ATE517354T1 - Integrierte halbleiterschaltung, steuerungsverfahren und informationsverarbeitungsvorrichtung - Google Patents

Integrierte halbleiterschaltung, steuerungsverfahren und informationsverarbeitungsvorrichtung

Info

Publication number
ATE517354T1
ATE517354T1 AT09161288T AT09161288T ATE517354T1 AT E517354 T1 ATE517354 T1 AT E517354T1 AT 09161288 T AT09161288 T AT 09161288T AT 09161288 T AT09161288 T AT 09161288T AT E517354 T1 ATE517354 T1 AT E517354T1
Authority
AT
Austria
Prior art keywords
power supply
data
supply noise
bus
error
Prior art date
Application number
AT09161288T
Other languages
English (en)
Inventor
Takashi Yamamoto
Takaharu Ishizuka
Toshikazu Ueki
Takeshi Owaki
Atsushi Morosawa
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of ATE517354T1 publication Critical patent/ATE517354T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Power Sources (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
AT09161288T 2008-05-30 2009-05-27 Integrierte halbleiterschaltung, steuerungsverfahren und informationsverarbeitungsvorrichtung ATE517354T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008142072A JP5292925B2 (ja) 2008-05-30 2008-05-30 半導体集積回路及びその制御方法、並びに情報処理装置

Publications (1)

Publication Number Publication Date
ATE517354T1 true ATE517354T1 (de) 2011-08-15

Family

ID=41066128

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09161288T ATE517354T1 (de) 2008-05-30 2009-05-27 Integrierte halbleiterschaltung, steuerungsverfahren und informationsverarbeitungsvorrichtung

Country Status (6)

Country Link
US (1) US7800396B2 (de)
EP (1) EP2128635B1 (de)
JP (1) JP5292925B2 (de)
KR (1) KR101009375B1 (de)
CN (1) CN101594133B (de)
AT (1) ATE517354T1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20120226949A1 (en) * 2011-03-02 2012-09-06 Texas Instruments Incorporated Multi-Channel Bus Protection
JP2014109453A (ja) * 2012-11-30 2014-06-12 Renesas Electronics Corp 半導体装置
JP6458626B2 (ja) 2015-05-07 2019-01-30 富士通株式会社 デバッグ回路、半導体装置及びデバッグ方法
US9596037B2 (en) * 2015-05-12 2017-03-14 Intel Corporation Apparatus and method for measuring power supply noise
US10928484B2 (en) * 2017-09-01 2021-02-23 Gardenia Industrial Limited Directional radar transmitting and receiving system
US11899061B2 (en) 2021-06-14 2024-02-13 Apple Inc. Voltage monitoring circuit for interface
CN114840053B (zh) * 2022-04-11 2023-10-13 北京机电工程研究所 基于嵌入式软件的同步脉冲与定时器冗余控制方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05298193A (ja) * 1992-04-22 1993-11-12 Fujitsu Ltd メモリアクセス障害検出回路
JPH06324985A (ja) * 1993-05-18 1994-11-25 Mitsubishi Electric Corp データ処理装置
CN2518260Y (zh) * 2001-08-13 2002-10-23 周立峰 高压高频脉冲直流电发生器
US6751766B2 (en) * 2002-05-20 2004-06-15 Sandisk Corporation Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data
US6823293B2 (en) * 2002-12-31 2004-11-23 International Business Machines Corporation Hierarchical power supply noise monitoring device and system for very large scale integrated circuits
US7480774B2 (en) * 2003-04-01 2009-01-20 International Business Machines Corporation Method for performing a command cancel function in a DRAM
KR20060131723A (ko) * 2003-08-22 2006-12-20 자이단호우진 신산교소우조우 겐큐키코 반도체집적회로의 잡음검출 및 측정 회로
JP3902185B2 (ja) 2004-03-01 2007-04-04 日本電気株式会社 電源ノイズ測定装置
CN1808150B (zh) * 2005-01-18 2010-04-28 杰生自动技术有限公司 具有电源噪声信号模式分析功能的车辆电池保护方法及其装置
US7359811B1 (en) * 2005-06-16 2008-04-15 Altera Corporation Programmable logic device with power supply noise monitoring
US20070164753A1 (en) * 2006-01-18 2007-07-19 International Business Machines Corporation Power supply history monitor
US20070164754A1 (en) * 2006-01-18 2007-07-19 International Business Machines Corporation On-chip high frequency power supply noise sensor
JP2007219846A (ja) * 2006-02-16 2007-08-30 Fuji Xerox Co Ltd 半導体ディスク装置の異常監視・記録方法、プログラム、半導体ディスク装置、および記憶システム
US7486096B2 (en) * 2006-10-31 2009-02-03 International Business Machines Corporation Method and apparatus for testing to determine minimum operating voltages in electronic devices
JP5228332B2 (ja) * 2007-02-14 2013-07-03 富士通株式会社 半導体集積回路
JP5141052B2 (ja) * 2007-03-08 2013-02-13 日本電気株式会社 電源ノイズ測定回路および測定方法

Also Published As

Publication number Publication date
CN101594133A (zh) 2009-12-02
EP2128635B1 (de) 2011-07-20
JP2009289106A (ja) 2009-12-10
KR101009375B1 (ko) 2011-01-19
CN101594133B (zh) 2013-01-09
US7800396B2 (en) 2010-09-21
EP2128635A1 (de) 2009-12-02
US20090300410A1 (en) 2009-12-03
JP5292925B2 (ja) 2013-09-18
KR20090124934A (ko) 2009-12-03

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