BR112018010979A2 - dispositivo de medição de vão e método de medição de vão - Google Patents
dispositivo de medição de vão e método de medição de vãoInfo
- Publication number
- BR112018010979A2 BR112018010979A2 BR112018010979-7A BR112018010979A BR112018010979A2 BR 112018010979 A2 BR112018010979 A2 BR 112018010979A2 BR 112018010979 A BR112018010979 A BR 112018010979A BR 112018010979 A2 BR112018010979 A2 BR 112018010979A2
- Authority
- BR
- Brazil
- Prior art keywords
- plate
- span
- thickness
- span measurement
- upper plate
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title abstract 4
- 238000000691 measurement method Methods 0.000 title abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/16—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance of clearance between spaced objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016009096A JP6723634B2 (ja) | 2016-01-20 | 2016-01-20 | 隙間計測装置及び隙間計測方法 |
| JP2016-009096 | 2016-01-20 | ||
| PCT/JP2016/084834 WO2017126218A1 (ja) | 2016-01-20 | 2016-11-24 | 隙間計測装置及び隙間計測方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BR112018010979A2 true BR112018010979A2 (pt) | 2018-12-04 |
Family
ID=59361586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR112018010979-7A BR112018010979A2 (pt) | 2016-01-20 | 2016-11-24 | dispositivo de medição de vão e método de medição de vão |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US11054253B2 (enExample) |
| EP (1) | EP3370035B1 (enExample) |
| JP (1) | JP6723634B2 (enExample) |
| KR (1) | KR102045696B1 (enExample) |
| CN (1) | CN108369093A (enExample) |
| BR (1) | BR112018010979A2 (enExample) |
| CA (1) | CA3006543C (enExample) |
| ES (1) | ES2765744T3 (enExample) |
| WO (1) | WO2017126218A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| PL3708482T3 (pl) * | 2019-03-13 | 2023-09-11 | Becker Marine Systems Gmbh | Ster do jednostek pływających z przyrządem do pomiaru luzu łożyskowego, sposób pomiaru luzu łożyskowego w sterze oraz przyrząd do pomiaru luzu łożyskowego steru |
| JP7283228B2 (ja) * | 2019-05-27 | 2023-05-30 | コニカミノルタ株式会社 | 測定装置、画像形成装置、および、測定方法 |
| CN110631495B (zh) * | 2019-10-25 | 2024-05-14 | 宁波中车时代传感技术有限公司 | 磁电式速度传感器曲面间隙检测方法 |
| CN111690802B (zh) * | 2020-06-17 | 2021-11-09 | 广西先进铝加工创新中心有限责任公司 | 一种辊底式热处理炉炉辊的安装调试方法 |
| US12266579B2 (en) * | 2021-08-30 | 2025-04-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for adjusting the gap between a wafer and a top plate in a thin-film deposition process |
| CN114179322B (zh) * | 2021-12-08 | 2024-07-02 | 苏州博众智能机器人有限公司 | 一种模具间隙检测设备 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4165178A (en) * | 1978-06-29 | 1979-08-21 | International Business Machines Corporation | Gap measurement tool |
| JPS5784306A (en) * | 1980-11-14 | 1982-05-26 | Toshiba Corp | Method for providing gap |
| JPS6367908U (enExample) * | 1986-10-23 | 1988-05-07 | ||
| GB2206690B (en) | 1987-06-30 | 1991-12-11 | Matsushita Electric Works Ltd | Optically scanning displacement sensor |
| JPS6474405A (en) * | 1987-09-16 | 1989-03-20 | Toyota Motor Corp | Method for measuring work gap at the time of arc welding |
| US5113358A (en) * | 1990-03-28 | 1992-05-12 | Barber-Colman Company | Web caliper measuring system |
| US5250897A (en) * | 1992-05-07 | 1993-10-05 | Lsi Logic Corporation | Solenoid/slug gap measurement tool for semiconductor equipment and method of measurement |
| JPH06288713A (ja) | 1993-03-31 | 1994-10-18 | Hitachi Ltd | ギャップ位置計測方法及び画像処理方法 |
| FR2745905B1 (fr) | 1996-03-08 | 1998-04-24 | Lorraine Laminage | Appareil de detection acoustique de defauts dans une bande en defilement |
| JPH09318342A (ja) | 1996-05-31 | 1997-12-12 | Ket Kagaku Kenkyusho:Kk | 定圧機構 |
| JP3529744B2 (ja) * | 2001-07-05 | 2004-05-24 | 日本工業検査株式会社 | 鋼板厚測定装置 |
| JP2010101656A (ja) * | 2008-10-21 | 2010-05-06 | Toyota Motor Corp | 膜厚計測方法および膜厚計測装置 |
| DE102010020116A1 (de) * | 2010-05-10 | 2011-11-10 | Helmut Fischer GmbH Institut für Elektronik und Messtechnik | Verfahren und Vorrichtung zur Messung der Dicke dünner Schichten an großflächigen Messoberflächen |
| SG188414A1 (en) * | 2010-11-12 | 2013-04-30 | Ev Group E Thallner Gmbh | Measurement means and method for measuring layer thicknesses and voids of a wafer stack |
| GB2494170A (en) * | 2011-09-01 | 2013-03-06 | Sonar Pipeline Inspection Systems Ltd | Acoustic pipeline inspection |
| CN103512904A (zh) | 2012-06-29 | 2014-01-15 | 鸿富锦精密工业（深圳）有限公司 | 工件外观测量装置及其操作方法 |
| DE102014200157A1 (de) * | 2013-10-28 | 2015-05-21 | Micro-Epsilon Messtechnik Gmbh & Co. Kg | Verfahren zur Dickenmessung an Messobjekten und Vorrichtung zur Anwendung des Verfahrens |
| CN104525722B (zh) * | 2014-12-04 | 2016-09-14 | 柳州福臻车体实业有限公司 | 一种拉延模间隙的测量方法 |
| WO2017199795A1 (ja) * | 2016-05-19 | 2017-11-23 | 三菱日立パワーシステムズ株式会社 | 計測用治具及び計測装置並びに隙間計測方法 |
-
2016
- 2016-01-20 JP JP2016009096A patent/JP6723634B2/ja active Active
- 2016-11-24 CN CN201680069711.1A patent/CN108369093A/zh active Pending
- 2016-11-24 ES ES16886457T patent/ES2765744T3/es active Active
- 2016-11-24 CA CA3006543A patent/CA3006543C/en active Active
- 2016-11-24 EP EP16886457.7A patent/EP3370035B1/en active Active
- 2016-11-24 BR BR112018010979-7A patent/BR112018010979A2/pt not_active IP Right Cessation
- 2016-11-24 US US15/778,633 patent/US11054253B2/en active Active
- 2016-11-24 KR KR1020187014850A patent/KR102045696B1/ko not_active Expired - Fee Related
- 2016-11-24 WO PCT/JP2016/084834 patent/WO2017126218A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP2017129464A (ja) | 2017-07-27 |
| EP3370035A4 (en) | 2018-09-05 |
| EP3370035B1 (en) | 2019-10-23 |
| US20180347973A1 (en) | 2018-12-06 |
| JP6723634B2 (ja) | 2020-07-15 |
| EP3370035A1 (en) | 2018-09-05 |
| WO2017126218A1 (ja) | 2017-07-27 |
| CA3006543C (en) | 2020-06-02 |
| CA3006543A1 (en) | 2017-07-27 |
| ES2765744T3 (es) | 2020-06-10 |
| US11054253B2 (en) | 2021-07-06 |
| CN108369093A (zh) | 2018-08-03 |
| KR102045696B1 (ko) | 2019-11-15 |
| KR20180074768A (ko) | 2018-07-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
| B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 5A ANUIDADE. |
|
| B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 DA RPI 2647 DE 28/09/2021. |