ATE426897T1 - System und verfahren zur selbstpr fung und reparatur von speichermodulen - Google Patents

System und verfahren zur selbstpr fung und reparatur von speichermodulen

Info

Publication number
ATE426897T1
ATE426897T1 AT03788336T AT03788336T ATE426897T1 AT E426897 T1 ATE426897 T1 AT E426897T1 AT 03788336 T AT03788336 T AT 03788336T AT 03788336 T AT03788336 T AT 03788336T AT E426897 T1 ATE426897 T1 AT E426897T1
Authority
AT
Austria
Prior art keywords
memory
defective
locations
hub
repair
Prior art date
Application number
AT03788336T
Other languages
English (en)
Inventor
Joseph Jeddeloh
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE426897T1 publication Critical patent/ATE426897T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G11C29/4401—Indication or identification of errors, e.g. for repair for self repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606—Error catch memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Pens And Brushes (AREA)
  • Dot-Matrix Printers And Others (AREA)
AT03788336T 2002-08-16 2003-08-05 System und verfahren zur selbstpr fung und reparatur von speichermodulen ATE426897T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/222,393 US6754117B2 (en) 2002-08-16 2002-08-16 System and method for self-testing and repair of memory modules

Publications (1)

Publication Number Publication Date
ATE426897T1 true ATE426897T1 (de) 2009-04-15

Family

ID=31714947

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03788336T ATE426897T1 (de) 2002-08-16 2003-08-05 System und verfahren zur selbstpr fung und reparatur von speichermodulen

Country Status (10)

Country Link
US (1) US6754117B2 (de)
EP (1) EP1535131B1 (de)
JP (1) JP4431977B2 (de)
KR (1) KR100848254B1 (de)
CN (1) CN100578656C (de)
AT (1) ATE426897T1 (de)
AU (1) AU2003258104A1 (de)
DE (1) DE60326854D1 (de)
TW (1) TWI242780B (de)
WO (1) WO2004017162A2 (de)

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EP1535131A4 (de) 2006-02-22
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WO2004017162A2 (en) 2004-02-26
WO2004017162A3 (en) 2004-05-27
JP2005535978A (ja) 2005-11-24
CN100578656C (zh) 2010-01-06
EP1535131B1 (de) 2009-03-25
JP4431977B2 (ja) 2010-03-17
DE60326854D1 (de) 2009-05-07
TWI242780B (en) 2005-11-01
TW200414219A (en) 2004-08-01
KR100848254B1 (ko) 2008-07-25
US6754117B2 (en) 2004-06-22
US20040034825A1 (en) 2004-02-19
CN1703755A (zh) 2005-11-30
EP1535131A2 (de) 2005-06-01
KR20050061459A (ko) 2005-06-22

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