BRPI0917427A2 - método para testar dispositivo de exibição de cristal líquido e dispositivo de exibição de cristal líquido - Google Patents

método para testar dispositivo de exibição de cristal líquido e dispositivo de exibição de cristal líquido

Info

Publication number
BRPI0917427A2
BRPI0917427A2 BRPI0917427A BRPI0917427A BRPI0917427A2 BR PI0917427 A2 BRPI0917427 A2 BR PI0917427A2 BR PI0917427 A BRPI0917427 A BR PI0917427A BR PI0917427 A BRPI0917427 A BR PI0917427A BR PI0917427 A2 BRPI0917427 A2 BR PI0917427A2
Authority
BR
Brazil
Prior art keywords
liquid crystal
display device
crystal display
testing
testing liquid
Prior art date
Application number
BRPI0917427A
Other languages
English (en)
Inventor
Hidetaka Mizumaki
Original Assignee
Sharp Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Kk filed Critical Sharp Kk
Publication of BRPI0917427A2 publication Critical patent/BRPI0917427A2/pt

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0404—Matrix technologies
    • G09G2300/0408—Integration of the drivers onto the display substrate
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0404—Matrix technologies
    • G09G2300/0417—Special arrangements specific to the use of low carrier mobility technology
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix
    • G09G3/3666—Control of matrices with row and column drivers using an active matrix with the matrix divided into sections
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09—Shape and layout
    • H05K2201/09209—Shape and layout details of conductors
    • H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
    • H05K2201/09781—Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/36—Assembling printed circuits with other printed circuits
    • H05K3/361—Assembling flexible printed circuits with other printed circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
BRPI0917427A 2008-08-06 2009-05-27 método para testar dispositivo de exibição de cristal líquido e dispositivo de exibição de cristal líquido BRPI0917427A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2008203543 2008-08-06
PCT/JP2009/059714 WO2010016312A1 (ja) 2008-08-06 2009-05-27 液晶表示装置の試験方法および液晶表示装置

Publications (1)

Publication Number Publication Date
BRPI0917427A2 true BRPI0917427A2 (pt) 2015-12-01

Family

ID=41663537

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0917427A BRPI0917427A2 (pt) 2008-08-06 2009-05-27 método para testar dispositivo de exibição de cristal líquido e dispositivo de exibição de cristal líquido

Country Status (7)

Country Link
US (1) US20110175800A1 (pt)
EP (1) EP2320270A4 (pt)
JP (1) JPWO2010016312A1 (pt)
CN (1) CN102112914A (pt)
BR (1) BRPI0917427A2 (pt)
RU (1) RU2473104C2 (pt)
WO (1) WO2010016312A1 (pt)

Cited By (1)

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CN110444135A (zh) * 2019-06-11 2019-11-12 重庆惠科金渝光电科技有限公司 一种显示装置及其检测方法和覆晶薄膜

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JP2013058428A (ja) * 2011-09-09 2013-03-28 Japan Display East Co Ltd コネクタ接続検査回路、表示装置、コネクタ接続検査方法及び表示装置の製造方法
KR20140004991A (ko) * 2012-07-04 2014-01-14 삼성전자주식회사 영상처리장치 및 그 제어방법
KR101953117B1 (ko) * 2012-09-05 2019-05-22 삼성전자 주식회사 자가 진단 기능을 갖는 전자 장치 및 전자 장치의 자가 진단 방법
WO2014046099A1 (ja) * 2012-09-24 2014-03-27 シャープ株式会社 画像表示装置およびその実装検査方法
CN103293771B (zh) * 2013-06-26 2015-11-25 深圳市华星光电技术有限公司 液晶配向检查机及方法
CN103323963A (zh) * 2013-07-04 2013-09-25 京东方科技集团股份有限公司 显示模组的检测电路及其制作方法、显示模组
KR20160022416A (ko) * 2014-08-19 2016-03-02 삼성디스플레이 주식회사 표시 장치 및 이의 구동 방법
KR102330882B1 (ko) * 2014-10-13 2021-11-25 삼성디스플레이 주식회사 표시 장치
TWI569238B (zh) * 2014-10-13 2017-02-01 群創光電股份有限公司 顯示面板及顯示面板自動化檢測方法
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KR102631799B1 (ko) * 2016-11-11 2024-02-02 삼성디스플레이 주식회사 표시장치 및 그의 검사방법
KR102351323B1 (ko) 2017-03-28 2022-01-17 삼성전자주식회사 디스플레이의 균열을 감지하기 위한 회로 및 이를 포함하는 전자 장치
KR102447896B1 (ko) 2017-05-16 2022-09-27 삼성디스플레이 주식회사 표시 장치 및 불량 검사 방법
KR102376976B1 (ko) * 2017-05-23 2022-03-21 삼성디스플레이 주식회사 표시 장치 및 그 검사 방법
KR102426607B1 (ko) * 2017-08-28 2022-07-28 삼성디스플레이 주식회사 표시 장치
KR102627214B1 (ko) * 2017-12-11 2024-01-18 엘지디스플레이 주식회사 유기 발광 표시 장치
CN109935181A (zh) * 2017-12-19 2019-06-25 上海和辉光电有限公司 一种驱动电路、检测连接部件阻抗的方法及显示器
CN108288459B (zh) * 2018-04-24 2019-09-10 深圳市华星光电技术有限公司 显示装置的驱动系统及驱动方法与显示装置
CN111105740B (zh) * 2018-10-29 2023-02-28 隆达电子股份有限公司 显示器电路结构、显示器以及拼接式显示器
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JP6753482B2 (ja) 2019-02-26 2020-09-09 セイコーエプソン株式会社 電気光学装置および電子機器
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Publication number Priority date Publication date Assignee Title
CN110444135A (zh) * 2019-06-11 2019-11-12 重庆惠科金渝光电科技有限公司 一种显示装置及其检测方法和覆晶薄膜
CN110444135B (zh) * 2019-06-11 2022-12-23 重庆惠科金渝光电科技有限公司 一种显示装置及其检测方法和覆晶薄膜

Also Published As

Publication number Publication date
JPWO2010016312A1 (ja) 2012-01-19
CN102112914A (zh) 2011-06-29
RU2473104C2 (ru) 2013-01-20
WO2010016312A1 (ja) 2010-02-11
EP2320270A1 (en) 2011-05-11
EP2320270A4 (en) 2012-03-28
US20110175800A1 (en) 2011-07-21
RU2011104246A (ru) 2012-09-20

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B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

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B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2384 DE 13-09-2016 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.