AT257212B - Auftreffplatte für Röntgenstrahlenanalysatoren - Google Patents

Auftreffplatte für Röntgenstrahlenanalysatoren

Info

Publication number
AT257212B
AT257212B AT816665A AT816665A AT257212B AT 257212 B AT257212 B AT 257212B AT 816665 A AT816665 A AT 816665A AT 816665 A AT816665 A AT 816665A AT 257212 B AT257212 B AT 257212B
Authority
AT
Austria
Prior art keywords
target
ray analyzers
analyzers
ray
Prior art date
Application number
AT816665A
Other languages
English (en)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to NL6410514A priority Critical patent/NL6410514A/xx
Application filed by Philips Nv filed Critical Philips Nv
Application granted granted Critical
Publication of AT257212B publication Critical patent/AT257212B/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/315Accessories, mechanical or electrical features monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067Construction details
AT816665A 1964-09-10 1965-09-07 Auftreffplatte für Röntgenstrahlenanalysatoren AT257212B (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
NL6410514A NL6410514A (de) 1964-09-10 1964-09-10

Publications (1)

Publication Number Publication Date
AT257212B true AT257212B (de) 1967-09-25

Family

ID=19790980

Family Applications (1)

Application Number Title Priority Date Filing Date
AT816665A AT257212B (de) 1964-09-10 1965-09-07 Auftreffplatte für Röntgenstrahlenanalysatoren

Country Status (7)

Country Link
US (1) US3439163A (de)
AT (1) AT257212B (de)
BE (1) BE669377A (de)
CH (1) CH441813A (de)
DE (1) DE1598850C3 (de)
GB (1) GB1089714A (de)
NL (1) NL6410514A (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4132653A (en) * 1977-06-29 1979-01-02 Samson James A R Polarization analyzer for vacuum ultraviolet and x-ray radiation
EP0024859B1 (de) * 1979-08-28 1985-11-13 Gec Avionics Limited Röntgendiffraktometer
NL8300421A (nl) * 1983-02-04 1984-09-03 Philips Nv Roentgen onderzoek apparaat met dubbel focusserend kristal.
NL8302263A (nl) * 1983-06-27 1985-01-16 Philips Nv Roentgen analyse apparaat met dubbel gebogen monochromator kristal.
US4599741A (en) * 1983-11-04 1986-07-08 USC--Dept. of Materials Science System for local X-ray excitation by monochromatic X-rays
US4752945A (en) * 1985-11-04 1988-06-21 North American Philips Corp. Double crystal X-ray spectrometer
NL8801019A (nl) * 1988-04-20 1989-11-16 Philips Nv Roentgen spectrometer met dubbel gebogen kristal.
EP0765472A2 (de) * 1995-04-26 1997-04-02 Philips Electronics N.V. Verfahren zur herstellung eines optischen elementes im röntgenstrahlenbereich für einen röntgenanalyseapparat
DE69728258T2 (de) * 1996-12-20 2004-12-30 Panalytical B.V. Röntgenstrahlspektrometer mit kristallanalysator mit teilweise konstantem und ilweise variablem krümmungsradius
US6038285A (en) * 1998-02-02 2000-03-14 Zhong; Zhong Method and apparatus for producing monochromatic radiography with a bent laue crystal
US6259763B1 (en) * 1999-05-21 2001-07-10 The United States Of America As Represented By The United States Department Of Energy X-ray imaging crystal spectrometer for extended X-ray sources
WO2004086018A1 (ja) * 2003-03-27 2004-10-07 Rigaku Industrial Corporation 蛍光x線分析装置
US7076025B2 (en) 2004-05-19 2006-07-11 Illinois Institute Of Technology Method for detecting a mass density image of an object
US7330530B2 (en) * 2004-10-04 2008-02-12 Illinois Institute Of Technology Diffraction enhanced imaging method using a line x-ray source
JP2007093581A (ja) * 2005-09-01 2007-04-12 Jeol Ltd 波長分散型x線分光器
US7469037B2 (en) * 2007-04-03 2008-12-23 Illinois Institute Of Technology Method for detecting a mass density image of an object
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线系统和方法
JP2013096750A (ja) * 2011-10-28 2013-05-20 Hamamatsu Photonics Kk X線分光検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2853617A (en) * 1955-01-27 1958-09-23 California Inst Res Found Focusing crystal for x-rays and method of manufacture

Also Published As

Publication number Publication date
CH441813A (de) 1967-08-15
DE1598850C3 (de) 1974-08-08
US3439163A (en) 1969-04-15
BE669377A (de) 1966-03-08
NL6410514A (de) 1966-03-11
DE1598850A1 (de) 1970-07-30
GB1089714A (en) 1967-11-08
DE1598850B2 (de) 1974-01-24

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