ATE412172T1 - System zur einstellung der lichtintensität - Google Patents

System zur einstellung der lichtintensität

Info

Publication number
ATE412172T1
ATE412172T1 AT03772795T AT03772795T ATE412172T1 AT E412172 T1 ATE412172 T1 AT E412172T1 AT 03772795 T AT03772795 T AT 03772795T AT 03772795 T AT03772795 T AT 03772795T AT E412172 T1 ATE412172 T1 AT E412172T1
Authority
AT
Austria
Prior art keywords
target area
light intensity
image
light
light irradiation
Prior art date
Application number
AT03772795T
Other languages
English (en)
Inventor
Kenji Yoneda
Shigehide Hirooka
Original Assignee
Ccs Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ccs Inc filed Critical Ccs Inc
Application granted granted Critical
Publication of ATE412172T1 publication Critical patent/ATE412172T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8896—Circuits specially adapted for system specific signal conditioning

Landscapes

  • Immunology (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Textile Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Input (AREA)
  • Eye Examination Apparatus (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • Vehicle Body Suspensions (AREA)
  • Lighting Device Outwards From Vehicle And Optical Signal (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Glass Compositions (AREA)
  • Holo Graphy (AREA)
AT03772795T 2002-11-14 2003-11-14 System zur einstellung der lichtintensität ATE412172T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002331413 2002-11-14

Publications (1)

Publication Number Publication Date
ATE412172T1 true ATE412172T1 (de) 2008-11-15

Family

ID=32310622

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03772795T ATE412172T1 (de) 2002-11-14 2003-11-14 System zur einstellung der lichtintensität

Country Status (7)

Country Link
US (1) US7643746B2 (de)
EP (1) EP1566629B1 (de)
JP (2) JP4444838B2 (de)
AT (1) ATE412172T1 (de)
AU (1) AU2003280810A1 (de)
DE (1) DE60324317D1 (de)
WO (1) WO2004044565A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7751612B2 (en) 2006-10-10 2010-07-06 Usnr/Kockums Cancar Company Occlusionless scanner for workpieces
JP5029908B2 (ja) * 2008-03-12 2012-09-19 東京電力株式会社 フルネルレンズを用いた面照明装置
US8798316B2 (en) * 2009-05-14 2014-08-05 Koninklijke Philips N.V. Method and system for controlling lighting
CN103620375B (zh) 2011-04-29 2016-06-29 西门子医疗保健诊断公司 高通量准直照射器和均匀场照射的方法
JP2013152207A (ja) * 2011-12-31 2013-08-08 Shibaura Mechatronics Corp 検査装置及び検査方法
CN103901043B (zh) * 2012-12-24 2017-03-01 台达电子工业股份有限公司 检查设备
JP6212874B2 (ja) * 2013-02-12 2017-10-18 大日本印刷株式会社 照明制御装置、照明制御方法、照明制御装置用のプログラム、および、照明システム
JP6387589B2 (ja) * 2013-08-30 2018-09-12 株式会社リコー 画像形成装置、車両、及び画像形成装置の制御方法
AU2014202744B2 (en) 2014-05-20 2016-10-20 Canon Kabushiki Kaisha System and method for re-configuring a lighting arrangement
JP6359939B2 (ja) * 2014-10-08 2018-07-18 倉敷紡績株式会社 検査装置
US11308601B2 (en) * 2015-04-29 2022-04-19 Emhart Glass S.A. Container inspection system with individual light control
KR101767784B1 (ko) * 2015-12-24 2017-08-14 주식회사 포스코 핀홀 또는 홀 검출 장치 및 방법
JP6954925B2 (ja) * 2017-01-06 2021-10-27 株式会社Ｆｕｊｉ 部品実装機の撮像用照明装置
TWI663580B (zh) * 2017-12-01 2019-06-21 Getac Technology Corporation 監視系統的控制方法
JP7077635B2 (ja) * 2018-01-26 2022-05-31 王子ホールディングス株式会社 シート状物の欠陥検査装置及び製造方法
JP6775273B2 (ja) * 2018-08-30 2020-10-28 株式会社アイテックシステム ライン状照明装置、その製造方法および検査方法
ES2916577T3 (es) 2019-02-27 2022-07-01 Ivoclar Vivadent Ag Dispositivo de estereolitografía y un procedimiento para ajustar un dispositivo de estereolitografía
KR102228081B1 (ko) * 2019-10-23 2021-03-16 휴멘 주식회사 인쇄물 검사 시스템 및 인쇄물 검사 방법

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54132131A (en) * 1978-04-05 1979-10-13 Sumitomo Electric Ind Ltd Optical information reading device
JPS62166478A (ja) * 1986-01-20 1987-07-22 Tokyo Electric Co Ltd 光学読取装置
JPH0799542B2 (ja) * 1987-01-26 1995-10-25 オムロン株式会社 照明制御装置
JP2689482B2 (ja) * 1988-05-25 1997-12-10 松下電器産業株式会社 面発光装置
JPH04248449A (ja) * 1991-02-04 1992-09-03 Sumitomo Heavy Ind Ltd 成形品の外観検査装置
US6088941A (en) * 1992-04-06 2000-07-18 A.D.P. Adaptive Visual Perception Ltd. Transparency viewing apparatus
FR2708118B1 (fr) * 1993-06-29 1995-10-06 Int Jeux Dispositif d'analyse de supports d'informations pourvu de moyens de compensation de ses signaux de sortie.
JPH10111251A (ja) 1996-10-08 1998-04-28 Canon Inc 欠陥検査装置
US7781723B1 (en) * 1998-02-19 2010-08-24 Emhart Glass S.A. Container inspection machine using light source having spatially cyclically continuously varying intensity
US6359662B1 (en) * 1999-11-05 2002-03-19 Agilent Technologies, Inc. Method and system for compensating for defects in a multi-light valve display system
US20030215129A1 (en) * 2002-05-15 2003-11-20 Three-Five Systems, Inc. Testing liquid crystal microdisplays

Also Published As

Publication number Publication date
US7643746B2 (en) 2010-01-05
JPWO2004044565A1 (ja) 2006-03-16
JP4859958B2 (ja) 2012-01-25
EP1566629A4 (de) 2006-10-18
EP1566629A1 (de) 2005-08-24
WO2004044565A1 (ja) 2004-05-27
JP4444838B2 (ja) 2010-03-31
DE60324317D1 (de) 2008-12-04
US20060050499A1 (en) 2006-03-09
AU2003280810A1 (en) 2004-06-03
EP1566629B1 (de) 2008-10-22
JP2009222728A (ja) 2009-10-01

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Legal Events

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