BRPI0822092A2 - Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico - Google Patents

Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Info

Publication number
BRPI0822092A2
BRPI0822092A2 BRPI0822092-1A BRPI0822092A BRPI0822092A2 BR PI0822092 A2 BRPI0822092 A2 BR PI0822092A2 BR PI0822092 A BRPI0822092 A BR PI0822092A BR PI0822092 A2 BRPI0822092 A2 BR PI0822092A2
Authority
BR
Brazil
Prior art keywords
sensor device
target particle
microelectronic sensor
particle examination
examination
Prior art date
Application number
BRPI0822092-1A
Other languages
English (en)
Inventor
Dominique M Bruls
Johannes J H B Schleipen
Josephus A H M Kahlman
Menno W J Prins
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of BRPI0822092A2 publication Critical patent/BRPI0822092A2/pt
Publication of BRPI0822092A8 publication Critical patent/BRPI0822092A8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1721—Electromodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1727—Magnetomodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0691—Modulated (not pulsed supply)

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
BRPI0822092A 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico BRPI0822092A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07123741 2007-12-20
PCT/IB2008/054541 WO2009083814A2 (en) 2007-12-20 2008-10-31 Microelectronic sensor device for the detection of target particles

Publications (2)

Publication Number Publication Date
BRPI0822092A2 true BRPI0822092A2 (pt) 2015-06-30
BRPI0822092A8 BRPI0822092A8 (pt) 2016-03-22

Family

ID=40671102

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0822092A BRPI0822092A8 (pt) 2007-12-20 2008-10-31 Dispositivo sensor microeletrônico para o exame de partículas alvo, método para o exame das partículas alvo, e, uso do dispositivo sensor microeletrônico

Country Status (7)

Country Link
US (1) US8486689B2 (pt)
EP (1) EP2225547B1 (pt)
JP (1) JP2011508199A (pt)
CN (1) CN101903758B (pt)
BR (1) BRPI0822092A8 (pt)
RU (1) RU2489704C2 (pt)
WO (1) WO2009083814A2 (pt)

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CN102667452B (zh) * 2009-12-18 2014-12-24 皇家飞利浦电子股份有限公司 物质确定设备
US10876964B2 (en) 2009-12-18 2020-12-29 Koninklijke Philips N.V. System, apparatus and method for determining a substance within a fluid
US20130094019A1 (en) 2010-06-02 2013-04-18 Koninklijke Philips Electronics N.V. Sample carrier with light refracting structures
US10254204B2 (en) 2011-03-07 2019-04-09 Accelerate Diagnostics, Inc. Membrane-assisted purification
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EP2506014B1 (en) 2011-03-30 2014-08-06 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
EP2541230A1 (en) * 2011-06-30 2013-01-02 Koninklijke Philips Electronics N.V. Detection of clusters of magnetic particles
JP6054405B2 (ja) * 2011-10-20 2016-12-27 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 培養期間を用いた磁性粒子の検出
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JP6263884B2 (ja) * 2013-07-18 2018-01-24 コニカミノルタ株式会社 表面プラズモン増強蛍光測定装置および表面プラズモン増強蛍光測定方法
JP6263887B2 (ja) * 2013-07-22 2018-01-24 コニカミノルタ株式会社 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置
JP2014025951A (ja) * 2013-10-28 2014-02-06 Konica Minolta Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2015025820A (ja) * 2014-11-04 2015-02-05 株式会社東芝 光導波路型測定システムおよび糖化ヘモグロビンの測定方法
US9759651B2 (en) * 2014-12-23 2017-09-12 Magellan Diagnostics, Inc. Combination optical hemoglobin and electrochemical lead assay
CN104777136B (zh) * 2015-03-25 2018-06-19 深圳市贝沃德克生物技术研究院有限公司 基于表面等离子共振技术的生物标志物检测方法与系统
US10023895B2 (en) 2015-03-30 2018-07-17 Accelerate Diagnostics, Inc. Instrument and system for rapid microogranism identification and antimicrobial agent susceptibility testing
US10253355B2 (en) 2015-03-30 2019-04-09 Accelerate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing
US10928305B2 (en) 2015-06-30 2021-02-23 Imec Vzw Modulation of luminescent dyes
CN105929149B (zh) * 2016-04-26 2018-09-11 中国科学院电子学研究所 一种基于磁富集和全内反射的光学检测仪
RU177920U1 (ru) * 2016-11-30 2018-03-15 Общество с ограниченной ответственностью "ГемаКор Лабс" (ООО "ГемаКор Лабс") Устройство мониторинга пространственно-временной динамики тромбина
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Also Published As

Publication number Publication date
JP2011508199A (ja) 2011-03-10
BRPI0822092A8 (pt) 2016-03-22
WO2009083814A3 (en) 2009-10-15
RU2489704C2 (ru) 2013-08-10
CN101903758B (zh) 2013-05-08
US20100267165A1 (en) 2010-10-21
WO2009083814A2 (en) 2009-07-09
EP2225547A2 (en) 2010-09-08
RU2010130170A (ru) 2012-01-27
CN101903758A (zh) 2010-12-01
EP2225547B1 (en) 2016-07-27
US8486689B2 (en) 2013-07-16

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N. V. (NL)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2435 DE 05-09-2017 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.