US3439163A - X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral - Google Patents

X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral Download PDF

Info

Publication number
US3439163A
US3439163A US484907A US3439163DA US3439163A US 3439163 A US3439163 A US 3439163A US 484907 A US484907 A US 484907A US 3439163D A US3439163D A US 3439163DA US 3439163 A US3439163 A US 3439163A
Authority
US
United States
Prior art keywords
plate
incidence
rays
logarithmic spiral
strip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US484907A
Other languages
English (en)
Inventor
Wilhelmus Karel De Jongh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips North America LLC
US Philips Corp
Original Assignee
US Philips Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Philips Corp filed Critical US Philips Corp
Application granted granted Critical
Publication of US3439163A publication Critical patent/US3439163A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/315—Accessories, mechanical or electrical features monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

Definitions

  • This invention relates to a device for making a spectrochemical analyses with X-rays, and in particular to an analyzing crystal which is used in a device employing X-rays for making spectrochernical analyses.
  • a set of lattice planes of the crystal lattice, with mutual distance d, will be capable of reflecting the X-ray beam with Wavelength A only at angles of incidence 0 which satisfies this equation.
  • an analyzer which generally has the shape of an elongated strip consisting of a single crystal plate provided with parallel surfaces.
  • This plate will hereinafter be termed the plate of incidence ifOI X-rays.
  • the plate of incidence for X-rays of a given wavelength is arranged at the correct angle 0, rays originating from a source of a small cross-section will be reflected by a given zone of the plate of incidence.
  • a flat plate of incidence only a small part of the incident rays is reflected.
  • a focusing arrangement is used in which the reflecting surface of the plate of incidence is curved.
  • the most favorable arrangement is obtained by bending the plate of incidence in the form which corresponds to the curvature of the logarithmic spiral.
  • This shape of the plate of incidence enables the active surface used for the X-ray deflection, to be as large as possible.
  • rays starting from a source of finite, although none too large proportions, and of a given wavelength can be collected in a sharply bounded focus after reflection. As a result of this a high intensity of the reflected radiations is obtained.
  • the plate of incidence is an X-ray monochromator which need not necessarily consist of a single crystal. It may be a carrier which is coated with a material which reflects the radiation. In that case the carrier has a surface curved to the desired shape.
  • the required shape can be obtained by clamping the plate between two moldings which are curved in the correct manner.
  • the ends of a rectangular crystal plate are clamped in a holder of such a construction that unequal bending moments can be exerted on the two ICC ends.
  • the resulting curvature of the crystal plate is a good approximation of the logarithmic spiral and the shape can easily be adapted to various distances between the ray source and the plate of incidence.
  • the invention relates to a plate of incidence or crystal monochromator for X-ray diffraction which has the shape of an elongated strip, which strip, when deflected, assumes the shape of a part of a logarithmic spiral.
  • the surface of the plate of incidence is bounded by four sides joining one another, two opposite points of intersection of which are located on a symmetry line of the surface. The remaining two points of intersection determine the largest width of the strip. Furthermore the sides which meet in one point of intersection with the symmetry line are curved concave with respect to the said line, and the sides which meet in the opposite point of intersection are curved convex with respect to the said line.
  • Such a plate of incidence may be made from flexible single crystal plates, bounded by parallel surfaces, but may alternatively consist of flexible carrier material, for example, thin sheet steel which is laminated with substances which reflect X-rays.
  • FIG. 1 shows the arrangement for an X-ray spectrometer with logarithmically curved plate of incidence.
  • FIG. 2 diagrammatically shows the manner of deflection of the plate of incidence.
  • FIGS. 3 and 4 show embodiments of plates of incidence according to the invention.
  • FIG. 5 shows a mounting structure for supporting a deflection plate of incidence.
  • the logarithmic spiral has the characteristic feature that any radius vector from the origin 0 encloses equal angles with the surface of the curve A-B, as a result of which the origin 0 also is the focus of reflected rays of equal wavelengths.
  • a A(lx/B) (Li- 2 for x and wherein A is the largest width of the strip.
  • the plate of incidence is used as a carrier for the reflecting layer
  • substances may be used which are provided in thin layers on the surface and have properties useful for the reflection of rays.
  • the arrangement of the ends of a strip of material which tapers to points may present difliculties when the plate has a low mechanical strength. Since the ends of the plate of incidence do not contribute substantially to the reflection of rays, the plate of incidence may be extended at the ends as shown in FIG. 4, by laterally projecting wings which afford the required rigidity to the supported parts.
  • X-rays from a source 1 are deflected by a monochromator 2, which is an elongated strip of a flat crystal plate the central portion of which bears against two upright right angle members 3 of a rectangular frame 4 while the end portions rest on contact members the height of which is adjustable by screws 5 so that by turning knobs 6 the ends of the strip may be raised.
  • the deflected X-rays are received by a counter 7.
  • An X-ray crystal monochromator the reflecting surface of which is curved in the shape of parts of a logarithmic spiral the smallest radius of curvature of which is adapted to be placed closest to the source of X-rays by bending an elongated strip of a flat crystal plate having a central portion and end portions, the opposite end portions of which are deflected in the same direction with respect to the central portion, which strip is bounded by four sides joining one another in pairs, two opposite points of intersection of said sides being located at the end portions and the remaining two points of intersection being located in the central portion and determining the largest width of the strip, said sides meeting in one point of intersection at the end portion placed closest to the source being curved concave with respect to the central portion and the sides which meet in the opposite point of intersection being curved convex with respect to the central portion of the strip.

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
US484907A 1964-09-10 1965-09-03 X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral Expired - Lifetime US3439163A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (enExample) 1964-09-10 1964-09-10

Publications (1)

Publication Number Publication Date
US3439163A true US3439163A (en) 1969-04-15

Family

ID=19790980

Family Applications (1)

Application Number Title Priority Date Filing Date
US484907A Expired - Lifetime US3439163A (en) 1964-09-10 1965-09-03 X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral

Country Status (7)

Country Link
US (1) US3439163A (enExample)
AT (1) AT257212B (enExample)
BE (1) BE669377A (enExample)
CH (1) CH441813A (enExample)
DE (1) DE1598850C3 (enExample)
GB (1) GB1089714A (enExample)
NL (1) NL6410514A (enExample)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
EP0129939A1 (en) * 1983-06-27 1985-01-02 Koninklijke Philips Electronics N.V. X-ray analysis apparatus including a monochromator crystal having crystal lattice surfaces
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
US4949367A (en) * 1988-04-20 1990-08-14 U.S. Philips Corporation X-ray spectrometer having a doubly curved crystal
US5757883A (en) * 1995-04-26 1998-05-26 U.S. Philips Corporation Method of manufacturing an X-ray optical element for an X-ray analysis apparatus
US5914997A (en) * 1996-12-20 1999-06-22 U.S. Philips Corporation X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
US20060072702A1 (en) * 2004-10-04 2006-04-06 Chapman Leroy D Diffraction enhanced imaging method using a line x-ray source
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US20060153332A1 (en) * 2003-03-27 2006-07-13 Hisayuki Kohno X-ray fluorescence analyzer
US20080247511A1 (en) * 2007-04-03 2008-10-09 Wernick Miles N Method for detecting a mass density image of an object
US20100284513A1 (en) * 2005-09-01 2010-11-11 Jeol Ltd. Wavelength-dispersive X-ray spectrometer
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
US20140291518A1 (en) * 2011-10-28 2014-10-02 Hamamatsu Photonics K.K. X-ray spectrometry detector device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3071231D1 (en) * 1979-08-28 1985-12-19 Gec Avionics X-ray diffraction apparatus
NL8300421A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen onderzoek apparaat met dubbel focusserend kristal.

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
EP0129939A1 (en) * 1983-06-27 1985-01-02 Koninklijke Philips Electronics N.V. X-ray analysis apparatus including a monochromator crystal having crystal lattice surfaces
US4649557A (en) * 1983-06-27 1987-03-10 U.S. Philips Corporation X-ray analysis apparatus including a monochromator crystal having crystal lattice surfaces
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
US4949367A (en) * 1988-04-20 1990-08-14 U.S. Philips Corporation X-ray spectrometer having a doubly curved crystal
US5757883A (en) * 1995-04-26 1998-05-26 U.S. Philips Corporation Method of manufacturing an X-ray optical element for an X-ray analysis apparatus
US5914997A (en) * 1996-12-20 1999-06-22 U.S. Philips Corporation X-ray spectrometer with an analyzer crystal having a partly variable and a partly constant radius of curvature
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
US20060153332A1 (en) * 2003-03-27 2006-07-13 Hisayuki Kohno X-ray fluorescence analyzer
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US20060072702A1 (en) * 2004-10-04 2006-04-06 Chapman Leroy D Diffraction enhanced imaging method using a line x-ray source
US7330530B2 (en) 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
US20100284513A1 (en) * 2005-09-01 2010-11-11 Jeol Ltd. Wavelength-dispersive X-ray spectrometer
US7864922B2 (en) 2005-09-01 2011-01-04 Jeol Ltd. Wavelength-dispersive X-ray spectrometer
US20080247511A1 (en) * 2007-04-03 2008-10-09 Wernick Miles N Method for detecting a mass density image of an object
US7469037B2 (en) 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
US20140291518A1 (en) * 2011-10-28 2014-10-02 Hamamatsu Photonics K.K. X-ray spectrometry detector device

Also Published As

Publication number Publication date
BE669377A (enExample) 1966-03-08
NL6410514A (enExample) 1966-03-11
GB1089714A (en) 1967-11-08
AT257212B (de) 1967-09-25
DE1598850B2 (de) 1974-01-24
CH441813A (de) 1967-08-15
DE1598850C3 (de) 1974-08-08
DE1598850A1 (de) 1970-07-30

Similar Documents

Publication Publication Date Title
US3439163A (en) X-ray crystal monochromator with a reflecting surface that conforms to part of a logarithmic spiral
US2853617A (en) Focusing crystal for x-rays and method of manufacture
WO1988001428A1 (en) Instrumentation for conditioning x-ray or neutron beams
CN110530907B (zh) X射线吸收测量系统
US3143651A (en) X-ray reflection collimator adapted to focus x-radiation directly on a detector
US20150357069A1 (en) High brightness x-ray absorption spectroscopy system
Riste Singly bent graphite monochromators for neutrons
US7801272B2 (en) X-ray diffraction apparatus and X-ray diffraction method
US2922331A (en) Spectroscopic device
US20020080916A1 (en) Multilayer optics with adjustable working wavelength
WO2015187219A1 (en) X-ray absorption measurement system
JPS6020139A (ja) Ｘ線分析装置
JP2017508160A (ja) 光干渉デバイス
US5008910A (en) X-ray analysis apparatus comprising a saggitally curved analysis crystal
Suortti et al. An X-ray spectrometer for inelastic scattering experiments. II. Spectral flux and resolution
US3013470A (en) Wedge structure for a double beam spectrophotometer
US20140112452A1 (en) Double-multilayer Monochromator
US3420138A (en) Variable angle attenuated total reflection attachment
RU2080669C1 (ru) Устройство для фокусировки рентгеновского излучения
JPH06167605A (ja) 光学素子
JPH02271300A (ja) Ｘ線集光器
RU2248559C1 (ru) Фокусирующий монохроматор
Pantojas et al. A polycapillary-based X-ray optical system for diffraction applications
US2887585A (en) X-ray diffraction method and apparatus
Peele et al. Lobster-eye all-sky monitors: A comparison of one-and two-dimensional designs