ATE538475T1 - Seitenumkehrreihenfolgeschreiben in flash- speichern - Google Patents

Seitenumkehrreihenfolgeschreiben in flash- speichern

Info

Publication number
ATE538475T1
ATE538475T1 AT09766316T AT09766316T ATE538475T1 AT E538475 T1 ATE538475 T1 AT E538475T1 AT 09766316 T AT09766316 T AT 09766316T AT 09766316 T AT09766316 T AT 09766316T AT E538475 T1 ATE538475 T1 AT E538475T1
Authority
AT
Austria
Prior art keywords
written
page
word lines
pages
flash memory
Prior art date
Application number
AT09766316T
Other languages
English (en)
Inventor
Menahem Lasser
Original Assignee
Sandisk Il Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandisk Il Ltd filed Critical Sandisk Il Ltd
Application granted granted Critical
Publication of ATE538475T1 publication Critical patent/ATE538475T1/de

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
AT09766316T 2008-06-16 2009-06-15 Seitenumkehrreihenfolgeschreiben in flash- speichern ATE538475T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/139,545 US7848144B2 (en) 2008-06-16 2008-06-16 Reverse order page writing in flash memories
PCT/IL2009/000592 WO2009153781A1 (en) 2008-06-16 2009-06-15 Reverse order page writing in flash memories

Publications (1)

Publication Number Publication Date
ATE538475T1 true ATE538475T1 (de) 2012-01-15

Family

ID=40974050

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09766316T ATE538475T1 (de) 2008-06-16 2009-06-15 Seitenumkehrreihenfolgeschreiben in flash- speichern

Country Status (8)

Country Link
US (2) US7848144B2 (de)
EP (1) EP2291847B1 (de)
JP (1) JP2011524600A (de)
KR (1) KR20110033206A (de)
CN (1) CN102067237B (de)
AT (1) ATE538475T1 (de)
TW (1) TWI406284B (de)
WO (1) WO2009153781A1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100885783B1 (ko) * 2007-01-23 2009-02-26 주식회사 하이닉스반도체 플래시 메모리 장치 및 동작 방법
KR101498669B1 (ko) * 2007-12-20 2015-03-19 삼성전자주식회사 반도체 메모리 시스템 및 그것의 액세스 방법
US7848144B2 (en) * 2008-06-16 2010-12-07 Sandisk Corporation Reverse order page writing in flash memories
US8254167B2 (en) * 2010-05-17 2012-08-28 Seagate Technologies Llc Joint encoding of logical pages in multi-page memory architecture
CN102135943B (zh) * 2011-03-23 2013-03-13 华为终端有限公司 闪存数据的存储、访问方法及装置
CN102147771B (zh) * 2011-04-08 2013-04-10 深圳市江波龙电子有限公司 查找闪存设备中固件程序存放位置的方法
US8537623B2 (en) * 2011-07-07 2013-09-17 Micron Technology, Inc. Devices and methods of programming memory cells
JP5754273B2 (ja) * 2011-07-11 2015-07-29 株式会社リコー メモリ制御装置、情報処理装置およびメモリ制御方法
US8743615B2 (en) 2011-08-22 2014-06-03 Sandisk Technologies Inc. Read compensation for partially programmed blocks of non-volatile storage
KR102003930B1 (ko) 2012-07-31 2019-07-25 삼성전자주식회사 불휘발성 메모리 장치의 데이터 라이팅 제어방법 및 웨어레벨링 제어 기능을 가지는 메모리 콘트롤러
US9478271B2 (en) * 2013-03-14 2016-10-25 Seagate Technology Llc Nonvolatile memory data recovery after power failure
CN103198039A (zh) * 2013-04-19 2013-07-10 无锡云动科技发展有限公司 一种数据传输控制器及其混合存储装置
US20150098271A1 (en) * 2013-10-09 2015-04-09 Sandisk Technologies Inc. System and method of storing data in a data storage device
US10754587B2 (en) 2015-03-20 2020-08-25 Burlywood, Inc. Memory partitioning storage controller
US9997251B2 (en) 2015-03-26 2018-06-12 Burlywood, LLC Medium defect management method for storage systems requiring an integrated controller
US10157680B2 (en) * 2015-12-22 2018-12-18 Sandisk Technologies Llp Sub-block mode for non-volatile memory
KR102289598B1 (ko) 2017-06-26 2021-08-18 삼성전자주식회사 불휘발성 메모리 장치 및 그것을 포함하는 메모리 시스템 그리고 그것의 프로그램 방법
CN109062822B (zh) * 2018-07-18 2021-09-07 北京世纪东方通讯设备有限公司 一种机车无线通信数据的存储方法及装置
JP2020095767A (ja) 2018-12-13 2020-06-18 キオクシア株式会社 半導体記憶装置
JP7213712B2 (ja) 2019-02-14 2023-01-27 キオクシア株式会社 不揮発性半導体記憶装置
CN109979508A (zh) 2019-03-15 2019-07-05 合肥沛睿微电子股份有限公司 固态硬盘装置与相关的固态硬盘控制电路
TWI701677B (zh) * 2019-03-20 2020-08-11 大陸商合肥沛睿微電子股份有限公司 固態硬碟裝置與相關的資料寫入方法
TWI690936B (zh) * 2019-03-20 2020-04-11 大陸商合肥沛睿微電子股份有限公司 固態硬碟裝置與相關的固態硬碟控制電路
JP2021047941A (ja) 2019-09-17 2021-03-25 キオクシア株式会社 メモリシステム及びメモリシステムの制御方法
US10984867B1 (en) * 2019-12-23 2021-04-20 SanDiskTechnologies LLC Direct look ahead mode for memory apparatus programmed with reverse order programming
US11081162B1 (en) * 2020-02-24 2021-08-03 Sandisk Technologies Llc Source side precharge and boosting improvement for reverse order program
CN111966298B (zh) * 2020-08-24 2021-07-27 深圳三地一芯电子有限责任公司 一种基于Flash存储器的倒序编程实现方法及装置
US11442666B2 (en) * 2020-11-17 2022-09-13 Western Digital Technologies, Inc. Storage system and dual-write programming method with reverse order for secondary block
CN115437566B (zh) * 2022-08-24 2026-02-06 杭州华橙软件技术有限公司 一种数据读写方法及装置

Family Cites Families (86)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3319323A1 (de) 1983-05-27 1984-11-29 Alcan Ohler GmbH, 5970 Plettenberg Verfahren und vorrichtung zum verschliessen eines behaelters mit einem deckel, welche beide aus plastisch verformbarem material bestehen
GB8319853D0 (en) 1983-07-22 1983-08-24 Forsac Valves Ball valve for pipeline
US5268319A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Highly compact EPROM and flash EEPROM devices
US5101378A (en) * 1988-06-15 1992-03-31 Advanced Micro Devices, Inc. Optimized electrically erasable cell for minimum read disturb and associated method of sensing
KR960002006B1 (ko) 1991-03-12 1996-02-09 가부시끼가이샤 도시바 2개의 기준 레벨을 사용하는 기록 검증 제어기를 갖는 전기적으로 소거 가능하고 프로그램 가능한 불휘발성 메모리 장치
US6222762B1 (en) * 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5532962A (en) * 1992-05-20 1996-07-02 Sandisk Corporation Soft errors handling in EEPROM devices
US5555204A (en) * 1993-06-29 1996-09-10 Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device
US5449947A (en) * 1993-07-07 1995-09-12 Actel Corporation Read-disturb tolerant metal-to-metal antifuse and fabrication method
KR0169267B1 (ko) * 1993-09-21 1999-02-01 사토 후미오 불휘발성 반도체 기억장치
GB9423036D0 (en) * 1994-11-15 1995-01-04 Sgs Thomson Microelectronics An integrated circuit memory device
TW388982B (en) * 1995-03-31 2000-05-01 Samsung Electronics Co Ltd Memory controller which executes read and write commands out of order
KR100253868B1 (ko) 1995-11-13 2000-05-01 니시무로 타이죠 불휘발성 반도체기억장치
US5581504A (en) * 1995-11-14 1996-12-03 Programmable Microelectronics Corp. Non-volatile electrically erasable memory with PMOS transistor NAND gate structure
US5814853A (en) * 1996-01-22 1998-09-29 Advanced Micro Devices, Inc. Sourceless floating gate memory device and method of storing data
US5903495A (en) * 1996-03-18 1999-05-11 Kabushiki Kaisha Toshiba Semiconductor device and memory system
US5917766A (en) * 1996-05-28 1999-06-29 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device that can carry out read disturb testing and burn-in testing reliably
TW338165B (en) * 1996-09-09 1998-08-11 Sony Co Ltd Semiconductor nand type flash memory with incremental step pulse programming
US6066979A (en) * 1996-09-23 2000-05-23 Eldec Corporation Solid-state high voltage linear regulator circuit
JP3967409B2 (ja) * 1996-12-26 2007-08-29 株式会社東芝 半導体集積回路装置
JP3489958B2 (ja) * 1997-03-19 2004-01-26 富士通株式会社 不揮発性半導体記憶装置
KR100323554B1 (ko) * 1997-05-14 2002-03-08 니시무로 타이죠 불휘발성반도체메모리장치
KR100255956B1 (ko) * 1997-07-16 2000-05-01 윤종용 강유전체 메모리 장치 및 그것의 데이터 보호 방법
US5930167A (en) * 1997-07-30 1999-07-27 Sandisk Corporation Multi-state non-volatile flash memory capable of being its own two state write cache
JP3805867B2 (ja) * 1997-09-18 2006-08-09 株式会社東芝 不揮発性半導体記憶装置
US5867429A (en) * 1997-11-19 1999-02-02 Sandisk Corporation High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates
US7031214B2 (en) * 1999-01-14 2006-04-18 Silicon Storage Technology, Inc. Digital multilevel memory system having multistage autozero sensing
IT1306963B1 (it) * 1999-01-19 2001-10-11 St Microelectronics Srl Circuito a compensazione capacitativa per la regolazione dellatensione di lettura di riga in memorie non-volatili
TW475267B (en) 1999-07-13 2002-02-01 Toshiba Corp Semiconductor memory
KR100322470B1 (ko) 1999-07-22 2002-02-07 윤종용 고밀도 노어형 플래시 메모리 장치 및 그것의 프로그램 방법
US6380033B1 (en) * 1999-09-20 2002-04-30 Advanced Micro Devices, Inc. Process to improve read disturb for NAND flash memory devices
US6175522B1 (en) 1999-09-30 2001-01-16 Advanced Micro Devices, Inc. Read operation scheme for a high-density, low voltage, and superior reliability nand flash memory device
US6240016B1 (en) * 1999-12-17 2001-05-29 Advanced Micro Devices, Inc. Method to reduce read gate disturb for flash EEPROM application
JP3891539B2 (ja) 2000-06-15 2007-03-14 シャープ株式会社 半導体装置およびその制御装置
US6570785B1 (en) * 2000-10-31 2003-05-27 Sandisk Corporation Method of reducing disturbs in non-volatile memory
US6535423B2 (en) * 2000-12-29 2003-03-18 Intel Corporation Drain bias for non-volatile memory
US6763424B2 (en) * 2001-01-19 2004-07-13 Sandisk Corporation Partial block data programming and reading operations in a non-volatile memory
JP3631463B2 (ja) * 2001-12-27 2005-03-23 株式会社東芝 不揮発性半導体記憶装置
JP3829088B2 (ja) 2001-03-29 2006-10-04 株式会社東芝 半導体記憶装置
US6377507B1 (en) * 2001-04-06 2002-04-23 Integrated Memory Technologies, Inc. Non-volatile memory device having high speed page mode operation
US6522580B2 (en) 2001-06-27 2003-02-18 Sandisk Corporation Operating techniques for reducing effects of coupling between storage elements of a non-volatile memory operated in multiple data states
US6891262B2 (en) * 2001-07-19 2005-05-10 Sony Corporation Semiconductor device and method of producing the same
US6456528B1 (en) * 2001-09-17 2002-09-24 Sandisk Corporation Selective operation of a multi-state non-volatile memory system in a binary mode
US6717847B2 (en) * 2001-09-17 2004-04-06 Sandisk Corporation Selective operation of a multi-state non-volatile memory system in a binary mode
US7054994B2 (en) 2002-07-29 2006-05-30 Hy Wire Ltd. Multiple-RAM CAM device and method therefor
US6542407B1 (en) * 2002-01-18 2003-04-01 Sandisk Corporation Techniques of recovering data from memory cells affected by field coupling with adjacent memory cells
JP3938309B2 (ja) * 2002-01-22 2007-06-27 富士通株式会社 リードディスターブを緩和したフラッシュメモリ
US6771536B2 (en) * 2002-02-27 2004-08-03 Sandisk Corporation Operating techniques for reducing program and read disturbs of a non-volatile memory
KR100476888B1 (ko) * 2002-04-04 2005-03-17 삼성전자주식회사 온도보상기능을 가진 멀티비트 플래쉬메모리
US6785169B1 (en) * 2002-04-05 2004-08-31 T-Ram, Inc. Memory cell error recovery
US6594181B1 (en) * 2002-05-10 2003-07-15 Fujitsu Limited System for reading a double-bit memory cell
WO2004001852A1 (en) 2002-06-19 2003-12-31 Sandisk Corporation Deep wordline trench to shield cross coupling between adjacent cells for scaled nand
US6894931B2 (en) * 2002-06-20 2005-05-17 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device
US6781877B2 (en) * 2002-09-06 2004-08-24 Sandisk Corporation Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells
US7196931B2 (en) 2002-09-24 2007-03-27 Sandisk Corporation Non-volatile memory and method with reduced source line bias errors
US6983428B2 (en) 2002-09-24 2006-01-03 Sandisk Corporation Highly compact non-volatile memory and method thereof
US7443757B2 (en) 2002-09-24 2008-10-28 Sandisk Corporation Non-volatile memory and method with reduced bit line crosstalk errors
US6891753B2 (en) 2002-09-24 2005-05-10 Sandisk Corporation Highly compact non-volatile memory and method therefor with internal serial buses
US6987693B2 (en) 2002-09-24 2006-01-17 Sandisk Corporation Non-volatile memory and method with reduced neighboring field errors
US6657891B1 (en) * 2002-11-29 2003-12-02 Kabushiki Kaisha Toshiba Semiconductor memory device for storing multivalued data
US6829167B2 (en) * 2002-12-12 2004-12-07 Sandisk Corporation Error recovery for nonvolatile memory
US7233522B2 (en) 2002-12-31 2007-06-19 Sandisk 3D Llc NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same
JP3913704B2 (ja) * 2003-04-22 2007-05-09 株式会社東芝 不揮発性半導体記憶装置及びこれを用いた電子装置
US6956770B2 (en) * 2003-09-17 2005-10-18 Sandisk Corporation Non-volatile memory and method with bit line compensation dependent on neighboring operating modes
US7012835B2 (en) * 2003-10-03 2006-03-14 Sandisk Corporation Flash memory data correction and scrub techniques
KR20050033996A (ko) 2003-10-07 2005-04-14 삼성전자주식회사 이동 통신 시스템에서 채널 수신 장치 및 방법
TW200515147A (en) * 2003-10-17 2005-05-01 Matsushita Electric Industrial Co Ltd Semiconductor memory device, controller, and read/write control method thereof
US6888758B1 (en) * 2004-01-21 2005-05-03 Sandisk Corporation Programming non-volatile memory
US7372730B2 (en) * 2004-01-26 2008-05-13 Sandisk Corporation Method of reading NAND memory to compensate for coupling between storage elements
US7177977B2 (en) * 2004-03-19 2007-02-13 Sandisk Corporation Operating non-volatile memory without read disturb limitations
US7020017B2 (en) * 2004-04-06 2006-03-28 Sandisk Corporation Variable programming of non-volatile memory
KR100645044B1 (ko) 2004-09-17 2006-11-10 삼성전자주식회사 높은 신뢰도를 갖는 불 휘발성 메모리 장치의 프로그램 방법
US7187585B2 (en) 2005-04-05 2007-03-06 Sandisk Corporation Read operation for non-volatile storage that includes compensation for coupling
US7196946B2 (en) 2005-04-05 2007-03-27 Sandisk Corporation Compensating for coupling in non-volatile storage
US7196928B2 (en) 2005-04-05 2007-03-27 Sandisk Corporation Compensating for coupling during read operations of non-volatile memory
KR100680462B1 (ko) * 2005-04-11 2007-02-08 주식회사 하이닉스반도체 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법
US7752382B2 (en) * 2005-09-09 2010-07-06 Sandisk Il Ltd Flash memory storage system and method
US7443726B2 (en) * 2005-12-29 2008-10-28 Sandisk Corporation Systems for alternate row-based reading and writing for non-volatile memory
US7349260B2 (en) * 2005-12-29 2008-03-25 Sandisk Corporation Alternate row-based reading and writing for non-volatile memory
KR101012131B1 (ko) * 2006-04-12 2011-02-07 샌디스크 코포레이션 프로그램 혼란의 영향을 감소시키는 방법
WO2008039667A2 (en) * 2006-09-27 2008-04-03 Sandisk Corporation Reducing program disturb in non-volatile storage
US7684247B2 (en) * 2006-09-29 2010-03-23 Sandisk Corporation Reverse reading in non-volatile memory with compensation for coupling
US7447076B2 (en) 2006-09-29 2008-11-04 Sandisk Corporation Systems for reverse reading in non-volatile memory with compensation for coupling
US7606070B2 (en) * 2006-12-29 2009-10-20 Sandisk Corporation Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation
US7848144B2 (en) * 2008-06-16 2010-12-07 Sandisk Corporation Reverse order page writing in flash memories
US8144512B2 (en) * 2009-12-18 2012-03-27 Sandisk Technologies Inc. Data transfer flows for on-chip folding

Also Published As

Publication number Publication date
US20090310413A1 (en) 2009-12-17
KR20110033206A (ko) 2011-03-30
JP2011524600A (ja) 2011-09-01
TWI406284B (zh) 2013-08-21
EP2291847A1 (de) 2011-03-09
EP2291847B1 (de) 2011-12-21
US7848144B2 (en) 2010-12-07
CN102067237A (zh) 2011-05-18
CN102067237B (zh) 2014-01-01
US20110096603A1 (en) 2011-04-28
US8339855B2 (en) 2012-12-25
WO2009153781A1 (en) 2009-12-23
TW201009842A (en) 2010-03-01

Similar Documents

Publication Publication Date Title
ATE538475T1 (de) Seitenumkehrreihenfolgeschreiben in flash- speichern
GB2476536B (en) Modified B+ tree to store nand memory indirection maps
WO2008132725A3 (en) A method for efficient storage of metadata in flash memory
WO2012106107A3 (en) Control arrangements and methods for accessing block oriented nonvolatile memory
GB2485732A (en) Container marker scheme for reducing write amplification in solid state devices
GB2495873A (en) Wear-Leveling of Cells/Pages/Sub-Pages/Blocks of a Memory
EP2077559A3 (de) Aktualisierungsverfahren für einen Flash-Speicher
MX2014007167A (es) Intercambio de conjunto operativo utilizando un archivo de intercambio secuencialmente ordenado.
EP4031973A4 (de) Zugreifen auf gespeicherte metadaten zur identifizierung von speichervorrichtungen mit darin gespeicherten daten
GB2442162A (en) Technique to write to a non-volatile memory
TW200736909A (en) Memory controller for flash memory
GB2485730A (en) Symmetric live migration of virtual machines
TW200641602A (en) Direct data file storage in flash memories
SG162655A1 (en) Recovery for non-volatile memory after power loss
TW200639633A (en) Direct data file storage implementation techniques in flash memories
WO2011116071A3 (en) Mlc self-raid flash data protection scheme
ATE552552T1 (de) Programmierverwaltungsdaten für nand-speicher
SG190955A1 (en) Transaction log recovery
WO2014105705A3 (en) Flash memory using virtual physical addresses
ATE545934T1 (de) Speichersystem
ATE512441T1 (de) Bereitstellung von energiereduktion bei der datenspeicherung in einem speicher
WO2010144587A3 (en) Memory system having persistent garbage collection
DE602007011105D1 (de) Konfigurierbarer cache für einen mikroprozessor
WO2015020900A3 (en) Method and device for error correcting code (ecc) error handling
GB2466106B (en) Deadlock avoidance by using multiple virtual channels of a bus