CA2634290A1 - Scanning system for scanning an object surface, in particular for a coordinate measurement machine - Google Patents

Scanning system for scanning an object surface, in particular for a coordinate measurement machine Download PDF

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Publication number
CA2634290A1
CA2634290A1 CA002634290A CA2634290A CA2634290A1 CA 2634290 A1 CA2634290 A1 CA 2634290A1 CA 002634290 A CA002634290 A CA 002634290A CA 2634290 A CA2634290 A CA 2634290A CA 2634290 A1 CA2634290 A1 CA 2634290A1
Authority
CA
Canada
Prior art keywords
light
transport module
scanning
module
fluid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002634290A
Other languages
English (en)
French (fr)
Inventor
Alexander Knuettel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ISIS Sentronics GmbH
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2634290A1 publication Critical patent/CA2634290A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Laminated Bodies (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Physical Vapour Deposition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CA002634290A 2005-12-23 2006-12-02 Scanning system for scanning an object surface, in particular for a coordinate measurement machine Abandoned CA2634290A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102005062130A DE102005062130A1 (de) 2005-12-23 2005-12-23 Abtastsystem zum Abtasten einer Objektoberfläche, insbesondere für eine Koordinaten-Meßmaschine
DE102005062130.9 2005-12-23
PCT/EP2006/011586 WO2007079837A1 (de) 2005-12-23 2006-12-02 Abtastsystem zum abtasten einer objektoberfläche, insbesondere für eine koordinaten-messmaschine

Publications (1)

Publication Number Publication Date
CA2634290A1 true CA2634290A1 (en) 2007-07-19

Family

ID=37697847

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002634290A Abandoned CA2634290A1 (en) 2005-12-23 2006-12-02 Scanning system for scanning an object surface, in particular for a coordinate measurement machine

Country Status (8)

Country Link
US (1) US20100220369A1 (enExample)
EP (1) EP1963781B1 (enExample)
JP (1) JP2009520955A (enExample)
AT (1) ATE472089T1 (enExample)
AU (1) AU2006334831A1 (enExample)
CA (1) CA2634290A1 (enExample)
DE (2) DE102005062130A1 (enExample)
WO (1) WO2007079837A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE502007001288D1 (de) 2007-01-02 2009-09-24 Isis Sentronics Gmbh Positionserkennungssystem zur berührungslosen interferometrischen Detektion der Ortsposition eines Zielobjektes und damit ausgestattetes Abtastsystem
DE102007008361B3 (de) 2007-02-16 2008-04-03 Isis Sentronics Gmbh Abtastsensorsystem zum berührungslosen optischen Abtasten von Objektoberflächen
FR2979143B1 (fr) 2011-08-16 2016-03-25 Univ Joseph Fourier Dispositif optique d'analyse interferometrique de l'etat de surface interne d'un tube
CN104121872B (zh) 2013-04-26 2018-04-13 通用电气公司 表面粗糙度测量装置
EP2977715B1 (en) 2014-07-23 2017-12-06 Tesa Sa Probe holder for measuring system
ES2747305T3 (es) * 2015-10-14 2020-03-10 Sturm Maschinen & Anlagenbau Gmbh Dispositivo sensor y procedimiento para la inspección de la superficie de un receptáculo hueco cilíndrico
KR102499831B1 (ko) * 2016-05-23 2023-02-14 코닝 인코포레이티드 글라스 시트의 무중력 형상 예측 방법 및 무중력 형상 기반 글라스 시트 품질 관리 방법
CN114434442B (zh) * 2022-01-21 2024-06-25 新拓三维技术(深圳)有限公司 一种基于协作机器人的自动化检测方法及系统
CN115265359B (zh) * 2022-06-23 2024-07-30 宿州捷创模具有限公司 汽车钣金验收检具

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4585379A (en) * 1980-12-27 1986-04-29 Hitachi, Ltd. Precision positioning device
US4928030A (en) * 1988-09-30 1990-05-22 Rockwell International Corporation Piezoelectric actuator
JPH07167620A (ja) * 1993-12-13 1995-07-04 Nikon Corp レーザ測定方法および測定針
DE19640495C2 (de) * 1996-10-01 1999-12-16 Leica Microsystems Vorrichtung zur konfokalen Oberflächenvermessung
DE19819762A1 (de) * 1998-05-04 1999-11-25 Bosch Gmbh Robert Interferometrische Meßeinrichtung
DE60033272T2 (de) * 1999-03-03 2007-11-29 Riken, Wako Sondenartiger formmessaufnehmer sowie nc-bearbeitungsvorrichtung und formmessverfahren unter verwendung des messaufnehmers
JP4262355B2 (ja) * 1999-05-14 2009-05-13 オリンパス株式会社 光イメージング装置
US6687010B1 (en) * 1999-09-09 2004-02-03 Olympus Corporation Rapid depth scanning optical imaging device
JP2001083077A (ja) * 1999-09-09 2001-03-30 Olympus Optical Co Ltd 光イメージング装置
DE19961684A1 (de) * 1999-12-21 2001-06-28 Philips Corp Intellectual Pty Aktuator mit einer Kugel und piezo-elektrischen Antrieben
DE10207186C1 (de) * 2002-02-21 2003-04-17 Alexander Knuettel Niederkohärenz-interferometrisches Gerät zur lichtoptischen Abtastung eines Objektes
DE10210750B4 (de) * 2002-03-12 2004-02-12 Precise Präzisionsspindeln GmbH Schnellfrequenzspindel
JP3908226B2 (ja) * 2004-02-04 2007-04-25 日本電産株式会社 スキャニング型レンジセンサ
DE102004012426A1 (de) * 2004-03-13 2005-09-29 Knüttel, Alexander, Dr. Niederkohärenz-interferometrisches Verfahren und Gerät zur lichtoptischen Abtastung von Oberflächen

Also Published As

Publication number Publication date
EP1963781B1 (de) 2010-06-23
US20100220369A1 (en) 2010-09-02
DE502006007290D1 (de) 2010-08-05
EP1963781A1 (de) 2008-09-03
ATE472089T1 (de) 2010-07-15
JP2009520955A (ja) 2009-05-28
AU2006334831A1 (en) 2007-07-19
WO2007079837A1 (de) 2007-07-19
DE102005062130A1 (de) 2007-06-28

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Legal Events

Date Code Title Description
FZDE Discontinued