CA2347765C - Column redundancy circuit with reduced signal path delay - Google Patents
Column redundancy circuit with reduced signal path delay Download PDFInfo
- Publication number
- CA2347765C CA2347765C CA002347765A CA2347765A CA2347765C CA 2347765 C CA2347765 C CA 2347765C CA 002347765 A CA002347765 A CA 002347765A CA 2347765 A CA2347765 A CA 2347765A CA 2347765 C CA2347765 C CA 2347765C
- Authority
- CA
- Canada
- Prior art keywords
- column
- redundant
- normal
- signal
- redundant column
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
- G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Logic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/182,495 | 1998-10-30 | ||
| US09/182,495 US6137735A (en) | 1998-10-30 | 1998-10-30 | Column redundancy circuit with reduced signal path delay |
| PCT/CA1999/001054 WO2000026784A1 (en) | 1998-10-30 | 1999-10-29 | Column redundancy circuit with reduced signal path delay |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2347765A1 CA2347765A1 (en) | 2000-05-11 |
| CA2347765C true CA2347765C (en) | 2008-07-29 |
Family
ID=22668727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002347765A Expired - Fee Related CA2347765C (en) | 1998-10-30 | 1999-10-29 | Column redundancy circuit with reduced signal path delay |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US6137735A (enExample) |
| EP (2) | EP1526458B8 (enExample) |
| JP (1) | JP4965025B2 (enExample) |
| KR (1) | KR100724816B1 (enExample) |
| CN (1) | CN1186725C (enExample) |
| AT (1) | ATE278217T1 (enExample) |
| AU (1) | AU1024500A (enExample) |
| CA (1) | CA2347765C (enExample) |
| DE (2) | DE69939716D1 (enExample) |
| WO (1) | WO2000026784A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100363085B1 (ko) * | 1999-11-05 | 2002-12-05 | 삼성전자 주식회사 | 리던던시 효율을 향상시키는 로우 리던던시 스킴을 갖는반도체장치 |
| JP2002050191A (ja) * | 2000-08-02 | 2002-02-15 | Fujitsu Ltd | 半導体記憶装置 |
| US6775759B2 (en) * | 2001-12-07 | 2004-08-10 | Micron Technology, Inc. | Sequential nibble burst ordering for data |
| US20040015645A1 (en) * | 2002-07-19 | 2004-01-22 | Dodd James M. | System, apparatus, and method for a flexible DRAM architecture |
| US6674673B1 (en) | 2002-08-26 | 2004-01-06 | International Business Machines Corporation | Column redundancy system and method for a micro-cell embedded DRAM (e-DRAM) architecture |
| EP1717814B1 (en) * | 2004-02-20 | 2012-09-19 | Spansion LLc | Semiconductor storage device and semiconductor storage device control method |
| US7035152B1 (en) * | 2004-10-14 | 2006-04-25 | Micron Technology, Inc. | System and method for redundancy memory decoding |
| US7251173B2 (en) * | 2005-08-02 | 2007-07-31 | Micron Technology, Inc. | Combination column redundancy system for a memory array |
| CN105355233B (zh) * | 2015-11-23 | 2018-04-10 | 清华大学 | 基于pcm反转纠错算法的高效数据写入方法 |
| CN107389211B (zh) * | 2017-06-29 | 2019-03-12 | 西安邮电大学 | 一种二进制码转温度计码电路 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4598388A (en) * | 1985-01-22 | 1986-07-01 | Texas Instruments Incorporated | Semiconductor memory with redundant column circuitry |
| JP2564507B2 (ja) * | 1985-04-16 | 1996-12-18 | 富士通株式会社 | 半導体記憶装置 |
| JPH01125799A (ja) * | 1987-11-11 | 1989-05-18 | Fujitsu Ltd | 半導体記憶装置 |
| US5270975A (en) * | 1990-03-29 | 1993-12-14 | Texas Instruments Incorporated | Memory device having a non-uniform redundancy decoder arrangement |
| DE69132951T2 (de) * | 1991-08-28 | 2002-09-12 | Oki Electric Industry Co., Ltd. | Halbleiter-speicher-vorrichtung |
| US5257229A (en) * | 1992-01-31 | 1993-10-26 | Sgs-Thomson Microelectronics, Inc. | Column redundancy architecture for a read/write memory |
| US5268866A (en) * | 1992-03-02 | 1993-12-07 | Motorola, Inc. | Memory with column redundancy and localized column redundancy control signals |
| ATE187826T1 (de) * | 1994-08-12 | 2000-01-15 | Siemens Ag | Redundanz-schaltungsanordnung für einen integrierten halbleiterspeicher |
| KR0130030B1 (ko) * | 1994-08-25 | 1998-10-01 | 김광호 | 반도체 메모리 장치의 컬럼 리던던시 회로 및 그 방법 |
| US5572470A (en) * | 1995-05-10 | 1996-11-05 | Sgs-Thomson Microelectronics, Inc. | Apparatus and method for mapping a redundant memory column to a defective memory column |
| JPH0955080A (ja) * | 1995-08-08 | 1997-02-25 | Fujitsu Ltd | 半導体記憶装置及び半導体記憶装置のセル情報の書き込み及び読み出し方法 |
| DE59510258D1 (de) * | 1995-08-09 | 2002-08-08 | Infineon Technologies Ag | Integrierte Halbleiter-Speichervorrichtung mit Redundanzschaltungsanordnung |
| US5646896A (en) * | 1995-10-31 | 1997-07-08 | Hyundai Electronics America | Memory device with reduced number of fuses |
| US5732030A (en) * | 1996-06-25 | 1998-03-24 | Texas Instruments Incorporated | Method and system for reduced column redundancy using a dual column select |
| JPH10275493A (ja) * | 1997-03-31 | 1998-10-13 | Nec Corp | 半導体記憶装置 |
| CA2202692C (en) * | 1997-04-14 | 2006-06-13 | Mosaid Technologies Incorporated | Column redundancy in semiconductor memories |
| KR100281284B1 (ko) * | 1998-06-29 | 2001-02-01 | 김영환 | 컬럼 리던던시 회로 |
-
1998
- 1998-10-30 US US09/182,495 patent/US6137735A/en not_active Expired - Lifetime
-
1999
- 1999-10-29 CN CNB998128104A patent/CN1186725C/zh not_active Expired - Lifetime
- 1999-10-29 KR KR1020017005435A patent/KR100724816B1/ko not_active Expired - Fee Related
- 1999-10-29 AU AU10245/00A patent/AU1024500A/en not_active Abandoned
- 1999-10-29 WO PCT/CA1999/001054 patent/WO2000026784A1/en not_active Ceased
- 1999-10-29 EP EP04023097A patent/EP1526458B8/en not_active Expired - Lifetime
- 1999-10-29 EP EP99953491A patent/EP1125203B1/en not_active Expired - Lifetime
- 1999-10-29 JP JP2000580093A patent/JP4965025B2/ja not_active Expired - Fee Related
- 1999-10-29 AT AT99953491T patent/ATE278217T1/de not_active IP Right Cessation
- 1999-10-29 CA CA002347765A patent/CA2347765C/en not_active Expired - Fee Related
- 1999-10-29 DE DE69939716T patent/DE69939716D1/de not_active Expired - Lifetime
- 1999-10-29 DE DE69920735T patent/DE69920735T2/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| KR20010085983A (ko) | 2001-09-07 |
| EP1526458A2 (en) | 2005-04-27 |
| EP1526458B1 (en) | 2008-10-08 |
| US6137735A (en) | 2000-10-24 |
| JP2002529874A (ja) | 2002-09-10 |
| EP1125203B1 (en) | 2004-09-29 |
| KR100724816B1 (ko) | 2007-06-04 |
| JP4965025B2 (ja) | 2012-07-04 |
| EP1526458A3 (en) | 2006-03-29 |
| CN1331818A (zh) | 2002-01-16 |
| DE69920735D1 (de) | 2004-11-04 |
| AU1024500A (en) | 2000-05-22 |
| EP1125203A1 (en) | 2001-08-22 |
| DE69939716D1 (de) | 2008-11-20 |
| CA2347765A1 (en) | 2000-05-11 |
| ATE278217T1 (de) | 2004-10-15 |
| EP1526458B8 (en) | 2008-12-24 |
| WO2000026784A1 (en) | 2000-05-11 |
| DE69920735T2 (de) | 2005-02-10 |
| CN1186725C (zh) | 2005-01-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20161031 |