CA3018888A1 - Semiconductor lens optimization of fabrication - Google Patents

Semiconductor lens optimization of fabrication Download PDF

Info

Publication number
CA3018888A1
CA3018888A1 CA3018888A CA3018888A CA3018888A1 CA 3018888 A1 CA3018888 A1 CA 3018888A1 CA 3018888 A CA3018888 A CA 3018888A CA 3018888 A CA3018888 A CA 3018888A CA 3018888 A1 CA3018888 A1 CA 3018888A1
Authority
CA
Canada
Prior art keywords
lenses
lens
substrate
laser
lens array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA3018888A
Other languages
English (en)
French (fr)
Inventor
Richard F. Carson
John R. Joseph
Mial E. Warren
Thomas A. Wilcox
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lumentum Operations LLC
Original Assignee
TriLumina Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TriLumina Corp filed Critical TriLumina Corp
Publication of CA3018888A1 publication Critical patent/CA3018888A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0012—Arrays characterised by the manufacturing method
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
    • G02B1/14—Protective coatings, e.g. hard coatings
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • G02B3/0043—Inhomogeneous or irregular arrays, e.g. varying shape, size, height
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • G02B3/0056—Arrays characterized by the distribution or form of lenses arranged along two different directions in a plane, e.g. honeycomb arrangement of lenses
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/003—Alignment of optical elements
    • G02B7/005—Motorised alignment
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/42—Arrays of surface emitting lasers
    • H01S5/423—Arrays of surface emitting lasers having a vertical cavity
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J2208/00—Processes carried out in the presence of solid particles; Reactors therefor
    • B01J2208/00008—Controlling the process
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J8/00—Chemical or physical processes in general, conducted in the presence of fluids and solid particles; Apparatus for such processes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0012—Arrays characterised by the manufacturing method
    • G02B3/0018—Reflow, i.e. characterized by the step of melting microstructures to form curved surfaces, e.g. manufacturing of moulds and surfaces for transfer etching
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0012—Arrays characterised by the manufacturing method
    • G02B3/0025—Machining, e.g. grinding, polishing, diamond turning, manufacturing of mould parts
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/10—Lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32—Processing objects by plasma generation
    • H01J2237/33—Processing objects by plasma generation characterised by the type of processing
    • H01J2237/334—Etching

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Laser Beam Processing (AREA)
  • Semiconductor Lasers (AREA)
  • Optical Couplings Of Light Guides (AREA)
CA3018888A 2016-04-19 2017-04-14 Semiconductor lens optimization of fabrication Abandoned CA3018888A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/133,094 2016-04-19
US15/133,094 US9927558B2 (en) 2016-04-19 2016-04-19 Semiconductor lens optimization of fabrication
PCT/US2017/027674 WO2017184455A1 (en) 2016-04-19 2017-04-14 Semiconductor lens optimization of fabrication

Publications (1)

Publication Number Publication Date
CA3018888A1 true CA3018888A1 (en) 2017-10-26

Family

ID=60038117

Family Applications (1)

Application Number Title Priority Date Filing Date
CA3018888A Abandoned CA3018888A1 (en) 2016-04-19 2017-04-14 Semiconductor lens optimization of fabrication

Country Status (7)

Country Link
US (3) US9927558B2 (enExample)
EP (2) EP4224220A1 (enExample)
JP (2) JP6987783B2 (enExample)
CN (2) CN109416417A (enExample)
CA (1) CA3018888A1 (enExample)
TW (1) TWI650583B (enExample)
WO (1) WO2017184455A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130223846A1 (en) 2009-02-17 2013-08-29 Trilumina Corporation High speed free-space optical communications
US11095365B2 (en) 2011-08-26 2021-08-17 Lumentum Operations Llc Wide-angle illuminator module
US10630053B2 (en) 2015-07-30 2020-04-21 Optipulse Inc. High power laser grid structure
US10630055B2 (en) * 2017-06-16 2020-04-21 Optipulse Inc. Graphene lens structures for use with light engine and grid laser structures
AU2016298390B2 (en) 2015-07-30 2021-09-02 Optipulse Inc. Rigid high power and high speed lasing grid structures
US9927558B2 (en) 2016-04-19 2018-03-27 Trilumina Corp. Semiconductor lens optimization of fabrication
WO2019033111A1 (en) 2017-08-11 2019-02-14 Optipulse Inc. LASER GRID STRUCTURES FOR HIGH-SPEED WIRELESS DATA TRANSFERS
US10374705B2 (en) 2017-09-06 2019-08-06 Optipulse Inc. Method and apparatus for alignment of a line-of-sight communications link
JP2020149032A (ja) * 2018-10-05 2020-09-17 株式会社リコー 光学素子、表示装置、表示システムおよび移動体
CN111381334B (zh) * 2018-12-28 2021-06-15 中国科学院长春光学精密机械与物理研究所 一种用于光学系统中光路组件的对准方法
EP4073585A1 (en) 2019-12-10 2022-10-19 TRUMPF Photonic Components GmbH Method of lithographically forming an optical structure in a semiconductor substrate

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5073041A (en) * 1990-11-13 1991-12-17 Bell Communications Research, Inc. Integrated assembly comprising vertical cavity surface-emitting laser array with Fresnel microlenses
US5316640A (en) * 1991-06-19 1994-05-31 Matsushita Electric Industrial Co., Ltd. Fabricating method of micro lens
JP3251150B2 (ja) * 1994-12-29 2002-01-28 日本板硝子株式会社 平板マイクロレンズアレイおよびその製造方法
JP3570194B2 (ja) * 1998-01-19 2004-09-29 セイコーエプソン株式会社 液晶装置、それを用いた電子機器及び液晶装置の製造方法
US6835535B2 (en) * 2000-07-31 2004-12-28 Corning Incorporated Microlens arrays having high focusing efficiency
KR20050005357A (ko) 2003-07-01 2005-01-13 삼성전자주식회사 마이크로렌즈 제작방법 및 이를 이용한 광모듈 제작방법
US7307788B2 (en) * 2004-12-03 2007-12-11 Micron Technology, Inc. Gapless microlens array and method of fabrication
US7333267B2 (en) 2003-11-26 2008-02-19 Micron Technology, Inc. Micro-lenses for CMOS imagers
JP2009500663A (ja) * 2005-06-29 2009-01-08 リフレキサイト・コーポレーション コリメーティングマイクロレンズアレイ
KR20070055764A (ko) * 2005-11-28 2007-05-31 광주과학기술원 화합물 반도체의 선택적 식각을 이용한 마이크로렌즈 및마이크로 렌즈가 집적된 광전소자 제조 방법
US8599301B2 (en) * 2006-04-17 2013-12-03 Omnivision Technologies, Inc. Arrayed imaging systems having improved alignment and associated methods
CN101473439B (zh) * 2006-04-17 2013-03-27 全视技术有限公司 阵列成像系统及相关方法
TWI319815B (en) * 2006-10-31 2010-01-21 Molding technology of optics component with micro-lens array
US10038304B2 (en) * 2009-02-17 2018-07-31 Trilumina Corp. Laser arrays for variable optical properties
US8995493B2 (en) * 2009-02-17 2015-03-31 Trilumina Corp. Microlenses for multibeam arrays of optoelectronic devices for high frequency operation
KR101632311B1 (ko) * 2010-12-30 2016-06-22 삼성전자주식회사 패널 형태의 면 카메라, 이를 적용한 광 터치스크린 및 디스플레이 장치
US9157790B2 (en) * 2012-02-15 2015-10-13 Apple Inc. Integrated optoelectronic modules with transmitter, receiver and beam-combining optics for aligning a beam axis with a collection axis
US9065239B2 (en) 2012-04-17 2015-06-23 Trilumina Corp. Multibeam array of top emitting VCSEL elements
US9369677B2 (en) 2012-11-30 2016-06-14 Qualcomm Technologies International, Ltd. Image assistance for indoor positioning
JP6175761B2 (ja) * 2012-12-03 2017-08-09 セイコーエプソン株式会社 電気光学装置及び電子機器
JP6339665B2 (ja) * 2013-04-22 2018-06-06 トリルミナ コーポレーション 高周波動作のための光電子装置のマルチビームアレイ用マイクロレンズ
US10249661B2 (en) * 2014-08-22 2019-04-02 Visera Technologies Company Limited Imaging devices with dummy patterns
US9927558B2 (en) 2016-04-19 2018-03-27 Trilumina Corp. Semiconductor lens optimization of fabrication
TWI886529B (zh) * 2023-08-01 2025-06-11 友達光電股份有限公司 顯示面板

Also Published As

Publication number Publication date
US20170299781A1 (en) 2017-10-19
JP6987783B2 (ja) 2022-01-05
TW201802497A (zh) 2018-01-16
JP2019514073A (ja) 2019-05-30
EP3446160A1 (en) 2019-02-27
JP2022043095A (ja) 2022-03-15
CN118169788A (zh) 2024-06-11
WO2017184455A1 (en) 2017-10-26
EP3446160B1 (en) 2023-11-08
US11187831B2 (en) 2021-11-30
CN109416417A (zh) 2019-03-01
US20180172885A1 (en) 2018-06-21
US9927558B2 (en) 2018-03-27
US20220082733A1 (en) 2022-03-17
TWI650583B (zh) 2019-02-11
EP4224220A1 (en) 2023-08-09
JP7402855B2 (ja) 2023-12-21
EP3446160A4 (en) 2019-12-18

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EEER Examination request

Effective date: 20180924

FZDE Discontinued

Effective date: 20220603