JP2009503448A - スパークの位置と相関させたアーク／スパークの発光分析 - Google Patents

スパークの位置と相関させたアーク／スパークの発光分析 Download PDF

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Publication number
JP2009503448A
JP2009503448A JP2008522841A JP2008522841A JP2009503448A JP 2009503448 A JP2009503448 A JP 2009503448A JP 2008522841 A JP2008522841 A JP 2008522841A JP 2008522841 A JP2008522841 A JP 2008522841A JP 2009503448 A JP2009503448 A JP 2009503448A
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Prior art keywords
sample
microphones
spark
sound
generating
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Ceased
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JP2008522841A
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Japanese (ja)
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JP2009503448A5 (enExample
Inventor
リー グロジンズ
Original Assignee
サーモ ニトン アナライザーズ リミテッド ライアビリティ カンパニー
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Publication of JP2009503448A publication Critical patent/JP2009503448A/ja
Publication of JP2009503448A5 publication Critical patent/JP2009503448A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/202—Constituents thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S5/00—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations
    • G01S5/18—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations using ultrasonic, sonic, or infrasonic waves
    • G01S5/26—Position of receiver fixed by co-ordinating a plurality of position lines defined by path-difference measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S5/00—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations
    • G01S5/18—Position-fixing by co-ordinating two or more direction or position line determinations; Position-fixing by co-ordinating two or more distance determinations using ultrasonic, sonic, or infrasonic waves
    • G01S5/30—Determining absolute distances from a plurality of spaced points of known location
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2008522841A 2005-07-20 2006-07-13 スパークの位置と相関させたアーク／スパークの発光分析 Ceased JP2009503448A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US70066405P 2005-07-20 2005-07-20
PCT/US2006/027374 WO2007011729A2 (en) 2005-07-20 2006-07-13 Arc/spark optical emission spectroscopy correlated with spark location

Publications (2)

Publication Number Publication Date
JP2009503448A true JP2009503448A (ja) 2009-01-29
JP2009503448A5 JP2009503448A5 (enExample) 2009-07-16

Family

ID=37256875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008522841A Ceased JP2009503448A (ja) 2005-07-20 2006-07-13 スパークの位置と相関させたアーク／スパークの発光分析

Country Status (5)

Country Link
US (1) US7391508B2 (enExample)
EP (1) EP1907827A2 (enExample)
JP (1) JP2009503448A (enExample)
CA (1) CA2614819A1 (enExample)
WO (1) WO2007011729A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101242936B1 (ko) 2010-08-03 2013-03-12 주식회사 포스코 스파크 위치 측정 기능을 구비한 발광분광분석기 및 발광분광분석기의 스파크 위치 측정 방법

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9072169B1 (en) 2010-07-13 2015-06-30 Cascodium Inc. Pulse generator and systems and methods for using same
US8963555B2 (en) * 2011-05-13 2015-02-24 General Electric Company Methods, systems, and apparatus for detecting light and acoustic waves
DE102015210123B4 (de) * 2015-06-02 2022-03-17 Deutsches Zentrum für Luft- und Raumfahrt e.V. Messsystem zur Gasanalyse sowie Verfahren zur Gasanalyse
KR102403994B1 (ko) * 2016-06-21 2022-05-31 몰렉스 엘엘씨 전기 스파크 검출을 위한 시스템 및 방법
JP6823555B2 (ja) * 2017-07-05 2021-02-03 アークレイ株式会社 プラズマ分光分析方法
JP6754326B2 (ja) * 2017-07-05 2020-09-09 アークレイ株式会社 プラズマ分光分析方法
HUP1900246A1 (hu) * 2019-07-05 2021-01-28 Univ Szegedi Eljárás és berendezés szikrakisülési részecskegenerátor monitorozására

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310148A (ja) * 1989-06-08 1991-01-17 Shimadzu Corp 発光分析装置
JPH03146891A (ja) * 1989-09-26 1991-06-21 Cyber Scient Inc 音響位置検出装置
JP2001066255A (ja) * 1999-08-26 2001-03-16 Fujikura Ltd 電界発光測定用試料
JP2002122544A (ja) * 2000-10-16 2002-04-26 Shimadzu Corp 発光分析装置
JP2002159926A (ja) * 2000-11-27 2002-06-04 Japan Steel Works Ltd:The レーザクリーニング処理時における基板表面の洗浄状況検出装置及び方法

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US4641250A (en) 1984-06-11 1987-02-03 The United States Of America As Represented By The Secretary Of The Air Force Inspection workstation data entry method
US4804603A (en) 1987-09-21 1989-02-14 Eastman Kodak Company Electrophotographic method and apparatus
US4973800A (en) 1988-12-15 1990-11-27 Science Accessories Corp. Apparatus for digitizing positions on a transparency
DE69014398T2 (de) 1989-04-29 1995-04-20 Fisons Plc Verfahren und Vorrichtung zur optischen Emissionsspektroskopie.
US4956824A (en) 1989-09-12 1990-09-11 Science Accessories Corp. Position determination apparatus
US5050134A (en) 1990-01-19 1991-09-17 Science Accessories Corp. Position determining apparatus
US5009277A (en) 1990-03-19 1991-04-23 Science Accessories Corp. Method and apparatus for position determination
US5252834A (en) * 1990-11-13 1993-10-12 Union Oil Company Of California Pulsed and gated multi-mode microspectrophotometry device and method
US5216817A (en) 1992-03-18 1993-06-08 Colgate-Palmolive Company Digitizer measuring system
US5308936A (en) 1992-08-26 1994-05-03 Mark S. Knighton Ultrasonic pen-type data input device
US5379269A (en) 1993-01-13 1995-01-03 Science Accessories Corp. Position determining apparatus
US6008896A (en) 1998-07-01 1999-12-28 National Research Council Of Canada Method and apparatus for spectroscopic analysis of heterogeneous materials
US6466309B1 (en) * 1999-02-26 2002-10-15 California Institute Of Technology Method and apparatus for chemical and topographical microanalysis
US6359687B1 (en) 1999-10-12 2002-03-19 Lockheed Martin Energy Research Corporation Aerosol beam-focus laser-induced plasma spectrometer device
US6777953B2 (en) 2001-01-24 2004-08-17 General Dynamics (Otc) Aerospace, Inc. Parallel arc fault diagnostic for aircraft wiring
WO2003085376A2 (en) * 2002-04-03 2003-10-16 The Regents Of The University Of California System and method for quantitative or qualitative measurement of exogenous substances in tissue and other materials using laser-induced fluorescence spectroscopy
US6784429B2 (en) 2002-04-19 2004-08-31 Energy Research Company Apparatus and method for in situ, real time measurements of properties of liquids

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0310148A (ja) * 1989-06-08 1991-01-17 Shimadzu Corp 発光分析装置
JPH03146891A (ja) * 1989-09-26 1991-06-21 Cyber Scient Inc 音響位置検出装置
JP2001066255A (ja) * 1999-08-26 2001-03-16 Fujikura Ltd 電界発光測定用試料
JP2002122544A (ja) * 2000-10-16 2002-04-26 Shimadzu Corp 発光分析装置
JP2002159926A (ja) * 2000-11-27 2002-06-04 Japan Steel Works Ltd:The レーザクリーニング処理時における基板表面の洗浄状況検出装置及び方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101242936B1 (ko) 2010-08-03 2013-03-12 주식회사 포스코 스파크 위치 측정 기능을 구비한 발광분광분석기 및 발광분광분석기의 스파크 위치 측정 방법

Also Published As

Publication number Publication date
CA2614819A1 (en) 2007-01-25
US7391508B2 (en) 2008-06-24
US20070019182A1 (en) 2007-01-25
WO2007011729A2 (en) 2007-01-25
EP1907827A2 (en) 2008-04-09
WO2007011729A3 (en) 2007-04-26

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