ATE538475T1 - Seitenumkehrreihenfolgeschreiben in flash- speichern - Google Patents
Seitenumkehrreihenfolgeschreiben in flash- speichernInfo
- Publication number
- ATE538475T1 ATE538475T1 AT09766316T AT09766316T ATE538475T1 AT E538475 T1 ATE538475 T1 AT E538475T1 AT 09766316 T AT09766316 T AT 09766316T AT 09766316 T AT09766316 T AT 09766316T AT E538475 T1 ATE538475 T1 AT E538475T1
- Authority
- AT
- Austria
- Prior art keywords
- written
- page
- word lines
- pages
- flash memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5642—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
- G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/139,545 US7848144B2 (en) | 2008-06-16 | 2008-06-16 | Reverse order page writing in flash memories |
| PCT/IL2009/000592 WO2009153781A1 (en) | 2008-06-16 | 2009-06-15 | Reverse order page writing in flash memories |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE538475T1 true ATE538475T1 (de) | 2012-01-15 |
Family
ID=40974050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT09766316T ATE538475T1 (de) | 2008-06-16 | 2009-06-15 | Seitenumkehrreihenfolgeschreiben in flash- speichern |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7848144B2 (de) |
| EP (1) | EP2291847B1 (de) |
| JP (1) | JP2011524600A (de) |
| KR (1) | KR20110033206A (de) |
| CN (1) | CN102067237B (de) |
| AT (1) | ATE538475T1 (de) |
| TW (1) | TWI406284B (de) |
| WO (1) | WO2009153781A1 (de) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100885783B1 (ko) * | 2007-01-23 | 2009-02-26 | 주식회사 하이닉스반도체 | 플래시 메모리 장치 및 동작 방법 |
| KR101498669B1 (ko) * | 2007-12-20 | 2015-03-19 | 삼성전자주식회사 | 반도체 메모리 시스템 및 그것의 액세스 방법 |
| US7848144B2 (en) * | 2008-06-16 | 2010-12-07 | Sandisk Corporation | Reverse order page writing in flash memories |
| US8254167B2 (en) * | 2010-05-17 | 2012-08-28 | Seagate Technologies Llc | Joint encoding of logical pages in multi-page memory architecture |
| CN102135943B (zh) * | 2011-03-23 | 2013-03-13 | 华为终端有限公司 | 闪存数据的存储、访问方法及装置 |
| CN102147771B (zh) * | 2011-04-08 | 2013-04-10 | 深圳市江波龙电子有限公司 | 查找闪存设备中固件程序存放位置的方法 |
| US8537623B2 (en) * | 2011-07-07 | 2013-09-17 | Micron Technology, Inc. | Devices and methods of programming memory cells |
| JP5754273B2 (ja) * | 2011-07-11 | 2015-07-29 | 株式会社リコー | メモリ制御装置、情報処理装置およびメモリ制御方法 |
| US8743615B2 (en) | 2011-08-22 | 2014-06-03 | Sandisk Technologies Inc. | Read compensation for partially programmed blocks of non-volatile storage |
| KR102003930B1 (ko) | 2012-07-31 | 2019-07-25 | 삼성전자주식회사 | 불휘발성 메모리 장치의 데이터 라이팅 제어방법 및 웨어레벨링 제어 기능을 가지는 메모리 콘트롤러 |
| US9478271B2 (en) * | 2013-03-14 | 2016-10-25 | Seagate Technology Llc | Nonvolatile memory data recovery after power failure |
| CN103198039A (zh) * | 2013-04-19 | 2013-07-10 | 无锡云动科技发展有限公司 | 一种数据传输控制器及其混合存储装置 |
| US20150098271A1 (en) * | 2013-10-09 | 2015-04-09 | Sandisk Technologies Inc. | System and method of storing data in a data storage device |
| US10754587B2 (en) | 2015-03-20 | 2020-08-25 | Burlywood, Inc. | Memory partitioning storage controller |
| US9997251B2 (en) | 2015-03-26 | 2018-06-12 | Burlywood, LLC | Medium defect management method for storage systems requiring an integrated controller |
| US10157680B2 (en) * | 2015-12-22 | 2018-12-18 | Sandisk Technologies Llp | Sub-block mode for non-volatile memory |
| KR102289598B1 (ko) | 2017-06-26 | 2021-08-18 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것을 포함하는 메모리 시스템 그리고 그것의 프로그램 방법 |
| CN109062822B (zh) * | 2018-07-18 | 2021-09-07 | 北京世纪东方通讯设备有限公司 | 一种机车无线通信数据的存储方法及装置 |
| JP2020095767A (ja) | 2018-12-13 | 2020-06-18 | キオクシア株式会社 | 半導体記憶装置 |
| JP7213712B2 (ja) | 2019-02-14 | 2023-01-27 | キオクシア株式会社 | 不揮発性半導体記憶装置 |
| CN109979508A (zh) | 2019-03-15 | 2019-07-05 | 合肥沛睿微电子股份有限公司 | 固态硬盘装置与相关的固态硬盘控制电路 |
| TWI701677B (zh) * | 2019-03-20 | 2020-08-11 | 大陸商合肥沛睿微電子股份有限公司 | 固態硬碟裝置與相關的資料寫入方法 |
| TWI690936B (zh) * | 2019-03-20 | 2020-04-11 | 大陸商合肥沛睿微電子股份有限公司 | 固態硬碟裝置與相關的固態硬碟控制電路 |
| JP2021047941A (ja) | 2019-09-17 | 2021-03-25 | キオクシア株式会社 | メモリシステム及びメモリシステムの制御方法 |
| US10984867B1 (en) * | 2019-12-23 | 2021-04-20 | SanDiskTechnologies LLC | Direct look ahead mode for memory apparatus programmed with reverse order programming |
| US11081162B1 (en) * | 2020-02-24 | 2021-08-03 | Sandisk Technologies Llc | Source side precharge and boosting improvement for reverse order program |
| CN111966298B (zh) * | 2020-08-24 | 2021-07-27 | 深圳三地一芯电子有限责任公司 | 一种基于Flash存储器的倒序编程实现方法及装置 |
| US11442666B2 (en) * | 2020-11-17 | 2022-09-13 | Western Digital Technologies, Inc. | Storage system and dual-write programming method with reverse order for secondary block |
| CN115437566B (zh) * | 2022-08-24 | 2026-02-06 | 杭州华橙软件技术有限公司 | 一种数据读写方法及装置 |
Family Cites Families (86)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3319323A1 (de) | 1983-05-27 | 1984-11-29 | Alcan Ohler GmbH, 5970 Plettenberg | Verfahren und vorrichtung zum verschliessen eines behaelters mit einem deckel, welche beide aus plastisch verformbarem material bestehen |
| GB8319853D0 (en) | 1983-07-22 | 1983-08-24 | Forsac Valves | Ball valve for pipeline |
| US5268319A (en) * | 1988-06-08 | 1993-12-07 | Eliyahou Harari | Highly compact EPROM and flash EEPROM devices |
| US5101378A (en) * | 1988-06-15 | 1992-03-31 | Advanced Micro Devices, Inc. | Optimized electrically erasable cell for minimum read disturb and associated method of sensing |
| KR960002006B1 (ko) | 1991-03-12 | 1996-02-09 | 가부시끼가이샤 도시바 | 2개의 기준 레벨을 사용하는 기록 검증 제어기를 갖는 전기적으로 소거 가능하고 프로그램 가능한 불휘발성 메모리 장치 |
| US6222762B1 (en) * | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
| US5532962A (en) * | 1992-05-20 | 1996-07-02 | Sandisk Corporation | Soft errors handling in EEPROM devices |
| US5555204A (en) * | 1993-06-29 | 1996-09-10 | Kabushiki Kaisha Toshiba | Non-volatile semiconductor memory device |
| US5449947A (en) * | 1993-07-07 | 1995-09-12 | Actel Corporation | Read-disturb tolerant metal-to-metal antifuse and fabrication method |
| KR0169267B1 (ko) * | 1993-09-21 | 1999-02-01 | 사토 후미오 | 불휘발성 반도체 기억장치 |
| GB9423036D0 (en) * | 1994-11-15 | 1995-01-04 | Sgs Thomson Microelectronics | An integrated circuit memory device |
| TW388982B (en) * | 1995-03-31 | 2000-05-01 | Samsung Electronics Co Ltd | Memory controller which executes read and write commands out of order |
| KR100253868B1 (ko) | 1995-11-13 | 2000-05-01 | 니시무로 타이죠 | 불휘발성 반도체기억장치 |
| US5581504A (en) * | 1995-11-14 | 1996-12-03 | Programmable Microelectronics Corp. | Non-volatile electrically erasable memory with PMOS transistor NAND gate structure |
| US5814853A (en) * | 1996-01-22 | 1998-09-29 | Advanced Micro Devices, Inc. | Sourceless floating gate memory device and method of storing data |
| US5903495A (en) * | 1996-03-18 | 1999-05-11 | Kabushiki Kaisha Toshiba | Semiconductor device and memory system |
| US5917766A (en) * | 1996-05-28 | 1999-06-29 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory device that can carry out read disturb testing and burn-in testing reliably |
| TW338165B (en) * | 1996-09-09 | 1998-08-11 | Sony Co Ltd | Semiconductor nand type flash memory with incremental step pulse programming |
| US6066979A (en) * | 1996-09-23 | 2000-05-23 | Eldec Corporation | Solid-state high voltage linear regulator circuit |
| JP3967409B2 (ja) * | 1996-12-26 | 2007-08-29 | 株式会社東芝 | 半導体集積回路装置 |
| JP3489958B2 (ja) * | 1997-03-19 | 2004-01-26 | 富士通株式会社 | 不揮発性半導体記憶装置 |
| KR100323554B1 (ko) * | 1997-05-14 | 2002-03-08 | 니시무로 타이죠 | 불휘발성반도체메모리장치 |
| KR100255956B1 (ko) * | 1997-07-16 | 2000-05-01 | 윤종용 | 강유전체 메모리 장치 및 그것의 데이터 보호 방법 |
| US5930167A (en) * | 1997-07-30 | 1999-07-27 | Sandisk Corporation | Multi-state non-volatile flash memory capable of being its own two state write cache |
| JP3805867B2 (ja) * | 1997-09-18 | 2006-08-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| US5867429A (en) * | 1997-11-19 | 1999-02-02 | Sandisk Corporation | High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates |
| US7031214B2 (en) * | 1999-01-14 | 2006-04-18 | Silicon Storage Technology, Inc. | Digital multilevel memory system having multistage autozero sensing |
| IT1306963B1 (it) * | 1999-01-19 | 2001-10-11 | St Microelectronics Srl | Circuito a compensazione capacitativa per la regolazione dellatensione di lettura di riga in memorie non-volatili |
| TW475267B (en) | 1999-07-13 | 2002-02-01 | Toshiba Corp | Semiconductor memory |
| KR100322470B1 (ko) | 1999-07-22 | 2002-02-07 | 윤종용 | 고밀도 노어형 플래시 메모리 장치 및 그것의 프로그램 방법 |
| US6380033B1 (en) * | 1999-09-20 | 2002-04-30 | Advanced Micro Devices, Inc. | Process to improve read disturb for NAND flash memory devices |
| US6175522B1 (en) | 1999-09-30 | 2001-01-16 | Advanced Micro Devices, Inc. | Read operation scheme for a high-density, low voltage, and superior reliability nand flash memory device |
| US6240016B1 (en) * | 1999-12-17 | 2001-05-29 | Advanced Micro Devices, Inc. | Method to reduce read gate disturb for flash EEPROM application |
| JP3891539B2 (ja) | 2000-06-15 | 2007-03-14 | シャープ株式会社 | 半導体装置およびその制御装置 |
| US6570785B1 (en) * | 2000-10-31 | 2003-05-27 | Sandisk Corporation | Method of reducing disturbs in non-volatile memory |
| US6535423B2 (en) * | 2000-12-29 | 2003-03-18 | Intel Corporation | Drain bias for non-volatile memory |
| US6763424B2 (en) * | 2001-01-19 | 2004-07-13 | Sandisk Corporation | Partial block data programming and reading operations in a non-volatile memory |
| JP3631463B2 (ja) * | 2001-12-27 | 2005-03-23 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP3829088B2 (ja) | 2001-03-29 | 2006-10-04 | 株式会社東芝 | 半導体記憶装置 |
| US6377507B1 (en) * | 2001-04-06 | 2002-04-23 | Integrated Memory Technologies, Inc. | Non-volatile memory device having high speed page mode operation |
| US6522580B2 (en) | 2001-06-27 | 2003-02-18 | Sandisk Corporation | Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states |
| US6891262B2 (en) * | 2001-07-19 | 2005-05-10 | Sony Corporation | Semiconductor device and method of producing the same |
| US6456528B1 (en) * | 2001-09-17 | 2002-09-24 | Sandisk Corporation | Selective operation of a multi-state non-volatile memory system in a binary mode |
| US6717847B2 (en) * | 2001-09-17 | 2004-04-06 | Sandisk Corporation | Selective operation of a multi-state non-volatile memory system in a binary mode |
| US7054994B2 (en) | 2002-07-29 | 2006-05-30 | Hy Wire Ltd. | Multiple-RAM CAM device and method therefor |
| US6542407B1 (en) * | 2002-01-18 | 2003-04-01 | Sandisk Corporation | Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells |
| JP3938309B2 (ja) * | 2002-01-22 | 2007-06-27 | 富士通株式会社 | リードディスターブを緩和したフラッシュメモリ |
| US6771536B2 (en) * | 2002-02-27 | 2004-08-03 | Sandisk Corporation | Operating techniques for reducing program and read disturbs of a non-volatile memory |
| KR100476888B1 (ko) * | 2002-04-04 | 2005-03-17 | 삼성전자주식회사 | 온도보상기능을 가진 멀티비트 플래쉬메모리 |
| US6785169B1 (en) * | 2002-04-05 | 2004-08-31 | T-Ram, Inc. | Memory cell error recovery |
| US6594181B1 (en) * | 2002-05-10 | 2003-07-15 | Fujitsu Limited | System for reading a double-bit memory cell |
| WO2004001852A1 (en) | 2002-06-19 | 2003-12-31 | Sandisk Corporation | Deep wordline trench to shield cross coupling between adjacent cells for scaled nand |
| US6894931B2 (en) * | 2002-06-20 | 2005-05-17 | Kabushiki Kaisha Toshiba | Nonvolatile semiconductor memory device |
| US6781877B2 (en) * | 2002-09-06 | 2004-08-24 | Sandisk Corporation | Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells |
| US7196931B2 (en) | 2002-09-24 | 2007-03-27 | Sandisk Corporation | Non-volatile memory and method with reduced source line bias errors |
| US6983428B2 (en) | 2002-09-24 | 2006-01-03 | Sandisk Corporation | Highly compact non-volatile memory and method thereof |
| US7443757B2 (en) | 2002-09-24 | 2008-10-28 | Sandisk Corporation | Non-volatile memory and method with reduced bit line crosstalk errors |
| US6891753B2 (en) | 2002-09-24 | 2005-05-10 | Sandisk Corporation | Highly compact non-volatile memory and method therefor with internal serial buses |
| US6987693B2 (en) | 2002-09-24 | 2006-01-17 | Sandisk Corporation | Non-volatile memory and method with reduced neighboring field errors |
| US6657891B1 (en) * | 2002-11-29 | 2003-12-02 | Kabushiki Kaisha Toshiba | Semiconductor memory device for storing multivalued data |
| US6829167B2 (en) * | 2002-12-12 | 2004-12-07 | Sandisk Corporation | Error recovery for nonvolatile memory |
| US7233522B2 (en) | 2002-12-31 | 2007-06-19 | Sandisk 3D Llc | NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same |
| JP3913704B2 (ja) * | 2003-04-22 | 2007-05-09 | 株式会社東芝 | 不揮発性半導体記憶装置及びこれを用いた電子装置 |
| US6956770B2 (en) * | 2003-09-17 | 2005-10-18 | Sandisk Corporation | Non-volatile memory and method with bit line compensation dependent on neighboring operating modes |
| US7012835B2 (en) * | 2003-10-03 | 2006-03-14 | Sandisk Corporation | Flash memory data correction and scrub techniques |
| KR20050033996A (ko) | 2003-10-07 | 2005-04-14 | 삼성전자주식회사 | 이동 통신 시스템에서 채널 수신 장치 및 방법 |
| TW200515147A (en) * | 2003-10-17 | 2005-05-01 | Matsushita Electric Industrial Co Ltd | Semiconductor memory device, controller, and read/write control method thereof |
| US6888758B1 (en) * | 2004-01-21 | 2005-05-03 | Sandisk Corporation | Programming non-volatile memory |
| US7372730B2 (en) * | 2004-01-26 | 2008-05-13 | Sandisk Corporation | Method of reading NAND memory to compensate for coupling between storage elements |
| US7177977B2 (en) * | 2004-03-19 | 2007-02-13 | Sandisk Corporation | Operating non-volatile memory without read disturb limitations |
| US7020017B2 (en) * | 2004-04-06 | 2006-03-28 | Sandisk Corporation | Variable programming of non-volatile memory |
| KR100645044B1 (ko) | 2004-09-17 | 2006-11-10 | 삼성전자주식회사 | 높은 신뢰도를 갖는 불 휘발성 메모리 장치의 프로그램 방법 |
| US7187585B2 (en) | 2005-04-05 | 2007-03-06 | Sandisk Corporation | Read operation for non-volatile storage that includes compensation for coupling |
| US7196946B2 (en) | 2005-04-05 | 2007-03-27 | Sandisk Corporation | Compensating for coupling in non-volatile storage |
| US7196928B2 (en) | 2005-04-05 | 2007-03-27 | Sandisk Corporation | Compensating for coupling during read operations of non-volatile memory |
| KR100680462B1 (ko) * | 2005-04-11 | 2007-02-08 | 주식회사 하이닉스반도체 | 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법 |
| US7752382B2 (en) * | 2005-09-09 | 2010-07-06 | Sandisk Il Ltd | Flash memory storage system and method |
| US7443726B2 (en) * | 2005-12-29 | 2008-10-28 | Sandisk Corporation | Systems for alternate row-based reading and writing for non-volatile memory |
| US7349260B2 (en) * | 2005-12-29 | 2008-03-25 | Sandisk Corporation | Alternate row-based reading and writing for non-volatile memory |
| KR101012131B1 (ko) * | 2006-04-12 | 2011-02-07 | 샌디스크 코포레이션 | 프로그램 혼란의 영향을 감소시키는 방법 |
| WO2008039667A2 (en) * | 2006-09-27 | 2008-04-03 | Sandisk Corporation | Reducing program disturb in non-volatile storage |
| US7684247B2 (en) * | 2006-09-29 | 2010-03-23 | Sandisk Corporation | Reverse reading in non-volatile memory with compensation for coupling |
| US7447076B2 (en) | 2006-09-29 | 2008-11-04 | Sandisk Corporation | Systems for reverse reading in non-volatile memory with compensation for coupling |
| US7606070B2 (en) * | 2006-12-29 | 2009-10-20 | Sandisk Corporation | Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation |
| US7848144B2 (en) * | 2008-06-16 | 2010-12-07 | Sandisk Corporation | Reverse order page writing in flash memories |
| US8144512B2 (en) * | 2009-12-18 | 2012-03-27 | Sandisk Technologies Inc. | Data transfer flows for on-chip folding |
-
2008
- 2008-06-16 US US12/139,545 patent/US7848144B2/en active Active
-
2009
- 2009-06-15 AT AT09766316T patent/ATE538475T1/de active
- 2009-06-15 TW TW098119975A patent/TWI406284B/zh not_active IP Right Cessation
- 2009-06-15 CN CN200980122793.1A patent/CN102067237B/zh active Active
- 2009-06-15 JP JP2011514196A patent/JP2011524600A/ja active Pending
- 2009-06-15 EP EP09766316A patent/EP2291847B1/de not_active Not-in-force
- 2009-06-15 KR KR1020117001111A patent/KR20110033206A/ko not_active Withdrawn
- 2009-06-15 WO PCT/IL2009/000592 patent/WO2009153781A1/en not_active Ceased
-
2010
- 2010-12-06 US US12/961,431 patent/US8339855B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20090310413A1 (en) | 2009-12-17 |
| KR20110033206A (ko) | 2011-03-30 |
| JP2011524600A (ja) | 2011-09-01 |
| TWI406284B (zh) | 2013-08-21 |
| EP2291847A1 (de) | 2011-03-09 |
| EP2291847B1 (de) | 2011-12-21 |
| US7848144B2 (en) | 2010-12-07 |
| CN102067237A (zh) | 2011-05-18 |
| CN102067237B (zh) | 2014-01-01 |
| US20110096603A1 (en) | 2011-04-28 |
| US8339855B2 (en) | 2012-12-25 |
| WO2009153781A1 (en) | 2009-12-23 |
| TW201009842A (en) | 2010-03-01 |
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