JP2011508199A - 標的粒子を検出するためのマイクロエレクトロニクスセンサデバイス - Google Patents

標的粒子を検出するためのマイクロエレクトロニクスセンサデバイス Download PDF

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Publication number
JP2011508199A
JP2011508199A JP2010538959A JP2010538959A JP2011508199A JP 2011508199 A JP2011508199 A JP 2011508199A JP 2010538959 A JP2010538959 A JP 2010538959A JP 2010538959 A JP2010538959 A JP 2010538959A JP 2011508199 A JP2011508199 A JP 2011508199A
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JP
Japan
Prior art keywords
target
light beam
sensor device
target particle
modulation
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Pending
Application number
JP2010538959A
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English (en)
Japanese (ja)
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JP2011508199A5 (enExample
Inventor
エム ブリュルス，ドミニク
イェー ハー ベー スフレイペン，ヨーハネス
アー ハー エム カールマン，ヨゼフュス
ウェー イェー プリンス，メンノ
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Koninklijke Philips NV
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Koninklijke Philips NV
Koninklijke Philips Electronics NV
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Application filed by Koninklijke Philips NV, Koninklijke Philips Electronics NV filed Critical Koninklijke Philips NV
Publication of JP2011508199A publication Critical patent/JP2011508199A/ja
Publication of JP2011508199A5 publication Critical patent/JP2011508199A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1721—Electromodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G01N2021/1727—Magnetomodulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0691—Modulated (not pulsed supply)

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP2010538959A 2007-12-20 2008-10-31 標的粒子を検出するためのマイクロエレクトロニクスセンサデバイス Pending JP2011508199A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP07123741 2007-12-20
PCT/IB2008/054541 WO2009083814A2 (en) 2007-12-20 2008-10-31 Microelectronic sensor device for the detection of target particles

Publications (2)

Publication Number Publication Date
JP2011508199A true JP2011508199A (ja) 2011-03-10
JP2011508199A5 JP2011508199A5 (enExample) 2012-02-16

Family

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Family Applications (1)

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JP2010538959A Pending JP2011508199A (ja) 2007-12-20 2008-10-31 標的粒子を検出するためのマイクロエレクトロニクスセンサデバイス

Country Status (7)

Country Link
US (1) US8486689B2 (enExample)
EP (1) EP2225547B1 (enExample)
JP (1) JP2011508199A (enExample)
CN (1) CN101903758B (enExample)
BR (1) BRPI0822092A8 (enExample)
RU (1) RU2489704C2 (enExample)
WO (1) WO2009083814A2 (enExample)

Cited By (9)

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JP2011080935A (ja) * 2009-10-09 2011-04-21 Konica Minolta Holdings Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2012215553A (ja) * 2011-03-30 2012-11-08 Toshiba Corp 光導波路型測定システム、測定方法及び光導波路型センサチップ
JP2013506125A (ja) * 2009-09-28 2013-02-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 物質決定装置
JP2014025951A (ja) * 2013-10-28 2014-02-06 Konica Minolta Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2014531029A (ja) * 2011-10-20 2014-11-20 コーニンクレッカ フィリップス エヌ ヴェ 培養期間を用いた磁性粒子の検出
JP2015021818A (ja) * 2013-07-18 2015-02-02 コニカミノルタ株式会社 表面プラズモン増強蛍光測定装置および表面プラズモン増強蛍光測定方法
JP2015021889A (ja) * 2013-07-22 2015-02-02 コニカミノルタ株式会社 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置
JP2015025820A (ja) * 2014-11-04 2015-02-05 株式会社東芝 光導波路型測定システムおよび糖化ヘモグロビンの測定方法
US9274104B2 (en) 2011-03-30 2016-03-01 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle

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US20120077206A1 (en) 2003-07-12 2012-03-29 Accelr8 Technology Corporation Rapid Microbial Detection and Antimicrobial Susceptibility Testing
WO2005027714A2 (en) 2003-07-12 2005-03-31 Accelr8 Technology Corporation Sensitive and rapid biodetection
ATE513200T1 (de) * 2007-10-25 2011-07-15 Koninkl Philips Electronics Nv Sensorvorrichtung für zielpartikel in einer probe
WO2011073866A1 (en) * 2009-12-18 2011-06-23 Koninklijke Philips Electronics N.V. Substance determining apparatus
WO2011073867A1 (en) * 2009-12-18 2011-06-23 Koninklijke Philips Electronics N.V. Substance determining apparatus
BR112012030422A2 (pt) 2010-06-02 2017-06-13 Koninl Philips Electronics Nv aparelho para manipulações ópticas de uma amostra em uma câmara de amostra e uso do aparelho
US10254204B2 (en) 2011-03-07 2019-04-09 Accelerate Diagnostics, Inc. Membrane-assisted purification
US9434937B2 (en) 2011-03-07 2016-09-06 Accelerate Diagnostics, Inc. Rapid cell purification systems
EP2541230A1 (en) * 2011-06-30 2013-01-02 Koninklijke Philips Electronics N.V. Detection of clusters of magnetic particles
DE102011088880A1 (de) * 2011-12-16 2013-06-20 Robert Bosch Gmbh Schlauchbeutelmaschine zur Abfüllung eines Produkts
US9677109B2 (en) 2013-03-15 2017-06-13 Accelerate Diagnostics, Inc. Rapid determination of microbial growth and antimicrobial susceptibility
US9759651B2 (en) 2014-12-23 2017-09-12 Magellan Diagnostics, Inc. Combination optical hemoglobin and electrochemical lead assay
CN104777136B (zh) * 2015-03-25 2018-06-19 深圳市贝沃德克生物技术研究院有限公司 基于表面等离子共振技术的生物标志物检测方法与系统
US10253355B2 (en) 2015-03-30 2019-04-09 Accelerate Diagnostics, Inc. Instrument and system for rapid microorganism identification and antimicrobial agent susceptibility testing
KR20170132856A (ko) 2015-03-30 2017-12-04 액셀러레이트 다이어그노스틱스, 아이엔씨. 신속한 미생물 동정 및 항균제 감수성 시험을 위한 기기 및 시스템
US10928305B2 (en) 2015-06-30 2021-02-23 Imec Vzw Modulation of luminescent dyes
CN105929149B (zh) * 2016-04-26 2018-09-11 中国科学院电子学研究所 一种基于磁富集和全内反射的光学检测仪
RU177920U1 (ru) * 2016-11-30 2018-03-15 Общество с ограниченной ответственностью "ГемаКор Лабс" (ООО "ГемаКор Лабс") Устройство мониторинга пространственно-временной динамики тромбина
JP7290243B2 (ja) * 2019-03-29 2023-06-13 Ｔｉａｎｍａ Ｊａｐａｎ株式会社 ガス検知装置
US11467093B2 (en) * 2019-10-24 2022-10-11 Ming Chuan University Electrical polarity adjustable biosensor based on lossy mode resonance, biosensing system, and method of using the same
US12442756B2 (en) * 2020-09-04 2025-10-14 The Regents Of The University Of Colorado Method and system for determining at least one property of magnetic matter
CN115615960B (zh) * 2022-12-14 2023-03-21 中节能(达州)新材料有限公司 一种玻璃微珠涂层反光性能测试平台
CN120507700B (zh) * 2025-07-22 2025-10-17 中国科学院空间应用工程与技术中心 一种月壤单颗粒磁化率测定计算方法、系统、装置和电子设备

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JP2006071300A (ja) * 2004-08-31 2006-03-16 Hitachi Ltd 生化学物質検出装置
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JP2003098075A (ja) * 2001-09-26 2003-04-03 Fuji Photo Film Co Ltd 全反射減衰を利用したセンサー
JP2006071300A (ja) * 2004-08-31 2006-03-16 Hitachi Ltd 生化学物質検出装置
JP2006322878A (ja) * 2005-05-20 2006-11-30 Matsushita Electric Ind Co Ltd サンプル中のリガンドの分析方法及びサンプル中のリガンドを分析する装置
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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013506125A (ja) * 2009-09-28 2013-02-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 物質決定装置
JP2011080935A (ja) * 2009-10-09 2011-04-21 Konica Minolta Holdings Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2012215553A (ja) * 2011-03-30 2012-11-08 Toshiba Corp 光導波路型測定システム、測定方法及び光導波路型センサチップ
US9274104B2 (en) 2011-03-30 2016-03-01 Kabushiki Kaisha Toshiba Measuring system using optical waveguide, measuring device, measuring method, optical waveguide type sensor chip, and magnetic fine particle
JP2014531029A (ja) * 2011-10-20 2014-11-20 コーニンクレッカ フィリップス エヌ ヴェ 培養期間を用いた磁性粒子の検出
JP2015021818A (ja) * 2013-07-18 2015-02-02 コニカミノルタ株式会社 表面プラズモン増強蛍光測定装置および表面プラズモン増強蛍光測定方法
JP2015021889A (ja) * 2013-07-22 2015-02-02 コニカミノルタ株式会社 表面プラズモン増強蛍光測定方法および表面プラズモン増強蛍光測定装置
JP2014025951A (ja) * 2013-10-28 2014-02-06 Konica Minolta Inc 測定方法及び表面プラズモン増強蛍光測定装置
JP2015025820A (ja) * 2014-11-04 2015-02-05 株式会社東芝 光導波路型測定システムおよび糖化ヘモグロビンの測定方法

Also Published As

Publication number Publication date
RU2010130170A (ru) 2012-01-27
CN101903758B (zh) 2013-05-08
EP2225547A2 (en) 2010-09-08
BRPI0822092A8 (pt) 2016-03-22
EP2225547B1 (en) 2016-07-27
BRPI0822092A2 (pt) 2015-06-30
US8486689B2 (en) 2013-07-16
CN101903758A (zh) 2010-12-01
RU2489704C2 (ru) 2013-08-10
WO2009083814A2 (en) 2009-07-09
US20100267165A1 (en) 2010-10-21
WO2009083814A3 (en) 2009-10-15

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