AU2003304359A1 - Transmission imager - Google Patents

Transmission imager

Info

Publication number
AU2003304359A1
AU2003304359A1 AU2003304359A AU2003304359A AU2003304359A1 AU 2003304359 A1 AU2003304359 A1 AU 2003304359A1 AU 2003304359 A AU2003304359 A AU 2003304359A AU 2003304359 A AU2003304359 A AU 2003304359A AU 2003304359 A1 AU2003304359 A1 AU 2003304359A1
Authority
AU
Australia
Prior art keywords
imager
transmission
transmission imager
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003304359A
Other languages
English (en)
Inventor
Keisuke Nakai
Shigeru Sasakura
Masayuki Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pony Industry Co Ltd
Original Assignee
Pony Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pony Industry Co Ltd filed Critical Pony Industry Co Ltd
Publication of AU2003304359A1 publication Critical patent/AU2003304359A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2003304359A 2003-07-22 2003-07-22 Transmission imager Abandoned AU2003304359A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2003/009233 WO2005008228A1 (ja) 2003-07-22 2003-07-22 透過撮影装置

Publications (1)

Publication Number Publication Date
AU2003304359A1 true AU2003304359A1 (en) 2005-02-04

Family

ID=34074126

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003304359A Abandoned AU2003304359A1 (en) 2003-07-22 2003-07-22 Transmission imager

Country Status (3)

Country Link
JP (1) JPWO2005008228A1 (ja)
AU (1) AU2003304359A1 (ja)
WO (1) WO2005008228A1 (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6018755B2 (ja) * 2012-01-10 2016-11-02 ヤマハ発動機株式会社 X線検査装置
RU201733U1 (ru) * 2020-05-12 2020-12-30 Общество с ограниченной ответственностью "ДИАГНОСТИКА-М" Устройство рентгеновского контроля изделий микроэлектроники

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09233388A (ja) * 1996-02-20 1997-09-05 Hitachi Medical Corp X線撮影装置
JPH09297111A (ja) * 1996-05-08 1997-11-18 Hihakai Kensa Kk 放射線透過試験装置
JP2000046760A (ja) * 1998-05-29 2000-02-18 Shimadzu Corp X線断層面検査装置
JP4075166B2 (ja) * 1998-11-30 2008-04-16 松下電器産業株式会社 X線基板検査装置
JP2001255286A (ja) * 2000-03-13 2001-09-21 Hitachi Kenki Fine Tech Co Ltd X線検査装置およびx線検査方法
JP3619132B2 (ja) * 2000-08-25 2005-02-09 株式会社日立製作所 電子顕微鏡
JP3531623B2 (ja) * 2001-04-26 2004-05-31 株式会社島津製作所 X線透視撮影装置
JP4608820B2 (ja) * 2001-06-26 2011-01-12 株式会社島津製作所 X線検査装置
JP4715986B2 (ja) * 2001-07-17 2011-07-06 株式会社島津製作所 X線透視装置
JP2003156454A (ja) * 2001-11-26 2003-05-30 Matsushita Electric Ind Co Ltd X線検査装置とその制御方法と調整方法
JP3853647B2 (ja) * 2001-12-04 2006-12-06 ポニー工業株式会社 放射線透過撮影装置

Also Published As

Publication number Publication date
WO2005008228A1 (ja) 2005-01-27
JPWO2005008228A1 (ja) 2006-08-31

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase