AU2002226058A1 - Off-center tomosynthesis - Google Patents

Off-center tomosynthesis

Info

Publication number
AU2002226058A1
AU2002226058A1 AU2002226058A AU2605802A AU2002226058A1 AU 2002226058 A1 AU2002226058 A1 AU 2002226058A1 AU 2002226058 A AU2002226058 A AU 2002226058A AU 2605802 A AU2605802 A AU 2605802A AU 2002226058 A1 AU2002226058 A1 AU 2002226058A1
Authority
AU
Australia
Prior art keywords
interest
regions
subset
tomosynthesis
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002226058A
Other languages
English (en)
Inventor
Dale Thayer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Genrad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Inc filed Critical Genrad Inc
Publication of AU2002226058A1 publication Critical patent/AU2002226058A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Toxicology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Prostheses (AREA)
  • External Artificial Organs (AREA)
  • Image Processing (AREA)
  • Control Of Motors That Do Not Use Commutators (AREA)
  • Preparation Of Compounds By Using Micro-Organisms (AREA)
  • Pyrane Compounds (AREA)
AU2002226058A 2000-12-06 2001-12-05 Off-center tomosynthesis Abandoned AU2002226058A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/731,335 US6748046B2 (en) 2000-12-06 2000-12-06 Off-center tomosynthesis
US09731335 2000-12-06
PCT/US2001/047540 WO2002046729A1 (en) 2000-12-06 2001-12-05 Off-center tomosynthesis

Publications (1)

Publication Number Publication Date
AU2002226058A1 true AU2002226058A1 (en) 2002-06-18

Family

ID=24939067

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002226058A Abandoned AU2002226058A1 (en) 2000-12-06 2001-12-05 Off-center tomosynthesis

Country Status (13)

Country Link
US (1) US6748046B2 (de)
EP (1) EP1350088B1 (de)
JP (2) JP2004515762A (de)
KR (2) KR20080074986A (de)
CN (1) CN100465629C (de)
AT (1) ATE498124T1 (de)
AU (1) AU2002226058A1 (de)
BR (1) BR0116192A (de)
CA (1) CA2441881A1 (de)
DE (1) DE60144026D1 (de)
MX (1) MXPA03004979A (de)
TW (1) TW573118B (de)
WO (1) WO2002046729A1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10638994B2 (en) 2002-11-27 2020-05-05 Hologic, Inc. X-ray mammography with tomosynthesis
US7110490B2 (en) * 2002-12-10 2006-09-19 General Electric Company Full field digital tomosynthesis method and apparatus
US20050084032A1 (en) * 2003-08-04 2005-04-21 Lowell Rosen Wideband holographic communications apparatus and methods
JP4603823B2 (ja) * 2003-10-14 2010-12-22 キヤノン株式会社 放射線撮像装置、放射線撮像方法及びプログラム
JP4636500B2 (ja) * 2005-03-28 2011-02-23 名古屋電機工業株式会社 Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム
US7245693B2 (en) * 2005-06-02 2007-07-17 Agilent Technologies, Inc. X-ray inspection system having on-axis and off-axis sensors
DE102005026578A1 (de) * 2005-06-08 2006-12-21 Comet Gmbh Vorrichtung zur Röntgen-Laminographie und/oder Tomosynthese
US20070009088A1 (en) * 2005-07-06 2007-01-11 Edic Peter M System and method for imaging using distributed X-ray sources
US7505554B2 (en) * 2005-07-25 2009-03-17 Digimd Corporation Apparatus and methods of an X-ray and tomosynthesis and dual spectra machine
US7302031B2 (en) * 2005-10-27 2007-11-27 Sectra Mamea Ab Method and arrangement relating to X-ray imaging
DE202005017496U1 (de) * 2005-11-07 2007-03-15 Comet Gmbh Target für eine Mikrofocus- oder Nanofocus-Röntgenröhre
US20070189460A1 (en) * 2006-02-15 2007-08-16 Buck Dean C Precise x-ray inspection system
US20080037703A1 (en) * 2006-08-09 2008-02-14 Digimd Corporation Three dimensional breast imaging
US20080089567A1 (en) * 2006-10-11 2008-04-17 Eliasson Tracy K Artifact reduction in an x-ray imaging system
US7925074B2 (en) * 2006-10-16 2011-04-12 Teradyne, Inc. Adaptive background propagation method and device therefor
US20080247505A1 (en) * 2007-04-07 2008-10-09 Rohit Patnaik Xray device for planar tomosynthesis
US7529336B2 (en) 2007-05-31 2009-05-05 Test Research, Inc. System and method for laminography inspection
US8031929B2 (en) * 2007-09-21 2011-10-04 Teradyne, Inc. X-ray inspection of solder reflow in high-density printed circuit board applications
WO2009078415A1 (ja) * 2007-12-17 2009-06-25 Uni-Hite System Corporation Ｘ線検査装置および方法
US8391581B2 (en) * 2007-12-27 2013-03-05 Omron Corporation X-ray inspecting apparatus and X-ray inspecting method
US7819581B2 (en) * 2008-02-29 2010-10-26 Teradyne, Inc. Method of and system for calibration of inspection systems producing X-ray images
WO2009121051A2 (en) * 2008-03-28 2009-10-01 Nordson Corporation X-ray inspection systems and methods
TWI394490B (zh) * 2008-09-10 2013-04-21 Omron Tateisi Electronics Co Ｘ射線檢查裝置及ｘ射線檢查方法
DE102008046698A1 (de) * 2008-09-10 2010-03-18 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Röntgencomputertomograf zur zerstörungsfreien Prüfung von aus Materiallagen aufgebauten Objekten mittels Röntgencomputertomografie
US7986764B2 (en) * 2008-12-08 2011-07-26 Morpho Detection, Inc. X-ray laminography device, object imaging system, and method for operating a security system
JP5104962B2 (ja) * 2008-12-22 2012-12-19 オムロン株式会社 Ｘ線検査方法およびｘ線検査装置
JP5177236B2 (ja) * 2008-12-22 2013-04-03 オムロン株式会社 Ｘ線検査方法およびｘ線検査装置
US8515004B2 (en) * 2009-01-16 2013-08-20 Varian Medical Systems, Inc. Real-time motion tracking using tomosynthesis
CN101839871B (zh) * 2010-05-18 2011-12-28 华南理工大学 一种x射线分层摄影检测方法与系统
CN103278515A (zh) * 2013-05-16 2013-09-04 华南理工大学 旋转式x射线分层摄影检测系统与方法
EP3011266B1 (de) * 2013-06-17 2022-04-13 Hexagon Metrology, Inc Verfahren und vorrichtung zur messung von objekten mittels selektiver bildgebung
US9642581B2 (en) * 2013-11-12 2017-05-09 KUB Technologies, Inc. Specimen radiography with tomosynthesis in a cabinet
US10488351B2 (en) 2016-09-07 2019-11-26 KUB Technologies, Inc. Specimen radiography with tomosynthesis in a cabinet with geometric magnification
US10830712B2 (en) * 2017-03-27 2020-11-10 KUB Technologies, Inc. System and method for cabinet x-ray systems with camera
JP6622260B2 (ja) * 2017-07-07 2019-12-18 名古屋電機工業株式会社 ３次元撮像装置、３次元撮像方法および３次元撮像プログラム
EP3832689A3 (de) 2019-12-05 2021-08-11 Hologic, Inc. Systeme und verfahren für verbesserte röntgenröhrenlebensdauer
US11471118B2 (en) 2020-03-27 2022-10-18 Hologic, Inc. System and method for tracking x-ray tube focal spot position

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4688241A (en) * 1984-03-26 1987-08-18 Ridge, Inc. Microfocus X-ray system
US4926452A (en) * 1987-10-30 1990-05-15 Four Pi Systems Corporation Automated laminography system for inspection of electronics
US5259012A (en) * 1990-08-30 1993-11-02 Four Pi Systems Corporation Laminography system and method with electromagnetically directed multipath radiation source
US5359637A (en) * 1992-04-28 1994-10-25 Wake Forest University Self-calibrated tomosynthetic, radiographic-imaging system, method, and device
DE4235183C2 (de) * 1992-10-19 1997-10-23 Fraunhofer Ges Forschung Verfahren zur Erzeugung von Schichtaufnahmen von einem Meßobjekt mittels Röntgenstrahlung
CA2113752C (en) * 1994-01-19 1999-03-02 Stephen Michael Rooks Inspection system for cross-sectional imaging
KR100198515B1 (ko) * 1994-02-03 1999-06-15 토비 에취. 쿠스머 주사이미지의 질을 개선하기 위한 x선 단층촬영시스템과 방법
US5594770A (en) * 1994-11-18 1997-01-14 Thermospectra Corporation Method and apparatus for imaging obscured areas of a test object
US5687209A (en) * 1995-04-11 1997-11-11 Hewlett-Packard Co. Automatic warp compensation for laminographic circuit board inspection
US5583904A (en) * 1995-04-11 1996-12-10 Hewlett-Packard Co. Continuous linear scan laminography system and method
US5760403A (en) * 1996-04-18 1998-06-02 Loral Fairchild Corp. High modulation transfer function CCD X-ray image sensor apparatus and method
US5710063A (en) * 1996-06-06 1998-01-20 Sun Microsystems, Inc. Method for improving the alignment of holes with other elements on a printed circuit board
US5872828A (en) * 1996-07-23 1999-02-16 The General Hospital Corporation Tomosynthesis system for breast imaging
US6028910A (en) * 1998-01-19 2000-02-22 Foster-Miller, Inc. High resolution areal tomosynthesis
JP2000046760A (ja) * 1998-05-29 2000-02-18 Shimadzu Corp Ｘ線断層面検査装置
CN1240948A (zh) * 1998-07-03 2000-01-12 三星电子株式会社 利用层析x－射线照相系统获取图像的方法
US6222902B1 (en) * 1998-11-25 2001-04-24 Picker International, Inc. Real-time tomographic system with flat panel detectors
JP3559952B2 (ja) * 1998-12-18 2004-09-02 松下電器産業株式会社 Ｘ線受像装置
US6324249B1 (en) * 2001-03-21 2001-11-27 Agilent Technologies, Inc. Electronic planar laminography system and method

Also Published As

Publication number Publication date
US6748046B2 (en) 2004-06-08
WO2002046729A1 (en) 2002-06-13
EP1350088A4 (de) 2006-05-03
CN1479868A (zh) 2004-03-03
ATE498124T1 (de) 2011-02-15
KR100863975B1 (ko) 2008-10-16
JP2007127668A (ja) 2007-05-24
KR20080074986A (ko) 2008-08-13
BR0116192A (pt) 2004-01-13
DE60144026D1 (en) 2011-03-24
MXPA03004979A (es) 2005-04-29
EP1350088A1 (de) 2003-10-08
JP2004515762A (ja) 2004-05-27
KR20030055340A (ko) 2003-07-02
JP4619349B2 (ja) 2011-01-26
EP1350088B1 (de) 2011-02-09
US20030058983A1 (en) 2003-03-27
CA2441881A1 (en) 2002-06-13
TW573118B (en) 2004-01-21
CN100465629C (zh) 2009-03-04

Similar Documents

Publication Publication Date Title
AU2002226058A1 (en) Off-center tomosynthesis
EP1428473A3 (de) Digitales Vollfeld-Tomosyntheseverfahren und -Gerät
WO2000021114A8 (en) X-ray scanning method and apparatus
EP1158842A4 (de) Röntgengenerator,röntgenbildaufnahmegerät und röntgeninspektionssystem
WO2003102518A3 (en) Terahertz imaging system and method
EP0938250A3 (de) Vorrichtung und Verfahren für zwei-Energien Röntgenstrahlungs-Bilderzeugung
WO2006116365A3 (en) X-ray imaging using temporal digital signal processing
GB2415589A (en) X-ray scanning system
EP0959342A3 (de) Konzentrationsbestimmung
WO1999064893A3 (en) A low noise, high resolution image detection system and method
EP1046929A3 (de) Verfahren und Vorrichtung zur dreidimensionalen Ultraschall-Bilddarstellung mittels Volumendarstellung mit verbesserten Oberflächen
WO2005078632A3 (en) Imaging method and system
DE60224770D1 (de) Verfahren und Vorrichtung zur Rauschverminderung in Computertomographen
IL140514A0 (en) Methods and apparatus for reduced radiation coronary computed tomography imaging
IL137863A0 (en) Methods and apparatus for positioning a ct imaging x-ray beam
IL138392A0 (en) Method and device for analysing the three-dimensional distribution of a component in a sample
WO2004105574A3 (en) Image guided radiation therapy
EP0867835A3 (de) Apparat für Röntgenaufnahmen
EP1462054A3 (de) Röntgengerät
WO2002033655A3 (en) Method and apparatus for correcting ct data
AU2003292474A1 (en) Medical imaging device having means for rendering the detector orientation and the display orientation essentially equal
EP1126289A3 (de) Bildaufnahmeverfahren und -apparat
AU2001237461A1 (en) Method for imaging the head area
FI20000369A0 (fi) Menetelmä kefalokuvauksen suorittamiseksi
EP1266620A3 (de) Artefakt-Kompensationssystem und Verfahren für ein Computer Tomographie Bildsystem