BRPI0417748A - método para análise de um material fundido, dispositivo e sensor de imersão - Google Patents

método para análise de um material fundido, dispositivo e sensor de imersão

Info

Publication number
BRPI0417748A
BRPI0417748A BRPI0417748-7A BRPI0417748A BRPI0417748A BR PI0417748 A BRPI0417748 A BR PI0417748A BR PI0417748 A BRPI0417748 A BR PI0417748A BR PI0417748 A BRPI0417748 A BR PI0417748A
Authority
BR
Brazil
Prior art keywords
molten material
analyzed
sensitive element
spectrometer
sensor
Prior art date
Application number
BRPI0417748-7A
Other languages
English (en)
Inventor
Jacques Plessers
Vittorino Tusset
Marc Schyns
Original Assignee
Heraeus Electro Nite Intenat N
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE10359447A external-priority patent/DE10359447B4/de
Priority claimed from BE2004/0085A external-priority patent/BE1015940A3/fr
Application filed by Heraeus Electro Nite Intenat N filed Critical Heraeus Electro Nite Intenat N
Publication of BRPI0417748A publication Critical patent/BRPI0417748A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
    • C—CHEMISTRY; METALLURGY
    • C21—METALLURGY OF IRON
    • C21C—PROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C5/00—Manufacture of carbon-steel, e.g. plain mild steel, medium carbon steel or cast steel or stainless steel
    • C21C5/28—Manufacture of steel in the converter
    • C21C5/42—Constructional features of converters
    • C21C5/46—Details or accessories
    • C21C5/4673—Measuring and sampling devices
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D19/00—Arrangements of controlling devices
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D21/00—Arrangements of monitoring devices; Arrangements of safety devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G01N21/8507—Probe photometers, i.e. with optical measuring part dipped into fluid sample
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D19/00—Arrangements of controlling devices
    • F27D2019/0003—Monitoring the temperature or a characteristic of the charge and using it as a controlling value

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

"MéTODO PARA ANáLISE DE UM MATERIAL FUNDIDO, DISPOSITIVO E SENSOR DE IMERSãO". A invenção refere-se a um método e dispositivo para a análise de um material fundido que utiliza espectrometria de emissão ótica, por exemplo, um metal fundido, tal como o ferro fundido ou o aço, ou uma escória, um vidro, ou uma lava. Um elemento sensível é utilizado que tem pelo menos um espectrómetro de emissão e pelo menos um dispositivo de excitação, de modo a efetuar a excitação do material a ser analisado e permitir a geração parcial ou completa de uma radiação a ser analisada por um espectrómetro presente no elemento sensível. O elemento sensível acima mencionado é colocado em contato com o material fundido a ser analisado e transmite informações, as quais contêm os elementos de análise supridos por um espectrómetro. A invenção também refere-se a um sensor de imersão.
BRPI0417748-7A 2003-12-17 2004-12-15 método para análise de um material fundido, dispositivo e sensor de imersão BRPI0417748A (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10359447A DE10359447B4 (de) 2003-12-17 2003-12-17 Eintauchsensor
BE2004/0085A BE1015940A3 (fr) 2004-02-13 2004-02-13 Procede d'analyse par spectrometrie d'emission optique d'une substance en fusion.
PCT/EP2004/014252 WO2005059527A1 (de) 2003-12-17 2004-12-15 Verfahren zur analyse eines schmelzstoffes, vorrichtung sowie eintauchsensor

Publications (1)

Publication Number Publication Date
BRPI0417748A true BRPI0417748A (pt) 2007-04-10

Family

ID=34701669

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0417748-7A BRPI0417748A (pt) 2003-12-17 2004-12-15 método para análise de um material fundido, dispositivo e sensor de imersão

Country Status (11)

Country Link
US (1) US7365841B2 (pt)
EP (1) EP1695068A1 (pt)
JP (2) JP4750717B2 (pt)
KR (2) KR101030103B1 (pt)
AU (4) AU2004299940C1 (pt)
BR (1) BRPI0417748A (pt)
CA (1) CA2539844C (pt)
MX (1) MXPA06006246A (pt)
RU (2) RU2348029C2 (pt)
WO (1) WO2005059527A1 (pt)
ZA (1) ZA200605776B (pt)

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US20050040570A1 (en) * 2002-01-18 2005-02-24 Andreas Asselborn Method and device for determining the characteristics of molten metal
DE102006005476A1 (de) * 2006-01-26 2007-09-13 Heraeus Electro-Nite International N.V. Vorrichtung zum Bestimmen einer Kenngröße einer Metallschmelze oder einer auf der Metallschmelze aufliegenden Schlackeschicht
DE102006047765B3 (de) * 2006-10-06 2007-12-20 Heraeus Electro-Nite International N.V. Eintauchlanze für die Analyse von Schmelzen und Flüssigkeiten
CN102216491A (zh) * 2008-11-14 2011-10-12 西门子Vai金属科技有限公司 用于测量适于镀覆钢带的金属液体的化学组成的方法和装置
ES2385643B1 (es) * 2009-09-23 2013-06-13 La Farga Lacambra, S.A.U. Procedimiento para estimación de la conductividad eléctrica de una aleación.
DE102009052778A1 (de) * 2009-11-11 2011-05-12 Sms Siemag Ag Bestimmung der Badspiegelhöhe in metallurgischen Gefäßen
IT1401529B1 (it) * 2010-08-18 2013-07-26 Tenova Spa Metodo e sistema di controllo e tracking della carica di materiale trasportata da un convogliatore continuo di alimentazione di un forno metallurgico, particolarmente un forno elettrico per la produzione di acciaio
DE102010053710B4 (de) 2010-12-07 2012-12-27 Heraeus Electro-Nite International N.V. Verfahren und Vorrichtung zur Analyse von Proben von Metallschmelzen
JP5896153B2 (ja) * 2011-08-12 2016-03-30 Ｊｆｅスチール株式会社 溶鋼の脱硫方法および製造方法
WO2013024766A1 (ja) 2011-08-12 2013-02-21 Ｊｆｅスチール株式会社 溶鋼の脱硫方法、溶鋼の二次精錬方法および溶鋼の製造方法
DE102013009962B3 (de) 2013-06-14 2014-11-06 K+S Aktiengesellschaft LIBS-Messtubus
US9719857B2 (en) * 2014-12-31 2017-08-01 Thermo Scientific Portable Analytical Instruments Inc. Laser induced breakdown spectroscopy sample chamber
JP6808376B2 (ja) * 2016-06-27 2021-01-06 キヤノン株式会社 吐出装置、インプリント装置、検出方法、判定方法及び物品の製造方法
RU2664485C1 (ru) 2017-07-05 2018-08-17 Александр Николаевич Забродин Способ спектрального анализа химического состава расплавленных металлов и устройство для его осуществления
DE102018218148A1 (de) * 2018-10-23 2020-04-23 Sms Group Gmbh Messsonde sowie Verfahren zu deren Betrieb
AU2019447629A1 (en) * 2019-05-31 2021-12-23 DTE ehf. Non-immersive method and apparatus for quantitative analysis of liquid metals and alloys
WO2022244408A1 (ja) 2021-05-17 2022-11-24 Ｊｆｅスチール株式会社 スラグの成分分析法、スラグの塩基度分析法および溶融鉄の精錬方法
EP4336172A1 (en) 2021-05-17 2024-03-13 JFE Steel Corporation Slag component analysis method, slag basicity analysis method, and molten iron refining method
WO2023176939A1 (ja) * 2022-03-16 2023-09-21 日本製鉄株式会社 レーザー発光分光分析用光学装置、レーザー発光分光分析装置、レーザー発光分光分析方法、及び、溶融金属めっき設備
WO2023249048A1 (ja) * 2022-06-21 2023-12-28 日本製鉄株式会社 溶融金属浴の成分分析システム、溶融金属浴の成分分析方法、溶融亜鉛めっき浴の管理方法、および溶融亜鉛めっき鋼板の製造方法

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JPS60122355A (ja) * 1983-12-07 1985-06-29 Nippon Steel Corp 溶融金属直接分析用微粒子生成プロ−ブ
GB8403976D0 (en) * 1984-02-15 1984-03-21 British Steel Corp Analysis of materials
JPS61275652A (ja) * 1985-05-28 1986-12-05 ジヨ−ジ　ビ−　ケニ− 溶融金属等の工程内元素分析装置および方法
JPS6230940A (ja) * 1985-08-01 1987-02-09 Hiroya Shoko:Kk 金属試料発光分光分析法における発光分光方法とその装置
US5319576A (en) * 1987-08-05 1994-06-07 General Signal Corporation Wireless data gathering system for molten metal processing
DE3839561C2 (de) * 1988-11-24 1996-10-24 Lange Gmbh Dr Bruno Vorrichtung zum Bestimmen der Komponenten in flüssigen Medien
US4986658B1 (en) * 1989-04-21 1996-06-25 Univ Lehigh Transient spectroscopic method and apparatus for in-process analysis of molten metal
US5198749A (en) * 1989-04-27 1993-03-30 R. Guthrie Research Associates Inc. Single-use disposable molten metal inclusion sensor
US5369483A (en) * 1993-05-07 1994-11-29 Basf Corporation Analysis of polymer melt stream
JP3511707B2 (ja) * 1994-12-03 2004-03-29 株式会社島津製作所 火花放電発光分析装置
TW337553B (en) * 1995-12-20 1998-08-01 Voest Alpine Ind Anlagen Method for determination of electromagnetic waves originating from a melt
EP1070953A1 (fr) * 1999-07-21 2001-01-24 Societe D'etude Et De Realisation D'equipements Speciaux - S.E.R.E.S. Procédé et dispositif de mesure optique de la transparence d'un liquide
JP4449188B2 (ja) * 2000-07-25 2010-04-14 Ｊｆｅスチール株式会社 溶融金属中の成分の分析方法および分析装置
US6762835B2 (en) * 2002-03-18 2004-07-13 Mississippi State University Fiber optic laser-induced breakdown spectroscopy sensor for molten material analysis
US6784429B2 (en) * 2002-04-19 2004-08-31 Energy Research Company Apparatus and method for in situ, real time measurements of properties of liquids

Also Published As

Publication number Publication date
AU2008249182B2 (en) 2011-10-06
RU2006125424A (ru) 2008-01-27
RU2348029C2 (ru) 2009-02-27
EP1695068A1 (de) 2006-08-30
RU2008133289A (ru) 2010-02-20
JP4750717B2 (ja) 2011-08-17
KR20110038149A (ko) 2011-04-13
KR101030103B1 (ko) 2011-04-20
AU2004299940B2 (en) 2008-12-04
JP5554281B2 (ja) 2014-07-23
KR20060121193A (ko) 2006-11-28
JP2011141293A (ja) 2011-07-21
US7365841B2 (en) 2008-04-29
JP2007514941A (ja) 2007-06-07
MXPA06006246A (es) 2006-08-23
KR101078926B1 (ko) 2011-11-01
RU2457467C2 (ru) 2012-07-27
AU2011201561A1 (en) 2011-04-28
AU2008249182A1 (en) 2008-12-11
CA2539844A1 (en) 2005-06-30
AU2004299940A1 (en) 2005-06-30
AU2011201560A1 (en) 2011-04-28
AU2004299940C1 (en) 2009-05-14
US20060250614A1 (en) 2006-11-09
ZA200605776B (en) 2008-04-30
AU2011201560B2 (en) 2011-10-06
CA2539844C (en) 2012-01-31
WO2005059527A1 (de) 2005-06-30

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 11A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2343 DE 01-12-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.