CA2614819A1 - Arc/spark optical emission spectroscopy correlated with spark location - Google Patents
Arc/spark optical emission spectroscopy correlated with spark location Download PDFInfo
- Publication number
- CA2614819A1 CA2614819A1 CA002614819A CA2614819A CA2614819A1 CA 2614819 A1 CA2614819 A1 CA 2614819A1 CA 002614819 A CA002614819 A CA 002614819A CA 2614819 A CA2614819 A CA 2614819A CA 2614819 A1 CA2614819 A1 CA 2614819A1
- Authority
- CA
- Canada
- Prior art keywords
- sample
- microphones
- sound
- spark
- excitation beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000002596 correlated effect Effects 0.000 title abstract description 12
- 238000000368 spark atomic emission spectrometry Methods 0.000 title description 2
- 238000001228 spectrum Methods 0.000 claims abstract description 50
- 230000005284 excitation Effects 0.000 claims abstract description 47
- 239000000203 mixture Substances 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims description 37
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 11
- 230000008016 vaporization Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims 2
- 238000001636 atomic emission spectroscopy Methods 0.000 abstract description 15
- 239000000463 material Substances 0.000 abstract description 6
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 238000005259 measurement Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 10
- 150000002739 metals Chemical class 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 238000009659 non-destructive testing Methods 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 238000000921 elemental analysis Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 241000500881 Lepisma Species 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 230000000875 corresponding effect Effects 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 238000012306 spectroscopic technique Methods 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
- 239000011364 vaporized material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
- G01N29/0609—Display arrangements, e.g. colour displays
- G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/202—Constituents thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S5/00—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations
- G01S5/18—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations using ultrasonic, sonic, or infrasonic waves
- G01S5/26—Position of receiver fixed by co-ordinating a plurality of position lines defined by path-difference measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S5/00—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations
- G01S5/18—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations using ultrasonic, sonic, or infrasonic waves
- G01S5/30—Determining absolute distances from a plurality of spaced points of known location
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
- G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/94—Investigating contamination, e.g. dust
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Remote Sensing (AREA)
- Radar, Positioning & Navigation (AREA)
- Acoustics & Sound (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Plasma & Fusion (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US70066405P | 2005-07-20 | 2005-07-20 | |
| US60/700,664 | 2005-07-20 | ||
| PCT/US2006/027374 WO2007011729A2 (en) | 2005-07-20 | 2006-07-13 | Arc/spark optical emission spectroscopy correlated with spark location |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2614819A1 true CA2614819A1 (en) | 2007-01-25 |
Family
ID=37256875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002614819A Abandoned CA2614819A1 (en) | 2005-07-20 | 2006-07-13 | Arc/spark optical emission spectroscopy correlated with spark location |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7391508B2 (enExample) |
| EP (1) | EP1907827A2 (enExample) |
| JP (1) | JP2009503448A (enExample) |
| CA (1) | CA2614819A1 (enExample) |
| WO (1) | WO2007011729A2 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9072169B1 (en) | 2010-07-13 | 2015-06-30 | Cascodium Inc. | Pulse generator and systems and methods for using same |
| KR101242936B1 (ko) | 2010-08-03 | 2013-03-12 | 주식회사 포스코 | 스파크 위치 측정 기능을 구비한 발광분광분석기 및 발광분광분석기의 스파크 위치 측정 방법 |
| US8963555B2 (en) * | 2011-05-13 | 2015-02-24 | General Electric Company | Methods, systems, and apparatus for detecting light and acoustic waves |
| DE102015210123B4 (de) * | 2015-06-02 | 2022-03-17 | Deutsches Zentrum für Luft- und Raumfahrt e.V. | Messsystem zur Gasanalyse sowie Verfahren zur Gasanalyse |
| EP3260778B1 (en) * | 2016-06-21 | 2021-07-21 | John Zink Company, L.L.C. | System and method for electrical spark detection |
| JP6754326B2 (ja) * | 2017-07-05 | 2020-09-09 | アークレイ株式会社 | プラズマ分光分析方法 |
| JP6823555B2 (ja) * | 2017-07-05 | 2021-02-03 | アークレイ株式会社 | プラズマ分光分析方法 |
| HUP1900246A1 (hu) * | 2019-07-05 | 2021-01-28 | Univ Szegedi | Eljárás és berendezés szikrakisülési részecskegenerátor monitorozására |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4641250A (en) | 1984-06-11 | 1987-02-03 | The United States Of America As Represented By The Secretary Of The Air Force | Inspection workstation data entry method |
| US4804603A (en) | 1987-09-21 | 1989-02-14 | Eastman Kodak Company | Electrophotographic method and apparatus |
| US4973800A (en) | 1988-12-15 | 1990-11-27 | Science Accessories Corp. | Apparatus for digitizing positions on a transparency |
| ATE114815T1 (de) | 1989-04-29 | 1994-12-15 | Fisons Plc | Verfahren und vorrichtung zur optischen emissionsspektroskopie. |
| JPH0676967B2 (ja) * | 1989-06-08 | 1994-09-28 | 株式会社島津製作所 | 発光分析装置 |
| US4956824A (en) | 1989-09-12 | 1990-09-11 | Science Accessories Corp. | Position determination apparatus |
| US4991148A (en) * | 1989-09-26 | 1991-02-05 | Gilchrist Ian R | Acoustic digitizing system |
| US5050134A (en) | 1990-01-19 | 1991-09-17 | Science Accessories Corp. | Position determining apparatus |
| US5009277A (en) | 1990-03-19 | 1991-04-23 | Science Accessories Corp. | Method and apparatus for position determination |
| US5252834A (en) * | 1990-11-13 | 1993-10-12 | Union Oil Company Of California | Pulsed and gated multi-mode microspectrophotometry device and method |
| US5216817A (en) | 1992-03-18 | 1993-06-08 | Colgate-Palmolive Company | Digitizer measuring system |
| US5308936A (en) | 1992-08-26 | 1994-05-03 | Mark S. Knighton | Ultrasonic pen-type data input device |
| US5379269A (en) | 1993-01-13 | 1995-01-03 | Science Accessories Corp. | Position determining apparatus |
| US6008896A (en) * | 1998-07-01 | 1999-12-28 | National Research Council Of Canada | Method and apparatus for spectroscopic analysis of heterogeneous materials |
| US6466309B1 (en) * | 1999-02-26 | 2002-10-15 | California Institute Of Technology | Method and apparatus for chemical and topographical microanalysis |
| JP2001066255A (ja) * | 1999-08-26 | 2001-03-16 | Fujikura Ltd | 電界発光測定用試料 |
| US6359687B1 (en) * | 1999-10-12 | 2002-03-19 | Lockheed Martin Energy Research Corporation | Aerosol beam-focus laser-induced plasma spectrometer device |
| JP2002122544A (ja) * | 2000-10-16 | 2002-04-26 | Shimadzu Corp | 発光分析装置 |
| JP2002159926A (ja) * | 2000-11-27 | 2002-06-04 | Japan Steel Works Ltd:The | レーザクリーニング処理時における基板表面の洗浄状況検出装置及び方法 |
| US6777953B2 (en) * | 2001-01-24 | 2004-08-17 | General Dynamics (Otc) Aerospace, Inc. | Parallel arc fault diagnostic for aircraft wiring |
| AU2003260583A1 (en) * | 2002-04-03 | 2003-10-20 | The Regents Of The University Of California | System and method for quantitative or qualitative measurement of exogenous substances in tissue and other materials using laser-induced fluorescence spectroscopy |
| US6784429B2 (en) * | 2002-04-19 | 2004-08-31 | Energy Research Company | Apparatus and method for in situ, real time measurements of properties of liquids |
-
2006
- 2006-07-13 WO PCT/US2006/027374 patent/WO2007011729A2/en not_active Ceased
- 2006-07-13 EP EP06787302A patent/EP1907827A2/en not_active Withdrawn
- 2006-07-13 US US11/486,439 patent/US7391508B2/en not_active Expired - Fee Related
- 2006-07-13 CA CA002614819A patent/CA2614819A1/en not_active Abandoned
- 2006-07-13 JP JP2008522841A patent/JP2009503448A/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP2009503448A (ja) | 2009-01-29 |
| WO2007011729A2 (en) | 2007-01-25 |
| US7391508B2 (en) | 2008-06-24 |
| WO2007011729A3 (en) | 2007-04-26 |
| US20070019182A1 (en) | 2007-01-25 |
| EP1907827A2 (en) | 2008-04-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| FZDE | Discontinued |
Effective date: 20140715 |