BRPI0822092A8 - Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico - Google Patents
Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônicoInfo
- Publication number
- BRPI0822092A8 BRPI0822092A8 BRPI0822092A BRPI0822092A BRPI0822092A8 BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8 BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A8 BRPI0822092 A8 BR PI0822092A8
- Authority
- BR
- Brazil
- Prior art keywords
- target particles
- sensor device
- examination
- microelectronic sensor
- carrier
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
- G01N2021/1721—Electromodulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
- G01N2021/1727—Magnetomodulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/069—Supply of sources
- G01N2201/0691—Modulated (not pulsed supply)
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Abstract
DISPOSITIVO SENSOR MICROELETRÔNICO PARA O EXAME DE PARTÍCULAS ALVO, MÉTODO PARA O EXAME DAS PARTÍCULAS ALVO, E, USO DO DISPOSITIVO SENSOR MICROELETRÔNICO. A invenção refere-se a um dispositivo sensor microeletrônico para o exame das partículas alvo (1) que são ligadas aos sítios de ligação (3) na superfície de ligação (12) de um portador (11). Em uma forma de realização preferida, um feixe de luz de entrada (L1) é transmitido para dentro do portador (11), em que uma reflexão interna total frustrada (FTIR) ocorre na superficie de ligação (12). A quantidade de luz em um feixe de luz de saída resultante (L2) é detectada por um detector de luz (31) e provê informação acerca da presença de partículas alvo na superfície de ligação. Além disso, uma unidade de atuação (50) induz movimentos das partículas alvo ligadas (1), particularmente com uma dada frequência de modulação (CO1n), de modo que por uma desmodulação do sinal detector (S) os efeitos das partículas alvo podem ser distinguidos do segundo plano.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07123741 | 2007-12-20 | ||
PCT/IB2008/054541 WO2009083814A2 (en) | 2007-12-20 | 2008-10-31 | Microelectronic sensor device for the detection of target particles |
Publications (2)
Publication Number | Publication Date |
---|---|
BRPI0822092A2 BRPI0822092A2 (pt) | 2015-06-30 |
BRPI0822092A8 true BRPI0822092A8 (pt) | 2016-03-22 |
Family
ID=40671102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0822092A BRPI0822092A8 (pt) | 2007-12-20 | 2008-10-31 | Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico |
Country Status (7)
Country | Link |
---|---|
US (1) | US8486689B2 (pt) |
EP (1) | EP2225547B1 (pt) |
JP (1) | JP2011508199A (pt) |
CN (1) | CN101903758B (pt) |
BR (1) | BRPI0822092A8 (pt) |
RU (1) | RU2489704C2 (pt) |
WO (1) | WO2009083814A2 (pt) |
Families Citing this family (30)
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US20120077206A1 (en) | 2003-07-12 | 2012-03-29 | Accelr8 Technology Corporation | Rapid Microbial Detection and Antimicrobial Susceptibility Testing |
WO2005027714A2 (en) | 2003-07-12 | 2005-03-31 | Accelr8 Technology Corporation | Sensitive and rapid biodetection |
CN101836102B (zh) * | 2007-10-25 | 2012-02-29 | 皇家飞利浦电子股份有限公司 | 用于样品中靶粒子的传感器装置 |
US9772272B2 (en) | 2009-09-28 | 2017-09-26 | Koninklijke Philips N.V. | Substance determining apparatus |
JP5463840B2 (ja) * | 2009-10-09 | 2014-04-09 | コニカミノルタ株式会社 | 測定方法及び表面プラズモン増強蛍光測定装置 |
EP2513637B1 (en) | 2009-12-18 | 2020-07-15 | Koninklijke Philips N.V. | Substance determining apparatus |
CN102667452B (zh) * | 2009-12-18 | 2014-12-24 | 皇家飞利浦电子股份有限公司 | 物质确定设备 |
US20130094019A1 (en) | 2010-06-02 | 2013-04-18 | Koninklijke Philips Electronics N.V. | Sample carrier with light refracting structures |
ES2551922T3 (es) | 2011-03-07 | 2015-11-24 | Accelerate Diagnostics, Inc. | Sistemas rápidos de purificación celular |
US10254204B2 (en) | 2011-03-07 | 2019-04-09 | Accelerate Diagnostics, Inc. | Membrane-assisted purification |
JP5814806B2 (ja) * | 2011-03-30 | 2015-11-17 | 株式会社東芝 | 光導波路型測定システム、測定方法及び光導波路型センサチップ |
EP2801824A3 (en) | 2011-03-30 | 2015-02-25 | Kabushiki Kaisha Toshiba | Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle |
EP2541230A1 (en) * | 2011-06-30 | 2013-01-02 | Koninklijke Philips Electronics N.V. | Detection of clusters of magnetic particles |
JP6054405B2 (ja) * | 2011-10-20 | 2016-12-27 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 培養期間を用いた磁性粒子の検出 |
DE102011088880A1 (de) * | 2011-12-16 | 2013-06-20 | Robert Bosch Gmbh | Schlauchbeutelmaschine zur Abfüllung eines Produkts |
US9677109B2 (en) | 2013-03-15 | 2017-06-13 | Accelerate Diagnostics, Inc. | Rapid determination of microbial growth and antimicrobial susceptibility |
JP6263884B2 (ja) * | 2013-07-18 | 2018-01-24 | コニカミノルタ株式会社 | 表面プラズモン増強蛍光測定装置および表面プラズモン増強蛍光測定方法 |
JP6263887B2 (ja) * | 2013-07-22 | 2018-01-24 | コニカミノルタ株式会社 | 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置 |
JP2014025951A (ja) * | 2013-10-28 | 2014-02-06 | Konica Minolta Inc | 測定方法及び表面プラズモン増強蛍光測定装置 |
JP2015025820A (ja) * | 2014-11-04 | 2015-02-05 | 株式会社東芝 | 光導波路型測定システムおよび糖化ヘモグロビンの測定方法 |
US9759651B2 (en) | 2014-12-23 | 2017-09-12 | Magellan Diagnostics, Inc. | Combination optical hemoglobin and electrochemical lead assay |
CN104777136B (zh) * | 2015-03-25 | 2018-06-19 | 深圳市贝沃德克生物技术研究院有限公司 | 基于表面等离子共振技术的生物标志物检测方法与系统 |
EP3278115A2 (en) | 2015-03-30 | 2018-02-07 | Accelerate Diagnostics, Inc. | Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing |
US10253355B2 (en) | 2015-03-30 | 2019-04-09 | Accelerate Diagnostics, Inc. | Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing |
US10928305B2 (en) | 2015-06-30 | 2021-02-23 | Imec Vzw | Modulation of luminescent dyes |
CN105929149B (zh) * | 2016-04-26 | 2018-09-11 | 中国科学院电子学研究所 | 一种基于磁富集和全内反射的光学检测仪 |
RU177920U1 (ru) * | 2016-11-30 | 2018-03-15 | Общество с ограниченной ответственностью "ГемаКор Лабс" (ООО "ГемаКор Лабс") | Устройство мониторинга пространственно-временной динамики тромбина |
JP7290243B2 (ja) | 2019-03-29 | 2023-06-13 | Tianma Japan株式会社 | ガス検知装置 |
US11467093B2 (en) * | 2019-10-24 | 2022-10-11 | Ming Chuan University | Electrical polarity adjustable biosensor based on lossy mode resonance, biosensing system, and method of using the same |
CN115615960B (zh) * | 2022-12-14 | 2023-03-21 | 中节能(达州)新材料有限公司 | 一种玻璃微珠涂层反光性能测试平台 |
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EP1972927A1 (en) * | 2007-03-14 | 2008-09-24 | Koninklijke Philips Electronics N.V. | Microelectronic sensor device for detecting label particles |
CN101836102B (zh) * | 2007-10-25 | 2012-02-29 | 皇家飞利浦电子股份有限公司 | 用于样品中靶粒子的传感器装置 |
-
2008
- 2008-10-31 RU RU2010130170/28A patent/RU2489704C2/ru not_active IP Right Cessation
- 2008-10-31 US US12/747,529 patent/US8486689B2/en active Active
- 2008-10-31 BR BRPI0822092A patent/BRPI0822092A8/pt not_active IP Right Cessation
- 2008-10-31 WO PCT/IB2008/054541 patent/WO2009083814A2/en active Application Filing
- 2008-10-31 EP EP08866200.2A patent/EP2225547B1/en active Active
- 2008-10-31 JP JP2010538959A patent/JP2011508199A/ja active Pending
- 2008-10-31 CN CN2008801211159A patent/CN101903758B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
RU2010130170A (ru) | 2012-01-27 |
CN101903758B (zh) | 2013-05-08 |
EP2225547A2 (en) | 2010-09-08 |
US8486689B2 (en) | 2013-07-16 |
RU2489704C2 (ru) | 2013-08-10 |
US20100267165A1 (en) | 2010-10-21 |
BRPI0822092A2 (pt) | 2015-06-30 |
JP2011508199A (ja) | 2011-03-10 |
EP2225547B1 (en) | 2016-07-27 |
WO2009083814A3 (en) | 2009-10-15 |
CN101903758A (zh) | 2010-12-01 |
WO2009083814A2 (en) | 2009-07-09 |
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B25D | Requested change of name of applicant approved |
Owner name: KONINKLIJKE PHILIPS N. V. (NL) |
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B25G | Requested change of headquarter approved |
Owner name: KONINKLIJKE PHILIPS N. V. (NL) |
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B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] | ||
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2435 DE 05-09-2017 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |