ATE491227T1 - Verfahren zur herstellung von interkonnektverbindungen für halbleiterkomponenten - Google Patents
Verfahren zur herstellung von interkonnektverbindungen für halbleiterkomponentenInfo
- Publication number
- ATE491227T1 ATE491227T1 AT05723820T AT05723820T ATE491227T1 AT E491227 T1 ATE491227 T1 AT E491227T1 AT 05723820 T AT05723820 T AT 05723820T AT 05723820 T AT05723820 T AT 05723820T AT E491227 T1 ATE491227 T1 AT E491227T1
- Authority
- AT
- Austria
- Prior art keywords
- solder
- opening
- semiconductor components
- interconnect connections
- deposition
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 239000000463 material Substances 0.000 abstract 6
- 238000009736 wetting Methods 0.000 abstract 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 238000000277 atomic layer chemical vapour deposition Methods 0.000 abstract 1
- 238000000231 atomic layer deposition Methods 0.000 abstract 1
- 238000000151 deposition Methods 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 239000002184 metal Substances 0.000 abstract 1
- 229910052751 metal Inorganic materials 0.000 abstract 1
- 229910052759 nickel Inorganic materials 0.000 abstract 1
- 150000004767 nitrides Chemical class 0.000 abstract 1
- 229910000679 solder Inorganic materials 0.000 abstract 1
Classifications
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
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- C23C16/45525—Atomic layer deposition [ALD]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/049—Nitrides composed of metals from groups of the periodic table
- H01L2924/0494—4th Group
- H01L2924/04941—TiN
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/784,074 US6943106B1 (en) | 2004-02-20 | 2004-02-20 | Methods of fabricating interconnects for semiconductor components including plating solder-wetting material and solder filling |
PCT/US2005/006116 WO2005083778A1 (en) | 2004-02-20 | 2005-02-18 | Methods of fabricating interconnects for semiconductor components |
Publications (1)
Publication Number | Publication Date |
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ATE491227T1 true ATE491227T1 (de) | 2010-12-15 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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AT05723820T ATE491227T1 (de) | 2004-02-20 | 2005-02-18 | Verfahren zur herstellung von interkonnektverbindungen für halbleiterkomponenten |
Country Status (9)
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US (4) | US6943106B1 (de) |
EP (1) | EP1719168B1 (de) |
JP (1) | JP4702562B2 (de) |
KR (1) | KR100821764B1 (de) |
CN (1) | CN100536105C (de) |
AT (1) | ATE491227T1 (de) |
DE (1) | DE602005025194D1 (de) |
SG (4) | SG131951A1 (de) |
WO (1) | WO2005083778A1 (de) |
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US6943106B1 (en) * | 2004-02-20 | 2005-09-13 | Micron Technology, Inc. | Methods of fabricating interconnects for semiconductor components including plating solder-wetting material and solder filling |
US7005379B2 (en) * | 2004-04-08 | 2006-02-28 | Micron Technology, Inc. | Semiconductor processing methods for forming electrical contacts |
US7279407B2 (en) | 2004-09-02 | 2007-10-09 | Micron Technology, Inc. | Selective nickel plating of aluminum, copper, and tungsten structures |
US7772115B2 (en) * | 2005-09-01 | 2010-08-10 | Micron Technology, Inc. | Methods for forming through-wafer interconnects, intermediate structures so formed, and devices and systems having at least one solder dam structure |
US7405146B2 (en) * | 2006-01-24 | 2008-07-29 | Kinsus Interconnect Technology Corp. | Electroplating method by transmitting electric current from a ball side |
EP1987535B1 (de) * | 2006-02-01 | 2011-06-01 | Silex Microsystems AB | Herstellungsverfahren für durchkontakte |
US7955946B2 (en) * | 2006-05-22 | 2011-06-07 | Micron Technology, Inc. | Methods of determining x-y spatial orientation of a semiconductor substrate comprising an integrated circuit, methods of positioning a semiconductor substrate comprising an integrated circuit, methods of processing a semiconductor substrate, and semiconductor devices |
US7473577B2 (en) * | 2006-08-11 | 2009-01-06 | International Business Machines Corporation | Integrated chip carrier with compliant interconnect |
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US8586465B2 (en) * | 2007-06-07 | 2013-11-19 | United Test And Assembly Center Ltd | Through silicon via dies and packages |
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US7678696B2 (en) * | 2008-08-08 | 2010-03-16 | International Business Machines Corporation | Method of making through wafer vias |
US8035198B2 (en) * | 2008-08-08 | 2011-10-11 | International Business Machines Corporation | Through wafer via and method of making same |
US8299566B2 (en) | 2008-08-08 | 2012-10-30 | International Business Machines Corporation | Through wafer vias and method of making same |
US8138036B2 (en) * | 2008-08-08 | 2012-03-20 | International Business Machines Corporation | Through silicon via and method of fabricating same |
US8384224B2 (en) * | 2008-08-08 | 2013-02-26 | International Business Machines Corporation | Through wafer vias and method of making same |
CN102097490A (zh) * | 2009-12-15 | 2011-06-15 | 中芯国际集成电路制造(上海)有限公司 | 双位快闪存储器的制作方法 |
US8518815B2 (en) | 2010-07-07 | 2013-08-27 | Lam Research Corporation | Methods, devices, and materials for metallization |
US20120049358A1 (en) * | 2010-08-24 | 2012-03-01 | Bin-Hong Cheng | Semiconductor Device and Semiconductor Process for Making the Same |
KR101215648B1 (ko) * | 2011-02-11 | 2012-12-26 | 에스케이하이닉스 주식회사 | 반도체 칩 및 그 제조방법 |
KR101780423B1 (ko) * | 2011-03-18 | 2017-09-22 | 삼성전자주식회사 | 반도체 장치 및 이의 제조 방법 |
US8853072B2 (en) | 2011-06-06 | 2014-10-07 | Micron Technology, Inc. | Methods of forming through-substrate interconnects |
US8519516B1 (en) | 2012-03-12 | 2013-08-27 | Micron Technology, Inc. | Semiconductor constructions |
CN103377954B (zh) * | 2012-04-28 | 2016-12-14 | 无锡华润上华科技有限公司 | 栅极焊盘和源极焊盘的形成方法 |
JP5862459B2 (ja) * | 2012-05-28 | 2016-02-16 | 東京エレクトロン株式会社 | 成膜方法 |
JP5966618B2 (ja) * | 2012-05-28 | 2016-08-10 | 東京エレクトロン株式会社 | 成膜方法 |
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US6107109A (en) | 1997-12-18 | 2000-08-22 | Micron Technology, Inc. | Method for fabricating a semiconductor interconnect with laser machined electrical paths through substrate |
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JP3918350B2 (ja) * | 1999-03-05 | 2007-05-23 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
US7045461B2 (en) * | 2000-01-07 | 2006-05-16 | Nikkon Materials Co., Ltd. | Metal plating method, pretreatment agent, and semiconductor wafer and semiconductor device obtained using these |
JP3736607B2 (ja) * | 2000-01-21 | 2006-01-18 | セイコーエプソン株式会社 | 半導体装置及びその製造方法、回路基板並びに電子機器 |
EP2293322A1 (de) * | 2000-06-08 | 2011-03-09 | Genitech, Inc. | Verfahren zur Abscheidung einer Metallnitridschicht |
US6459150B1 (en) | 2000-08-17 | 2002-10-01 | Industrial Technology Research Institute | Electronic substrate having an aperture position through a substrate, conductive pads, and an insulating layer |
CN1392510A (zh) | 2001-06-20 | 2003-01-22 | 力捷电脑股份有限公司 | 影像扫瞄的振动补偿装置及振动补偿方法 |
KR100407381B1 (ko) * | 2001-06-29 | 2003-12-01 | 주식회사 하이닉스반도체 | 반도체 소자의 커패시터 형성방법 |
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JP3967239B2 (ja) * | 2001-09-20 | 2007-08-29 | 株式会社フジクラ | 充填金属部付き部材の製造方法及び充填金属部付き部材 |
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US6902872B2 (en) * | 2002-07-29 | 2005-06-07 | Hewlett-Packard Development Company, L.P. | Method of forming a through-substrate interconnect |
KR100466332B1 (ko) * | 2002-12-14 | 2005-01-14 | 동부전자 주식회사 | 반도체 소자의 제조 방법 |
JP5214092B2 (ja) * | 2003-01-23 | 2013-06-19 | アドバンスト・マイクロ・ディバイシズ・インコーポレイテッド | 触媒を用いた無電解めっきによりパターン化された絶縁体上に金属層を形成する方法 |
US6903013B2 (en) * | 2003-05-16 | 2005-06-07 | Chartered Semiconductor Manufacturing Ltd. | Method to fill a trench and tunnel by using ALD seed layer and electroless plating |
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US6943106B1 (en) * | 2004-02-20 | 2005-09-13 | Micron Technology, Inc. | Methods of fabricating interconnects for semiconductor components including plating solder-wetting material and solder filling |
US7199439B2 (en) * | 2004-06-14 | 2007-04-03 | Micron Technology, Inc. | Microelectronic imagers and methods of packaging microelectronic imagers |
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-
2004
- 2004-02-20 US US10/784,074 patent/US6943106B1/en not_active Expired - Lifetime
-
2005
- 2005-01-03 US US11/028,892 patent/US7189642B2/en not_active Expired - Lifetime
- 2005-01-03 US US11/028,918 patent/US7071098B2/en not_active Expired - Lifetime
- 2005-02-18 CN CNB200580005360XA patent/CN100536105C/zh active Active
- 2005-02-18 DE DE602005025194T patent/DE602005025194D1/de active Active
- 2005-02-18 SG SG200703055-4A patent/SG131951A1/en unknown
- 2005-02-18 JP JP2006554336A patent/JP4702562B2/ja active Active
- 2005-02-18 SG SG201007874-9A patent/SG166787A1/en unknown
- 2005-02-18 KR KR1020067016544A patent/KR100821764B1/ko active IP Right Grant
- 2005-02-18 SG SG201007873-1A patent/SG166786A1/en unknown
- 2005-02-18 AT AT05723820T patent/ATE491227T1/de not_active IP Right Cessation
- 2005-02-18 EP EP05723820A patent/EP1719168B1/de active Active
- 2005-02-18 SG SG200703054-7A patent/SG131950A1/en unknown
- 2005-02-18 WO PCT/US2005/006116 patent/WO2005083778A1/en active Application Filing
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2007
- 2007-02-13 US US11/705,897 patent/US7410898B2/en not_active Expired - Lifetime
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US20050186777A1 (en) | 2005-08-25 |
US7410898B2 (en) | 2008-08-12 |
DE602005025194D1 (de) | 2011-01-20 |
SG166786A1 (en) | 2010-12-29 |
US20050186790A1 (en) | 2005-08-25 |
EP1719168A1 (de) | 2006-11-08 |
KR100821764B1 (ko) | 2008-04-14 |
SG166787A1 (en) | 2010-12-29 |
CN100536105C (zh) | 2009-09-02 |
JP2007523498A (ja) | 2007-08-16 |
JP4702562B2 (ja) | 2011-06-15 |
SG131951A1 (en) | 2007-05-28 |
KR20060111708A (ko) | 2006-10-27 |
US6943106B1 (en) | 2005-09-13 |
EP1719168B1 (de) | 2010-12-08 |
WO2005083778A1 (en) | 2005-09-09 |
US7071098B2 (en) | 2006-07-04 |
US20070141835A1 (en) | 2007-06-21 |
US20050186770A1 (en) | 2005-08-25 |
US7189642B2 (en) | 2007-03-13 |
CN1922726A (zh) | 2007-02-28 |
SG131950A1 (en) | 2007-05-28 |
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