ATE515078T1 - Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung - Google Patents
Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtungInfo
- Publication number
- ATE515078T1 ATE515078T1 AT04702422T AT04702422T ATE515078T1 AT E515078 T1 ATE515078 T1 AT E515078T1 AT 04702422 T AT04702422 T AT 04702422T AT 04702422 T AT04702422 T AT 04702422T AT E515078 T1 ATE515078 T1 AT E515078T1
- Authority
- AT
- Austria
- Prior art keywords
- anisotropically conductive
- conductive connector
- anisotropically
- film
- insulating
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/03—Contact members characterised by the material, e.g. plating, or coating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/01—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between the connecting locations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53196—Means to apply magnetic force directly to position or hold work part
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003010075 | 2003-01-17 | ||
PCT/JP2004/000238 WO2004066449A1 (ja) | 2003-01-17 | 2004-01-15 | 異方導電性コネクターおよびその製造方法並びに回路装置の検査装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE515078T1 true ATE515078T1 (de) | 2011-07-15 |
Family
ID=32767237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04702422T ATE515078T1 (de) | 2003-01-17 | 2004-01-15 | Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung |
Country Status (7)
Country | Link |
---|---|
US (1) | US7190180B2 (de) |
EP (1) | EP1585197B1 (de) |
KR (1) | KR100574315B1 (de) |
CN (1) | CN100397711C (de) |
AT (1) | ATE515078T1 (de) |
TW (1) | TWI239683B (de) |
WO (1) | WO2004066449A1 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3573120B2 (ja) * | 2001-08-31 | 2004-10-06 | Jsr株式会社 | 異方導電性コネクターおよびその製造方法並びにその応用製品 |
EP1585197B1 (de) | 2003-01-17 | 2011-06-29 | JSR Corporation | Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung |
US8518304B1 (en) | 2003-03-31 | 2013-08-27 | The Research Foundation Of State University Of New York | Nano-structure enhancements for anisotropic conductive material and thermal interposers |
US7446545B2 (en) * | 2003-05-08 | 2008-11-04 | Unitechno Inc. | Anisotropically conductive sheet |
JP4197659B2 (ja) * | 2003-05-30 | 2008-12-17 | 富士通マイクロエレクトロニクス株式会社 | 電子部品用コンタクタ及びこれを用いた試験方法 |
EP1633019B1 (de) * | 2003-06-12 | 2012-09-05 | JSR Corporation | Anisotrope leitfähige verbindereinrichtung und herstellungsverfahren dafür und schaltungsbauelement-untersuchungseinrichtung |
US20060177971A1 (en) * | 2004-01-13 | 2006-08-10 | Jsr Corporation | Anisotropically conductive connector, production process thereof and application product thereof |
JP2006300926A (ja) * | 2005-03-25 | 2006-11-02 | Yamaichi Electronics Co Ltd | 半導体装置用キャリアユニット、および、半導体装置用ソケット |
JP2006294527A (ja) * | 2005-04-14 | 2006-10-26 | Nec Corp | コネクタ及びその製造方法 |
US7397255B2 (en) * | 2005-06-22 | 2008-07-08 | Paricon Technology Corporation | Micro Kelvin probes and micro Kelvin probe methodology |
US7408367B2 (en) * | 2005-06-22 | 2008-08-05 | Paricon Technologies Corporation | Micro Kelvin probes and micro Kelvin probe methodology with concentric pad structures |
JPWO2007043350A1 (ja) * | 2005-10-11 | 2009-04-16 | Jsr株式会社 | 異方導電性コネクター装置および回路装置の検査装置 |
CN101449426B (zh) | 2006-04-11 | 2012-05-16 | Jsr株式会社 | 各向异性导电连接器及各向异性导电连接器装置 |
KR100761862B1 (ko) * | 2006-11-14 | 2007-09-28 | 삼성전자주식회사 | 반도체 패키지 테스트용 소켓 |
DE102006059429A1 (de) * | 2006-12-15 | 2008-06-26 | Atg Luther & Maelzer Gmbh | Modul für eine Prüfvorrichtung zum Testen von Leiterplatten |
US7939945B2 (en) | 2008-04-30 | 2011-05-10 | Intel Corporation | Electrically conductive fluid interconnects for integrated circuit devices |
ITMI20081023A1 (it) * | 2008-06-04 | 2009-12-05 | Eles Semiconductor Equipment Spa | Test di dispositivi elettronici con schede senza zoccoli basate su bloccaggio magnetico |
WO2009150570A1 (en) * | 2008-06-10 | 2009-12-17 | Koninklijke Philips Electronics N.V. | Electronic textile |
JP2011086880A (ja) * | 2009-10-19 | 2011-04-28 | Advantest Corp | 電子部品実装装置および電子部品の実装方法 |
KR101110002B1 (ko) * | 2011-06-22 | 2012-01-31 | 이정구 | 반도체 소자 테스트용 탄성 콘택터 및 그 제조방법 |
CN102436874B (zh) * | 2011-09-17 | 2013-01-02 | 山西金开源实业有限公司 | 各向异性导电薄膜生产设备 |
TW201325335A (zh) * | 2011-10-29 | 2013-06-16 | Cima Nanotech Israel Ltd | 經圖案化基材上之導電網路 |
KR101266124B1 (ko) | 2012-04-03 | 2013-05-27 | 주식회사 아이에스시 | 고밀도 도전부를 가지는 테스트용 소켓 및 그 제조방법 |
US8845363B2 (en) * | 2012-09-07 | 2014-09-30 | Apple Inc. | Reinforcing bars in I/O connectors |
US20140205851A1 (en) * | 2013-01-23 | 2014-07-24 | Ravindranath V. Mahajan | Magnetic contacts for electronics applications |
US9872390B1 (en) * | 2016-08-17 | 2018-01-16 | Microsoft Technology Licensing, Llc | Flexible interconnect |
JP2018073577A (ja) * | 2016-10-27 | 2018-05-10 | 株式会社エンプラス | 異方導電性シート及びその製造方法 |
CN110140184A (zh) * | 2016-12-07 | 2019-08-16 | 韦弗有限责任公司 | 低损耗电传输机构和使用其的天线 |
JP7405337B2 (ja) * | 2018-10-11 | 2023-12-26 | 積水ポリマテック株式会社 | 電気接続シート、及び端子付きガラス板構造 |
CN111175644A (zh) * | 2020-02-28 | 2020-05-19 | 南京金五环电子科技有限公司 | 一种电路板测试辅助装置、测试系统和测试方法 |
KR102211358B1 (ko) * | 2020-03-19 | 2021-02-03 | (주)티에스이 | 테스트 소켓 및 이를 포함하는 테스트 장치와, 테스트 소켓의 제조방법 |
CN112490813A (zh) * | 2020-11-24 | 2021-03-12 | 成都圣世达科技有限公司 | Tcc组模式滤波电连接器制备方法及tcc组模式滤波电连接器 |
Family Cites Families (24)
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JPS5193393A (en) | 1975-02-12 | 1976-08-16 | Erasuteitsuku kontakutoshiitonoseizohoho | |
US4209481A (en) * | 1976-04-19 | 1980-06-24 | Toray Industries, Inc. | Process for producing an anisotropically electroconductive sheet |
JPS6032285B2 (ja) | 1977-05-31 | 1985-07-27 | ジェイエスアール株式会社 | 加圧導電性エラストマ−の製造方法 |
JPS61250906A (ja) | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | 導電性エラストマ−シ−ト |
US4954873A (en) | 1985-07-22 | 1990-09-04 | Digital Equipment Corporation | Electrical connector for surface mounting |
US4778950A (en) * | 1985-07-22 | 1988-10-18 | Digital Equipment Corporation | Anisotropic elastomeric interconnecting system |
US4770641A (en) * | 1986-03-31 | 1988-09-13 | Amp Incorporated | Conductive gel interconnection apparatus |
US5163837A (en) * | 1991-06-26 | 1992-11-17 | Amp Incorporated | Ordered area array connector |
JP2828410B2 (ja) | 1993-12-21 | 1998-11-25 | 松下電器産業株式会社 | プローブカード及び半導体チップの検査方法 |
JP3722321B2 (ja) | 1997-01-10 | 2005-11-30 | Jsr株式会社 | 検査治具 |
JPH10206493A (ja) | 1997-01-22 | 1998-08-07 | Jsr Corp | 検査治具 |
FR2766618B1 (fr) * | 1997-07-22 | 2000-12-01 | Commissariat Energie Atomique | Procede de fabrication d'un film conducteur anisotrope a inserts conducteurs |
JP3978905B2 (ja) * | 1998-11-19 | 2007-09-19 | Jsr株式会社 | 異方導電性積層体およびその製法 |
JP3900732B2 (ja) | 1999-02-17 | 2007-04-04 | Jsr株式会社 | 異方導電性シートおよびその製造方法 |
KR100314135B1 (ko) * | 1999-03-08 | 2001-11-16 | 윤종용 | Bga 패키지의 전기적 검사를 위한 소켓 및 이를 이용한검사방법 |
JP2001283996A (ja) | 2000-04-03 | 2001-10-12 | Jsr Corp | シート状コネクターおよびその製造方法、電気装置接続装置並びに検査装置 |
JP3879464B2 (ja) | 2000-09-25 | 2007-02-14 | Jsr株式会社 | 回路装置検査用異方導電性シートおよびその製造方法並びにその応用製品 |
KR100509526B1 (ko) * | 2000-09-25 | 2005-08-23 | 제이에스알 가부시끼가이샤 | 이방 도전성 시트 및 그의 제조 방법 및 그의 응용 제품 |
JP2002150851A (ja) * | 2000-11-07 | 2002-05-24 | Hitachi Cable Ltd | 消火層付難燃ケーブル |
JP4474767B2 (ja) | 2000-11-17 | 2010-06-09 | Jsr株式会社 | 異方導電性シート |
WO2002065588A1 (fr) * | 2001-02-09 | 2002-08-22 | Jsr Corporation | Connecteur conducteur anisotrope, son procede de fabrication et sonde |
JP3788258B2 (ja) * | 2001-03-27 | 2006-06-21 | Jsr株式会社 | 異方導電性コネクターおよびその応用製品 |
CN100539304C (zh) * | 2002-03-07 | 2009-09-09 | Jsr株式会社 | 各向异性导电连接器及生产工艺和电路器件的检验设备 |
EP1585197B1 (de) | 2003-01-17 | 2011-06-29 | JSR Corporation | Anisotroper leitfähiger verbinder und herstellungsverfahren dafür und untersuchungseinheit für eine schaltungseinrichtung |
-
2004
- 2004-01-15 EP EP04702422A patent/EP1585197B1/de not_active Expired - Lifetime
- 2004-01-15 WO PCT/JP2004/000238 patent/WO2004066449A1/ja not_active Application Discontinuation
- 2004-01-15 CN CNB2004800008686A patent/CN100397711C/zh not_active Expired - Fee Related
- 2004-01-15 KR KR1020057003755A patent/KR100574315B1/ko active IP Right Grant
- 2004-01-15 AT AT04702422T patent/ATE515078T1/de not_active IP Right Cessation
- 2004-01-15 US US10/525,799 patent/US7190180B2/en not_active Expired - Lifetime
- 2004-01-16 TW TW093101248A patent/TWI239683B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN1701468A (zh) | 2005-11-23 |
KR20050034759A (ko) | 2005-04-14 |
EP1585197A1 (de) | 2005-10-12 |
WO2004066449A1 (ja) | 2004-08-05 |
TWI239683B (en) | 2005-09-11 |
EP1585197A4 (de) | 2007-10-31 |
TW200425579A (en) | 2004-11-16 |
KR100574315B1 (ko) | 2006-04-27 |
US20050258850A1 (en) | 2005-11-24 |
CN100397711C (zh) | 2008-06-25 |
US7190180B2 (en) | 2007-03-13 |
EP1585197B1 (de) | 2011-06-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |