AU2001253180A1 - A chemical-mechanical polishing system for the manufacture of semiconductor devices - Google Patents
A chemical-mechanical polishing system for the manufacture of semiconductor devicesInfo
- Publication number
- AU2001253180A1 AU2001253180A1 AU2001253180A AU5318001A AU2001253180A1 AU 2001253180 A1 AU2001253180 A1 AU 2001253180A1 AU 2001253180 A AU2001253180 A AU 2001253180A AU 5318001 A AU5318001 A AU 5318001A AU 2001253180 A1 AU2001253180 A1 AU 2001253180A1
- Authority
- AU
- Australia
- Prior art keywords
- manufacture
- chemical
- semiconductor devices
- mechanical polishing
- polishing system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F33/00—Other mixers; Mixing plants; Combinations of mixers
- B01F33/45—Magnetic mixers; Mixers with magnetically driven stirrers
- B01F33/452—Magnetic mixers; Mixers with magnetically driven stirrers using independent floating stirring elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F35/00—Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
- B01F35/20—Measuring; Control or regulation
- B01F35/21—Measuring
- B01F35/2132—Concentration, pH, pOH, p(ION) or oxygen-demand
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F35/00—Accessories for mixers; Auxiliary operations or auxiliary devices; Parts or details of general application
- B01F35/80—Forming a predetermined ratio of the substances to be mixed
- B01F35/82—Forming a predetermined ratio of the substances to be mixed by adding a material to be mixed to a mixture in response to a detected feature, e.g. density, radioactivity, consumed power or colour
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/10—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/40—Mixing liquids with liquids; Emulsifying
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/574,969 US6267641B1 (en) | 2000-05-19 | 2000-05-19 | Method of manufacturing a semiconductor component and chemical-mechanical polishing system therefor |
US09/574,969 | 2000-05-19 | ||
PCT/US2001/011143 WO2001089767A2 (en) | 2000-05-19 | 2001-04-06 | A chemical-mechanical polishing system for the manufacture of semiconductor devices |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001253180A1 true AU2001253180A1 (en) | 2001-12-03 |
Family
ID=24298369
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001253180A Abandoned AU2001253180A1 (en) | 2000-05-19 | 2001-04-06 | A chemical-mechanical polishing system for the manufacture of semiconductor devices |
Country Status (8)
Country | Link |
---|---|
US (1) | US6267641B1 (zh) |
EP (1) | EP1286808A2 (zh) |
JP (1) | JP4869536B2 (zh) |
KR (1) | KR100777147B1 (zh) |
CN (1) | CN100402236C (zh) |
AU (1) | AU2001253180A1 (zh) |
TW (1) | TW504764B (zh) |
WO (1) | WO2001089767A2 (zh) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7905653B2 (en) * | 2001-07-31 | 2011-03-15 | Mega Fluid Systems, Inc. | Method and apparatus for blending process materials |
SG148839A1 (en) * | 2000-07-31 | 2009-01-29 | Celerity Inc | Method and apparatus for blending process materials |
US20040166584A1 (en) * | 2000-12-21 | 2004-08-26 | Ashutosh Misra | Method and apparatus for monitoring of a chemical characteristic of a process chemical |
TW539594B (en) * | 2001-05-17 | 2003-07-01 | Macronix Int Co Ltd | Oxidant concentration monitoring system in chemical mechanical polishing process |
US6709311B2 (en) | 2001-08-13 | 2004-03-23 | Particle Measuring Systems, Inc. | Spectroscopic measurement of the chemical constituents of a CMP slurry |
US6736926B2 (en) * | 2001-10-09 | 2004-05-18 | Micron Technology, Inc. | Inline monitoring of pad loading for CuCMP and developing an endpoint technique for cleaning |
US6464562B1 (en) * | 2001-12-19 | 2002-10-15 | Winbond Electronics Corporation | System and method for in-situ monitoring slurry flow rate during a chemical mechanical polishing process |
DE20205819U1 (de) | 2002-04-12 | 2003-08-21 | Kinetics Germany Gmbh | Vorrichtung zur Bereitstellung von hochreinen Prozesschemikalien |
US7344298B2 (en) * | 2002-07-19 | 2008-03-18 | Celerity, Inc. | Method and apparatus for blending process materials |
US7317533B2 (en) * | 2005-01-14 | 2008-01-08 | Jetalon Solutions, Inc. | Metal ion concentration analysis for liquids |
US7319523B2 (en) * | 2005-09-26 | 2008-01-15 | Jetalon Solutions, Inc. | Apparatus for a liquid chemical concentration analysis system |
US8602640B2 (en) * | 2009-05-20 | 2013-12-10 | Entegris—Jetalon Solutions, Inc. | Sensing system and method |
US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
KR102630261B1 (ko) | 2014-10-17 | 2024-01-29 | 어플라이드 머티어리얼스, 인코포레이티드 | 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성 |
US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
JP6940495B2 (ja) | 2015-10-30 | 2021-09-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法 |
US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
CN106442408A (zh) * | 2016-10-12 | 2017-02-22 | 上海胤飞自动化科技有限公司 | 化学机械研磨液自动配制控制系统 |
US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
CN112654655A (zh) | 2018-09-04 | 2021-04-13 | 应用材料公司 | 先进抛光垫配方 |
CN114193328A (zh) * | 2020-09-18 | 2022-03-18 | 中国科学院微电子研究所 | 研磨剂容器及研磨剂供应方法 |
US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05269462A (ja) * | 1992-03-26 | 1993-10-19 | Showa Alum Corp | 研削排液の回収再生方法 |
US5445996A (en) | 1992-05-26 | 1995-08-29 | Kabushiki Kaisha Toshiba | Method for planarizing a semiconductor device having a amorphous layer |
JP2971714B2 (ja) * | 1993-10-01 | 1999-11-08 | 住友金属工業株式会社 | 半導体基板の鏡面研磨方法 |
US5597595A (en) | 1995-04-07 | 1997-01-28 | Abbott Laboratories | Low pH beverage fortified with calcium and vitamin D |
US5905571A (en) | 1995-08-30 | 1999-05-18 | Sandia Corporation | Optical apparatus for forming correlation spectrometers and optical processors |
US5750440A (en) | 1995-11-20 | 1998-05-12 | Motorola, Inc. | Apparatus and method for dynamically mixing slurry for chemical mechanical polishing |
US5664990A (en) | 1996-07-29 | 1997-09-09 | Integrated Process Equipment Corp. | Slurry recycling in CMP apparatus |
US5846398A (en) * | 1996-08-23 | 1998-12-08 | Sematech, Inc. | CMP slurry measurement and control technique |
US5939831A (en) | 1996-11-13 | 1999-08-17 | Applied Materials, Inc. | Methods and apparatus for pre-stabilized plasma generation for microwave clean applications |
US5911619A (en) | 1997-03-26 | 1999-06-15 | International Business Machines Corporation | Apparatus for electrochemical mechanical planarization |
JPH1110540A (ja) * | 1997-06-23 | 1999-01-19 | Speedfam Co Ltd | Cmp装置のスラリリサイクルシステム及びその方法 |
US5922606A (en) | 1997-09-16 | 1999-07-13 | Nalco Chemical Company | Fluorometric method for increasing the efficiency of the rinsing and water recovery process in the manufacture of semiconductor chips |
JPH10223599A (ja) | 1998-03-12 | 1998-08-21 | Dainippon Screen Mfg Co Ltd | 浸漬式基板処理装置 |
JPH11277434A (ja) * | 1998-03-30 | 1999-10-12 | Speedfam Co Ltd | Cmp装置のスラリリサイクルシステム及びその方法 |
JP2000071172A (ja) * | 1998-08-28 | 2000-03-07 | Nec Corp | 化学機械研磨用スラリーの再生装置及び再生方法 |
JP2000117635A (ja) * | 1998-10-15 | 2000-04-25 | Sumitomo Metal Ind Ltd | 研磨方法及び研磨システム |
JP2000260736A (ja) * | 1999-03-04 | 2000-09-22 | Rohm Co Ltd | 電子デバイスの製造方法および化学的機械的研磨装置 |
US6048256A (en) * | 1999-04-06 | 2000-04-11 | Lucent Technologies Inc. | Apparatus and method for continuous delivery and conditioning of a polishing slurry |
-
2000
- 2000-05-19 US US09/574,969 patent/US6267641B1/en not_active Expired - Lifetime
-
2001
- 2001-04-06 KR KR1020027015502A patent/KR100777147B1/ko not_active IP Right Cessation
- 2001-04-06 AU AU2001253180A patent/AU2001253180A1/en not_active Abandoned
- 2001-04-06 JP JP2001585993A patent/JP4869536B2/ja not_active Expired - Fee Related
- 2001-04-06 EP EP01926659A patent/EP1286808A2/en not_active Withdrawn
- 2001-04-06 CN CNB018114202A patent/CN100402236C/zh not_active Expired - Fee Related
- 2001-04-06 WO PCT/US2001/011143 patent/WO2001089767A2/en active Application Filing
- 2001-04-27 TW TW090110067A patent/TW504764B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2004515905A (ja) | 2004-05-27 |
KR100777147B1 (ko) | 2007-11-19 |
CN100402236C (zh) | 2008-07-16 |
US6267641B1 (en) | 2001-07-31 |
JP4869536B2 (ja) | 2012-02-08 |
EP1286808A2 (en) | 2003-03-05 |
WO2001089767A2 (en) | 2001-11-29 |
KR20020097287A (ko) | 2002-12-31 |
WO2001089767A3 (en) | 2002-07-25 |
CN1438932A (zh) | 2003-08-27 |
TW504764B (en) | 2002-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2001253180A1 (en) | A chemical-mechanical polishing system for the manufacture of semiconductor devices | |
AU2001251318A1 (en) | Integrated chemical-mechanical polishing | |
AU2001234973A1 (en) | Semiconductor devices | |
AU2001253308A1 (en) | System for the preferential removal of silicon oxide | |
EP1295680A3 (en) | Polishing pad for semiconductor wafer | |
AU4025701A (en) | Cleaning solution for semiconductor surfaces following chemical-mechanical polishing | |
AU2002360661A1 (en) | Polishing pad | |
AU2000224587A1 (en) | Semiconductor device | |
AU2001236028A1 (en) | Semiconductor device | |
AU2319600A (en) | Semiconductor device | |
AU2001232401A1 (en) | Cmp slurry composition and a method for planarizing semiconductor device using the same | |
AU2001294817A1 (en) | Fabrication of semiconductor devices | |
AU4309601A (en) | Chemical-mechanical polishing method | |
AU2002329197A1 (en) | Trench structure for semiconductor devices | |
AU2002338003A1 (en) | Semiconductor Devices | |
SG91348A1 (en) | Hybrid polishing slurry | |
AU2002253902A1 (en) | Chemical-mechanical planarization using ozone | |
AU2002322122A1 (en) | Semiconductor wafer storage kiosk | |
AU4875601A (en) | Polishing compound for polishing semiconductor device and method for manufacturing semiconductor device using the same | |
AU2002213215A1 (en) | Infrared end-point system for cmp | |
AU2001288930A1 (en) | Wafer carrier for cmp system | |
SG130931A1 (en) | Polishing slurry for the chemical-mechanical polishisng of silica films | |
AU1784001A (en) | Abrasives for chemical mechanical polishing | |
GB2361447B (en) | Wafer polishing apparatus | |
AU2000274531A1 (en) | Semiconductor device |