BRPI0822092A8 - Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico - Google Patents

Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Info

Publication number
BRPI0822092A8
BRPI0822092A8 BRPI0822092A BRPI0822092A BRPI0822092A8 BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8 BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8
Authority
BR
Brazil
Prior art keywords
target particles
sensor device
examination
microelectronic sensor
carrier
Prior art date
Application number
BRPI0822092A
Other languages
English (en)
Portuguese (pt)
Inventor
M Bruls Dominique
J H B Schleipen Johannes
A H M Kahlman Josephus
W J Prins Menno
Original Assignee
Koninklijke Philips Electronics Nv
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics Nv, Koninklijke Philips Nv filed Critical Koninklijke Philips Electronics Nv
Publication of BRPI0822092A2 publication Critical patent/BRPI0822092A2/pt
Publication of BRPI0822092A8 publication Critical patent/BRPI0822092A8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1721—Electromodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1727—Magnetomodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0691—Modulated (not pulsed supply)

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
BRPI0822092A 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico BRPI0822092A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07123741 2007-12-20
PCT/IB2008/054541 WO2009083814A2 (en) 2007-12-20 2008-10-31 Microelectronic sensor device for the detection of target particles

Publications (2)

Publication Number Publication Date
BRPI0822092A2 BRPI0822092A2 (pt) 2015-06-30
BRPI0822092A8 true BRPI0822092A8 (pt) 2016-03-22

Family

ID=40671102

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0822092A BRPI0822092A8 (pt) 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Country Status (7)

Country Link
US (1) US8486689B2 (enExample)
EP (1) EP2225547B1 (enExample)
JP (1) JP2011508199A (enExample)
CN (1) CN101903758B (enExample)
BR (1) BRPI0822092A8 (enExample)
RU (1) RU2489704C2 (enExample)
WO (1) WO2009083814A2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120077206A1 (en) 2003-07-12 2012-03-29 Accelr8 Technology Corporation Rapid Microbial Detection and Antimicrobial Susceptibility Testing
WO2005027714A2 (en) 2003-07-12 2005-03-31 Accelr8 Technology Corporation Sensitive and rapid biodetection
ATE513200T1 (de) * 2007-10-25 2011-07-15 Koninkl Philips Electronics Nv Sensorvorrichtung für zielpartikel in einer probe
CN102575976B (zh) * 2009-09-28 2016-03-30 皇家飞利浦电子股份有限公司 物质确定设备
JP5463840B2 (ja) * 2009-10-09 2014-04-09 コニカミノルタ株式会社 測定方法及び表面プラズモン増強蛍光測定装置
WO2011073866A1 (en) * 2009-12-18 2011-06-23 Koninklijke Philips Electronics N.V. Substance determining apparatus
WO2011073867A1 (en) * 2009-12-18 2011-06-23 Koninklijke Philips Electronics N.V. Substance determining apparatus
BR112012030422A2 (pt) 2010-06-02 2017-06-13 Koninl Philips Electronics Nv aparelho para manipulações ópticas de uma amostra em uma câmara de amostra e uso do aparelho
US10254204B2 (en) 2011-03-07 2019-04-09 Accelerate Diagnostics, Inc. Membrane-assisted purification
US9434937B2 (en) 2011-03-07 2016-09-06 Accelerate Diagnostics, Inc. Rapid cell purification systems
US9274104B2 (en) 2011-03-30 2016-03-01 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
JP5814806B2 (ja) * 2011-03-30 2015-11-17 株式会社東芝 光導波路型測定システム、測定方法及び光導波路型センサチップ
EP2541230A1 (en) * 2011-06-30 2013-01-02 Koninklijke Philips Electronics N.V. Detection of clusters of magnetic particles
IN2014CN02659A (enExample) * 2011-10-20 2015-06-26 Koninkl Philips Nv
DE102011088880A1 (de) * 2011-12-16 2013-06-20 Robert Bosch Gmbh Schlauchbeutelmaschine zur Abfüllung eines Produkts
US9677109B2 (en) 2013-03-15 2017-06-13 Accelerate Diagnostics, Inc. Rapid determination of microbial growth and antimicrobial susceptibility
JP6263884B2 (ja) * 2013-07-18 2018-01-24 コニカミノルタ株式会社 表面プラズモン増強蛍光測定装置および表面プラズモン増強蛍光測定方法
JP6263887B2 (ja) * 2013-07-22 2018-01-24 コニカミノルタ株式会社 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置
JP2014025951A (ja) * 2013-10-28 2014-02-06 Konica Minolta Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2015025820A (ja) * 2014-11-04 2015-02-05 株式会社東芝 光導波路型測定システムおよび糖化ヘモグロビンの測定方法
US9759651B2 (en) 2014-12-23 2017-09-12 Magellan Diagnostics, Inc. Combination optical hemoglobin and electrochemical lead assay
CN104777136B (zh) * 2015-03-25 2018-06-19 深圳市贝沃德克生物技术研究院有限公司 基于表面等离子共振技术的生物标志物检测方法与系统
US10253355B2 (en) 2015-03-30 2019-04-09 Accelerate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing
KR20170132856A (ko) 2015-03-30 2017-12-04 액셀러레이트 다이어그노스틱스, 아이엔씨. 신속한 미생물 동정 및 항균제 감수성 시험을 위한 기기 및 시스템
US10928305B2 (en) 2015-06-30 2021-02-23 Imec Vzw Modulation of luminescent dyes
CN105929149B (zh) * 2016-04-26 2018-09-11 中国科学院电子学研究所 一种基于磁富集和全内反射的光学检测仪
RU177920U1 (ru) * 2016-11-30 2018-03-15 Общество с ограниченной ответственностью "ГемаКор Лабс" (ООО "ГемаКор Лабс") Устройство мониторинга пространственно-временной динамики тромбина
JP7290243B2 (ja) * 2019-03-29 2023-06-13 Ｔｉａｎｍａ Ｊａｐａｎ株式会社 ガス検知装置
US11467093B2 (en) * 2019-10-24 2022-10-11 Ming Chuan University Electrical polarity adjustable biosensor based on lossy mode resonance, biosensing system, and method of using the same
US12442756B2 (en) * 2020-09-04 2025-10-14 The Regents Of The University Of Colorado Method and system for determining at least one property of magnetic matter
CN115615960B (zh) * 2022-12-14 2023-03-21 中节能(达州)新材料有限公司 一种玻璃微珠涂层反光性能测试平台
CN120507700B (zh) * 2025-07-22 2025-10-17 中国科学院空间应用工程与技术中心 一种月壤单颗粒磁化率测定计算方法、系统、装置和电子设备

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL103674A0 (en) * 1991-11-19 1993-04-04 Houston Advanced Res Center Method and apparatus for molecule detection
ATE173338T1 (de) 1992-02-08 1998-11-15 Genera Tech Ltd Analyseverfahren
US6333200B1 (en) * 1998-07-27 2001-12-25 University Of Delaware Miniaturized immunosensor assembled from colloidal particles between micropatterned electrodes
CN1185492C (zh) * 1999-03-15 2005-01-19 清华大学 可单点选通式微电磁单元阵列芯片、电磁生物芯片及应用
RU2166751C1 (ru) * 2000-03-09 2001-05-10 Никитин Петр Иванович Способ анализа смеси биологических и/или химических компонентов с использованием магнитных частиц и устройство для его осуществления
DE60110604T2 (de) * 2000-06-14 2006-01-19 Board of Regents, The University of Texas System, Austin Dielektrisch-hergestellte mikropartikel
WO2002082078A2 (en) * 2001-04-09 2002-10-17 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Activated enzyme-linked detection systems for detecting and quantifying nucleid acids, antigens antibodies and other analytes
AU2002329186A1 (en) * 2001-06-21 2003-01-08 Virginia Tech Intellectual Properties, Inc. Electro-optical detection device
US20030068655A1 (en) 2001-09-12 2003-04-10 Protiveris, Inc. Microcantilever apparatus and methods for detection of enzymes
JP2003098075A (ja) * 2001-09-26 2003-04-03 Fuji Photo Film Co Ltd 全反射減衰を利用したセンサー
WO2005027714A2 (en) 2003-07-12 2005-03-31 Accelr8 Technology Corporation Sensitive and rapid biodetection
JP2006071300A (ja) * 2004-08-31 2006-03-16 Hitachi Ltd 生化学物質検出装置
US20070023643A1 (en) * 2005-02-01 2007-02-01 Nolte David D Differentially encoded biological analyzer planar array apparatus and methods
JP2006322878A (ja) * 2005-05-20 2006-11-30 Matsushita Electric Ind Co Ltd サンプル中のリガンドの分析方法及びサンプル中のリガンドを分析する装置
JP2006337038A (ja) * 2005-05-31 2006-12-14 Matsushita Electric Ind Co Ltd サンプル中のリガンドの分析方法およびサンプル中のリガンドを分析する装置
US20080206892A1 (en) * 2005-06-17 2008-08-28 Koninklijke Philips Electronics, N.V. Rapid Magnetic Biosensor With Integrated Arrival Time Measuremnt
CN101029776B (zh) * 2006-02-27 2011-10-05 李建民 一种热管太阳能热能利用系统
US20090181464A1 (en) * 2006-05-09 2009-07-16 Koninklijke Philips Electronics N.V. Accurate magnetic biosensor
US20090219012A1 (en) * 2006-05-09 2009-09-03 Koninklijke Philips Electronics N.V. Microelectronic sensor device for concentration measurements
US20090109441A1 (en) * 2006-05-16 2009-04-30 Nile Hartman Method and apparatus for enhancing waveguide sensor signal
EP1972927A1 (en) * 2007-03-14 2008-09-24 Koninklijke Philips Electronics N.V. Microelectronic sensor device for detecting label particles
ATE513200T1 (de) * 2007-10-25 2011-07-15 Koninkl Philips Electronics Nv Sensorvorrichtung für zielpartikel in einer probe

Also Published As

Publication number Publication date
RU2010130170A (ru) 2012-01-27
CN101903758B (zh) 2013-05-08
JP2011508199A (ja) 2011-03-10
EP2225547A2 (en) 2010-09-08
EP2225547B1 (en) 2016-07-27
BRPI0822092A2 (pt) 2015-06-30
US8486689B2 (en) 2013-07-16
CN101903758A (zh) 2010-12-01
RU2489704C2 (ru) 2013-08-10
WO2009083814A2 (en) 2009-07-09
US20100267165A1 (en) 2010-10-21
WO2009083814A3 (en) 2009-10-15

Similar Documents

Publication Publication Date Title
BRPI0822092A8 (pt) Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico
ATE531312T1 (de) Optische messvorrichtung
BRPI0518876A2 (pt) aparelho e mÉtodo para tratamento de uma amostra de material com luz
JP2005502060A5 (enExample)
TW200624974A (en) Touchscreens for displays
EP2108919A3 (en) Interferometer for determining characteristics of an object surface
JP2006194898A5 (enExample)
TW200702656A (en) Surface defect inspection apparatus
BRPI0210579B8 (pt) anticorpo e composição farmacêutica
WO2010011357A3 (en) Detection of prostate cancer using psa glycosylation patterns
WO2007100648A3 (en) Depth-resolved reflectance instrument and method for its use
FI4209510T3 (fi) Anti-PD-L1-vasta-aineita ja niiden käyttö T-solutoiminnan tehostamiseksi
ATE423972T1 (de) Vorrichtung und verfahren um gleichzeitig verschiedene antikörper und antigene nachzuweisen in klinischen, nahrungsmittel- und umwelt-proben
KR102216459B1 (ko) 면역크로마토그래피법에서의 광 반사재를 사용한 검출광의 증강 방법
WO2009013706A3 (en) Microelectronic sensor device for optical examinations with total internal reflection
GB2404022A9 (en) Detection of methamphetamine class of drugs
BRPI0704890A (pt) dispositivo de detecção, uso de um dispositivo de detecção, processo de detecção e plataforma de uma estação de metrÈ
TW200745530A (en) Lighting-assisted testing of an optoelectronic module
ATE203345T1 (de) Vorrichtung zur detektion von eigenschaften eines blattguts
TW200643406A (en) Inspection device of superconductive wire and the method of the same
SG157244A1 (en) Point of care test for the detection of exposure or immunity to dengue virus
FR2735238B1 (fr) Utilisation d'un complexe phycobiliproteine-peptide de liaison en tant que traceur fluorescent
GB201117623D0 (en) Fluorescence gas and liquid sensor
TW200745535A (en) In-line quadrature and anti-reflection enhanced phase quadrature interferometric detection
CN101957312B (zh) 珍珠真伪鉴别的无损检测装置

Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2435 DE 05-09-2017 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.