-09-07 DE DE1598850A patent/DE1598850C3/en not_active Expired
- 1965-09-07 CH CH1243065A patent/CH441813A/en unknown
- 1965-09-07 GB GB38161/65A patent/GB1089714A/en not_active Expired
- 1965-09-08 BE BE669377A patent/BE669377A/xx unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0115892A1 (en) * | 1983-02-04 | 1984-08-15 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus having a double focusing crystal |
EP0339713A1 (en) * | 1988-04-20 | 1989-11-02 | Koninklijke Philips Electronics N.V. | X-ray spectrometer having a doubly curved crystal |
Also Published As
Publication number | Publication date |
---|---|
US3439163A (en) | 1969-04-15 |
NL6410514A (en) | 1966-03-11 |
AT257212B (en) | 1967-09-25 |
DE1598850A1 (en) | 1970-07-30 |
DE1598850B2 (en) | 1974-01-24 |
CH441813A (en) | 1967-08-15 |
DE1598850C3 (en) | 1974-08-08 |
BE669377A (en) | 1966-03-08 |
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